DE3852755D1 - Optischer Fühler mit mehreren Elementen. - Google Patents

Optischer Fühler mit mehreren Elementen.

Info

Publication number
DE3852755D1
DE3852755D1 DE3852755T DE3852755T DE3852755D1 DE 3852755 D1 DE3852755 D1 DE 3852755D1 DE 3852755 T DE3852755 T DE 3852755T DE 3852755 T DE3852755 T DE 3852755T DE 3852755 D1 DE3852755 D1 DE 3852755D1
Authority
DE
Germany
Prior art keywords
optical sensor
several elements
several
elements
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3852755T
Other languages
English (en)
Other versions
DE3852755T2 (de
Inventor
James J Sullivan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE3852755D1 publication Critical patent/DE3852755D1/de
Application granted granted Critical
Publication of DE3852755T2 publication Critical patent/DE3852755T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Automatic Focus Adjustment (AREA)
  • Focusing (AREA)
DE3852755T 1987-12-30 1988-11-11 Optischer Fühler mit mehreren Elementen. Expired - Fee Related DE3852755T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/139,509 US4810091A (en) 1987-12-30 1987-12-30 Apparatus and method for adjusting focus of a multi-element optical detector

Publications (2)

Publication Number Publication Date
DE3852755D1 true DE3852755D1 (de) 1995-02-23
DE3852755T2 DE3852755T2 (de) 1995-09-07

Family

ID=22487008

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3852755T Expired - Fee Related DE3852755T2 (de) 1987-12-30 1988-11-11 Optischer Fühler mit mehreren Elementen.

Country Status (4)

Country Link
US (1) US4810091A (de)
EP (1) EP0324076B1 (de)
JP (1) JP2810678B2 (de)
DE (1) DE3852755T2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4883356A (en) * 1988-09-13 1989-11-28 The Perkin-Elmer Corporation Spectrometer detector mounting assembly
US5517302A (en) * 1990-01-30 1996-05-14 Stearns; Thornton Multispectral reflectometer
DE4017317C2 (de) * 1990-05-30 2000-02-17 Bodenseewerk Perkin Elmer Co Anodnung zur Verbesserung der Auflösung eines Spektrometers
EP0746746B1 (de) * 1992-12-28 2001-10-17 HINNRICHS, Michele Multispektrale bildanalyse
US20030017081A1 (en) * 1994-02-10 2003-01-23 Affymetrix, Inc. Method and apparatus for imaging a sample on a device
US5974365A (en) * 1997-10-23 1999-10-26 The United States Of America As Represented By The Secretary Of The Army System for measuring the location and orientation of an object
US7095032B2 (en) * 1998-03-20 2006-08-22 Montagu Jean I Focusing of microscopes and reading of microarrays
US6472671B1 (en) * 2000-02-09 2002-10-29 Jean I. Montagu Quantified fluorescence microscopy
US7397561B2 (en) * 2005-11-07 2008-07-08 Wafermasters, Incorporated Spectroscopy system
US7564547B2 (en) * 2005-11-07 2009-07-21 Wafermasters, Inc. Spectroscopy system
US7485869B2 (en) * 2007-02-27 2009-02-03 Metrosol, Inc. Prism spectrometer
US7579601B2 (en) * 2007-02-27 2009-08-25 Metrosol, Inc. Spectrometer with moveable detector element
US7684037B2 (en) * 2007-02-27 2010-03-23 Metrosol, Inc. Spectrometer with collimated input light
US9036147B2 (en) * 2009-05-29 2015-05-19 Toyota Jidosha Kabushiki Kaisha Spectrum measuring apparatus
CN110411717B (zh) * 2019-08-30 2021-06-18 广东北创光电科技股份有限公司 显微球面光谱自动分析仪及应用其的光谱自动分析方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618928B2 (de) * 1971-12-29 1981-05-02
JPS5340333B2 (de) * 1972-11-14 1978-10-26
JPS5099541A (de) * 1973-12-29 1975-08-07
US4047187A (en) * 1974-04-01 1977-09-06 Canon Kabushiki Kaisha System for exposure measurement and/or focus detection by means of image senser
US3973849A (en) * 1975-06-16 1976-08-10 International Business Machines Corporation Self-calibratable spectrum analyzer
JPS5413330A (en) * 1977-07-01 1979-01-31 Olympus Optical Co Ltd Automatic focus adjusting system
US4435079A (en) * 1981-08-28 1984-03-06 American Optical Corporation Apparatus for testing lenses by determining best focus
DE3403372C1 (de) * 1984-02-01 1985-07-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Mehrkanal-Prozeß-Spektrometer
DE3510066C1 (de) * 1985-03-20 1986-05-07 Will Wetzlar Gmbh, 6330 Wetzlar Verfahren zur Fokussierung eines optischen Abbildungssystems sowie Einrichtung zur Durchfuehrung des Verfahrens

Also Published As

Publication number Publication date
EP0324076A3 (en) 1990-09-05
JP2810678B2 (ja) 1998-10-15
EP0324076A2 (de) 1989-07-19
DE3852755T2 (de) 1995-09-07
EP0324076B1 (de) 1995-01-11
JPH026720A (ja) 1990-01-10
US4810091A (en) 1989-03-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee