DE3787431D1 - Verfahren zur Generierung einer Kandidatenliste von fehlerhaften Schaltungselementen und Verfahren zur Isolierung von Fehlern in einer logischen Schaltung unter Verwendung dieser Kandidatenliste. - Google Patents
Verfahren zur Generierung einer Kandidatenliste von fehlerhaften Schaltungselementen und Verfahren zur Isolierung von Fehlern in einer logischen Schaltung unter Verwendung dieser Kandidatenliste.Info
- Publication number
- DE3787431D1 DE3787431D1 DE87112000T DE3787431T DE3787431D1 DE 3787431 D1 DE3787431 D1 DE 3787431D1 DE 87112000 T DE87112000 T DE 87112000T DE 3787431 T DE3787431 T DE 3787431T DE 3787431 D1 DE3787431 D1 DE 3787431D1
- Authority
- DE
- Germany
- Prior art keywords
- candidate list
- generating
- circuit elements
- methods
- fault
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Earth Drilling (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
- Control Of Turbines (AREA)
- Dc Digital Transmission (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/902,614 US4727545A (en) | 1986-09-02 | 1986-09-02 | Method and apparatus for isolating faults in a digital logic circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3787431D1 true DE3787431D1 (de) | 1993-10-21 |
DE3787431T2 DE3787431T2 (de) | 1994-01-13 |
Family
ID=25416113
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE87112000T Expired - Fee Related DE3787431T2 (de) | 1986-09-02 | 1987-08-18 | Verfahren zur Generierung einer Kandidatenliste von fehlerhaften Schaltungselementen und Verfahren zur Isolierung von Fehlern in einer logischen Schaltung unter Verwendung dieser Kandidatenliste. |
Country Status (11)
Country | Link |
---|---|
US (1) | US4727545A (de) |
EP (1) | EP0259662B1 (de) |
JP (1) | JPS63132346A (de) |
AT (1) | ATE94666T1 (de) |
AU (1) | AU590110B2 (de) |
CA (1) | CA1273706A (de) |
DE (1) | DE3787431T2 (de) |
DK (1) | DK456087A (de) |
FI (1) | FI873793A (de) |
IE (1) | IE872345L (de) |
IL (1) | IL83617A0 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4996659A (en) * | 1986-08-20 | 1991-02-26 | Hitachi, Ltd. | Method of diagnosing integrated logic circuit |
US4829520A (en) * | 1987-03-16 | 1989-05-09 | American Telephone And Telegraph Company, At&T Bell Laboratories | In-place diagnosable electronic circuit board |
US4961156A (en) * | 1987-10-27 | 1990-10-02 | Nec Corporation | Simulation capable of simultaneously simulating a logic circuit model in response to a plurality of input logic signals |
US5029166A (en) * | 1989-05-31 | 1991-07-02 | At&T Bell Laboratories | Method and apparatus for testing circuit boards |
US5107497A (en) * | 1989-07-28 | 1992-04-21 | At&T Bell Laboratories | Technique for producing an expert system for system fault diagnosis |
US5161158A (en) * | 1989-10-16 | 1992-11-03 | The Boeing Company | Failure analysis system |
US5210699A (en) * | 1989-12-18 | 1993-05-11 | Siemens Components, Inc. | Process for extracting logic from transistor and resistor data representations of circuits |
US5146460A (en) * | 1990-02-16 | 1992-09-08 | International Business Machines | Logic simulation using a hardware accelerator together with an automated error event isolation and trace facility |
US5327361A (en) * | 1990-03-30 | 1994-07-05 | International Business Machines Corporation | Events trace gatherer for a logic simulation machine |
US8050903B1 (en) * | 1990-05-29 | 2011-11-01 | Texas Instruments Incorporated | Apparatus and method for checkpointing simulation data in a simulator |
