DE69413478T2 - Inverter mit Verzögerungselement mit variabler Impedanz - Google Patents

Inverter mit Verzögerungselement mit variabler Impedanz

Info

Publication number
DE69413478T2
DE69413478T2 DE69413478T DE69413478T DE69413478T2 DE 69413478 T2 DE69413478 T2 DE 69413478T2 DE 69413478 T DE69413478 T DE 69413478T DE 69413478 T DE69413478 T DE 69413478T DE 69413478 T2 DE69413478 T2 DE 69413478T2
Authority
DE
Germany
Prior art keywords
inverter
delay element
variable impedance
impedance delay
variable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69413478T
Other languages
English (en)
Other versions
DE69413478D1 (de
Inventor
David Charles Mcclure
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
SGS Thomson Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics Inc filed Critical SGS Thomson Microelectronics Inc
Publication of DE69413478D1 publication Critical patent/DE69413478D1/de
Application granted granted Critical
Publication of DE69413478T2 publication Critical patent/DE69413478T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Pulse Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
DE69413478T 1993-07-30 1994-07-27 Inverter mit Verzögerungselement mit variabler Impedanz Expired - Fee Related DE69413478T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10062493A 1993-07-30 1993-07-30

Publications (2)

Publication Number Publication Date
DE69413478D1 DE69413478D1 (de) 1998-10-29
DE69413478T2 true DE69413478T2 (de) 1999-02-11

Family

ID=22280701

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69413478T Expired - Fee Related DE69413478T2 (de) 1993-07-30 1994-07-27 Inverter mit Verzögerungselement mit variabler Impedanz

Country Status (4)

Country Link
US (2) US6014050A (de)
EP (1) EP0637134B1 (de)
JP (1) JPH07170162A (de)
DE (1) DE69413478T2 (de)

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DE19501707C1 (de) * 1995-01-20 1996-06-05 Texas Instruments Deutschland Elektrisches Bauelement und Verfahren zum Abgleichen der inneren Laufzeit eines solchen elektrischen Bauelements
JPH10215156A (ja) 1997-01-29 1998-08-11 Nec Corp 遅延時間可変装置
DE19800776C1 (de) * 1998-01-12 1999-06-17 Siemens Ag Verzögerungsschaltung
DE19946495C2 (de) * 1999-09-28 2002-10-24 Infineon Technologies Ag Verfahren zur Verringerung der Anzahl der Pads auf einem Halbleiterchip
US6411150B1 (en) * 2001-01-30 2002-06-25 Cypress Semiconductor Corp. Dynamic control of input buffer thresholds
US20030017697A1 (en) * 2001-07-19 2003-01-23 Kyung-In Choi Methods of forming metal layers using metallic precursors
US6859082B2 (en) * 2002-10-07 2005-02-22 Agilent Technologies, Inc. Balanced programmable delay element
JP4413516B2 (ja) * 2003-03-31 2010-02-10 シャープ株式会社 信号タイミング調整システムおよび信号タイミング調整量設定プログラム
US7480361B1 (en) 2004-07-12 2009-01-20 Xilinx, Inc. Phase lock detector
US20060176096A1 (en) * 2005-02-10 2006-08-10 International Business Machines Corporation Power supply insensitive delay element
US7355435B2 (en) * 2005-02-10 2008-04-08 International Business Machines Corporation On-chip detection of power supply vulnerabilities
US7279949B2 (en) * 2005-02-11 2007-10-09 International Business Machines Corporation Programmable delay element
US20070063758A1 (en) * 2005-09-22 2007-03-22 Honeywell International Inc. Voltage divider and method for minimizing higher than rated voltages
US7782093B2 (en) * 2007-05-23 2010-08-24 Infineon Technologies Ag Integrated circuit and method of detecting a signal edge transition
US7821315B2 (en) * 2007-11-08 2010-10-26 Qualcomm Incorporated Adjustable duty cycle circuit
US8615205B2 (en) 2007-12-18 2013-12-24 Qualcomm Incorporated I-Q mismatch calibration and method
US8970272B2 (en) 2008-05-15 2015-03-03 Qualcomm Incorporated High-speed low-power latches
US8712357B2 (en) 2008-11-13 2014-04-29 Qualcomm Incorporated LO generation with deskewed input oscillator signal
US8718574B2 (en) 2008-11-25 2014-05-06 Qualcomm Incorporated Duty cycle adjustment for a local oscillator signal
US7839170B1 (en) * 2009-03-13 2010-11-23 Nvidia Corporation Low power single rail input voltage level shifter
US8847638B2 (en) 2009-07-02 2014-09-30 Qualcomm Incorporated High speed divide-by-two circuit
US8791740B2 (en) 2009-07-16 2014-07-29 Qualcomm Incorporated Systems and methods for reducing average current consumption in a local oscillator path
US8854098B2 (en) 2011-01-21 2014-10-07 Qualcomm Incorporated System for I-Q phase mismatch detection and correction
US9154077B2 (en) 2012-04-12 2015-10-06 Qualcomm Incorporated Compact high frequency divider
CN113759239B (zh) * 2021-11-09 2022-02-15 武汉普赛斯电子技术有限公司 芯片测试装置及芯片测试方法

Family Cites Families (19)

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Publication number Priority date Publication date Assignee Title
US4209713A (en) * 1975-07-18 1980-06-24 Tokyo Shibaura Electric Co., Ltd. Semiconductor integrated circuit device in which difficulties caused by parasitic transistors are eliminated
EP0031583B1 (de) * 1979-12-26 1988-08-17 Kabushiki Kaisha Toshiba Treiberschaltung für eine ladungsgekoppelte Vorrichtung
EP0390226A1 (de) * 1984-07-31 1990-10-03 Yamaha Corporation Absorptionsschaltung des Zitterns
JPS6152022A (ja) * 1984-08-22 1986-03-14 Hitachi Ltd 半導体集積回路装置
JPS62226499A (ja) * 1986-03-27 1987-10-05 Toshiba Corp 遅延回路
KR970000560B1 (ko) * 1986-10-01 1997-01-13 아오이 죠이치 반도체집적회로
JPS63244494A (ja) * 1987-03-31 1988-10-11 Toshiba Corp 半導体記憶装置
US5111085A (en) * 1987-04-29 1992-05-05 Ncr Corporation Digitally controlled delay circuit
JPH02236482A (ja) * 1989-03-10 1990-09-19 Hitachi Medical Corp 遅延回路及びそれを用いた超音波診断装置
JPH02290328A (ja) * 1989-04-18 1990-11-30 Nec Ic Microcomput Syst Ltd 出力バッファ回路
US5077676A (en) * 1990-03-30 1991-12-31 International Business Machines Corporation Reducing clock skew in large-scale integrated circuits
JPH04167613A (ja) * 1990-10-26 1992-06-15 Ricoh Co Ltd 遅延調整回路装置
US5157278A (en) * 1990-10-30 1992-10-20 Samsung Electronics Co., Ltd. Substrate voltage generator for semiconductor device
US5121014A (en) * 1991-03-05 1992-06-09 Vlsi Technology, Inc. CMOS delay circuit with controllable delay
US5231319A (en) * 1991-08-22 1993-07-27 Ncr Corporation Voltage variable delay circuit
US5376848A (en) * 1993-04-05 1994-12-27 Motorola, Inc. Delay matching circuit
US5418756A (en) * 1993-09-30 1995-05-23 Sgs-Thomson Microelectronics, Inc. Edge transition detection disable circuit to alter memory device operating characteristics
TW253083B (de) * 1993-10-05 1995-08-01 Advanced Micro Devices Inc
US5790612A (en) * 1996-02-29 1998-08-04 Silicon Graphics, Inc. System and method to reduce jitter in digital delay-locked loops

Also Published As

Publication number Publication date
US6252447B1 (en) 2001-06-26
EP0637134B1 (de) 1998-09-23
US6014050A (en) 2000-01-11
DE69413478D1 (de) 1998-10-29
JPH07170162A (ja) 1995-07-04
EP0637134A1 (de) 1995-02-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee