CY1108198T1 - Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων - Google Patents
Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικωνInfo
- Publication number
- CY1108198T1 CY1108198T1 CY20081100737T CY081100737T CY1108198T1 CY 1108198 T1 CY1108198 T1 CY 1108198T1 CY 20081100737 T CY20081100737 T CY 20081100737T CY 081100737 T CY081100737 T CY 081100737T CY 1108198 T1 CY1108198 T1 CY 1108198T1
- Authority
- CY
- Cyprus
- Prior art keywords
- specimen
- changes
- interference pattern
- microwaves
- irregularities
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Inorganic Insulating Materials (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
Αποκαλύπτονται μία συσκευή και μέθοδος για τον μη καταστρεπτικό έλεγχο διηλεκτρικών υλικών. Μονοχρωματική, συμφασική ηλεκτρομαγνητική ακτινοβολία (6), κατά προτίμηση στο εύρος συχνοτήτων των 5-50 gigahertz (δηλ. μικροκυμάτων) προσκρούει στο δείγμα. Σύμφωνα με τον Νόμο του Snell, τα μικροκύματα μεταδίδονται μερικώς και ανακλώνται μερικώς σε έκαστη διεπαφή όπου η διηλεκτρική σταθερά αλλάζει λόγω των ανωμαλιών. Ένα μέρος της ανακλώμενης δέσμης συγχωνεύεται με το σήμα ανακλώμενο από το δοκίμιο υπό έλεγχο. Αυτά τα δύο σήματα έχουν την ίδια συχνότητα, αλλά δύνανται να διαφέρουν σε πλάτος και φάση. Τα σήματα συγχωνεύονται για να παράγουν μιαν παρεμβατική σχηματομορφή, μίαν σχηματομορφή που αλλάζει καθώς το δοκίμιο αλλάζει, ή καθώς η θέση του δοκιμίου αλλάζει σε σχέση με έναν ανιχνευτή (2, 4). Ένας ηλεκτρονικός υπολογιστής (10) είναι προγραμματισμένος να διακρίνει τα χαρακτηριστικά γνωρίσματα στην παρεμβατική σχηματομορφή αποδοτέα σε ανωμαλίες στο υλικό από τα χαρακτηριστικά γνωρίσματα στην παρεμβατική σχηματομορφή αποδοτέα σε πηγές θορύβου.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US93507497A | 1997-09-25 | 1997-09-25 | |
EP98947203A EP1017996B1 (en) | 1997-09-25 | 1998-09-22 | Nondestructive testing of dielectric materials |
Publications (1)
Publication Number | Publication Date |
---|---|
CY1108198T1 true CY1108198T1 (el) | 2014-02-12 |
Family
ID=25466555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CY20081100737T CY1108198T1 (el) | 1997-09-25 | 2008-07-14 | Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων |
Country Status (9)
Country | Link |
---|---|
EP (1) | EP1017996B1 (el) |
AT (1) | ATE397210T1 (el) |
AU (1) | AU746997B2 (el) |
CA (1) | CA2304782C (el) |
CY (1) | CY1108198T1 (el) |
DE (1) | DE69839567D1 (el) |
DK (1) | DK1017996T3 (el) |
NZ (1) | NZ503713A (el) |
WO (1) | WO1999015883A1 (el) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2384831C (en) * | 1999-09-17 | 2009-05-19 | Sik-Institut For Livsmedel Och Bioteknik Ab | Apparatus and method for detection of foreign bodies in products |
EP1390726A4 (en) * | 2001-04-20 | 2004-06-16 | Commw Scient Ind Res Org | NON-DESTRUCTIVE TEST PROBE |
EP1779123A4 (en) * | 2004-08-05 | 2007-11-21 | Jack R Little Jr | IMAGING, NON DESTRUCTIVE HIGH RESOLUTION OF DIELECTRIC MATERIALS |
US7520667B2 (en) | 2006-05-11 | 2009-04-21 | John Bean Technologies Ab | Method and system for determining process parameters |
US9046605B2 (en) | 2012-11-05 | 2015-06-02 | The Curators Of The University Of Missouri | Three-dimensional holographical imaging |
WO2014079695A1 (de) * | 2012-11-23 | 2014-05-30 | Siemens Ag Österreich | Überwachung eines bauteils |
EP3779609B1 (fr) | 2019-08-13 | 2022-03-16 | Patek Philippe SA Genève | Mécanisme d'affichage pour pièce d'horlogerie |
SG10202004777YA (en) * | 2020-05-21 | 2021-12-30 | Wavescan Tech Pte Ltd | System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE564022A (el) * | 1957-01-16 | |||
US3025463A (en) * | 1957-11-22 | 1962-03-13 | Eino J Luoma | Apparatus for measurement of complex reflection coefficient |
SE8000410L (sv) * | 1979-01-20 | 1980-07-21 | Lambda Ind Science Ltd | Sprickdetektor |
JPS61274209A (ja) * | 1985-05-30 | 1986-12-04 | Furuno Electric Co Ltd | コンクリ−ト欠損等の検出装置 |
IT1201375B (it) * | 1985-11-08 | 1989-01-27 | Consiglio Nazionale Ricerche | Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore |
US5103181A (en) * | 1988-10-05 | 1992-04-07 | Den Norske Oljeselskap A. S. | Composition monitor and monitoring process using impedance measurements |
US5216372A (en) * | 1991-07-29 | 1993-06-01 | Colorado State University Research Foundation | Microwave steel belt location sensor for tires |
US5384543A (en) * | 1992-11-09 | 1995-01-24 | Martin Marietta Energy Systems, Inc. | Portable microwave instrument for non-destructive evaluation of structural characteristics |
US5393557A (en) * | 1992-12-17 | 1995-02-28 | Northrop Grumman Corporation | Method for measuring electromagnetic properties |
DE4311103A1 (de) * | 1993-04-05 | 1994-10-06 | Komi Koppelberg & Migl Kg | Verfahren und Vorrichtung zum Erkennen von Fehlern bei Glaskörpern |
DE69609336T2 (de) * | 1995-09-11 | 2001-03-15 | Yissum Research Development Company Of The Hebrew University Of Jerusalem, Jerusalem/Jerusalajim | Nahfeld-leitfähigkeits-mikroskop |
-
1998
- 1998-09-22 DK DK98947203T patent/DK1017996T3/da active
- 1998-09-22 WO PCT/US1998/019832 patent/WO1999015883A1/en active IP Right Grant
- 1998-09-22 AT AT98947203T patent/ATE397210T1/de not_active IP Right Cessation
- 1998-09-22 EP EP98947203A patent/EP1017996B1/en not_active Expired - Lifetime
- 1998-09-22 DE DE69839567T patent/DE69839567D1/de not_active Expired - Lifetime
- 1998-09-22 CA CA002304782A patent/CA2304782C/en not_active Expired - Lifetime
- 1998-09-22 NZ NZ503713A patent/NZ503713A/en not_active IP Right Cessation
- 1998-09-22 AU AU94034/98A patent/AU746997B2/en not_active Expired
-
2008
- 2008-07-14 CY CY20081100737T patent/CY1108198T1/el unknown
Also Published As
Publication number | Publication date |
---|---|
AU746997B2 (en) | 2002-05-09 |
DE69839567D1 (de) | 2008-07-10 |
NZ503713A (en) | 2001-09-28 |
AU9403498A (en) | 1999-04-12 |
EP1017996B1 (en) | 2008-05-28 |
CA2304782A1 (en) | 1999-04-01 |
ATE397210T1 (de) | 2008-06-15 |
CA2304782C (en) | 2007-03-27 |
EP1017996A4 (en) | 2003-04-23 |
EP1017996A1 (en) | 2000-07-12 |
DK1017996T3 (da) | 2008-09-15 |
WO1999015883A1 (en) | 1999-04-01 |
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