DE102004061604A1 - Semiconductor-solar cell producing method, involves directly contacting films having openings with solar cell areas, applying voltage between cell surface and one film, locally removing cell material in openings after limiting gas discharge - Google Patents
Semiconductor-solar cell producing method, involves directly contacting films having openings with solar cell areas, applying voltage between cell surface and one film, locally removing cell material in openings after limiting gas discharge Download PDFInfo
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- DE102004061604A1 DE102004061604A1 DE200410061604 DE102004061604A DE102004061604A1 DE 102004061604 A1 DE102004061604 A1 DE 102004061604A1 DE 200410061604 DE200410061604 DE 200410061604 DE 102004061604 A DE102004061604 A DE 102004061604A DE 102004061604 A1 DE102004061604 A1 DE 102004061604A1
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- 210000004027 cell Anatomy 0.000 title claims abstract description 72
- 238000000034 method Methods 0.000 title claims abstract description 21
- 239000000463 material Substances 0.000 title claims abstract description 15
- 239000002184 metal Substances 0.000 claims abstract description 41
- 229910052751 metal Inorganic materials 0.000 claims abstract description 41
- 239000011888 foil Substances 0.000 claims abstract description 21
- 229920006254 polymer film Polymers 0.000 claims abstract description 12
- 239000004065 semiconductor Substances 0.000 claims description 11
- 238000005530 etching Methods 0.000 claims description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 7
- 229910052710 silicon Inorganic materials 0.000 claims description 7
- 239000010703 silicon Substances 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 6
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 5
- 229920000642 polymer Polymers 0.000 claims description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 5
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 4
- 238000001465 metallisation Methods 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims 2
- 238000001020 plasma etching Methods 0.000 abstract description 5
- 239000007789 gas Substances 0.000 description 19
- 238000002161 passivation Methods 0.000 description 7
- 239000010408 film Substances 0.000 description 5
- 230000000873 masking effect Effects 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- 238000000608 laser ablation Methods 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 239000010953 base metal Substances 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000005431 greenhouse gas Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000003631 wet chemical etching Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
Description
Technisches Gebiettechnical area
Die Erfindung bezieht sich auf ein Verfahren sowie eine Vorrichtung zur Herstellung von Solarzellen mit lokalen Oberflächenvertiefungen, insbesondere können mit dem Verfahren undiffundierte und/oder diffundierten Gebiete an der Halbleiteroberfläche der Solarzelle lokal entfernt werden sowie dielektrische Schichten, mit denen die Solarzellenoberfläche überzogen ist.The The invention relates to a method and a device for the production of solar cells with local surface depressions, in particular can diffused and / or diffused regions with the method on the semiconductor surface the solar cell are removed locally as well as dielectric layers, with which the solar cell surface covered is.
Es sind unterschiedliche Solarzellentypen auf der Basis von kristallinen Siliziumscheiben mit Vertiefungen und Erhebungen an der Oberfläche bekannt. Ein solches Beispiel ist die sogenannte „Buried Contact"-Solarzelle (US-PAT 4726850). Das charakteristische Merkmal dieses Zelltyps sind die schmalen, tiefen Gräben, die die Position und die Form der Metallisierung vorgeben. Die Gräben werden mittels stromloser Galvanik mit Metall gefüllt. Gegenüber konventionellen Siebdruck-Silizium-Solarzellen konnten so die Abschattungsverluste reduziert werden. Zur Herstellung der Gräben werden relativ zum zu strukturierenden Material bewegte mechanische Strukturierungselemente oder Laserstrahlen eingesetzt.It are different solar cell types based on crystalline Silicon wafers with depressions and elevations on the surface known. One such example is the so-called "buried contact" solar cell (US Pat 4726850). The characteristic feature of this cell type are the narrow, deep trenches, which dictate the position and shape of the metallization. The trenches will be electroless plating filled with metal. Compared to conventional screen-printed silicon solar cells could thus be reduced the Abschattungsverluste. For the production the trenches be moved relative to the material to be structured moving mechanical Structuring elements or laser beams used.
Nachteilig ist dabei, dass diese Verfahren eine mehrere μm tiefe Schädigung unterhalb der Siliziumoberfläche hervorrufen, die mit Hilfe von zusätzlichen Ätzschritten entfernt werden muss. Weiterhin wird die Siliziumscheibe mechanisch und/oder thermisch belastet während der Grabenherstellung, was bei der Solarzellenherstellung zu erhöhten Bruchraten führt.adversely is that these processes cause damage several micrometers deep below the silicon surface, with the help of additional etching steps must be removed. Furthermore, the silicon wafer becomes mechanical and / or thermally stressed during trenching, which leads to increased breakage rates in solar cell production leads.
Aus
Patent
Auch dieser Zelltyp weist gegenüber konventionellen Siebdruck-Solarzellen verminderte Abschattungsverluste auf. Außerdem ist die elektrische Qualität der aufgedampften Metallkontakte den siebgedruckten und den galvanisch hergestellten Metallkontakten überlegen. Die Kanten und flankenartigen Bereiche werden hergestellt durch relativ zum zu strukturierenden Material bewegte mechanische Strukturierungselemente, die Verwendung von Laserstrahlen oder durch Ätztechniken.Also this cell type faces conventional screen-printed solar cells reduced shading losses on. Furthermore is the electrical quality the vapor-deposited metal contacts the screen-printed and the galvanic superior to manufactured metal contacts. The edges and flank-like areas are made by moving mechanical structuring elements relative to the material to be structured, the use of laser beams or by etching techniques.
Bezüglich der ersten beiden genannten Strukturierungsverfahren gelten die gleichen Nachteile wie oben bereits erwähnt. Um die Kanten und flankenartigen Bereiche mittels Ätztechnik herzustellen, ist es erforderlich vor der Ätzung eine Maskierungsschicht aufzubringen und diese Schicht in weiteren Prozessschritten (z.B. mit photolithographischen Verfahren oder Laserablation) lokal zu entfernen. Anschließend wird mittels nasschemischem Ätzen oder Plasmaätzen das Silizium an den geöffneten Bereichen der Maskierungsschicht entfernt. Nachteilig ist an diesem Verfahren, dass es aufwendig ist.Regarding the the first two structuring procedures are the same Disadvantages as mentioned above. To the edges and flank-like areas by means of etching It is necessary to prepare a masking layer before etching apply and this layer in further process steps (e.g. with photolithographic or laser ablation) locally too remove. Subsequently is by wet chemical etching or plasma etching the silicon at the open Removed areas of the masking layer. The disadvantage of this Procedure that it is expensive.
Eine Solarzelle ohne Vorderseitenmetallisierung ist aus (R.M. Swanson, „Point Contact Silicon Solar Cells", Electric Power Research Institute Rep. AP-2859, May 1983) bekannt. Dieses Zellkonzept wurde ständig weiterentwickelt (US-PAT 5053083). Eine vereinfachte Version dieser Punktkontakt-Solarzelle wird von der US-Firma SunPower produziert (K.R. McIntosh et al., Proc. 3rd World Conference on Photovoltaic Energy Conv., 2004, p. 971-974). Zu deren Herstellung werden dabei in mehreren Maskierungsschritten unterschiedlich dotierte Gebiete nebeneinander erzeugt und durch Aufbringen einer teilweise mehrschichtigen Metallstruktur metallisiert bzw. kontaktiert. Nachteilig ist dabei, dass diese Verfahren mehrere justierende Maskenschritte benötigen und dadurch aufwendig sind.A Solar cell without front side metallization is made of (R.M. Swanson, "Point Contact Silicon Solar Cells ", Electric Power Research Institute Rep. AP-2859, May 1983). This cell concept became permanent further developed (US Pat 5053083). A simplified version of this Point contact solar cell is produced by the US company SunPower (K.R. McIntosh et al., Proc. 3rd World Conference on Photovoltaic Energy Conv., 2004, p. 971-974). For their preparation are doing in several masking steps differently doped areas created side by side and by Plating a partially multi-layered metal structure metallized or contacted. The disadvantage here is that these methods several need adjusting mask steps and thereby are expensive.
In
Patent
Eine
von diesem Zelltyp abgeleitete vereinfachte Solarzellenstruktur
Aufgabe der ErfindungTask of invention
Der Erfindung liegt die Aufgabe zugrunde, ein Verfahren sowie eine Vorrichtung zur Herstellung von Solarzellen mit lokalen Oberflächenvertiefungen weiterzubilden, dass die vorstehend dargelegten, beim Stand der Technik auftretenden Nachteile umgangen werden können. Insbesondere können mit dem Verfahren undiffundierte und/oder diffundierten Gebiete an der Halbleiteroberfläche der Solarzelle sowie dielektrische Schichten, mit denen die Solarzellenoberfläche überzogen ist, lokal entfernt werden.Of the Invention is based on the object, a method and a device for the further development of solar cells with local surface depressions, that set forth above, occurring in the prior art Disadvantages can be avoided. In particular, you can diffused and / or diffused regions with the method on the semiconductor surface the solar cell and dielectric layers with which the solar cell surface coated is to be removed locally.
Darstellung der Erfindungpresentation the invention
Die Lösung der der Erfindung zugrunde liegenden Aufgabe ist im Anspruch 1 angegeben. Gegenstand des Anspruchs 5 ist eine erfindungsgemäße Vorrichtung, mit der die Solarzellen hergestellt werden können. Den Erfindungsgedanken vorteilhaft ausbildende Merkmale sind Gegenstand der Unteransprüche.The solution the object underlying the invention is specified in claim 1. The subject of claim 5 is a device according to the invention, with which the solar cells can be produced. The idea of the invention advantageous features forming the subject of the dependent claims.
Erfindungsgemäß ist das Verfahren zur Herstellung von Halbleiter-Solarzellen mit lokalen Oberflächenvertiefungen, insbesondere zur lokalen Entfernung von diffundierten und/oder undiffundierten Gebieten der Solarzelle, dadurch ausgezeichnet, dass eine als Schablone dienende Metall-Polymer-Folie (z.B. Kupfer-Polyimid) mit lokalen Öffnungen in direkten Kontakt mit der diffundierten und/oder undiffundierten Gebieten der Solarzelle gebracht wird, so dass sich die Polymer-Seite in direktem Kontakt mit der Halbleiteroberfläche befindet. Die Anordnung befindet sich in einem Vakuum und in die Vakuumkammer wird ein reaktives Gas (z.B. SF6 oder CF4) oder ein reaktives Gasgemisch (z.B. SF6/O2 oder SF6/Ar) eingelassen. Durch Anlegen einer elektrischen Spannung (typischerweise einige zehn bis einige hundert Volt) zwischen der Metallelektrode der Metall-Polymer-Folie und der Halbleiteroberfläche wird das reaktive Gas in den lokalen Öffnungen zu einer örtlich durch die Ausdehnung der Öffnungen begrenzten Gasentladung angeregt. An den Öffnungen kommt es zu lokalen Mikroentladungen und das Halbleitermaterial wird mit hohen Raten abgetragen durch reaktives Plasmaätzen. Das vorgeschlagene Verfahren zur Herstellung von Solarzellen kann auch zum lokalen Abtrag von auf der Solarzellenoberfläche aufgebrachten Dünnschichten z.B. aus Siliziumdioxid, Siliziumnitrid oder amorphem Silizium genutzt werden, um einen elektrischen Kontakt eines Metalls zur Basis oder zum Emitter der Solarzelle herzustellen. Außerdem kann das Verfahren zur elektrischen Trennung von auf Trägersubstraten (z.B. Glas) aufgebrachten Dünnschichtsolarzellen eingesetzt werden. Dass das beschriebene Verfahren grundsätzlich geeignet ist, um Silizium lokal zu ätzen, wurde bereits in der Literatur demonstriert (R. M. Sankaran and K. P. Geapis, Applied Physics Letters 79 (2001) 593). Alternativ kann eine Metall-Polymer-Metall-Folie verwendet werden und die elektrische Spannung wird zwischen beiden Metall-Folien angelegt, was den Vorteil hat, dass kein elektrischer Kontakt zum Halbleitermaterial hergestellt werden muss. Die Erzeugung von Mikroentladungen in kreisförmigen Öffnungen (150 μm Durchmesser) in ca. 30 μm dicken Metall-Polymer-Metall-Folien wurde bereits in der Literatur nachgewiesen (S. J. Park et al., Applied Physics Letters 77 (2000) 199).According to the invention, the method for the production of semiconductor solar cells with local surface depressions, in particular for the local removal of diffused and / or undiffused areas of the solar cell, characterized in that serving as a template metal-polymer film (eg copper polyimide) with local openings is brought into direct contact with the diffused and / or undiffused areas of the solar cell, so that the polymer side is in direct contact with the semiconductor surface. The arrangement is in a vacuum and in the vacuum chamber, a reactive gas (eg SF 6 or CF 4 ) or a reactive gas mixture (eg SF 6 / O 2 or SF 6 / Ar) is admitted. By applying an electrical voltage (typically several tens to several hundred volts) between the metal electrode of the metal-polymer film and the semiconductor surface, the reactive gas in the local openings is excited to a gas discharge localized by the expansion of the openings. At the openings, there are local micro-discharges and the semiconductor material is removed at high rates by reactive plasma etching. The proposed method for producing solar cells can also be used for the local removal of thin films deposited on the solar cell surface, for example of silicon dioxide, silicon nitride or amorphous silicon, in order to produce electrical contact of a metal with the base or emitter of the solar cell. In addition, the method can be used for the electrical separation of thin-film solar cells applied to carrier substrates (eg glass). The fact that the process described is fundamentally suitable for locally etching silicon has already been demonstrated in the literature (RM Sankaran and KP Geapis, Applied Physics Letters 79 (2001) 593). Alternatively, a metal-polymer-metal foil may be used and the voltage is applied between both metal foils, which has the advantage that no electrical contact to the semiconductor material has to be made. The generation of microdischarges in circular openings (150 .mu.m diameter) in approximately 30 .mu.m thick metal-polymer-metal foils has already been demonstrated in the literature (SJ Park et al., Applied Physics Letters 77 (2000) 199).
Die Vorrichtung, mit der der gezielte lokale Materialabtrag vorgenommen wird, besteht aus einem vakuumdichten Gehäuse, in dessen eine Wand die oben beschriebene Metall-Polymer-Folie oder die Metall-Polymer-Metall-Folie mit lokalen Öffnungen eingesetzt wird. Die Folie wird in Kontakt mit der Halbleiteroberfläche gebracht, indem das Gehäuse dicht auf die zur strukturierende Solarzellenoberfläche gedrückt wird. Anschließend wird im Gehäuse mittels einer Pumpe ein Vakuum erzeugt, wobei das zu evakuierende Gehäusevolumen möglichst klein zu wählen ist, so dass die Abpumpzeiten klein sind. Dann wird das reaktive Gas in die Kammer eingelassen. Durch Anlegen einer Spannung zwischen Metall-Folie und Halbleiter bzw. zwischen den beiden Metall-Folien der Metall-Polymer-Metall-Folie wird das Plasma an den Öffnungen der Folie gezündet und es erfolgt ein lokaler Materialabtrag der darunter liegenden Solarzelle. Ein großer Vorteil dieser Vorrichtung gegenüber konventionellen Plasmaätzanlagen liegt in dem sehr kleinen Volumen, was geringe Evakuierungszeiten und geringe Mengen der reaktiven Gase erforderlich macht. Die in der Halbleitertechnologie eingesetzten reaktiven Gase haben häufig eine stark umweltbelastende Wirkungen, z.B. wirkt SF6 als Treibhausgas. Daher ist die Vorrichtung im Vergleich zu konventionellen Plasmaätzanlagen weniger umweltbelastend.The device, with which the targeted local removal of material is carried out, consists of a vacuum-tight housing, in which one wall the above-described metal-polymer film or the metal-polymer-metal film with local openings is used. The film is brought into contact with the semiconductor surface by pressing the housing close to the solar cell surface to be structured. Subsequently, a vacuum is generated in the housing by means of a pump, wherein the housing volume to be evacuated is to be selected as small as possible, so that the pumping times are small. Then the reactive gas is admitted into the chamber. By applying a voltage between metal foil and semiconductor or between the two Metal foils of the metal-polymer-metal foil, the plasma is ignited at the openings of the film and there is a local material removal of the underlying solar cell. A major advantage of this device over conventional plasma etching equipment is its very small volume, which requires low evacuation times and small amounts of reactive gases. The reactive gases used in semiconductor technology often have a strong environmental impact, for example, SF 6 acts as a greenhouse gas. Therefore, the device is less polluting than conventional plasma etching equipment.
Wege zur Ausführung der ErfindungWays to execute the invention
Die Erfindung wird nachstehend ohne Beschränkung des allgemeinen Erfindungsgedankens anhand von Ausführungsbeispielen unter Bezugnahme auf die Zeichnung exemplarisch beschrieben. Es zeigen:The Invention will be described below without limiting the general inventive concept of exemplary embodiments described by way of example with reference to the drawing. Show it:
In
Eine
Ausführungsform
der Vorrichtung, mit der der gezielte lokale Materialabtrag der
Solarzelle vorgenommen wird, ist in
- 11
- Solarzellesolar cell
- 22
- Basis-BereichBase region
- 33
- Emitter-BereichEmitter region
- 44
- PassivierschichtPassivation layer
- 55
- BasismetallkontaktBase metal contact
- 66
- EmittermetallkontaktEmitter metal contact
- 77
- AntireflexschichtAnti-reflective coating
- 88th
- Metallfoliemetal foil
- 99
- Polymerfoliepolymer film
- 1010
- Spannungsquellevoltage source
- 1111
- Plasmaplasma
- 1212
- Vakuumgehäusevacuum housing
- 1313
- Gaseinlassgas inlet
- 1414
- Gasauslassgas outlet
- 1515
- Reaktives Gas oder Gasgemischreactive Gas or gas mixture
Claims (8)
Priority Applications (1)
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DE200410061604 DE102004061604A1 (en) | 2004-12-17 | 2004-12-17 | Semiconductor-solar cell producing method, involves directly contacting films having openings with solar cell areas, applying voltage between cell surface and one film, locally removing cell material in openings after limiting gas discharge |
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DE200410061604 DE102004061604A1 (en) | 2004-12-17 | 2004-12-17 | Semiconductor-solar cell producing method, involves directly contacting films having openings with solar cell areas, applying voltage between cell surface and one film, locally removing cell material in openings after limiting gas discharge |
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DE102004061604A1 true DE102004061604A1 (en) | 2006-06-29 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008040273A2 (en) | 2006-09-05 | 2008-04-10 | Q-Cells Se | Local heterostructure contacts |
US8013239B2 (en) | 2002-08-29 | 2011-09-06 | Day4 Energy Inc. | Electrode for photovoltaic cells, photovoltaic cell and photovoltaic module |
DE102010026331A1 (en) * | 2010-07-07 | 2012-02-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for removing material from solids |
US8293568B2 (en) | 2008-07-28 | 2012-10-23 | Day4 Energy Inc. | Crystalline silicon PV cell with selective emitter produced with low temperature precision etch back and passivation process |
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US5053083A (en) * | 1989-05-08 | 1991-10-01 | The Board Of Trustees Of The Leland Stanford Junior University | Bilevel contact solar cells |
-
2004
- 2004-12-17 DE DE200410061604 patent/DE102004061604A1/en not_active Ceased
Patent Citations (2)
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US4638952A (en) * | 1985-08-08 | 1987-01-27 | Williams Patent Crusher And Pulverizer Company | Method of fluid coke reduction |
US5053083A (en) * | 1989-05-08 | 1991-10-01 | The Board Of Trustees Of The Leland Stanford Junior University | Bilevel contact solar cells |
Non-Patent Citations (2)
Title |
---|
Sankaran, R.M., Giapis, K.P.: High-pressure micro- discharges in etching and deposition applications. In: J. Phys. D. Appl. Phys. 2003, Vol. 36, S. 2914 -2921 |
Sankaran, R.M., Giapis, K.P.: High-pressure micro-discharges in etching and deposition applications.In: J. Phys. D. Appl. Phys. 2003, Vol. 36, S. 2914-2921 * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8013239B2 (en) | 2002-08-29 | 2011-09-06 | Day4 Energy Inc. | Electrode for photovoltaic cells, photovoltaic cell and photovoltaic module |
WO2008040273A2 (en) | 2006-09-05 | 2008-04-10 | Q-Cells Se | Local heterostructure contacts |
WO2008040273A3 (en) * | 2006-09-05 | 2008-06-05 | Maximilian Scherff | Local heterostructure contacts |
JP2010503222A (en) * | 2006-09-05 | 2010-01-28 | キュー−セルズ エスエー | Method and apparatus for generating local heterocontacts |
US7943416B2 (en) | 2006-09-05 | 2011-05-17 | Q-Cells Se | Local heterostructure contacts |
US8293568B2 (en) | 2008-07-28 | 2012-10-23 | Day4 Energy Inc. | Crystalline silicon PV cell with selective emitter produced with low temperature precision etch back and passivation process |
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