DE3879007D1 - Steuerkreis fuer verarbeitungsimpulse. - Google Patents

Steuerkreis fuer verarbeitungsimpulse.

Info

Publication number
DE3879007D1
DE3879007D1 DE8888109843T DE3879007T DE3879007D1 DE 3879007 D1 DE3879007 D1 DE 3879007D1 DE 8888109843 T DE8888109843 T DE 8888109843T DE 3879007 T DE3879007 T DE 3879007T DE 3879007 D1 DE3879007 D1 DE 3879007D1
Authority
DE
Germany
Prior art keywords
control circuit
processing pulses
pulses
processing
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888109843T
Other languages
English (en)
Other versions
DE3879007T2 (de
Inventor
Robert J Savaglio
Peter A Twombly
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of DE3879007D1 publication Critical patent/DE3879007D1/de
Application granted granted Critical
Publication of DE3879007T2 publication Critical patent/DE3879007T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE8888109843T 1987-06-29 1988-06-21 Steuerkreis fuer verarbeitungsimpulse. Expired - Fee Related DE3879007T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/067,181 US4864570A (en) 1987-06-29 1987-06-29 Processing pulse control circuit for use in device performing signature analysis of digital circuits

Publications (2)

Publication Number Publication Date
DE3879007D1 true DE3879007D1 (de) 1993-04-15
DE3879007T2 DE3879007T2 (de) 1993-09-16

Family

ID=22074248

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888109843T Expired - Fee Related DE3879007T2 (de) 1987-06-29 1988-06-21 Steuerkreis fuer verarbeitungsimpulse.

Country Status (5)

Country Link
US (1) US4864570A (de)
EP (1) EP0297398B1 (de)
JP (1) JPH0833440B2 (de)
CA (1) CA1277433C (de)
DE (1) DE3879007T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5488615A (en) * 1990-02-28 1996-01-30 Ail Systems, Inc. Universal digital signature bit device
US5544063A (en) * 1990-03-30 1996-08-06 Dallas Semiconductor Corporation Digital controller
US5309447A (en) * 1991-06-03 1994-05-03 At&T Bell Laboratories Space compression technique for pseudo-exhaustive self-testing of digital electronic circuits
US5475694A (en) * 1993-01-19 1995-12-12 The University Of British Columbia Fuzzy multiple signature compaction scheme for built-in self-testing of large scale digital integrated circuits
KR100261019B1 (ko) * 1997-09-08 2000-07-01 윤종용 시그너츄어 압축 방법 및 회로
US5978946A (en) * 1997-10-31 1999-11-02 Intel Coporation Methods and apparatus for system testing of processors and computers using signature analysis
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
CA2348799A1 (fr) * 2001-05-22 2002-11-22 Marcel Blais Appareil d'essai de composants electroniques
CN100373772C (zh) * 2004-02-09 2008-03-05 中国科学院计算技术研究所 片上用于交流扫描测试中的快速信号产生电路

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3740646A (en) * 1971-08-02 1973-06-19 Ibm Testing of non-linear circuits by accumulated result comparison
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
GB2070779B (en) * 1980-02-28 1984-02-15 Solartron Electronic Group Apparatus for testing digital electronic circuits
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4510572A (en) * 1981-12-28 1985-04-09 Data I/O Corporation Signature analysis system for testing digital circuits
US4513418A (en) * 1982-11-08 1985-04-23 International Business Machines Corporation Simultaneous self-testing system
US4534030A (en) * 1982-12-20 1985-08-06 International Business Machines Corporation Self-clocked signature analyzer
US4534028A (en) * 1983-12-01 1985-08-06 Siemens Corporate Research & Support, Inc. Random testing using scan path technique
US4601033A (en) * 1984-01-16 1986-07-15 Siemens Corporate Research & Suppport, Inc. Circuit testing apparatus employing signature analysis

Also Published As

Publication number Publication date
CA1277433C (en) 1990-12-04
EP0297398A2 (de) 1989-01-04
EP0297398B1 (de) 1993-03-10
JPS6418078A (en) 1989-01-20
DE3879007T2 (de) 1993-09-16
JPH0833440B2 (ja) 1996-03-29
US4864570A (en) 1989-09-05
EP0297398A3 (en) 1989-07-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee