DE60205389D1 - Einzelzelllöschverfahren der Rückgewinnung von progammiergestörte Zellen in nichtflüchtige Speichervorrichtung - Google Patents
Einzelzelllöschverfahren der Rückgewinnung von progammiergestörte Zellen in nichtflüchtige SpeichervorrichtungInfo
- Publication number
- DE60205389D1 DE60205389D1 DE60205389T DE60205389T DE60205389D1 DE 60205389 D1 DE60205389 D1 DE 60205389D1 DE 60205389 T DE60205389 T DE 60205389T DE 60205389 T DE60205389 T DE 60205389T DE 60205389 D1 DE60205389 D1 DE 60205389D1
- Authority
- DE
- Germany
- Prior art keywords
- recovering
- pro
- memory device
- volatile memory
- quenching method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
- G11C16/3431—Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3404—Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02425727A EP1424700B1 (de) | 2002-11-28 | 2002-11-28 | Einzelzelllöschverfahren der Rückgewinnung von progammiergestörte Zellen in nichtflüchtige Speichervorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60205389D1 true DE60205389D1 (de) | 2005-09-08 |
Family
ID=32241381
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60205389T Expired - Lifetime DE60205389D1 (de) | 2002-11-28 | 2002-11-28 | Einzelzelllöschverfahren der Rückgewinnung von progammiergestörte Zellen in nichtflüchtige Speichervorrichtung |
Country Status (3)
Country | Link |
---|---|
US (1) | US6944061B2 (de) |
EP (1) | EP1424700B1 (de) |
DE (1) | DE60205389D1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7319615B1 (en) * | 2006-08-02 | 2008-01-15 | Spansion Llc | Ramp gate erase for dual bit flash memory |
US20080285368A1 (en) * | 2007-05-17 | 2008-11-20 | Macronix International Co., Ltd. | Method for nrom array word line retry erasing and threshold voltage recovering |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5268319A (en) * | 1988-06-08 | 1993-12-07 | Eliyahou Harari | Highly compact EPROM and flash EEPROM devices |
KR100470575B1 (ko) * | 1995-01-31 | 2005-06-27 | 가부시끼가이샤 히다치 세이사꾸쇼 | 불휘발성메모리 |
TW368749B (en) * | 1995-09-11 | 1999-09-01 | Matsushita Electronics Corp | Semiconductor memory device and driving method thereof |
JP3189740B2 (ja) * | 1997-06-20 | 2001-07-16 | 日本電気株式会社 | 不揮発性半導体メモリのデータ修復方法 |
EP0932161B1 (de) * | 1998-01-22 | 2004-06-09 | STMicroelectronics S.r.l. | Verfahren für kontrolliertes Löschen von Speicheranordnungen, insbesondere Analog- oder Mehrwert-Flash-EEPROM Anordnungen |
US6118705A (en) * | 1998-03-13 | 2000-09-12 | Atmel Corporation | Page mode erase in a flash memory array |
DE60015770T2 (de) * | 1999-08-23 | 2005-12-08 | Micron Technology, Inc. | Flashspeicheranordnung mit extern ausgelöster erfassung und heilung von fehlerhaften zellen |
US6178117B1 (en) * | 2000-01-24 | 2001-01-23 | Advanced Micro Devices, Inc. | Background correction for charge gain and loss |
US6620682B1 (en) * | 2001-02-27 | 2003-09-16 | Aplus Flash Technology, Inc. | Set of three level concurrent word line bias conditions for a nor type flash memory array |
-
2002
- 2002-11-28 DE DE60205389T patent/DE60205389D1/de not_active Expired - Lifetime
- 2002-11-28 EP EP02425727A patent/EP1424700B1/de not_active Expired - Fee Related
-
2003
- 2003-11-26 US US10/724,022 patent/US6944061B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1424700A1 (de) | 2004-06-02 |
EP1424700B1 (de) | 2005-08-03 |
US6944061B2 (en) | 2005-09-13 |
US20040233730A1 (en) | 2004-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |