DE69102111D1 - Cantilever zum Gebrauch in einem Atomkraftmikroskop und Verfahren zu dessen Herstellung. - Google Patents
Cantilever zum Gebrauch in einem Atomkraftmikroskop und Verfahren zu dessen Herstellung.Info
- Publication number
- DE69102111D1 DE69102111D1 DE69102111T DE69102111T DE69102111D1 DE 69102111 D1 DE69102111 D1 DE 69102111D1 DE 69102111 T DE69102111 T DE 69102111T DE 69102111 T DE69102111 T DE 69102111T DE 69102111 D1 DE69102111 D1 DE 69102111D1
- Authority
- DE
- Germany
- Prior art keywords
- cantilever
- making
- same
- atomic force
- force microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/14—Particular materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/873—Tip holder
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/875—Scanning probe structure with tip detail
- Y10S977/879—Material
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2224473A JP2501945B2 (ja) | 1990-08-28 | 1990-08-28 | 原子間力顕微鏡のカンチレバ―及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69102111D1 true DE69102111D1 (de) | 1994-06-30 |
DE69102111T2 DE69102111T2 (de) | 1995-01-05 |
Family
ID=16814348
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69102111T Expired - Fee Related DE69102111T2 (de) | 1990-08-28 | 1991-03-05 | Cantilever zum Gebrauch in einem Atomkraftmikroskop und Verfahren zu dessen Herstellung. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5193385A (de) |
EP (1) | EP0475559B1 (de) |
JP (1) | JP2501945B2 (de) |
DE (1) | DE69102111T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5264696A (en) * | 1991-05-20 | 1993-11-23 | Olympus Optical Co., Ltd. | Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios |
DE69309318T2 (de) * | 1992-01-10 | 1997-10-30 | Hitachi Ltd | Verfahren und Vorrichtung zum Beobachten einer Fläche |
US5319960A (en) * | 1992-03-06 | 1994-06-14 | Topometrix | Scanning force microscope |
JP2917674B2 (ja) * | 1992-06-03 | 1999-07-12 | 松下電器産業株式会社 | 走査トンネル顕微鏡用探針およびその製造方法 |
DE4310349C2 (de) * | 1993-03-30 | 2000-11-16 | Inst Mikrotechnik Mainz Gmbh | Sensorkopf und Verfahren zu seiner Herstellung |
US5646339A (en) * | 1994-02-14 | 1997-07-08 | International Business Machines Corporation | Force microscope and method for measuring atomic forces in multiple directions |
US5591903A (en) * | 1994-08-11 | 1997-01-07 | Iowa State University Research Foundation | Reconstructing the shape of an atomic force microscope probe |
JPH08297129A (ja) * | 1995-04-26 | 1996-11-12 | Nikon Corp | 原子間力顕微鏡用カンチレバー及びその製造方法 |
US5874668A (en) * | 1995-10-24 | 1999-02-23 | Arch Development Corporation | Atomic force microscope for biological specimens |
US5781649A (en) * | 1996-04-15 | 1998-07-14 | Phase Metrics, Inc. | Surface inspection of a disk by diffraction pattern sampling |
JP4403585B2 (ja) | 2005-10-06 | 2010-01-27 | 並木精密宝石株式会社 | 探針及びカンチレバー |
JP2008026281A (ja) * | 2006-07-25 | 2008-02-07 | Sumitomo Electric Ind Ltd | マイクロプローブ |
US8001830B2 (en) * | 2007-05-15 | 2011-08-23 | Anasys Instruments, Inc. | High frequency deflection measurement of IR absorption |
JP2008292375A (ja) * | 2007-05-25 | 2008-12-04 | Namiki Precision Jewel Co Ltd | 走査プローブ顕微鏡に用いる探針及びカンチレバー |
