CY1108198T1 - Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων - Google Patents

Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων

Info

Publication number
CY1108198T1
CY1108198T1 CY20081100737T CY081100737T CY1108198T1 CY 1108198 T1 CY1108198 T1 CY 1108198T1 CY 20081100737 T CY20081100737 T CY 20081100737T CY 081100737 T CY081100737 T CY 081100737T CY 1108198 T1 CY1108198 T1 CY 1108198T1
Authority
CY
Cyprus
Prior art keywords
specimen
changes
interference pattern
microwaves
irregularities
Prior art date
Application number
CY20081100737T
Other languages
English (en)
Inventor
Jack R Little Jr
Original Assignee
Little, Jack, R., Jr.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Little, Jack, R., Jr. filed Critical Little, Jack, R., Jr.
Publication of CY1108198T1 publication Critical patent/CY1108198T1/el

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Inorganic Insulating Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

Αποκαλύπτονται μία συσκευή και μέθοδος για τον μη καταστρεπτικό έλεγχο διηλεκτρικών υλικών. Μονοχρωματική, συμφασική ηλεκτρομαγνητική ακτινοβολία (6), κατά προτίμηση στο εύρος συχνοτήτων των 5-50 gigahertz (δηλ. μικροκυμάτων) προσκρούει στο δείγμα. Σύμφωνα με τον Νόμο του Snell, τα μικροκύματα μεταδίδονται μερικώς και ανακλώνται μερικώς σε έκαστη διεπαφή όπου η διηλεκτρική σταθερά αλλάζει λόγω των ανωμαλιών. Ένα μέρος της ανακλώμενης δέσμης συγχωνεύεται με το σήμα ανακλώμενο από το δοκίμιο υπό έλεγχο. Αυτά τα δύο σήματα έχουν την ίδια συχνότητα, αλλά δύνανται να διαφέρουν σε πλάτος και φάση. Τα σήματα συγχωνεύονται για να παράγουν μιαν παρεμβατική σχηματομορφή, μίαν σχηματομορφή που αλλάζει καθώς το δοκίμιο αλλάζει, ή καθώς η θέση του δοκιμίου αλλάζει σε σχέση με έναν ανιχνευτή (2, 4). Ένας ηλεκτρονικός υπολογιστής (10) είναι προγραμματισμένος να διακρίνει τα χαρακτηριστικά γνωρίσματα στην παρεμβατική σχηματομορφή αποδοτέα σε ανωμαλίες στο υλικό από τα χαρακτηριστικά γνωρίσματα στην παρεμβατική σχηματομορφή αποδοτέα σε πηγές θορύβου.
CY20081100737T 1997-09-25 2008-07-14 Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων CY1108198T1 (el)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US93507497A 1997-09-25 1997-09-25
EP98947203A EP1017996B1 (en) 1997-09-25 1998-09-22 Nondestructive testing of dielectric materials

Publications (1)

Publication Number Publication Date
CY1108198T1 true CY1108198T1 (el) 2014-02-12

Family

ID=25466555

Family Applications (1)

Application Number Title Priority Date Filing Date
CY20081100737T CY1108198T1 (el) 1997-09-25 2008-07-14 Μη καταστρεπτικη δοκιμη διηλεκτρικων υλικων

Country Status (9)

Country Link
EP (1) EP1017996B1 (el)
AT (1) ATE397210T1 (el)
AU (1) AU746997B2 (el)
CA (1) CA2304782C (el)
CY (1) CY1108198T1 (el)
DE (1) DE69839567D1 (el)
DK (1) DK1017996T3 (el)
NZ (1) NZ503713A (el)
WO (1) WO1999015883A1 (el)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2384831C (en) * 1999-09-17 2009-05-19 Sik-Institut For Livsmedel Och Bioteknik Ab Apparatus and method for detection of foreign bodies in products
EP1390726A4 (en) * 2001-04-20 2004-06-16 Commw Scient Ind Res Org NON-DESTRUCTIVE TEST PROBE
EP1779123A4 (en) * 2004-08-05 2007-11-21 Jack R Little Jr IMAGING, NON DESTRUCTIVE HIGH RESOLUTION OF DIELECTRIC MATERIALS
US7520667B2 (en) 2006-05-11 2009-04-21 John Bean Technologies Ab Method and system for determining process parameters
US9046605B2 (en) 2012-11-05 2015-06-02 The Curators Of The University Of Missouri Three-dimensional holographical imaging
WO2014079695A1 (de) * 2012-11-23 2014-05-30 Siemens Ag Österreich Überwachung eines bauteils
EP3779609B1 (fr) 2019-08-13 2022-03-16 Patek Philippe SA Genève Mécanisme d'affichage pour pièce d'horlogerie
SG10202004777YA (en) * 2020-05-21 2021-12-30 Wavescan Tech Pte Ltd System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE564022A (el) * 1957-01-16
US3025463A (en) * 1957-11-22 1962-03-13 Eino J Luoma Apparatus for measurement of complex reflection coefficient
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
JPS61274209A (ja) * 1985-05-30 1986-12-04 Furuno Electric Co Ltd コンクリ−ト欠損等の検出装置
IT1201375B (it) * 1985-11-08 1989-01-27 Consiglio Nazionale Ricerche Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore
US5103181A (en) * 1988-10-05 1992-04-07 Den Norske Oljeselskap A. S. Composition monitor and monitoring process using impedance measurements
US5216372A (en) * 1991-07-29 1993-06-01 Colorado State University Research Foundation Microwave steel belt location sensor for tires
US5384543A (en) * 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5393557A (en) * 1992-12-17 1995-02-28 Northrop Grumman Corporation Method for measuring electromagnetic properties
DE4311103A1 (de) * 1993-04-05 1994-10-06 Komi Koppelberg & Migl Kg Verfahren und Vorrichtung zum Erkennen von Fehlern bei Glaskörpern
DE69609336T2 (de) * 1995-09-11 2001-03-15 Yissum Research Development Company Of The Hebrew University Of Jerusalem, Jerusalem/Jerusalajim Nahfeld-leitfähigkeits-mikroskop

Also Published As

Publication number Publication date
AU746997B2 (en) 2002-05-09
DE69839567D1 (de) 2008-07-10
NZ503713A (en) 2001-09-28
AU9403498A (en) 1999-04-12
EP1017996B1 (en) 2008-05-28
CA2304782A1 (en) 1999-04-01
ATE397210T1 (de) 2008-06-15
CA2304782C (en) 2007-03-27
EP1017996A4 (en) 2003-04-23
EP1017996A1 (en) 2000-07-12
DK1017996T3 (da) 2008-09-15
WO1999015883A1 (en) 1999-04-01

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