US5127012A (en) * | 1991-02-19 | 1992-06-30 | Eastman Kodak Company | Diagnostic and administrative device for document production apparatus |
US5633812A (en) * | 1992-09-29 | 1997-05-27 | International Business Machines Corporation | Fault simulation of testing for board circuit failures |
US5418974A (en) * | 1992-10-08 | 1995-05-23 | International Business Machines Corporation | Circuit design method and system therefor |
US5418794A (en) * | 1992-12-18 | 1995-05-23 | Amdahl Corporation | Error determination scan tree apparatus and method |
US5475695A (en) * | 1993-03-19 | 1995-12-12 | Semiconductor Diagnosis & Test Corporation | Automatic failure analysis system |
US5500940A (en) * | 1994-04-25 | 1996-03-19 | Hewlett-Packard Company | Method for evaluating failure in an electronic data storage system and preemptive notification thereof, and system with component failure evaluation |
US6480817B1 (en) * | 1994-09-01 | 2002-11-12 | Hynix Semiconductor, Inc. | Integrated circuit I/O pad cell modeling |
US5671352A (en) * | 1995-07-07 | 1997-09-23 | Sun Microsystems, Inc. | Error injection to a behavioral model |
WO1997016740A1 (en) * | 1995-11-02 | 1997-05-09 | Genrad, Inc. | System and method of accounting for defect detection in a testing system |
US6161202A (en) * | 1997-02-18 | 2000-12-12 | Ee-Signals Gmbh & Co. Kg | Method for the monitoring of integrated circuits |
US8489860B1 (en) * | 1997-12-22 | 2013-07-16 | Texas Instruments Incorporated | Mobile electronic device having a host processor system capable of dynamically canging tasks performed by a coprocessor in the device |
US6694362B1 (en) * | 2000-01-03 | 2004-02-17 | Micromuse Inc. | Method and system for network event impact analysis and correlation with network administrators, management policies and procedures |
US6515483B1 (en) * | 2000-08-30 | 2003-02-04 | Micron Technology, Inc. | System for partial scan testing of integrated circuits |
US20050157654A1 (en) * | 2000-10-12 | 2005-07-21 | Farrell Craig A. | Apparatus and method for automated discovery and monitoring of relationships between network elements |
US7383191B1 (en) | 2000-11-28 | 2008-06-03 | International Business Machines Corporation | Method and system for predicting causes of network service outages using time domain correlation |
US6966015B2 (en) * | 2001-03-22 | 2005-11-15 | Micromuse, Ltd. | Method and system for reducing false alarms in network fault management systems |
GB2373607B (en) * | 2001-03-23 | 2003-02-12 | Sun Microsystems Inc | A computer system |
US6744739B2 (en) * | 2001-05-18 | 2004-06-01 | Micromuse Inc. | Method and system for determining network characteristics using routing protocols |
US7043727B2 (en) * | 2001-06-08 | 2006-05-09 | Micromuse Ltd. | Method and system for efficient distribution of network event data |
US7516208B1 (en) | 2001-07-20 | 2009-04-07 | International Business Machines Corporation | Event database management method and system for network event reporting system |
US20050286685A1 (en) * | 2001-08-10 | 2005-12-29 | Nikola Vukovljak | System and method for testing multiple dial-up points in a communications network |
US6961887B1 (en) * | 2001-10-09 | 2005-11-01 | The United States Of America As Represented By The Secretary Of The Navy | Streamlined LASAR-to-L200 post-processing for CASS |
US7363368B2 (en) | 2001-12-24 | 2008-04-22 | International Business Machines Corporation | System and method for transaction recording and playback |
US7395468B2 (en) * | 2004-03-23 | 2008-07-01 | Broadcom Corporation | Methods for debugging scan testing failures of integrated circuits |
US7581150B2 (en) * | 2004-09-28 | 2009-08-25 | Broadcom Corporation | Methods and computer program products for debugging clock-related scan testing failures of integrated circuits |
US7500165B2 (en) | 2004-10-06 | 2009-03-03 | Broadcom Corporation | Systems and methods for controlling clock signals during scan testing integrated circuits |
US8171347B2 (en) * | 2007-07-11 | 2012-05-01 | Oracle America, Inc. | Method and apparatus for troubleshooting a computer system |
US8229723B2 (en) * | 2007-12-07 | 2012-07-24 | Sonics, Inc. | Performance software instrumentation and analysis for electronic design automation |
US8806401B1 (en) * | 2013-03-15 | 2014-08-12 | Atrenta, Inc. | System and methods for reasonable functional verification of an integrated circuit design |
US9940235B2 (en) | 2016-06-29 | 2018-04-10 | Oracle International Corporation | Method and system for valid memory module configuration and verification |
CN107219772B (zh) * | 2017-05-23 | 2020-02-18 | 南方电网科学研究院有限责任公司 | 测试多回线故障抑制与隔离装置功能指标的方法、装置及*** |
US10585995B2 (en) | 2017-06-26 | 2020-03-10 | International Business Machines Corporation | Reducing clock power consumption of a computer processor |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3702011A (en) * | 1970-05-12 | 1972-10-31 | Bell Telephone Labor Inc | Apparatus and method for simulating logic faults |
GB1389319A (en) * | 1971-11-15 | 1975-04-03 | Ibm | Data processing system |
JPS55153054A (en) * | 1979-05-15 | 1980-11-28 | Hitachi Ltd | Logic circuit simulation system |
GB8309692D0 (en) * | 1983-04-09 | 1983-05-11 | Int Computers Ltd | Verifying design of digital electronic systems |
US4587625A (en) * | 1983-07-05 | 1986-05-06 | Motorola Inc. | Processor for simulating digital structures |
GB8327753D0 (en) * | 1983-10-17 | 1983-11-16 | Robinson G D | Test generation system |
FR2567273B1 (fr) * | 1984-07-03 | 1986-11-14 | Commissariat Energie Atomique | Dispositif de simulation de la defaillance ou du bon fonctionnement d'un systeme logique |
US4654851A (en) * | 1984-12-24 | 1987-03-31 | Rockwell International Corporation | Multiple data path simulator |
-
1986
- 1986-09-02 US US06/902,614 patent/US4727545A/en not_active Expired - Fee Related
-
1987
- 1987-08-18 AU AU77149/87A patent/AU590110B2/en not_active Ceased
- 1987-08-18 DE DE87112000T patent/DE3787431T2/de not_active Expired - Fee Related
- 1987-08-18 AT AT87112000T patent/ATE94666T1/de not_active IP Right Cessation
- 1987-08-18 EP EP87112000A patent/EP0259662B1/de not_active Expired - Lifetime
- 1987-08-23 IL IL83617A patent/IL83617A0/xx unknown
- 1987-08-27 CA CA000545547A patent/CA1273706A/en not_active Expired - Fee Related
- 1987-09-01 FI FI873793A patent/FI873793A/fi not_active Application Discontinuation
- 1987-09-01 IE IE872345A patent/IE872345L/xx unknown
- 1987-09-01 DK DK456087A patent/DK456087A/da not_active Application Discontinuation
- 1987-09-02 JP JP62218063A patent/JPS63132346A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DK456087D0 (da) | 1987-09-01 |
JPS63132346A (ja) | 1988-06-04 |
DK456087A (da) | 1988-03-03 |
IL83617A0 (en) | 1988-01-31 |
FI873793A (fi) | 1988-03-03 |
EP0259662B1 (de) | 1993-09-15 |
IE872345L (en) | 1988-03-02 |
US4727545A (en) | 1988-02-23 |
FI873793A0 (fi) | 1987-09-01 |
DE3787431T2 (de) | 1994-01-13 |
EP0259662A3 (en) | 1989-07-26 |
AU590110B2 (en) | 1989-10-26 |
EP0259662A2 (de) | 1988-03-16 |
ATE94666T1 (de) | 1993-10-15 |
AU7714987A (en) | 1988-03-10 |
CA1273706A (en) | 1990-09-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |