DE1959008B2 - Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid - Google Patents

Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid

Info

Publication number
DE1959008B2
DE1959008B2 DE19691959008 DE1959008A DE1959008B2 DE 1959008 B2 DE1959008 B2 DE 1959008B2 DE 19691959008 DE19691959008 DE 19691959008 DE 1959008 A DE1959008 A DE 1959008A DE 1959008 B2 DE1959008 B2 DE 1959008B2
Authority
DE
Germany
Prior art keywords
radionuclide
radiating
coatings
coating
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19691959008
Other languages
English (en)
Other versions
DE1959008A1 (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DE19691959008 priority Critical patent/DE1959008B2/de
Priority to US4903A priority patent/US3639763A/en
Publication of DE1959008A1 publication Critical patent/DE1959008A1/de
Publication of DE1959008B2 publication Critical patent/DE1959008B2/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DE19691959008 1969-11-25 1969-11-25 Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid Withdrawn DE1959008B2 (de)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE19691959008 DE1959008B2 (de) 1969-11-25 1969-11-25 Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid
US4903A US3639763A (en) 1969-11-25 1970-01-22 Device for measuring the thickness of metallic layers utilizing beta ray backscattering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19691959008 DE1959008B2 (de) 1969-11-25 1969-11-25 Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid

Publications (2)

Publication Number Publication Date
DE1959008A1 DE1959008A1 (de) 1971-06-09
DE1959008B2 true DE1959008B2 (de) 1971-10-21

Family

ID=5751945

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19691959008 Withdrawn DE1959008B2 (de) 1969-11-25 1969-11-25 Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid

Country Status (2)

Country Link
US (1) US3639763A (de)
DE (1) DE1959008B2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832551A (en) * 1972-06-22 1974-08-27 Bethlehem Steel Corp Radiation gage with sample and hold feature in deviation measuring circuit
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
US4079237A (en) * 1975-11-12 1978-03-14 Unit Process Assemblies, Inc. Card controlled beta backscatter thickness measuring instrument
DE2611411C3 (de) * 1976-03-18 1980-07-17 Helmut Fischer Gmbh & Co Institut Fuer Elektronik Und Messtechnik, 7032 Sindelfingen Vorrichtung zum Messen der Dicke von Schichten mit einem die Schicht bestrahlenden Radionuklid
US7918293B1 (en) 2005-03-09 2011-04-05 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume
US8969833B1 (en) 2011-12-16 2015-03-03 Us Synthetic Corporation Method and system for perceiving a boundary between a first region and a second region of a superabrasive volume

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3271572A (en) * 1962-08-24 1966-09-06 Unit Process Assemblies Direct reading beta ray comparator
US3460030A (en) * 1965-10-22 1969-08-05 Brun Sensor Systems Inc Method and apparatus for measuring the percent moisture content in process material utilizing microwave absorption and a diverse radiant energy absorption technique

Also Published As

Publication number Publication date
US3639763A (en) 1972-02-01
DE1959008A1 (de) 1971-06-09

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Legal Events

Date Code Title Description
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee