DE602006001668D1 - Fehlerüberprüfungsverfahren - Google Patents

Fehlerüberprüfungsverfahren

Info

Publication number
DE602006001668D1
DE602006001668D1 DE200660001668 DE602006001668T DE602006001668D1 DE 602006001668 D1 DE602006001668 D1 DE 602006001668D1 DE 200660001668 DE200660001668 DE 200660001668 DE 602006001668 T DE602006001668 T DE 602006001668T DE 602006001668 D1 DE602006001668 D1 DE 602006001668D1
Authority
DE
Germany
Prior art keywords
error
checking process
checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE200660001668
Other languages
English (en)
Inventor
Tomoaki Ishiura
Kunihiko Miyazaki
Katsumi Ichifuji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Publication of DE602006001668D1 publication Critical patent/DE602006001668D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE200660001668 2005-03-18 2006-03-17 Fehlerüberprüfungsverfahren Active DE602006001668D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005079595A JP2006258726A (ja) 2005-03-18 2005-03-18 欠陥検査方法

Publications (1)

Publication Number Publication Date
DE602006001668D1 true DE602006001668D1 (de) 2008-08-21

Family

ID=36570846

Family Applications (1)

Application Number Title Priority Date Filing Date
DE200660001668 Active DE602006001668D1 (de) 2005-03-18 2006-03-17 Fehlerüberprüfungsverfahren

Country Status (3)

Country Link
EP (1) EP1703274B1 (de)
JP (1) JP2006258726A (de)
DE (1) DE602006001668D1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009047517A (ja) * 2007-08-17 2009-03-05 Kokusai Gijutsu Kaihatsu Co Ltd 検査装置
JP2010160023A (ja) * 2009-01-07 2010-07-22 Ntn Corp 円周面の歪検出方法及び装置
JP5415162B2 (ja) * 2009-06-23 2014-02-12 昭和電工株式会社 円筒体の表面検査装置
CN105445285A (zh) * 2014-09-26 2016-03-30 宝山钢铁股份有限公司 用于无张力约束下线材视觉检测装置及方法
JP6841109B2 (ja) * 2017-03-17 2021-03-10 三菱ケミカル株式会社 表面測定装置及び表面測定方法
US11493453B2 (en) * 2019-06-28 2022-11-08 Kyocera Document Solutions Inc. Belt inspection system, belt inspection method, and recording medium for belt inspection program
IT202000012214A1 (it) 2020-05-25 2021-11-25 Sacmi Metodo e dispositivo per ispezionare un’incisione su un tappo di plastica
CN112697807B (zh) * 2020-12-09 2024-03-26 江汉大学 一种圆柱状物体表面裂纹宽度检测方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0373831A (ja) * 1989-05-19 1991-03-28 Mitsubishi Rayon Co Ltd 欠陥検査装置
JP2819892B2 (ja) * 1991-10-18 1998-11-05 富士ゼロックス株式会社 表面層欠陥検出装置
JPH06123707A (ja) * 1992-10-09 1994-05-06 Fuji Xerox Co Ltd 表面欠陥検査方法およびその装置
JPH0719838A (ja) * 1993-07-05 1995-01-20 Daido Steel Co Ltd 外観検査方法および装置
JPH07239304A (ja) * 1994-02-28 1995-09-12 Fuji Xerox Co Ltd 表面層欠陥検出装置
JP3267062B2 (ja) * 1994-08-31 2002-03-18 富士ゼロックス株式会社 表面層欠陥検出装置
JPH0921628A (ja) * 1995-07-04 1997-01-21 Ricoh Co Ltd 円筒状被検物の表面凹凸欠陥検出方法
JPH09113463A (ja) * 1995-10-18 1997-05-02 Fuji Xerox Co Ltd 表面欠陥検査装置
JP3469714B2 (ja) * 1996-06-03 2003-11-25 株式会社リコー 感光体表面検査方法および感光体表面検査装置
SE516096C2 (sv) * 1999-08-11 2001-11-19 Westinghouse Atom Ab Förfarande och anordning för inspektion av och mätning vid ett föremål
JP2001165868A (ja) * 1999-12-10 2001-06-22 Sharp Corp 円筒表面検査装置及び検査方法
JP2002168611A (ja) * 2000-09-08 2002-06-14 Ricoh Co Ltd 円筒状被検物の表面凹凸検査方法及び同検査装置
JP3754003B2 (ja) * 2001-06-21 2006-03-08 株式会社リコー 欠陥検査装置及びその方法
JP2004101240A (ja) * 2002-09-05 2004-04-02 Mitsui Eng & Shipbuild Co Ltd 積層ベルトリング検査方法および装置
JP2004219119A (ja) * 2003-01-10 2004-08-05 Matsushita Electric Ind Co Ltd 欠陥検査方法および装置
FR2857152B1 (fr) * 2003-07-04 2008-09-05 Cogema Dispositif et procede de controle d'aspect exterieur de crayons de combustible pour reacteur nucleaire

Also Published As

Publication number Publication date
EP1703274A1 (de) 2006-09-20
EP1703274B1 (de) 2008-07-09
JP2006258726A (ja) 2006-09-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition