DE3685231D1 - Messschaltung zur erprobung eines digital-analog-wandlers. - Google Patents
Messschaltung zur erprobung eines digital-analog-wandlers.Info
- Publication number
- DE3685231D1 DE3685231D1 DE8686101785T DE3685231T DE3685231D1 DE 3685231 D1 DE3685231 D1 DE 3685231D1 DE 8686101785 T DE8686101785 T DE 8686101785T DE 3685231 T DE3685231 T DE 3685231T DE 3685231 D1 DE3685231 D1 DE 3685231D1
- Authority
- DE
- Germany
- Prior art keywords
- dac
- output signal
- sampling
- analog
- digital
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60026730A JPS61186867A (ja) | 1985-02-14 | 1985-02-14 | Dac測定回路 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3685231D1 true DE3685231D1 (de) | 1992-06-17 |
Family
ID=12201430
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686101785T Expired - Lifetime DE3685231D1 (de) | 1985-02-14 | 1986-02-13 | Messschaltung zur erprobung eines digital-analog-wandlers. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4733167A (de) |
EP (1) | EP0191478B1 (de) |
JP (1) | JPS61186867A (de) |
DE (1) | DE3685231D1 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6215930A (ja) * | 1985-07-15 | 1987-01-24 | Hitachi Ltd | D/a変換器の試験方式 |
US4829236A (en) * | 1987-10-30 | 1989-05-09 | Teradyne, Inc. | Digital-to-analog calibration system |
US4947106A (en) * | 1988-03-31 | 1990-08-07 | Hewlett-Packard Company | Programmatically generated in-circuit test of analog to digital converters |
US4888548A (en) * | 1988-03-31 | 1989-12-19 | Hewlett-Packard Company | Programmatically generated in-circuit test of digital to analog converters |
JP2810253B2 (ja) * | 1991-05-22 | 1998-10-15 | 株式会社日立製作所 | D/a変換器の試験装置 |
JP3623035B2 (ja) * | 1996-01-26 | 2005-02-23 | アジレント・テクノロジーズ・インク | 信号発生装置 |
US6326909B1 (en) * | 1997-09-18 | 2001-12-04 | Advantest Corporation | Evaluation system for analog-digital or digital-analog converter |
US6320528B1 (en) | 1999-10-15 | 2001-11-20 | Koninklijke Philips Electronics Nv | Built-in self test for integrated digital-to-analog converters |
WO2004072668A1 (en) * | 2003-02-13 | 2004-08-26 | Mcgill Iniversity | Mixed-signal-device testing |
US7961083B2 (en) * | 2007-08-29 | 2011-06-14 | Infineon Technologies Ag | Digital satellite receiver controller |
KR20140026046A (ko) * | 2012-08-24 | 2014-03-05 | 에스케이하이닉스 주식회사 | 데이터입력회로 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1278694A (en) * | 1969-07-04 | 1972-06-21 | Sperry Rand Corp | Improvements in or relating to apparatus for testing electronic circuits |
US3659087A (en) * | 1970-09-30 | 1972-04-25 | Ibm | Controllable digital pulse generator and a test system incorporating the pulse generator |
GB1379588A (en) * | 1971-12-01 | 1975-01-02 | Int Computers Ltd | Systems for testing electrical devices |
JPS50129079A (de) * | 1974-03-29 | 1975-10-11 | ||
US4092589A (en) * | 1977-03-23 | 1978-05-30 | Fairchild Camera And Instrument Corp. | High-speed testing circuit |
FR2460526A1 (fr) * | 1979-06-29 | 1981-01-23 | Ibm France | Procede de mesure du temps d'acces d'adresse de memoires mettant en oeuvre la technique de recirculation des donnees, et testeur en resultant |
JPS5832178A (ja) * | 1981-08-19 | 1983-02-25 | Advantest Corp | Icテスタ |
JPS58142658A (ja) * | 1982-02-17 | 1983-08-24 | Nec Corp | 監視信号発生回路 |
JPS58144763A (ja) * | 1982-02-24 | 1983-08-29 | Toshiba Corp | 同期検出回路 |
JPS58172560A (ja) * | 1982-04-02 | 1983-10-11 | Fujitsu Ltd | D/aコンバ−タの直線性測定方法 |
-
1985
- 1985-02-14 JP JP60026730A patent/JPS61186867A/ja active Granted
-
1986
- 1986-02-13 EP EP86101785A patent/EP0191478B1/de not_active Expired
- 1986-02-13 DE DE8686101785T patent/DE3685231D1/de not_active Expired - Lifetime
- 1986-02-13 US US06/829,363 patent/US4733167A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS61186867A (ja) | 1986-08-20 |
JPH0582780B2 (de) | 1993-11-22 |
EP0191478B1 (de) | 1992-05-13 |
US4733167A (en) | 1988-03-22 |
EP0191478A2 (de) | 1986-08-20 |
EP0191478A3 (en) | 1989-12-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |