DE3873422D1 - Spannungsdetektor. - Google Patents

Spannungsdetektor.

Info

Publication number
DE3873422D1
DE3873422D1 DE8888108715T DE3873422T DE3873422D1 DE 3873422 D1 DE3873422 D1 DE 3873422D1 DE 8888108715 T DE8888108715 T DE 8888108715T DE 3873422 T DE3873422 T DE 3873422T DE 3873422 D1 DE3873422 D1 DE 3873422D1
Authority
DE
Germany
Prior art keywords
voltage detector
detector
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888108715T
Other languages
English (en)
Other versions
DE3873422T2 (de
Inventor
Shinichiro Aoshima
Yutaka Tsuchiya
Hironori Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Application granted granted Critical
Publication of DE3873422D1 publication Critical patent/DE3873422D1/de
Publication of DE3873422T2 publication Critical patent/DE3873422T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
DE8888108715T 1987-05-31 1988-05-31 Spannungsdetektor. Expired - Fee Related DE3873422T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62137055A JP2571385B2 (ja) 1987-05-31 1987-05-31 電圧検出装置

Publications (2)

Publication Number Publication Date
DE3873422D1 true DE3873422D1 (de) 1992-09-10
DE3873422T2 DE3873422T2 (de) 1993-01-28

Family

ID=15189826

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888108715T Expired - Fee Related DE3873422T2 (de) 1987-05-31 1988-05-31 Spannungsdetektor.

Country Status (3)

Country Link
US (1) US4866372A (de)
JP (1) JP2571385B2 (de)
DE (1) DE3873422T2 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
JP2777268B2 (ja) * 1989-08-02 1998-07-16 浜松ホトニクス株式会社 レーザダイオードを用いた低ノイズパルス光源及びこの光源を用いた電圧検出装置
US5036270A (en) * 1989-08-15 1991-07-30 Victor Company Of Japan, Ltd. Apparatus for detecting electrostatic surface potential
US5434698A (en) * 1989-11-13 1995-07-18 Dai Nippon Printing Co., Ltd. Potential sensor employing electrooptic crystal and potential measuring method
JP2556910B2 (ja) * 1989-11-30 1996-11-27 浜松ホトニクス株式会社 光強度変化検出装置
US5274325A (en) * 1991-03-18 1993-12-28 Nippon Telegraph And Telephone Corporation Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
EP0541139B1 (de) * 1991-08-05 2003-01-22 Koninklijke Philips Electronics N.V. Elektrooptische Messanordnung zum Messen eines elektrischen Signals in einem elektronischen Bauteil
JP2735418B2 (ja) * 1991-10-01 1998-04-02 中部電力株式会社 交流電圧検出装置
DE4202185A1 (de) * 1992-01-28 1993-07-29 Hilti Ag Verfahren zur faseroptischen kraftmessung
JP2802868B2 (ja) * 1992-12-22 1998-09-24 大日本スクリーン製造株式会社 半導体ウエハの非接触電気測定用センサおよびその製造方法、並びに、そのセンサを用いた測定方法
US5940549A (en) * 1996-07-30 1999-08-17 Seagate Technology, Incorporated Optical system and method using optical fibers for storage and retrieval of information
US5850375A (en) * 1996-07-30 1998-12-15 Seagate Technology, Inc. System and method using optical fibers in a data storage and retrieval system
US6081499A (en) * 1997-05-05 2000-06-27 Seagate Technology, Inc. Magneto-optical data storage system having an optical-processing flying head
US6034938A (en) * 1996-07-30 2000-03-07 Seagate Technology, Inc. Data storage system having an optical processing flying head
US6850475B1 (en) 1996-07-30 2005-02-01 Seagate Technology, Llc Single frequency laser source for optical data storage system
DE19634251A1 (de) * 1996-08-26 1998-03-05 Abb Patent Gmbh Spannungswandler
US6298027B1 (en) 1998-03-30 2001-10-02 Seagate Technology Llc Low-birefringence optical fiber for use in an optical data storage system
CN1160715C (zh) 1998-03-30 2004-08-04 西加特技术有限责任公司 具有降低由寄生反射引起的噪声的装置的光学数据存储***
US6574015B1 (en) 1998-05-19 2003-06-03 Seagate Technology Llc Optical depolarizer
US6859467B2 (en) * 2001-05-03 2005-02-22 The Regents Of The University Of California Electro-optic modulator material
US6894519B2 (en) * 2002-04-11 2005-05-17 Solid State Measurements, Inc. Apparatus and method for determining electrical properties of a semiconductor wafer
JP2013003072A (ja) * 2011-06-21 2013-01-07 Nippon Telegr & Teleph Corp <Ntt> 光センサ及び光センサ感度変動抑制方法
US9121872B2 (en) * 2011-09-26 2015-09-01 Beijing Aerospace Times Optical-Electronic Technology Co. Ltd. Electro-optic effect based optical voltage transformer
CN107430157B (zh) * 2015-03-19 2020-05-19 Abb瑞士股份有限公司 不透气体舱和光学电压传感器的组件
US10234501B2 (en) * 2016-02-26 2019-03-19 Tektronix, Inc. Active noise suppression for optical voltage sensor
JP6989852B2 (ja) * 2019-01-22 2022-02-03 横河電機株式会社 電界センサ

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5155273A (en) * 1974-11-09 1976-05-14 Eto Goro Hikarihenseigatakendenki
JPS57168167A (en) * 1981-04-10 1982-10-16 Meidensha Electric Mfg Co Ltd Electric field/voltage detector
JPS58137768A (ja) * 1982-02-09 1983-08-16 Mitsubishi Electric Corp 光電圧電界センサ
JPS58120974U (ja) * 1982-02-10 1983-08-17 三菱電機株式会社 光電圧電界検出装置
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
JPS5918923A (ja) * 1982-07-23 1984-01-31 Toshiba Corp 複屈折測定装置
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich

Also Published As

Publication number Publication date
US4866372A (en) 1989-09-12
DE3873422T2 (de) 1993-01-28
JPS63300969A (ja) 1988-12-08
JP2571385B2 (ja) 1997-01-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee