CN87208603U - Semiconductor laser radial width testing instrument using pressure scanning - Google Patents
Semiconductor laser radial width testing instrument using pressure scanning Download PDFInfo
- Publication number
- CN87208603U CN87208603U CN 87208603 CN87208603U CN87208603U CN 87208603 U CN87208603 U CN 87208603U CN 87208603 CN87208603 CN 87208603 CN 87208603 U CN87208603 U CN 87208603U CN 87208603 U CN87208603 U CN 87208603U
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- Prior art keywords
- air
- pressure
- pressure chamber
- etalon
- utility
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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- Measuring Fluid Pressure (AREA)
Abstract
The utility model relates to a semiconductor laser radial width testing instrument using pressure scanning, which is a testing instrument for the parameters of a laser. The utility model is composed of a telescopic system, an atmospheric pressure chamber, an F-P etalon, a pneumatic control system and a pressure sensor. The radial shape and the mode of laser can be directly described by an x-y recorder; meanwhile, the number value of the radial width of the laser can be directly red out by a Z-80 single-board computer. The utility model has the advantages of simple structure, convenient operation, low cost, high measuring precision, etc.; the needed environmental conditions are not specific. The utility model not only can test the radial width of semiconductor lasers, but also can be made into an interferometer to be used for testing the refractive index and the micrometric displacement of gas.
Description
The utility model belongs to the testing apparatus of laser instrument, is a kind of semiconductor laser test Instrument of Line Width device.
At present, the domestic ready-made instrument that does not also have the semiconductor laser wire width measuring, external commercial scanning F-P spectrometer and the employing self-heterodyne method of adopting usually measured.The F-P spectrometer measurement mainly changes light path with realization scanning by regulating F-P chamber length, and is furnished with computer control, but it is relatively more difficult to measure the long subtle change in F-P chamber; The self-heterodyne method is a kind of high-precision measuring method, and it utilizes modulation along separate routes and realizes accurate measurement by the single-mode fiber more than the km, but total system involves great expense very difficult the realization.
It is convenient that the purpose of this utility model is to develop a kind of measurement, the cheap and semiconductor laser test Instrument of Line Width that is easy to realize.
The utility model adopts pressure scanning F-P etalon, changes light path by the refraction that changes gas in the F-P chamber, interference fringe is changed and measures the live width of semiconductor laser.The utility model is made up of telescopic system, F-P etalon and air-pressure chamber etc., its characteristics are that the F-P etalon is placed in the sealing air-pressure chamber, the pneumatic control system of air pressure change communicates with air-pressure chamber in the control air-pressure chamber, and air-pressure chamber also links to each other with the pressure transducer of reflection air pressure signal.The F-P etalon has decisive influence to measurement range and precision, changes the etalon that is coated with different centre wavelength highly reflecting films, can measure the laser linewidth of different-waveband; Improve the reflectivity (can increase coating layers) of highly reflecting films, then can improve measuring accuracy, for example reflectivity is 97% o'clock, and measuring accuracy can reach 10
More than, along with the reflectivity raising of highly reflecting films, measuring accuracy can reach 10
-4～10
The order of magnitude.Pneumatic control system is made up of filter bulb, valve, needle-valve and mechanical pump, and air pressure control can adopt mechanical pump to bleed, and air valve slowly venting is realized.
The utility model compared with prior art, have simple in structure, easy to operate, stable performance and low cost and other advantages, it does not have specific (special) requirements to environmental baseline, measuring accuracy is higher, mixes visible light (6328
) the F-P etalon, can make interferometer, be used for measurement gas refractive index and micrometric displacement.
Fig. 1 is a fundamental diagram of the present utility model.The light beam of semiconductor laser (1) becomes directional light by telescopic system (2), produces multiple-beam interference by the F-P etalon (4) that is placed in the air-pressure chamber (3).When pneumatic control system (9) changed air pressure in the air-pressure chamber (3), then refractive index changed, and caused the change of optical path difference and made moving interference fringes.The variation and the interference fringe of record air pressure are intensity variations, after signal is handled, can calculate live width △ λ by following formula:
△λ＝ (λ)/(n) · (β)/(P
S) △P。
Wherein λ is an optical maser wavelength, and n is a gas refracting index, P
S=760 torrs are standard atmospheric pressure, constant β=2.94 * 10
-4, △ P is the change amount of air pressure.At signal collection with in handling, the pressure information of air-pressure chamber (3) is transferred to x-y registering instrument (10) and Z-80 single card microcomputer (11) by baroceptor (5); After light signal scioptics (6) focus on, collect, signal is transferred to x-y registering instrument (10) and Z-80 single card microcomputer (11) through power meter (8) back by probe (7); Linear and the pattern that x-y registering instrument (10) can directly draw laser according to two signals, the rough calculation line width values is directly read the accurate numerical value of live width after Z-80 single card microcomputer (11) then can be handled according to two signals.
Fig. 2 is a structural representation of the present utility model.
The utility model can be implemented in the following ways: the filter bulb (9a) of air-pressure chamber (3), telescopic system (2), pressure transducer (5), track (14) and pneumatic control system (9), valve (9b) and needle-valve (9c) are made of one, and the material of air-pressure chamber (3) and track (14) can adopt metals such as copper, aluminium, steel; The quick silicon cup of pressure transducer (5) employing power is installed in the position near F-P etalon (4); Telescopic system (2) adopts the single hole conventional telescope; Filter bulb (9a), valve (9b) and needle-valve (9c) and mechanical pump (9d) all can adopt common product commonly used, connect together by conduit and air-pressure chamber (3).After F-P etalon (4) is adjusted, be fixed in the air-pressure chamber (3) and can before and after parallel moving, so that change the etalon of different wave length, (4a), (4b) and (4c) be respectively the F-P etalon of measuring (0.8～0.9) micron, (1.3～1.6) micron and (0.6～0.7) micron waveband, they can before and after parallel move, be fixed on side by side in the metallic room (3), the left end of track (14) is furnished with laser stent (12) and lens carrier (13), is convenient to fixed laser and arrangement and adjusting lens or optical fiber head.Total focus mirror (6) is equipped with on air-pressure chamber (3) the right; The right-hand member of track (14) is equipped with the support that can top to bottom, left and right, front and rear moves, and is used for laying probe (7).Power meter (8) can adopt the multifunctional light power meter; X-y registering instrument (10) and Z-80 single card microcomputer (11) can be matched according to customer requirements, routine x-y function recording instrument and TP801 single card microcomputer.
Claims (4)
1, pressure scanning semiconductor laser test Instrument of Line Width is made up of telescopic system, F-P etalon and air-pressure chamber etc., it is aerial to it is characterized in that the F-P etalon is placed on a sealing air pressure, the pneumatic control system (9) that gas changes in the control air-pressure chamber (3) communicates with air-pressure chamber, and air-pressure chamber also links to each other with the pressure transducer (5) of reflection air pressure signal.
2, test Instrument of Line Width according to claim 1 is characterized in that pneumatic control system (9) is made up of filter bulb (9a), valve (9b), needle-valve (9c) and mechanical pump (9d), and is connected with air-pressure chamber (3) by conduit.
3, test Instrument of Line Width according to claim 1 and 2, the filter bulb (9a), valve (9b) and the needle-valve (9c) that it is characterized in that air-pressure chamber (3), telescopic system (2), pressure transducer (5), track (14) and pneumatic control system (9) are made of one, the quick silicon cup of pressure transducer (5) employing power, and be installed in position near F-P etalon (4); Telescopic system (2) adopts the single hole conventional telescope.
4, test Instrument of Line Width according to claim 3, it is characterized in that F-P etalon (4) adopts three F-P etalons (4a) of measuring different-wavebands, (4b) and (4c) composition, the three is fixed in the air-pressure chamber (3) side by side, can before and after parallel move.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 87208603 CN87208603U (en) | 1987-05-25 | 1987-05-25 | Semiconductor laser radial width testing instrument using pressure scanning |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 87208603 CN87208603U (en) | 1987-05-25 | 1987-05-25 | Semiconductor laser radial width testing instrument using pressure scanning |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN87208603U true CN87208603U (en) | 1988-05-11 |
Family
ID=4823849
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 87208603 Ceased CN87208603U (en) | 1987-05-25 | 1987-05-25 | Semiconductor laser radial width testing instrument using pressure scanning |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN87208603U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103558185A (en) * | 2013-10-23 | 2014-02-05 | 国家电网公司 | Method and device for measuring refractive index of gas |
| CN103676142A (en) * | 2012-09-13 | 2014-03-26 | 福州高意通讯有限公司 | Scanning etalon |
| CN107339931A (en) * | 2017-06-29 | 2017-11-10 | 安徽皖仪科技股份有限公司 | Air pressure adjustment without motion part interferometer |
-
1987
- 1987-05-25 CN CN 87208603 patent/CN87208603U/en not_active Ceased
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN102628736B (en) * | 2012-04-20 | 2014-10-29 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103676142A (en) * | 2012-09-13 | 2014-03-26 | 福州高意通讯有限公司 | Scanning etalon |
| CN103558185A (en) * | 2013-10-23 | 2014-02-05 | 国家电网公司 | Method and device for measuring refractive index of gas |
| CN103558185B (en) * | 2013-10-23 | 2016-01-20 | 国家电网公司 | The method and apparatus of measurement gas refractive index |
| CN107339931A (en) * | 2017-06-29 | 2017-11-10 | 安徽皖仪科技股份有限公司 | Air pressure adjustment without motion part interferometer |
| CN107339931B (en) * | 2017-06-29 | 2019-04-16 | 安徽皖仪科技股份有限公司 | Air pressure adjustment without motion part interferometer |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CE01 | Termination of patent right |