WO2009086534A1 (en) | 2007-12-28 | 2009-07-09 | Veeco Instruments Inc. | Method of fabricating a probe device for a metrology instrument and probe device produced thereby |
DE102010035931A1 (de) | 2010-08-31 | 2012-03-01 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur Herstellung einer Messspitze für ein Rastersondenmikroskop sowie Messsonde mit nach diesem Verfahren hergestellter Messspitze |
RU2479063C1 (ru) * | 2011-11-16 | 2013-04-10 | Федеральное государственное бюджетное учреждение науки Институт проблем механики им. А.Ю. Ишлинского Российской академии наук (ИПМех РАН) | Способ определения рельефа поверхности |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53168Y2 (de) * | 1975-12-22 | 1978-01-06 | ||
US4340954A (en) * | 1980-08-04 | 1982-07-20 | Rca Corporation | Stylus tip fabrication from a synthetic diamond stone |
US4669300A (en) * | 1984-03-30 | 1987-06-02 | Sloan Technology Corporation | Electromagnetic stylus force adjustment mechanism |
US4724318A (en) * | 1985-11-26 | 1988-02-09 | International Business Machines Corporation | Atomic force microscope and method for imaging surfaces with atomic resolution |
JP2572107B2 (ja) * | 1988-04-04 | 1997-01-16 | 三菱電機株式会社 | 走査型トンネル顕微鏡の粗動機構 |
JPH0758164B2 (ja) * | 1988-04-22 | 1995-06-21 | 三菱電機株式会社 | 走査型トンネル顕微鏡の微動機構 |
JPH0792462B2 (ja) * | 1988-05-16 | 1995-10-09 | 三菱電機株式会社 | 走査型トンネル顕微鏡の微動機構 |
GB8818445D0 (en) * | 1988-08-03 | 1988-09-07 | Jones B L | Stm probe |
JPH0267401A (ja) * | 1988-09-02 | 1990-03-07 | Toshiba Corp | タービンのパワーロードアンバランス検出装置 |
JPH0275902A (ja) * | 1988-09-13 | 1990-03-15 | Seiko Instr Inc | ダイヤモンド探針及びその成形方法 |
JP2547869B2 (ja) * | 1988-11-09 | 1996-10-23 | キヤノン株式会社 | プローブユニット,該プローブの駆動方法及び該プローブユニットを備えた走査型トンネル電流検知装置 |
US4947042A (en) * | 1988-12-13 | 1990-08-07 | Mitsubishi Denki Kabushiki Kaisha | Tunnel unit and scanning head for scanning tunneling microscope |
US4943719A (en) * | 1989-01-17 | 1990-07-24 | The Board Of Trustees Of The Leland Stanford University | Microminiature cantilever stylus |
US4935634A (en) * | 1989-03-13 | 1990-06-19 | The Regents Of The University Of California | Atomic force microscope with optional replaceable fluid cell |
EP0413042B1 (de) * | 1989-08-16 | 1992-12-16 | International Business Machines Corporation | Verfahren für die Herstellung mikromechanischer Messfühler für AFM/STM-Profilometrie und mikromechanischer Messfühlerkopf |
GB2238161A (en) * | 1989-08-18 | 1991-05-22 | Rosser Roy J | Attractive atomic force microscope |
US5021364A (en) * | 1989-10-31 | 1991-06-04 | The Board Of Trustees Of The Leland Stanford Junior University | Microcantilever with integral self-aligned sharp tetrahedral tip |
-
1990
- 1990-08-28 JP JP2224473A patent/JP2501945B2/ja not_active Expired - Lifetime
-
1991
- 1991-03-05 EP EP91301821A patent/EP0475559B1/de not_active Expired - Lifetime
- 1991-03-05 DE DE69102111T patent/DE69102111T2/de not_active Expired - Fee Related
- 1991-04-16 US US07/685,644 patent/US5193385A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69102111T2 (de) | 1995-01-05 |
US5193385A (en) | 1993-03-16 |
EP0475559B1 (de) | 1994-05-25 |
JP2501945B2 (ja) | 1996-05-29 |
EP0475559A2 (de) | 1992-03-18 |
EP0475559A3 (en) | 1992-05-13 |
JPH04106852A (ja) | 1992-04-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |