DD132718A3 - Nadeltraeger zum pruefen von halbleiterchips - Google Patents

Nadeltraeger zum pruefen von halbleiterchips

Info

Publication number
DD132718A3
DD132718A3 DD19794677A DD19794677A DD132718A3 DD 132718 A3 DD132718 A3 DD 132718A3 DD 19794677 A DD19794677 A DD 19794677A DD 19794677 A DD19794677 A DD 19794677A DD 132718 A3 DD132718 A3 DD 132718A3
Authority
DD
German Democratic Republic
Prior art keywords
semiconductor chips
needle carrier
testing semiconductor
testing
needle
Prior art date
Application number
DD19794677A
Other languages
English (en)
Inventor
Werner Seewald
Hartmut Gocht
Karl-Heinz Krueger
Original Assignee
Werner Seewald
Hartmut Gocht
Krueger Karl Heinz
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Werner Seewald, Hartmut Gocht, Krueger Karl Heinz filed Critical Werner Seewald
Priority to DD19794677A priority Critical patent/DD132718A3/de
Priority to DE19772756383 priority patent/DE2756383C2/de
Priority to HUEE002547 priority patent/HU176088B/hu
Priority to SU787770106A priority patent/SU964556A1/ru
Publication of DD132718A3 publication Critical patent/DD132718A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DD19794677A 1977-03-21 1977-03-21 Nadeltraeger zum pruefen von halbleiterchips DD132718A3 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DD19794677A DD132718A3 (de) 1977-03-21 1977-03-21 Nadeltraeger zum pruefen von halbleiterchips
DE19772756383 DE2756383C2 (de) 1977-03-21 1977-12-17 Nadelträger zum Prüfen von Halbleiterchips
HUEE002547 HU176088B (en) 1977-03-21 1978-01-30 Pin holder for testing semiconductor chips
SU787770106A SU964556A1 (ru) 1977-03-21 1978-02-28 Иглоноситель дл контрол полупроводниковых микросхем

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD19794677A DD132718A3 (de) 1977-03-21 1977-03-21 Nadeltraeger zum pruefen von halbleiterchips

Publications (1)

Publication Number Publication Date
DD132718A3 true DD132718A3 (de) 1978-10-25

Family

ID=5507732

Family Applications (1)

Application Number Title Priority Date Filing Date
DD19794677A DD132718A3 (de) 1977-03-21 1977-03-21 Nadeltraeger zum pruefen von halbleiterchips

Country Status (4)

Country Link
DD (1) DD132718A3 (de)
DE (1) DE2756383C2 (de)
HU (1) HU176088B (de)
SU (1) SU964556A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR940001809B1 (ko) * 1991-07-18 1994-03-09 금성일렉트론 주식회사 반도체 칩의 테스터

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3453545A (en) * 1967-07-07 1969-07-01 Rca Corp Probe assembly for testing semiconductor wafers including a wafer vibrator for effecting good test connections
US3611128A (en) * 1968-07-26 1971-10-05 Hitachi Ltd Probe header for testing integrated circuits
US3781681A (en) * 1971-12-17 1973-12-25 Ibm Test probe apparatus
US3810017A (en) * 1972-05-15 1974-05-07 Teledyne Inc Precision probe for testing micro-electronic units

Also Published As

Publication number Publication date
DE2756383A1 (de) 1978-09-28
SU964556A1 (ru) 1982-10-07
DE2756383C2 (de) 1985-10-31
HU176088B (en) 1980-12-28

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