DE69429340D1 - Kontaktloses inspektionssystem - Google Patents

Kontaktloses inspektionssystem

Info

Publication number
DE69429340D1
DE69429340D1 DE69429340T DE69429340T DE69429340D1 DE 69429340 D1 DE69429340 D1 DE 69429340D1 DE 69429340 T DE69429340 T DE 69429340T DE 69429340 T DE69429340 T DE 69429340T DE 69429340 D1 DE69429340 D1 DE 69429340D1
Authority
DE
Germany
Prior art keywords
inspection system
contactless inspection
contactless
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69429340T
Other languages
English (en)
Other versions
DE69429340T2 (de
Inventor
Lee Hanna
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MECTRON ENGINEERING CO
Original Assignee
MECTRON ENGINEERING CO
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MECTRON ENGINEERING CO filed Critical MECTRON ENGINEERING CO
Application granted granted Critical
Publication of DE69429340D1 publication Critical patent/DE69429340D1/de
Publication of DE69429340T2 publication Critical patent/DE69429340T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2425—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures of screw-threads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE69429340T 1993-04-19 1994-04-07 Kontaktloses inspektionssystem Expired - Fee Related DE69429340T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/049,172 US5383021A (en) 1993-04-19 1993-04-19 Optical part inspection system
PCT/US1994/003822 WO1994024517A1 (en) 1993-04-19 1994-04-07 Non-contact inspection system

Publications (2)

Publication Number Publication Date
DE69429340D1 true DE69429340D1 (de) 2002-01-17
DE69429340T2 DE69429340T2 (de) 2002-08-14

Family

ID=21958409

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69429340T Expired - Fee Related DE69429340T2 (de) 1993-04-19 1994-04-07 Kontaktloses inspektionssystem

Country Status (5)

Country Link
US (2) US5383021A (de)
EP (1) EP0695413B1 (de)
JP (1) JP3042885B2 (de)
DE (1) DE69429340T2 (de)
WO (1) WO1994024517A1 (de)

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US6285034B1 (en) 1998-11-04 2001-09-04 James L. Hanna Inspection system for flanged bolts
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US6313948B1 (en) 1999-08-02 2001-11-06 James I. Hanna Optical beam shaper
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JP4212944B2 (ja) * 2003-04-15 2009-01-21 株式会社トプコン 測量機
US20050174567A1 (en) * 2004-02-09 2005-08-11 Mectron Engineering Company Crack detection system
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US7367893B2 (en) * 2005-05-05 2008-05-06 Whitesell International Corporation Fastener manufacturing apparatus and method
US7633635B2 (en) * 2006-08-07 2009-12-15 GII Acquisitions, LLC Method and system for automatically identifying non-labeled, manufactured parts
US7684054B2 (en) 2006-08-25 2010-03-23 Gii Acquisition, Llc Profile inspection system for threaded and axial components
US20080079936A1 (en) * 2006-09-29 2008-04-03 Caterpillar Inc. Internal thread inspection probe
US7403872B1 (en) 2007-04-13 2008-07-22 Gii Acquisition, Llc Method and system for inspecting manufactured parts and sorting the inspected parts
US7684030B2 (en) * 2007-05-04 2010-03-23 Vab Solutions Inc. Enclosure for a linear inspection system
US7812970B2 (en) * 2007-10-23 2010-10-12 Gii Acquisition, Llc Method and system for inspecting parts utilizing triangulation
US8550444B2 (en) * 2007-10-23 2013-10-08 Gii Acquisition, Llc Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station
US8237935B2 (en) * 2007-10-23 2012-08-07 Gii Acquisition, Llc Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts
US7633046B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition Llc Method for estimating thread parameters of a part
US7633634B2 (en) * 2007-10-23 2009-12-15 Gii Acquisition, Llc Optical modules and method of precisely assembling same
US7777900B2 (en) * 2007-10-23 2010-08-17 Gii Acquisition, Llc Method and system for optically inspecting parts
US8132802B2 (en) * 2007-10-23 2012-03-13 Gii Acquisition, Llc Apparatus for quickly retaining and releasing parts to be optically measured
US7755754B2 (en) * 2007-10-23 2010-07-13 Gii Acquisition, Llc Calibration device for use in an optical part measuring system
US7738121B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Method and inspection head apparatus for optically measuring geometric dimensions of a part
US7920278B2 (en) * 2007-10-23 2011-04-05 Gii Acquisition, Llc Non-contact method and system for inspecting parts
US7738088B2 (en) * 2007-10-23 2010-06-15 Gii Acquisition, Llc Optical method and system for generating calibration data for use in calibrating a part inspection system
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US7796278B2 (en) * 2008-09-19 2010-09-14 Gii Acquisition, Llc Method for precisely measuring position of a part to be inspected at a part inspection station
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US8521480B2 (en) * 2009-03-12 2013-08-27 Etegent Technologies, Ltd. Managing non-destructive evaluation data
US8004694B2 (en) * 2009-03-27 2011-08-23 Gll Acquistion LLC System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station
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US8888568B2 (en) * 2009-10-14 2014-11-18 Ronald B. Stein Thread inspection and polishing device
US8892398B2 (en) * 2010-04-21 2014-11-18 Tesa Sa Optical measurement method and apparatus
EP2392896B1 (de) * 2010-06-01 2019-11-27 Tenaris Connections B.V. Vorrichtung zur Messung der Gewindeparameter für Gewindeverbindungen
CN103492834B (zh) * 2010-09-15 2016-03-30 吴乃恩 用于检测回转部件质量的自动器具及检验方法
CN101934273A (zh) * 2010-09-29 2011-01-05 株洲硬质合金集团有限公司 棒材直径自动检测、分选及统计装置
US8390826B2 (en) * 2011-04-20 2013-03-05 Gii Acquisition, Llc Method and system for optically inspecting parts
CA2738386C (en) * 2011-04-28 2013-11-12 Denis Lepine Enclosure for an optical inspection apparatus
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9047657B2 (en) 2011-05-17 2015-06-02 Gii Acquisition, Lcc Method and system for optically inspecting outer peripheral surfaces of parts
US9228957B2 (en) 2013-05-24 2016-01-05 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts
US9370799B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis
US9575013B2 (en) * 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US8570504B2 (en) 2011-05-17 2013-10-29 Gii Acquisition, Llc Method and system for optically inspecting parts
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US10209200B2 (en) 2012-03-07 2019-02-19 Gil Acquisition, LLC High-speed, 3-D method and system for optically inspecting parts
US8896844B2 (en) 2012-12-14 2014-11-25 Gii Acquisition, Llc High-speed, 3-D method and system for optically measuring a geometric dimension of manufactured parts
US8993914B2 (en) 2012-12-14 2015-03-31 Gii Acquisition, Llc High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US9486840B2 (en) 2013-05-24 2016-11-08 Gii Acquisition, Llc High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts
US9823062B2 (en) 2013-03-07 2017-11-21 Mectron Engineering Company, Inc. Inspection system for threaded parts
US9194691B2 (en) * 2013-03-13 2015-11-24 U.S. Department Of Energy High-speed volume measurement system and method
US9864366B2 (en) 2013-03-15 2018-01-09 Etegent Technologies Ltd. Manufacture modeling and monitoring
US11543811B2 (en) 2013-03-15 2023-01-03 Etegent Technologies Ltd. Manufacture modeling and monitoring
US9539619B2 (en) 2013-05-24 2017-01-10 Gii Acquisition, Llc High speed method and system for inspecting a stream of parts at a pair of inspection stations
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US9377297B2 (en) 2013-08-21 2016-06-28 Gii Acquisition, Llc High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined
US9372077B2 (en) 2013-08-21 2016-06-21 Gii Acquistion, Llc High-resolution imaging and processing method and system for determining a geometric dimension of a part
DE102014106312A1 (de) * 2014-05-06 2015-11-12 Broetje-Automation Gmbh Verfahren zum Prüfen eines Niets
US10300510B2 (en) * 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
CN104438114A (zh) * 2014-11-07 2015-03-25 宁波聚华光学科技有限公司 一种全自动圆轴分选机
JP7031559B2 (ja) * 2018-10-29 2022-03-08 オムロン株式会社 ネジ長判定システム、ネジ締めシステムおよびプログラム
CN110102498A (zh) * 2019-03-20 2019-08-09 合肥壹点通信息科技有限公司 一种激光测径分选装置

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Also Published As

Publication number Publication date
DE69429340T2 (de) 2002-08-14
US5568263A (en) 1996-10-22
US5383021A (en) 1995-01-17
JP3042885B2 (ja) 2000-05-22
JPH09500445A (ja) 1997-01-14
EP0695413B1 (de) 2001-12-05
WO1994024517A1 (en) 1994-10-27
EP0695413A4 (de) 1997-12-29
EP0695413A1 (de) 1996-02-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: KRAMER - BARSKE - SCHMIDTCHEN, 81245 MUENCHEN

8339 Ceased/non-payment of the annual fee