DE60133945D1 - Spannungsversorgung für prüflinge, mit hoher geschwindigkeit und hoher genauigkeit und mit aktiver boostschaltung - Google Patents

Spannungsversorgung für prüflinge, mit hoher geschwindigkeit und hoher genauigkeit und mit aktiver boostschaltung

Info

Publication number
DE60133945D1
DE60133945D1 DE60133945T DE60133945T DE60133945D1 DE 60133945 D1 DE60133945 D1 DE 60133945D1 DE 60133945 T DE60133945 T DE 60133945T DE 60133945 T DE60133945 T DE 60133945T DE 60133945 D1 DE60133945 D1 DE 60133945D1
Authority
DE
Germany
Prior art keywords
supply circuit
active
boostering
voltage supply
sense lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60133945T
Other languages
English (en)
Inventor
Gerald H Johnson
Michael F Taylor
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE60133945D1 publication Critical patent/DE60133945D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Electronic Switches (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Dram (AREA)
  • Details Of Television Scanning (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE60133945T 2000-11-22 2001-11-21 Spannungsversorgung für prüflinge, mit hoher geschwindigkeit und hoher genauigkeit und mit aktiver boostschaltung Expired - Lifetime DE60133945D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/718,808 US6556034B1 (en) 2000-11-22 2000-11-22 High speed and high accuracy DUT power supply with active boost circuitry
PCT/US2002/002149 WO2002057801A2 (en) 2000-11-22 2001-11-21 High speed and high accuracy dut power supply with active boost circuitry

Publications (1)

Publication Number Publication Date
DE60133945D1 true DE60133945D1 (de) 2008-06-19

Family

ID=24887639

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60133945T Expired - Lifetime DE60133945D1 (de) 2000-11-22 2001-11-21 Spannungsversorgung für prüflinge, mit hoher geschwindigkeit und hoher genauigkeit und mit aktiver boostschaltung

Country Status (8)

Country Link
US (1) US6556034B1 (de)
EP (1) EP1466185B1 (de)
AT (1) ATE394684T1 (de)
AU (1) AU2002249981A1 (de)
DE (1) DE60133945D1 (de)
MY (1) MY126854A (de)
TW (1) TW546898B (de)
WO (1) WO2002057801A2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002101480A1 (fr) * 2001-06-06 2002-12-19 Advantest Corporation Circuit d'alimentation et dispositif de test
CN101432630B (zh) * 2006-04-28 2010-12-08 爱德万测试株式会社 功率外加电路,及测试设备
US20110031984A1 (en) * 2009-07-14 2011-02-10 Advantest Corporation Test apparatus
WO2011010349A1 (ja) * 2009-07-23 2011-01-27 株式会社アドバンテスト 試験装置
US7952361B2 (en) * 2009-07-14 2011-05-31 Advantest Corporation Test apparatus
US8558560B2 (en) * 2009-07-23 2013-10-15 Advantest Corporation Test apparatus, additional circuit and test board for judgment based on peak current
US8558559B2 (en) * 2009-07-23 2013-10-15 Advantest Corporation Test apparatus, additional circuit and test board for calculating load current of a device under test
US8504883B2 (en) 2010-08-25 2013-08-06 Macronix International Co., Ltd. System and method for testing integrated circuits
US11041900B2 (en) 2014-03-26 2021-06-22 Teradyne, Inc. Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level
US10698020B2 (en) 2014-03-26 2020-06-30 Teradyne, Inc. Current regulation for accurate and low-cost voltage measurements at the wafer level
US9989584B2 (en) * 2014-07-11 2018-06-05 Teradyne, Inc. Controlling signal path inductance in automatic test equipment
KR101769341B1 (ko) 2016-03-30 2017-08-18 주식회사 포릭스 소스계측장치
JP6986910B2 (ja) * 2017-09-12 2021-12-22 東京エレクトロン株式会社 電圧印加装置および出力電圧波形の形成方法
CN108631591B (zh) * 2018-05-11 2020-07-24 西安理工大学 一种双向dc-dc变换器预测电流的控制方法
US10739411B2 (en) 2018-06-04 2020-08-11 Ford Global Technologies, Llc Power electronic test automation circuit
TWI824624B (zh) * 2021-08-18 2023-12-01 仁寶電腦工業股份有限公司 模擬測試系統以及模擬測試方法

Family Cites Families (25)

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Publication number Priority date Publication date Assignee Title
US3617881A (en) * 1969-11-24 1971-11-02 Tektronix Inc Dc voltage-testing and current-measuring circuit including differential amplifier
US3670230A (en) 1970-12-21 1972-06-13 Ibm Active filter capacitor for power supply switching regulators
US4605894A (en) 1983-08-29 1986-08-12 Genrad Semiconductor Test, Inc. High density test head
US4574232A (en) 1983-10-21 1986-03-04 Motorola, Inc. Rapid turn-on voltage regulator
US4591962A (en) 1983-12-16 1986-05-27 International Telephone And Telegraph Corporation Regulated power supply for rapid no-load to full-load transitions
US4710861A (en) 1986-06-03 1987-12-01 Martin Kanner Anti-ripple circuit
US4940929A (en) 1989-06-23 1990-07-10 Apollo Computer, Inc. AC to DC converter with unity power factor
US4952863A (en) 1989-12-20 1990-08-28 International Business Machines Corporation Voltage regulator with power boost system
US5059889A (en) * 1990-03-08 1991-10-22 Texas Instruments Incorporated Parametric measurement unit/device power supply for semiconductor test system
JP2689708B2 (ja) 1990-09-18 1997-12-10 日本モトローラ株式会社 バイアス電流制御回路
US5103388A (en) 1990-09-18 1992-04-07 Hewlett-Packard Company Low harmonic current and fault tolerant power supply
JP3263225B2 (ja) 1994-02-24 2002-03-04 株式会社リコー 電源高調波電流の抑制手段
US5686820A (en) 1995-06-15 1997-11-11 International Business Machines Corporation Voltage regulator with a minimal input voltage requirement
US5773990A (en) 1995-09-29 1998-06-30 Megatest Corporation Integrated circuit test power supply
JPH09236639A (ja) 1996-02-28 1997-09-09 Ando Electric Co Ltd 計測器用高速応答電源
US5789934A (en) 1996-05-23 1998-08-04 Hewlett-Packard Company Test circuit including a power supply with a current transformer to monitor capacitor output current
US5925278A (en) 1996-08-23 1999-07-20 Hewlett-Packard Company Universal power supply for multiple loads
US5757203A (en) 1996-10-16 1998-05-26 Hewlett-Packard Company Multiple on-chip IDDQ monitors
US5789933A (en) 1996-10-30 1998-08-04 Hewlett-Packard Co. Method and apparatus for determining IDDQ
US6046577A (en) 1997-01-02 2000-04-04 Texas Instruments Incorporated Low-dropout voltage regulator incorporating a current efficient transient response boost circuit
US6087843A (en) 1997-07-14 2000-07-11 Credence Systems Corporation Integrated circuit tester with test head including regulating capacitor
DE19741430A1 (de) 1997-09-19 1999-04-01 Siemens Ag Schaltungsanordnung und Verfahren zur Unterdrückung störender Rückwirkungen eines Umrichters
US5886892A (en) 1997-12-05 1999-03-23 Hewlett-Packard Company Power supply with improved inrush circuit for limiting inrush current
US5914870A (en) 1997-12-18 1999-06-22 Hewlett-Packard Company Low power high efficiency power supply
US5932996A (en) 1998-04-28 1999-08-03 Hewlett-Packard Co. Low cost current mode control switching power supply without discrete current sense resistor

Also Published As

Publication number Publication date
TW546898B (en) 2003-08-11
WO2002057801A3 (en) 2002-11-14
AU2002249981A1 (en) 2002-07-30
ATE394684T1 (de) 2008-05-15
WO2002057801A2 (en) 2002-07-25
US6556034B1 (en) 2003-04-29
EP1466185B1 (de) 2008-05-07
EP1466185A2 (de) 2004-10-13
MY126854A (en) 2006-10-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition