DE60042518D1 - Verfahren zur speicherprüfung - Google Patents
Verfahren zur speicherprüfungInfo
- Publication number
- DE60042518D1 DE60042518D1 DE60042518T DE60042518T DE60042518D1 DE 60042518 D1 DE60042518 D1 DE 60042518D1 DE 60042518 T DE60042518 T DE 60042518T DE 60042518 T DE60042518 T DE 60042518T DE 60042518 D1 DE60042518 D1 DE 60042518D1
- Authority
- DE
- Germany
- Prior art keywords
- memory testing
- testing
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP99203002 | 1999-09-15 | ||
PCT/EP2000/008848 WO2001020614A1 (en) | 1999-09-15 | 2000-09-08 | Method of testing a memory |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60042518D1 true DE60042518D1 (de) | 2009-08-20 |
Family
ID=8240640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60042518T Expired - Lifetime DE60042518D1 (de) | 1999-09-15 | 2000-09-08 | Verfahren zur speicherprüfung |
Country Status (7)
Country | Link |
---|---|
US (1) | US6829736B1 (de) |
EP (1) | EP1129454B1 (de) |
JP (1) | JP2003509804A (de) |
KR (1) | KR100750416B1 (de) |
CN (1) | CN1206659C (de) |
DE (1) | DE60042518D1 (de) |
WO (1) | WO2001020614A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020196687A1 (en) * | 2001-06-08 | 2002-12-26 | Sauvageau Anthony J. | Methods and apparatus for analyzing and repairing memory |
FR2843208B1 (fr) * | 2002-07-31 | 2005-03-04 | Iroc Technologies | Dispositif de reconfiguration d'un ensemble memoire presentant des defauts |
KR100557948B1 (ko) * | 2003-06-20 | 2006-03-10 | 주식회사 하이닉스반도체 | 메모리 장치의 테스트 방법 |
US6922649B2 (en) * | 2003-11-25 | 2005-07-26 | International Business Machines Corporation | Multiple on-chip test runs and repairs for memories |
US7401270B2 (en) * | 2005-10-20 | 2008-07-15 | Infineon Technologies Ag | Repair of semiconductor memory device via external command |
WO2007055068A1 (ja) * | 2005-11-14 | 2007-05-18 | Mitsubishi Electric Corporation | メモリ診断装置 |
US20070140897A1 (en) * | 2005-12-21 | 2007-06-21 | Hongna Wang | Ph stable biguanide composition and method of treatment and prevention of infections |
CN101405818B (zh) * | 2006-03-28 | 2012-10-03 | 富士通半导体股份有限公司 | 半导体存储器以及测试*** |
US10789398B2 (en) * | 2016-08-31 | 2020-09-29 | Synopsys, Inc. | Method and apparatus for SOC with optimal RSMA |
CN115954024B (zh) * | 2023-03-14 | 2023-06-02 | 长鑫存储技术有限公司 | 一种解码器及其解码方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4460997A (en) * | 1981-07-15 | 1984-07-17 | Pacific Western Systems Inc. | Memory tester having memory repair analysis capability |
US4460999A (en) * | 1981-07-15 | 1984-07-17 | Pacific Western Systems, Inc. | Memory tester having memory repair analysis under pattern generator control |
EP0424612A3 (en) * | 1989-08-30 | 1992-03-11 | International Business Machines Corporation | Apparatus and method for real time data error capture and compression for redundancy analysis of a memory |
JP2777276B2 (ja) | 1990-09-20 | 1998-07-16 | 株式会社東芝 | 冗長回路付メモリicの試験装置 |
US5568437A (en) * | 1995-06-20 | 1996-10-22 | Vlsi Technology, Inc. | Built-in self test for integrated circuits having read/write memory |
US6032264A (en) * | 1997-04-22 | 2000-02-29 | Micron Technology, Inc. | Apparatus and method implementing repairs on a memory device |
-
2000
- 2000-09-08 WO PCT/EP2000/008848 patent/WO2001020614A1/en active Application Filing
- 2000-09-08 EP EP00960642A patent/EP1129454B1/de not_active Expired - Lifetime
- 2000-09-08 US US09/831,657 patent/US6829736B1/en not_active Expired - Fee Related
- 2000-09-08 CN CNB008019533A patent/CN1206659C/zh not_active Expired - Fee Related
- 2000-09-08 KR KR1020017006072A patent/KR100750416B1/ko not_active IP Right Cessation
- 2000-09-08 JP JP2001524107A patent/JP2003509804A/ja not_active Withdrawn
- 2000-09-08 DE DE60042518T patent/DE60042518D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1129454A1 (de) | 2001-09-05 |
KR20010075709A (ko) | 2001-08-09 |
CN1206659C (zh) | 2005-06-15 |
CN1321320A (zh) | 2001-11-07 |
WO2001020614A1 (en) | 2001-03-22 |
KR100750416B1 (ko) | 2007-08-21 |
EP1129454B1 (de) | 2009-07-08 |
US6829736B1 (en) | 2004-12-07 |
JP2003509804A (ja) | 2003-03-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE60143125D1 (de) | Verfahren für doppelbitspeicherlöschprüfung | |
DE60026449D1 (de) | Verfahren zur überkritischen Trocknung | |
DE60013420D1 (de) | Verfahren zum ringförmigen abdichten | |
DE122006000035I2 (de) | Nd verfahren zu seiner herstellung | |
DE50013673D1 (de) | Verfahren zur Sichtweitenbestimmung | |
DE60043873D1 (de) | Verfahren zur Datensicherung | |
DE60029182D1 (de) | Verfahren zur eindeutigen Abstandsschätzung | |
DE69902769D1 (de) | Elektrochemisches verfahren | |
DE50009496D1 (de) | Verfahren zur gefriertrocknung | |
DE50002724D1 (de) | Verfahren zur querstromfiltration | |
DE60041503D1 (de) | Verfahren zur konturkorrektur | |
DE69841303D1 (de) | Verfahren zur Feuchtigkeitsmessung | |
ATE249417T1 (de) | Verfahren zur herstellung von l- phenylephrinhydrochlorid | |
DE69940761D1 (de) | Verfahren zur Transistorsherstellung | |
DE60042518D1 (de) | Verfahren zur speicherprüfung | |
DE60003077D1 (de) | Verfahren zur leckerkennung | |
DE60030624D1 (de) | Verfahren zur Kombination teilweise gemessenen Daten | |
DE50000893D1 (de) | Verfahren zur veredelung | |
DE50014809D1 (de) | Verfahren zur Füllstandsmessung | |
DE50003545D1 (de) | Verfahren zur entschwefelung | |
DE50001116D1 (de) | Verfahren zur justage von parabolantennen | |
DE60024037T2 (de) | Verfahren zur Verbesserung NHRP | |
ATE206392T1 (de) | Verfahren zur alkylierug von gehinderten sulfonamiden | |
DE50000567D1 (de) | Verfahren zur gefechtsfeldsimulation | |
DE50008085D1 (de) | Verfahren zur Auswertung von Schäumvorgängen |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |