DE60236019D1 - Stereoskopisches dreidimensionales metrologiesystem und -verfahren - Google Patents

Stereoskopisches dreidimensionales metrologiesystem und -verfahren

Info

Publication number
DE60236019D1
DE60236019D1 DE60236019T DE60236019T DE60236019D1 DE 60236019 D1 DE60236019 D1 DE 60236019D1 DE 60236019 T DE60236019 T DE 60236019T DE 60236019 T DE60236019 T DE 60236019T DE 60236019 D1 DE60236019 D1 DE 60236019D1
Authority
DE
Germany
Prior art keywords
test article
stereoscopic
metrology system
feature
dimensional metrology
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60236019T
Other languages
English (en)
Inventor
Donald B Snow
John T Strom
Raymond H Kraft
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MARINER ACQUISITION CO LLC
Rudolph Technologies Inc
Original Assignee
MARINER ACQUISITION CO LLC
Rudolph Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MARINER ACQUISITION CO LLC, Rudolph Technologies Inc filed Critical MARINER ACQUISITION CO LLC
Application granted granted Critical
Publication of DE60236019D1 publication Critical patent/DE60236019D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/0015—Orientation; Alignment; Positioning

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Manufacturing & Machinery (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE60236019T 2001-12-28 2002-12-18 Stereoskopisches dreidimensionales metrologiesystem und -verfahren Expired - Lifetime DE60236019D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34644701P 2001-12-28 2001-12-28
PCT/US2002/040610 WO2003058158A2 (en) 2001-12-28 2002-12-18 Stereoscopic three-dimensional metrology system and method

Publications (1)

Publication Number Publication Date
DE60236019D1 true DE60236019D1 (de) 2010-05-27

Family

ID=23359434

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60236019T Expired - Lifetime DE60236019D1 (de) 2001-12-28 2002-12-18 Stereoskopisches dreidimensionales metrologiesystem und -verfahren

Country Status (7)

Country Link
US (2) US7231081B2 (de)
EP (1) EP1466137B1 (de)
JP (2) JP4896373B2 (de)
AT (1) ATE464535T1 (de)
AU (1) AU2002357335A1 (de)
DE (1) DE60236019D1 (de)
WO (1) WO2003058158A2 (de)

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Also Published As

Publication number Publication date
US7231081B2 (en) 2007-06-12
US7634128B2 (en) 2009-12-15
US20070269103A1 (en) 2007-11-22
EP1466137A2 (de) 2004-10-13
WO2003058158A3 (en) 2003-09-18
US20030142862A1 (en) 2003-07-31
JP4896373B2 (ja) 2012-03-14
JP2005514606A (ja) 2005-05-19
AU2002357335A1 (en) 2003-07-24
EP1466137A4 (de) 2005-03-23
WO2003058158A2 (en) 2003-07-17
AU2002357335A8 (en) 2003-07-24
EP1466137B1 (de) 2010-04-14
ATE464535T1 (de) 2010-04-15
JP2010038923A (ja) 2010-02-18

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