DE3575023D1 - Eichungselement fuer analyse. - Google Patents

Eichungselement fuer analyse.

Info

Publication number
DE3575023D1
DE3575023D1 DE8585300767T DE3575023T DE3575023D1 DE 3575023 D1 DE3575023 D1 DE 3575023D1 DE 8585300767 T DE8585300767 T DE 8585300767T DE 3575023 T DE3575023 T DE 3575023T DE 3575023 D1 DE3575023 D1 DE 3575023D1
Authority
DE
Germany
Prior art keywords
analysis
calibration element
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585300767T
Other languages
English (en)
Inventor
Colin David Bell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GE Healthcare Ltd
Original Assignee
Amersham International PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Amersham International PLC filed Critical Amersham International PLC
Application granted granted Critical
Publication of DE3575023D1 publication Critical patent/DE3575023D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2942—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using autoradiographic methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/10—Composition for standardization, calibration, simulation, stabilization, preparation or preservation; processes of use in preparation for chemical testing

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
DE8585300767T 1984-02-07 1985-02-05 Eichungselement fuer analyse. Expired - Fee Related DE3575023D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB848403128A GB8403128D0 (en) 1984-02-07 1984-02-07 Standard for analysis

Publications (1)

Publication Number Publication Date
DE3575023D1 true DE3575023D1 (de) 1990-02-01

Family

ID=10556169

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585300767T Expired - Fee Related DE3575023D1 (de) 1984-02-07 1985-02-05 Eichungselement fuer analyse.

Country Status (5)

Country Link
US (1) US4715988A (de)
EP (1) EP0152267B1 (de)
JP (1) JPS60183539A (de)
DE (1) DE3575023D1 (de)
GB (1) GB8403128D0 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2693477B2 (ja) * 1988-04-05 1997-12-24 株式会社日立製作所 分解能評価試料およびそれを用いた分解能評価方法ならびにそれを備えた走査電子顕微鏡
US5610022A (en) * 1989-09-26 1997-03-11 City Of Hope Internal control for immunocytochemistry assay
JPH076887B2 (ja) * 1992-06-26 1995-01-30 工業技術院長 蛍光ｘ線定量用酸化物標準試料の製造方法
US6281004B1 (en) 1999-04-14 2001-08-28 Cytologix Corporation Quality control for cytochemical assays
US7011940B1 (en) * 1999-04-14 2006-03-14 Medical Discovery Partners Llc Quality control for cytochemical assays
US20070141723A1 (en) * 2005-12-16 2007-06-21 Sompuram Seshi A Immunohistochemistry staining controls
US7720254B2 (en) 2006-03-13 2010-05-18 Smi Holdings, Inc. Automatic microparticle mark reader
GB0720452D0 (en) * 2007-10-19 2007-11-28 Rolls Royce Plc An assembly
DE102011002443B4 (de) * 2011-01-04 2013-08-29 Leica Biosystems Nussloch Gmbh Kryostat mit Beleuchtungseinrichtung
US9453430B2 (en) * 2014-03-21 2016-09-27 Siemens Energy, Inc. Method for tracking turbine blade creep

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334233A (en) * 1963-10-31 1967-08-01 Phillips Petroleum Co Internal standards uniformly dispersed in the walls of a container for activation analysis
US4062799A (en) * 1973-01-30 1977-12-13 Fuji Photo Film Co., Ltd. Method of forming microcapsule films having low porosity
US4152271A (en) * 1973-08-11 1979-05-01 Micro Tracers, Inc. Tracer-containing composition
US4053433A (en) * 1975-02-19 1977-10-11 Minnesota Mining And Manufacturing Company Method of tagging with color-coded microparticles
US4138390A (en) * 1976-05-17 1979-02-06 Rohm And Haas Company Vinyl resin coating compositions comprising dicyclopentenyl acrylate and/or methacrylate vehicular component
DE2716689A1 (de) * 1977-04-15 1978-10-19 Ibm Deutschland Herstellung von eichstandards fuer die roentgenfluoreszenzanalyse
US4293436A (en) * 1979-03-30 1981-10-06 New England Nuclear Corporation Autofluorogram and composition and method for making the same
JPS6031355B2 (ja) * 1979-06-26 1985-07-22 株式会社ニコン 全固体エレクトロクロミツク素子
US4431766A (en) * 1979-11-05 1984-02-14 Stauffer Chemical Company Coded polymeric material and method
US4507233A (en) * 1981-04-22 1985-03-26 Oriental Yeast Co., Ltd. Colored molecular weight marker
JPS59132344A (ja) * 1983-01-18 1984-07-30 Sumitomo Electric Ind Ltd ＺｎＳｅ中のＬｉ定量分析用の標準試料作成方法

Also Published As

Publication number Publication date
US4715988A (en) 1987-12-29
GB8403128D0 (en) 1984-03-14
EP0152267A3 (en) 1986-12-30
EP0152267A2 (de) 1985-08-21
JPS60183539A (ja) 1985-09-19
EP0152267B1 (de) 1989-12-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee