DE3873848D1 - Behandlungsapparat und -verfahren. - Google Patents

Behandlungsapparat und -verfahren.

Info

Publication number
DE3873848D1
DE3873848D1 DE8888110011T DE3873848T DE3873848D1 DE 3873848 D1 DE3873848 D1 DE 3873848D1 DE 8888110011 T DE8888110011 T DE 8888110011T DE 3873848 T DE3873848 T DE 3873848T DE 3873848 D1 DE3873848 D1 DE 3873848D1
Authority
DE
Germany
Prior art keywords
treatment apparatus
treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8888110011T
Other languages
English (en)
Other versions
DE3873848T2 (de
Inventor
Lee M Loewenstein
Cecil J Davis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of DE3873848D1 publication Critical patent/DE3873848D1/de
Application granted granted Critical
Publication of DE3873848T2 publication Critical patent/DE3873848T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/517Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using a combination of discharges covered by two or more of groups C23C16/503 - C23C16/515

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Drying Of Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
DE8888110011T 1987-07-16 1988-06-23 Behandlungsapparat und -verfahren. Expired - Fee Related DE3873848T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7437987A 1987-07-16 1987-07-16

Publications (2)

Publication Number Publication Date
DE3873848D1 true DE3873848D1 (de) 1992-09-24
DE3873848T2 DE3873848T2 (de) 1993-03-11

Family

ID=22119243

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888110011T Expired - Fee Related DE3873848T2 (de) 1987-07-16 1988-06-23 Behandlungsapparat und -verfahren.

Country Status (4)

Country Link
EP (1) EP0299248B1 (de)
JP (1) JPH01186623A (de)
KR (1) KR890002982A (de)
DE (1) DE3873848T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2768760B2 (ja) * 1989-10-19 1998-06-25 株式会社東芝 レジストアッシング装置
EP0525942A2 (de) * 1991-05-31 1993-02-03 AT&T Corp. Herstellungsverfahren von einer integrierten Schaltung unter Verwendung eines doppelschichtigen Photolacks
JP2846274B2 (ja) * 1995-06-20 1999-01-13 芝浦メカトロニクス株式会社 ドライエッチング装置
JP2777085B2 (ja) * 1995-06-20 1998-07-16 株式会社芝浦製作所 ドライエッチング装置
JP3587249B2 (ja) * 2000-03-30 2004-11-10 東芝セラミックス株式会社 流体加熱装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4282267A (en) * 1979-09-20 1981-08-04 Western Electric Co., Inc. Methods and apparatus for generating plasmas
JPS59163826A (ja) * 1983-03-08 1984-09-14 Toshiba Corp ドライエツチング方法
US4544416A (en) * 1983-08-26 1985-10-01 Texas Instruments Incorporated Passivation of silicon oxide during photoresist burnoff
JPS61263126A (ja) * 1985-05-16 1986-11-21 Tokyo Denshi Kagaku Kk 有機膜の除去方法
US4613400A (en) * 1985-05-20 1986-09-23 Applied Materials, Inc. In-situ photoresist capping process for plasma etching
JPS6240728A (ja) * 1985-08-15 1987-02-21 Tokuda Seisakusho Ltd ドライエツチング装置

Also Published As

Publication number Publication date
EP0299248A1 (de) 1989-01-18
EP0299248B1 (de) 1992-08-19
KR890002982A (ko) 1989-04-12
DE3873848T2 (de) 1993-03-11
JPH01186623A (ja) 1989-07-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee