DE69127050D1 - Abtast- und Halteschaltung - Google Patents

Abtast- und Halteschaltung

Info

Publication number: DE69127050D1
Authority: DE; Germany
Prior art keywords: sample; hold circuit; hold; circuit
Prior art date: 1990-10-30
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69127050T

Other languages

English (en)

Other versions

DE69127050T2 (de

Inventor

Myles H Wakayama

Hiroshi Tanimoto

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Toshiba Corp

Original Assignee

Toshiba Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1990-10-30

Filing date

1991-10-30

Publication date

1997-09-04

1991-10-30 Application filed by Toshiba Corp filed Critical Toshiba Corp

1997-09-04 Publication of DE69127050D1 publication Critical patent/DE69127050D1/de

1998-01-22 Application granted granted Critical

1998-01-22 Publication of DE69127050T2 publication Critical patent/DE69127050T2/de

2011-10-31 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element

DE69127050T 1990-10-30 1991-10-30 Abtast- und Halteschaltung Expired - Fee Related DE69127050T2 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP29241890		1990-10-30
JP03241524A JP3103154B2 (ja)	1990-10-30	1991-09-20	サンプル・ホールド回路

Publications (2)

Publication Number	Publication Date
DE69127050D1 true DE69127050D1 (de)	1997-09-04
DE69127050T2 DE69127050T2 (de)	1998-01-22

Family

ID=26535312

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69127050T Expired - Fee Related DE69127050T2 (de)	1990-10-30	1991-10-30	Abtast- und Halteschaltung

Country Status (5)

Country	Link
US (1)	US5243235A (de)
EP (1)	EP0484129B1 (de)
JP (1)	JP3103154B2 (de)
KR (1)	KR950012937B1 (de)
DE (1)	DE69127050T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5444363A (en) *	1993-12-16	1995-08-22	Advanced Micro Devices Inc.	Low noise apparatus for receiving an input current and producing an output current which mirrors the input current
US5552784A (en) *	1994-06-30	1996-09-03	Northrop Grumman Corporation	Distortion reduction circuit for analog to digital converter system
US5477190A (en) *	1994-12-16	1995-12-19	Advanced Micro Devices, Inc.	Low voltage linear output buffer operational amplifier
US5572154A (en) *	1995-07-03	1996-11-05	Motorola, Inc.	Circuit and method of sampling an analog signal
JPH09306193A (ja) *	1996-05-17	1997-11-28	Nec Corp	サンプルホールド回路
US5838175A (en) *	1997-02-05	1998-11-17	Hewlett-Packard Company	Low distortion track and hold circuit
US6069502A (en) *	1998-04-06	2000-05-30	Intersil Corporation	Sample-and-hold circuit having reduced subthreshold conduction effects and related methods
US6002277A (en) *	1998-04-06	1999-12-14	Intersil Corporation	Sample-and-hold circuit having reduced parasitic diode effects and related methods
US6016067A (en) *	1998-04-06	2000-01-18	Intersil Corporation	Sample-and-hold circuit having reduced amplifier offset effects and related methods
US6323696B1 (en)	1999-12-07	2001-11-27	Hughes Electronics Corporation	Sample and hold circuit
US6720799B2 (en) *	2001-01-11	2004-04-13	Broadcom Corporation	Replica network for linearizing switched capacitor circuits
KR100433362B1 (ko) *	2002-07-11	2004-06-07	에이디반도체(주)	임피던스 비교 집적회로
US8482442B2 (en) *	2011-06-08	2013-07-09	Linear Technology Corporation	System and methods to improve the performance of semiconductor based sampling system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS58115693A (ja) *	1981-12-28	1983-07-09	Sony Corp	サンプルホ−ルド回路
US4879478A (en) *	1985-08-30	1989-11-07	Advanced Micro Devices, Inc.	Fast sample and hold circuit
US4659946A (en) *	1986-04-14	1987-04-21	Tektronix, Inc.	Memory gate for error sampler
JPS63108599A (ja) *	1986-10-24	1988-05-13	Mitsubishi Electric Corp	ホ−ルド回路
JPS63263699A (ja) *	1987-04-21	1988-10-31	Nec Corp	サンプルホ−ルド回路
FR2648943B1 (fr) *	1989-06-23	1991-10-11	Radiotechnique Compelec	Circuit echantillonneur-bloqueur

1991
- 1991-09-20 JP JP03241524A patent/JP3103154B2/ja not_active Expired - Fee Related
- 1991-10-30 US US07/784,872 patent/US5243235A/en not_active Expired - Fee Related
- 1991-10-30 EP EP91310021A patent/EP0484129B1/de not_active Expired - Lifetime
- 1991-10-30 KR KR1019910019383A patent/KR950012937B1/ko not_active IP Right Cessation
- 1991-10-30 DE DE69127050T patent/DE69127050T2/de not_active Expired - Fee Related

Also Published As

Publication number	Publication date
EP0484129B1 (de)	1997-07-30
US5243235A (en)	1993-09-07
JP3103154B2 (ja)	2000-10-23
EP0484129A2 (de)	1992-05-06
KR950012937B1 (ko)	1995-10-23
KR920009034A (ko)	1992-05-28
EP0484129A3 (en)	1992-08-26
DE69127050T2 (de)	1998-01-22
JPH0512897A (ja)	1993-01-22

Legal Events

Date	Code	Title
1998-08-27	8364	No opposition during term of opposition
1998-12-24	8320	Willingness to grant licences declared (paragraph 23)
2004-08-26	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE69033468T2 (de)	2000-08-03	Abtast- und Halteschaltung
DE69427667T2 (de)	2002-06-20	Differenz-Abtast- und Halteschaltung
KR890700208A (ko)	1989-03-10	카메라 및 다른 기구 지지대
NO921863L (no)	1992-07-14	Antistoffer og anvendelse derav
DE69123407D1 (de)	1997-01-16	Elektronisches Gerät
DE69030569D1 (de)	1997-05-28	Klemmschaltung
DE69117042D1 (de)	1996-03-21	Abtastschaltung
DE69014414D1 (de)	1995-01-12	Abtast- und Halteanordnung.
DE69029391D1 (de)	1997-01-23	Ganz differenzialer Abtast- und Haltkreisaddierer
DE69116878D1 (de)	1996-03-14	Analytisches gerät
DE69127050D1 (de)	1997-09-04	Abtast- und Halteschaltung
DE69220416D1 (de)	1997-07-24	Abtast- und Halteschaltung
DE69127149D1 (de)	1997-09-11	Schaltungsprüf-Verfahren
IT9020592A0 (it)	1990-06-08	procedimento e dispositivo
DE69515383T2 (de)	2000-10-26	Abtast- und Halteschaltung
DE68918180D1 (de)	1994-10-20	Abtast- und Halteschaltung.
IT1247290B (it)	1994-12-12	Procedimento e dispositivo di disaccoppiamento
DE69220274D1 (de)	1997-07-17	Abtast- und Halteschaltung
DE69024711D1 (de)	1996-02-22	Verstärkerschaltung
DE69024865D1 (de)	1996-02-29	Verstärkerschaltung
KR910001193U (ko)	1991-01-24	와 전류계
DE69521245T2 (de)	2001-09-20	Abtast- und Halterschaltung
DK195091D0 (da)	1991-12-02	Assayfremgangsmaade og -anordning
KR910003546U (ko)	1991-02-27	통신용 샘플앤드 홀드 회로
DE69119363D1 (de)	1996-06-13	Halteschaltung