DE3462971D1 - Power semiconductor device with main current section and emulation current section - Google Patents

Power semiconductor device with main current section and emulation current section

Info

Publication number
DE3462971D1
DE3462971D1 DE8484110162T DE3462971T DE3462971D1 DE 3462971 D1 DE3462971 D1 DE 3462971D1 DE 8484110162 T DE8484110162 T DE 8484110162T DE 3462971 T DE3462971 T DE 3462971T DE 3462971 D1 DE3462971 D1 DE 3462971D1
Authority
DE
Germany
Prior art keywords
current section
semiconductor device
power semiconductor
emulation
main current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484110162T
Other languages
English (en)
Inventor
John Palmer Walden
Eric Joseph Wildi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Application granted granted Critical
Publication of DE3462971D1 publication Critical patent/DE3462971D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802Vertical DMOS transistors, i.e. VDMOS transistors
    • H01L29/7815Vertical DMOS transistors, i.e. VDMOS transistors with voltage or current sensing structure, e.g. emulator section, overcurrent sensing cell
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70Bipolar devices
    • H01L29/72Transistor-type devices, i.e. able to continuously respond to applied control signals
    • H01L29/739Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
    • H01L29/7393Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
    • H01L29/7395Vertical transistors, e.g. vertical IGBT
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802Vertical DMOS transistors, i.e. VDMOS transistors
    • H01L29/7811Vertical DMOS transistors, i.e. VDMOS transistors with an edge termination structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Thyristors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE8484110162T 1983-09-06 1984-08-25 Power semiconductor device with main current section and emulation current section Expired DE3462971D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52924083A 1983-09-06 1983-09-06

Publications (1)

Publication Number Publication Date
DE3462971D1 true DE3462971D1 (en) 1987-05-07

Family

ID=24109099

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484110162T Expired DE3462971D1 (en) 1983-09-06 1984-08-25 Power semiconductor device with main current section and emulation current section

Country Status (6)

Country Link
EP (1) EP0139998B1 (de)
JP (1) JPH06105783B2 (de)
CA (1) CA1219382A (de)
DE (1) DE3462971D1 (de)
IE (1) IE55753B1 (de)
MX (1) MX156196A (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8503394A (nl) * 1985-12-10 1987-07-01 Philips Nv Stroomaftastschakeling voor een vermogenshalfgeleiderinrichting, in het bijzonder geintegreerde intelligente vermogenshalfgeleiderschakelaar voor met name automobieltoepassingen.
JPH073854B2 (ja) * 1985-12-18 1995-01-18 株式会社日立製作所 複合半導体装置
US4777579A (en) * 1988-01-04 1988-10-11 General Electric Company Integrated current sensor configurations for AC motor drives
US4980740A (en) * 1989-03-27 1990-12-25 General Electric Company MOS-pilot structure for an insulated gate transistor
US5128823A (en) * 1989-06-14 1992-07-07 Nippondenso Co., Ltd. Power semiconductor apparatus
DE4127033A1 (de) * 1991-08-16 1993-02-18 Asea Brown Boveri Mos-gesteuerter thyristor mct
JP2833610B2 (ja) * 1991-10-01 1998-12-09 株式会社デンソー 絶縁ゲート型バイポーラトランジスタ
GB9420572D0 (en) * 1994-10-12 1994-11-30 Philips Electronics Uk Ltd A protected switch
JPH09135023A (ja) * 1995-11-08 1997-05-20 Toshiba Corp 圧接型半導体装置
JP4156717B2 (ja) * 1998-01-13 2008-09-24 三菱電機株式会社 半導体装置
JP2002505525A (ja) * 1998-02-27 2002-02-19 アーベーベー (シュヴァイツ) アクチェンゲゼルシャフト 絶縁ゲートバイポーラトランジスタ
GB9908285D0 (en) * 1999-04-13 1999-06-02 Koninkl Philips Electronics Nv A power switching circuit
GB0019535D0 (en) 2000-08-10 2000-09-27 Koninkl Philips Electronics Nv Two-terminal switch circuit and voltage threshold responsive circuit component
WO2011021076A1 (en) 2009-08-18 2011-02-24 Freescale Semiconductor, Inc. Transistor power switch device and method of measuring its characteristics

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4593302B1 (en) * 1980-08-18 1998-02-03 Int Rectifier Corp Process for manufacture of high power mosfet laterally distributed high carrier density beneath the gate oxide
JPS59164253U (ja) * 1983-04-19 1984-11-02 東洋電機製造株式会社 半導体装置の電極

Also Published As

Publication number Publication date
EP0139998B1 (de) 1987-04-01
MX156196A (es) 1988-07-22
JPS6094772A (ja) 1985-05-27
IE55753B1 (en) 1991-01-02
JPH06105783B2 (ja) 1994-12-21
CA1219382A (en) 1987-03-17
EP0139998A1 (de) 1985-05-08
IE842112L (en) 1985-03-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: VOIGT, R., DIPL.-ING., PAT.-ANW., 6232 BAD SODEN

8339 Ceased/non-payment of the annual fee