DE60316985D1 - Messvorrichtung - Google Patents

Messvorrichtung

Info

Publication number
DE60316985D1
DE60316985D1 DE60316985T DE60316985T DE60316985D1 DE 60316985 D1 DE60316985 D1 DE 60316985D1 DE 60316985 T DE60316985 T DE 60316985T DE 60316985 T DE60316985 T DE 60316985T DE 60316985 D1 DE60316985 D1 DE 60316985D1
Authority
DE
Germany
Prior art keywords
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60316985T
Other languages
English (en)
Other versions
DE60316985T2 (de
Inventor
Shu Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2002249684A external-priority patent/JP2004085487A/ja
Priority claimed from JP2002254727A external-priority patent/JP2004093342A/ja
Priority claimed from JP2002287291A external-priority patent/JP2004125494A/ja
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of DE60316985D1 publication Critical patent/DE60316985D1/de
Application granted granted Critical
Publication of DE60316985T2 publication Critical patent/DE60316985T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE60316985T 2002-08-28 2003-08-26 Messvorrichtung Expired - Lifetime DE60316985T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2002249684 2002-08-28
JP2002249684A JP2004085487A (ja) 2002-08-28 2002-08-28 全反射減衰を利用したセンサー
JP2002254727 2002-08-30
JP2002254727A JP2004093342A (ja) 2002-08-30 2002-08-30 測定装置
JP2002287291 2002-09-30
JP2002287291A JP2004125494A (ja) 2002-09-30 2002-09-30 測定装置

Publications (2)

Publication Number Publication Date
DE60316985D1 true DE60316985D1 (de) 2007-11-29
DE60316985T2 DE60316985T2 (de) 2008-07-24

Family

ID=31499127

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60316985T Expired - Lifetime DE60316985T2 (de) 2002-08-28 2003-08-26 Messvorrichtung

Country Status (3)

Country Link
US (1) US7075657B2 (de)
EP (3) EP1566628B1 (de)
DE (1) DE60316985T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221274A (ja) * 2004-02-04 2005-08-18 Fuji Photo Film Co Ltd 測定方法および測定装置
US7187446B2 (en) * 2004-07-26 2007-03-06 Fuji Photo Film Co., Ltd. Measuring apparatus
EP2232239A1 (de) 2008-01-04 2010-09-29 Koninklijke Philips Electronics N.V. Optimierte detektorauslesung für biosensor
US8506887B2 (en) * 2008-10-17 2013-08-13 Vanderbilt University Porous membrane waveguide sensors and sensing systems therefrom for detecting biological or chemical targets
WO2013011831A1 (ja) * 2011-07-15 2013-01-24 独立行政法人産業技術総合研究所 目的物質検出チップ、目的物質検出プレート、目的物質検出装置及び目的物質検出方法
ES2778677T3 (es) 2015-12-17 2020-08-11 Hoffmann La Roche Calibración y/o detección de errores en un dispositivo de medición óptica para muestras biológicas

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2197065A (en) * 1986-11-03 1988-05-11 Stc Plc Optical sensor device
JPH06167443A (ja) 1992-10-23 1994-06-14 Olympus Optical Co Ltd 表面プラズモン共鳴を利用した測定装置
US6415235B1 (en) * 1996-11-06 2002-07-02 Texas Instruments Incorporated Fixed optic sensor system and distributed sensor network
JP3399836B2 (ja) * 1998-05-21 2003-04-21 富士写真フイルム株式会社 表面プラズモンセンサー
JP2001330560A (ja) 2000-03-16 2001-11-30 Fuji Photo Film Co Ltd 全反射減衰を利用した測定方法および装置
JP3983455B2 (ja) * 2000-04-13 2007-09-26 シャープ株式会社 データ駆動型情報処理装置の実行制御装置
AU2001261155A1 (en) * 2000-05-03 2001-11-12 Quantech Ltd. Methods and devices for signal position analysis
DE60128302T2 (de) * 2000-08-29 2008-01-24 Heraeus Quarzglas Gmbh & Co. Kg Plasmafeste Quartzglas-Haltevorrichtung
JP2002195945A (ja) * 2000-12-27 2002-07-10 Fuji Photo Film Co Ltd 全反射減衰を利用したセンサー

Also Published As

Publication number Publication date
EP1566628A3 (de) 2005-09-28
EP1562036A3 (de) 2005-09-28
EP1566628B1 (de) 2007-10-17
EP1394532A3 (de) 2004-06-09
EP1562036A2 (de) 2005-08-10
US7075657B2 (en) 2006-07-11
DE60316985T2 (de) 2008-07-24
US20040042012A1 (en) 2004-03-04
EP1566628A2 (de) 2005-08-24
EP1394532A2 (de) 2004-03-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition