DE4225595C1 - Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values - Google Patents

Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values

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Publication number
DE4225595C1
DE4225595C1 DE19924225595 DE4225595A DE4225595C1 DE 4225595 C1 DE4225595 C1 DE 4225595C1 DE 19924225595 DE19924225595 DE 19924225595 DE 4225595 A DE4225595 A DE 4225595A DE 4225595 C1 DE4225595 C1 DE 4225595C1
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Germany
Prior art keywords
cable
pulses
sampling period
memory
separate channels
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Expired - Fee Related
Application number
DE19924225595
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German (de)
Inventor
Wikhard Dr.-Ing. 8551 Hemhofen De Kiesel
Juergen Dipl.-Ing. 7057 Winnenden De Schroeder
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Siemens AG
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Siemens AG
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Priority to DE19924225595 priority Critical patent/DE4225595C1/en
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Publication of DE4225595C1 publication Critical patent/DE4225595C1/en
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08Locating faults in cables, transmission lines, or networks
    • G01R31/11Locating faults in cables, transmission lines, or networks using pulse reflection methods

Abstract

The test method involves supplying measuring pulses to one end of the tested cable section and detecting the reflected pulse response at the same cable end, supplied to 2 separate channels (6,7) each having an A/D converter supplying digital sample values to a single memory (8). The A/D converters receive respective clock signals (T1,T2) with the same sampling frequency which are offset by one half period so that the digital sample values are fed to the memory (8) in alternation. The measuring pulse duration (tMP) is pref. greater than the sampling period (tA). USE/ADVANTAGE - For Time Domain Reflectometry appts. Improved cable fault location accuracy compared to oscilloscope method.

Description

Die vorliegende Erfindung betrifft ein Verfahren zum Lokali­ sieren von Widerstandsänderungen in Kabelsegmenten eines lo­ kalen Netzwerks (LAN), mit Einspeisung eines Meßimpulses am Kabelanfang und Auswertung der reflektierten Impulsantwort. Mit diesem, unter der Bezeichnung TDR (Time Domain Reflecto­ metry) bekannten Impuls-Echo-Verfahren kann aus dem zeitli­ chen Verlauf der Impulsantwort auf den Ort von Wellenwider­ standsänderungen entlang des Kabels, wie sie durch den An­ schluß von Transceivern, durch fehlangepaßten Leitungsab­ schluß, durch mechanische Verformungen des Kabels, usw. ent­ stehen, geschlossen werden.The present invention relates to a method for localization sieren of resistance changes in cable segments of a lo kalen network (LAN), with feeding of a measuring pulse on Cable start and evaluation of the reflected impulse response. With this, under the name TDR (Time Domain Reflecto metry) known pulse-echo method can from the Zeitli Chen course of the impulse response to the location of wave resistance Changes in position along the cable, as caused by the An termination of transceivers due to mismatched lines conclusion, by mechanical deformation of the cable, etc. ent stand, be closed.

Bei üblichen TDR-Testgeräten, wie sie beispielsweise auf den Seiten 65 bis 67 des Tektronix-Katalogs 1989, beschrieben sind, oder aus der US 47 66 386 hervorgehen, wird der Re­ flexionsverlauf analog mittels eines Oszillographen erfaßt. Zur Ermittlung von Fehlerstellen in elektrischen Kabeln ist es gemäß den deutschen Offenlegungsschriften DE 26 44 157 A1 und DE 29 53 266 A1 auch bekannt, die reflektierte Impulsantwort abzu­ tasten, so daß ihre Auswertung bequemer und mit größerer Ge­ nauigkeit als bei Verwendung eines Oszillographen erfolgen kann.With conventional TDR test devices, such as those on the Pages 65 to 67 of the 1989 Tektronix catalog are, or emerge from US 47 66 386, the Re inflection curve recorded analogously by means of an oscillograph. For the determination of defects in electrical cables it according to the German published documents DE 26 44 157 A1 and It is also known from DE 29 53 266 A1 to remove the reflected impulse response buttons so that their evaluation is more convenient and with a larger Ge accuracy than when using an oscillograph can.

Im Hinblick auf die noch zu erfassenden Signallaufzeiten zwi­ schen zwei Transceivern, welche im minimal zulässigen Abstand an das Kabel angeschlossen sind, werden Abtastfrequenzen in der Größenordnung von 200 MHz erforderlich. Handelsüblich er­ hältliche Analog/Digital-Wandler mit solch kleinen Abtastpe­ rioden sind recht teuer.With regard to the signal delays to be recorded between two transceivers, which are at the minimum permissible distance are connected to the cable, sampling frequencies in of the order of 200 MHz is required. Customary he Stable analog / digital converters with such small trap periods are quite expensive.

Die Erfindung stellt sich daher die Aufgabe, ein Verfahren anzugeben, mit dem man mit einfacheren und billigeren Analog-/Digitalwandlern auskommt.The invention therefore addresses the Task to specify a procedure with which one with simpler and cheaper analog / digital converters.

Die Lösung dieser Aufgabe gelingt erfindungsgemäß mit den im Patent­ anspruch 1 angegebenen Maßnahmen. Auf diese Weise steht jeweils nach der halben Abtastperiode ein neuer digita­ lisierter Meßwert zur Verfügung und es können zur Implemen­ tierung billigere Analog/Digital-Wandler verwendet werden. This object is achieved according to the invention with those in the patent  claim 1 specified measures. That way it stands a new digita every half the sampling period lized measured value available and it can implement cheaper analog / digital converter can be used.  

Von Vorteil ist es, als Speicher einen sogenannten ECL- (Emitter-Coupled Logic) - Speicher einzusetzen, der - da mit ungesättigten Transistoren arbeitend - in sehr schneller Folge mit abzulegenden Eingangswerten beaufschlagt werden kann.It is advantageous to use a so-called ECL (Emitter-Coupled Logic) - use memory that - because with unsaturated transistors working - in very fast Sequence with input values to be filed can.

Die Erfindung mit ihren weiteren, in Unteransprüchen ge­ kennzeichneten Ausgestaltungen, soll nachstehend anhand der Figuren näher erläutert werden. Dabei zeigtThe invention with its further ge marked configurations, is to be based on the Figures are explained in more detail. It shows

Fig. 1 ein Prinzipschaltbild für eine die Erfindung reali­ sierende Meßanordnung, Fig. 1 is a basic circuit diagram for a measuring device, the invention reali sierende,

Fig. 2 ein Diagramm für aufeinanderfolgende Abtastwerte und Fig. 2 is a diagram for successive samples and

Fig. 3 ein typisches Impulsdiagramm für einen sich bei einer bestimmten Kabelkonfiguration ergebenden Reflexionsverlauf. Fig. 3 shows a typical pulse diagram for a reflection curve resulting in a specific cable configuration.

In Fig. 1 ist mit 1 ein koaxiales Kabel bezeichnet, das ein Teilstück beispielsweise eines Ethernet-Rechnernetzwer­ kes darstellt und dessen maximale Länge lmax in diesem Fall bis zu 500 m betragen könnte. Die Testzeit bestimmt sich aus der doppelten Signallaufzeit vom Anfang bis zum Ende eines Kabels mit maximaler Länge und beginnt mit der Aus­ sendung eines Meßimpulses mit der Pulsdauer tMP, welcher über einen dem Wellenwiderstand des Kabels entsprechenden Widerstand von 50 Ohm von einem Impulsgenerator 2 am Kabel­ segmentanfang eingespeist wird. Ausgelöst wird dieser Meßimpuls von einer Steuerstation 3, welche über einen internen Systembus 4 einen Zugang zu dem Netzwerk hat, der durch das CSNA/CD - (Carrier Sense Multiple Access with Collision Detect) - Zugangsprotokoll geregelt ist. Erkennt die Steuerstation, daß das Netz momentan frei ist, dann aktiviert sie den Impulsgeber 2 und wenn nach der vom Zu­ gangsprotokoll spezifizierten Wartezeit für eine sende­ willige Station das Netz immer noch frei ist, wird unter Aktivierung des Impulsgenerators 2 der Meßimpuls in das Kabel 1 eingespeist. Impuls und Impulsantwort werden einem Pegelanpaßverstärker 5 zugeführt, dessen Ausgangssignal IA die Eingänge von zwei Analog/Digital-Wandlern 6 und 7 be­ aufschlagt. Diese Anlaog/Digital-Wandler weisen interne Abtast- und Haltekreise auf, die nach Maßgabe der ihnen an ihren sogenannten "Strobe"-Eingängen zugeführten und von der Steuerstation 3 generierten Taktsignale T1 und T2 be­ tätigt werden. Diese Taktsignale legen die Abtastfrequenz fest. Die Taktsignale T1 und T2 sind von gleicher Frequenz, jedoch gegeneinander um eine halbe Taktperiode zeitver­ setzt. Die digitalen Ausgänge der beiden Analog/Digital- Wandler 6 und 7 werden über einen Demultiplexer 8 den Eingängen eines ECL-Speichers 9 zugeführt, wobei der De­ multiplexer 8 von der Steuerstation 3 so gesteuert wird, daß er jeweils für die Dauer einer halben Abtastperiode abwechselnd den einen oder den anderen Ausgang der Analog/- Digital-Wandler 6 bzw. 7 zum Speicher 9 durchschaltet. Auf diese Weise wird im Abstand einer halben Abtastperiode ein neuer digitalisierter Meßwert der Impulsantwort IA vom Speicher 9 übernommen. Wird innerhalb der Meßzeit ein Datenpaket gesendet, dann erkennt dies die Steuerstation 4, verwirft die bisher im Speicher 9 gesammelten Meßwerte und unternimmt nach einer gemäß dem Protokoll bestimmten Zu­ fallszeit einen erneuten Meßversuch. In Fig. 1, 1 denotes a coaxial cable, which represents a section of, for example, an Ethernet computer network and the maximum length l max in this case could be up to 500 m. The test time is determined from the double signal propagation time from the beginning to the end of a cable of maximum length and begins with the transmission of a measuring pulse with the pulse duration t MP , which has a resistance of 50 ohms corresponding to the characteristic impedance of the cable from a pulse generator 2 on the cable segment start is fed. This measurement pulse is triggered by a control station 3 , which has access to the network via an internal system bus 4 , which is regulated by the CSNA / CD (Carrier Sense Multiple Access with Collision Detect) access protocol. If the control station detects that the network is currently free, it activates the pulse generator 2 and if, after the waiting time specified by the access protocol for a willing station to transmit, the network is still free, the measuring pulse in the cable 1 is activated by activating the pulse generator 2 fed. Pulse and impulse response are fed to a level matching amplifier 5 , the output signal IA of which opens the inputs of two analog / digital converters 6 and 7 . These analog / digital converters have internal sample and hold circuits which are operated in accordance with the clock signals T 1 and T 2 they are supplied to their so-called "strobe" inputs and generated by the control station 3 . These clock signals determine the sampling frequency. The clock signals T 1 and T 2 are of the same frequency, but offset against each other by half a clock period. The digital outputs of the two analog / digital converters 6 and 7 are fed via a demultiplexer 8 to the inputs of an ECL memory 9 , the de multiplexer 8 being controlled by the control station 3 in such a way that it alternates for the duration of half a sampling period connects one or the other output of the analog / digital converter 6 or 7 to the memory 9 . In this way, a new digitized measured value of the impulse response IA is taken from the memory 9 every half a sampling period. If a data packet is sent within the measuring time, the control station 4 recognizes this, discards the measurement values previously collected in the memory 9 and, after a time determined according to the protocol, makes a new measurement attempt.

Bei den Analog/Digital-Wandler 6 bzw. 7 kann es sich um handelsübliche Bauelemente handeln. Der Siemens Analog- Digital-Umsetzer SDA 5200 beispielsweise benötigt nur ein Strobe-Signal T1 bzw. T2, dessen prinzipielle Form in der rechten unteren Hälfte der Fig. 1 dargestellt ist. Mit den im zeitlichen Abstand von tA aufeinanderfolgenden, anstei­ genden Flanken der Strobesignale T1 bzw. T2 wird jeweils ein aktueller Wert der Impulsantwort IA abgetastet und in der darauffolgenden Impulspause, welche durch einen Taktsignalpegel von "low" gekennzeichnet ist, als einge­ schwungener Abtastwert ausgangsseitig zur Verfügung ge­ stellt. Am Ausgang des Analog/Digital-Wandlers 6 erscheint also jeweils zu den mit einem "." gekennzeichneten Zeiten ein gültiges Ausgangssignal, während ein solches am Ausgang des Analog/Digital-Wandlers 7 zu den mit einem "x" gekenn­ zeichneten Zeiten erfolgt. Auf diese Weise wird die Abtast­ frequenz praktisch verdoppelt.The analog / digital converters 6 and 7 can be commercially available components. The Siemens analog-digital converter SDA 5200, for example, only requires a strobe signal T 1 or T 2 , the basic form of which is shown in the lower right half of FIG. 1. With the successive, rising edges of the strobe signals T 1 and T 2 at intervals of t A , a current value of the impulse response IA is sampled and in the subsequent impulse pause, which is characterized by a clock signal level of "low", as a more even one Sample value provided on the output side. At the output of the analog-to-digital converter 6 , each appears with a "." marked times a valid output signal, while such takes place at the output of the analog / digital converter 7 at the times marked with an "x". In this way, the sampling frequency is practically doubled.

Fig. 2 zeigt bei einem willkürlich angenommenen Signal S die zeitliche Abfolge der von den zwei parallel beauf­ schlagten Analog/Digital -Wandlern gelieferten Abtastwerte. Man erkennt, daß durch die zeitliche Verschiebung um ta=0,5·tA jeweils im Abstand ta ein neuer aktueller Abtast­ wert von einem der beiden parallelen Analog/Digital-Wand­ lern zur Verfügung gestellt wird, obwohl diese selbst das Signal S mit einer doppelt so großen Abtastperiode tA ab­ tasten. Fig. 2 shows at an arbitrarily assumed signal S, the time sequence of the estimated from the two parallel beauf analog / digital -Wandlern supplied samples. It can be seen that a new current sample value from one of the two parallel analog / digital converters is made available by the time shift by t a = 0.5 · t A each at a distance t a , even though this itself itself produces the signal S sample with a sampling period t A twice as large.

Fig. 3 zeigt den typischen Reflexionsverlauf bei einem Kabelsegment 1, an welches vier Transceiver TR1 bis TR4 angeschlossen sind und welches am Leitungsende kurzge­ schlossen ist. Auf den Meßimpuls mit der Dauer tMP, welche ungefähr 10 Nanosekunden beträgt, folgen in zeitlichen Ab­ ständen, welche proportional zur Entfernung der Transcei­ veranschlußstellen vom Kabelanfang sind, die zurückreflek­ tierten Impulse. Fig. 3 shows the typical reflection curve for a cable segment 1 , to which four transceivers TR1 to TR4 are connected and which is short-circuited at the end of the line. On the measuring pulse with the duration t MP , which is approximately 10 nanoseconds, follow in time intervals, which are proportional to the distance of the transcei connection points from the beginning of the cable, the reflected pulses.

Claims (5)

1. Verfahren zum Lokalisieren von Widerstandsänderungen in Kabelsegmenten eines lokalen Netzwerks (LAN), mit Einspeisung eines Meßimpulses am Kabelanfang und Auswertung der reflektierten Impulsantwort, wobei die Impulsantwort (IA) in zwei getrennten Kanälen (6, 7) mit gleicher Abtastperiode (tA), jedoch gegeneinander zeitversetzt um die Zeitdauer ei­ ner halben Abtastperiode, abgetastet sowie digitalisiert wird und die digitalisierten Werte der beiden Kanalausgänge je­ weils abwechselnd in einem Speicher (9) abgelegt werden.1. Method for localizing changes in resistance in cable segments of a local area network (LAN), with feeding a measuring pulse at the beginning of the cable and evaluating the reflected impulse response, the impulse response (IA) in two separate channels ( 6 , 7 ) with the same sampling period (t A ) , but offset against each other by the time duration of half a sampling period, is sampled and digitized and the digitized values of the two channel outputs are each alternately stored in a memory ( 9 ). 2. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die digitalisierten Werte der Impulsantwort in einem ECL- Speicher abgelegt werden.2. The method according to claim 1, characterized, that the digitized values of the impulse response in an ECL Memory. 3. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Abtastperiode (tA) in den beiden Kanälen kleiner als die Signallaufzeit zwischen zwei im minimal zulässigem Ab­ stand am Netzkabel anschließbaren Transceivern gewählt ist.3. The method according to claim 1, characterized in that the sampling period (t A ) in the two channels is less than the signal transit time between two in the minimum permissible from the power cord connectable transceivers is selected. 4. Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Meßimpulsdauer (tMP) größer als die Abtastperiode (tA) gewählt ist.4. The method according to claim 1, characterized in that the measuring pulse duration (t MP ) is chosen to be greater than the sampling period (t A ). 5. Verfahren nach einem der vorhergehenden Ansprüche für Netzwerke mit CSMA/CD-Zugangsprotokoll, dadurch gekennzeichnet, daß nach Erkennung eines während der Testzeit im zu testenden Kabel gesendeten Datenpakets die bisher im Speicher ge­ sammelten Meßwerte verworfen werden und nach einer proto­ kollbestimmten Zufallszeit ein erneuter Testversuch begonnen wird.5. The method according to any one of the preceding claims for Networks with CSMA / CD access protocol, characterized, that after detection of one to be tested during the test period Cable data packets previously sent in memory collected measured values are discarded and after a proto a random test started a new test attempt becomes.
DE19924225595 1992-08-03 1992-08-03 Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values Expired - Fee Related DE4225595C1 (en)

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