CN2750618Y - An electrostatic discharge protection structure for USB interface - Google Patents

An electrostatic discharge protection structure for USB interface Download PDF

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Publication number
CN2750618Y
CN2750618Y CN 200420047020 CN200420047020U CN2750618Y CN 2750618 Y CN2750618 Y CN 2750618Y CN 200420047020 CN200420047020 CN 200420047020 CN 200420047020 U CN200420047020 U CN 200420047020U CN 2750618 Y CN2750618 Y CN 2750618Y
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CN
China
Prior art keywords
esd
protection structure
steering diode
usb interface
steering
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Expired - Lifetime
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CN 200420047020
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Chinese (zh)
Inventor
安飞
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ZTE Corp
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ZTE Corp
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Priority to CN 200420047020 priority Critical patent/CN2750618Y/en
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Publication of CN2750618Y publication Critical patent/CN2750618Y/en
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Expired - Lifetime legal-status Critical Current

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Abstract

The utility model relates to electrostatic discharge protection structure with a USB interface, which can be applied to various application fields with the USB interface. The utility model comprises at least a steering diode array and a zener diode, wherein the diode array is composed of a first and a second steering diodes; the first end of the first steering diode is connected with a USB data transmission line, and the second end which is relative to the first end is connected with a positive voltage power supply Vcc; the first end of the second steering diode is simultaneously connected with the first end of the first steering diode and the USB data transmission line, and the second end which is relative to the first end is connected with an earth end; the zener diode is connected between the positive voltage power supply Vcc and the earth end.

Description

A kind of ESD-protection structure of USB interface
Technical field
The utility model relates to a kind of USB interface data protection technology, relates in particular to a kind of ESD-protection structure of USB interface.This ESD-protection structure can be applied to the various applications with USB interface, such as USB flash disk, MP3, USB wireless network card, digital camera and PDA etc.
Background technology
Will produce static discharge ESD (Electricity andElectrostatic Discharge) when two object collisions or when separating, promptly static electric charge from a movement of objects to another object.Produce moving of static electric charge between two objects with different electromotive forces, be similar to once very little Lightning Process.The size of discharge capacity and discharge period, depend on the type of object and multiple factors such as environment on every side.When ESD has sufficiently high energy, the damage of semiconductor device will be caused.Static discharge may take place at any time, for example: the plug cable, or the I/O port of people's body-contacted device, or charged object contact semiconductor device, semiconductor device contact to earth and electrostatic field and electromagnetic interference produce sufficiently high voltage and cause static discharge ESD.
ESD can be divided into three types basically: the one, and the ESD that various machines cause; The 2nd, furniture moves or equipment moves the ESD that causes; The 3rd, human body contact or equipment move the ESD that causes.All these three kinds of ESD are the problems that should be noted that very much for the production of semiconductor device and the production of electronic product.The use of electronic product is the easiest to be subjected to the ESD that is caused by the human body contact and to damage.ESD can damage the interface device that is attached thereto generally speaking.Another kind of situation is that it(?) not possible can damage immediately by the device after ESD impacts, but decreased performance to cause product to break down too early.When integrated circuit (IC) stood ESD, the resistance of discharge loop is all very little usually can't to limit discharging current.For example: when being inserted into the cable of static electrification on the circuit interface, the resistance of discharge loop is almost nil, causes to flow into corresponding IC pin by the peak current that sparks up to tens amperes.Instantaneous large-current can major injury IC.The heat of local pyrexia even can melt the silicon chip tube core.ESD also comprises generally that to the damage of IC the interior metal connection is blown, and the destroyed transistor unit of passivation layer is burnt out.ESD also can cause the deadlock (LATCHUP) of IC, and the similar silicon controlled construction unit of this effect and cmos device inside is activated relevant.High voltage can activate these structures form big current channel generally from Vcc to the ground series interface part, locked electric current can be up to 1 ampere.Locked electric current can keep being de-energized up to device always, but IC has burnt because of overheated usually already till that time.
Because the application of the terminal data of existing a lot of equipment exchange is more and more, the mistake bag of data, the distortion of transmitted waveform occur through regular meeting in application, special even ESD can make near the equipment interference source can not carry out normal exchanges data.More and more be applied to the every field of data service based on the equipment of present USB interface.For this reason, must seek the basic processing scheme that solves antistatic and anti-impulse disturbances problem, to guarantee the operate as normal of equipment.
The utility model content
For this reason, the technical problems to be solved in the utility model provides the ESD-protection structure of the USB interface of a kind of electrostatic-discharge-proof and anti-impulse disturbances.
For solving the problems of the technologies described above, the utility model provides a kind of ESD-protection structure of USB interface.It comprises: an at least one steering diode array and a voltage stabilizing didoe, this diode array is made up of one first and one second steering diode, first end of this first steering diode is connected in a usb data transmission line, is connected in positive voltage source Vcc with the first end second opposed end; First end of this second steering diode is connected in first end and this usb data transmission line of this first steering diode simultaneously, is connected in earth terminal with the first end second opposed end, and this voltage stabilizing didoe is connected between positive voltage source Vcc and the earth terminal.
Wherein, first end of this first and second steering diode also is connected in an integrated circuit that needs electrostatic discharge (ESD) protection.The anode of this voltage stabilizing didoe is connected in earth terminal, and negative electrode is connected in positive voltage source Vcc.
If this ESD-protection structure comprises at least two steering diode arrays, this steering diode array should parallel with one another being connected between positive voltage source Vcc and the earth terminal.
When transient voltage took place, this steering diode array can be directed at transient voltage positive voltage source Vcc end or earth terminal.When the spike of forward occurred, first steering diode was in forward bias, the result be output voltage by clamped on VF+Vcc, on the contrary when negative-going pulse occurs, following diode is for anti-state partially, output voltage by clamped on-VF.The use of voltage stabilizing didoe can prevent the overvoltage (Over-voltage) of power line, with the protective circuit downstream components.
Electrostatic discharge protection structure of the present utility model suppresses the ESD impact in USB interface very effective, and the error rate of the transceiver channel of wireless network card is reduced greatly, and EVM is also optimised.
Description of drawings
Below in conjunction with accompanying drawing,, will make the technical solution of the utility model and beneficial effect thereof apparent by detailed description to specific embodiment of the utility model.In the accompanying drawing,
Fig. 1 is the electrical block diagram of the ESD-protection structure of the utility model USB interface.
Fig. 2 is the utility model ESD-protection structure shown in Figure 1 one concrete schematic diagram of using.
Fig. 3 is the esd protection topological diagram of the ESD-protection structure of the utility model USB interface.
Embodiment
At first, see also Fig. 1.Fig. 1 is the electrical block diagram of the ESD-protection structure of the utility model USB interface.This ESD-protection structure comprises: two steering diode arrays and a voltage stabilizing didoe.Each diode array is made up of one first and one second steering diode.This steering diode array is parallel with one another to be connected between positive voltage source Vcc and the earth terminal.First end of this first steering diode (pin 2,3) is connected in a usb data transmission line, is connected in positive voltage source Vcc with the first end second opposed end (pin 4); First end of this second steering diode is connected in first end (pin 2,3 ends) of this first steering diode, and be connected in this usb data transmission line simultaneously, be connected in earth terminal (pin 1) with the first end second opposed end, this voltage stabilizing didoe is connected between positive voltage source Vcc and the earth terminal.The anode of this voltage stabilizing didoe is connected in earth terminal, and negative electrode is connected in positive voltage source Vcc.
The quantity that should be pointed out that this steering diode array and voltage stabilizing didoe should not exceeded with present embodiment.Those of ordinary skill in the art should be understood that the quantity of this steering diode array and voltage stabilizing didoe can be followed concrete application need, and for example the quantity of data line is done corresponding design.
See also Fig. 2.Fig. 2 is applied to the circuit diagram of wireless network card of the mini USB interface of a WLAN (wireless local area network) for ESD-protection structure one of the present utility model.In the present embodiment, an end of this usb data transmission line (pin 2,3) is connected in an integrated circuit (IC) that needs electrostatic discharge (ESD) protection simultaneously.
See also Fig. 3.Fig. 3 is rail-to-rail (Rail-To-Rail) topological diagram of esd protection of the ESD-protection structure of the utility model USB interface.When the spike of forward occurred, first steering diode was in forward bias, the result be output voltage by clamped on VF+Vcc, on the contrary when negative-going pulse occurs, second steering diode is in anti-state partially, output voltage by clamped on-VF.Thereby the voltage of spacing output of the voltage range that makes output and output equates or approximately equal with supply voltage.
Need to prove that above-mentioned explanation only is the detailed description to the utility model preferred embodiment, narration only is explanation realizability of the present utility model and outstanding effect thereof, and concrete feature can not be used as the restriction to the technical solution of the utility model.

Claims (5)

1, a kind of ESD-protection structure of USB interface, it is characterized in that it comprises: an at least one steering diode array and a voltage stabilizing didoe, this diode array is made up of one first and one second steering diode, first end of this first steering diode is connected in a usb data transmission line, is connected in positive voltage source Vcc with the first end second opposed end; First end of this second steering diode is connected in first end and this usb data transmission line of this first steering diode simultaneously, is connected in earth terminal with the first end second opposed end, and this voltage stabilizing didoe is connected between positive voltage source Vcc and the earth terminal.
2, ESD-protection structure according to claim 1 is characterized in that first end of this first and second steering diode, also is connected in an integrated circuit that needs electrostatic discharge (ESD) protection.
3, ESD-protection structure according to claim 1 is characterized in that the anode of this voltage stabilizing didoe is connected in earth terminal, and negative electrode is connected in positive voltage source Vcc.
4, ESD-protection structure according to claim 1 is characterized in that described ESD-protection structure comprises at least two steering diode arrays.
5, ESD-protection structure according to claim 4 is characterized in that this steering diode array is parallel with one another to be connected between positive voltage source Vcc and the earth terminal.
CN 200420047020 2004-06-12 2004-06-12 An electrostatic discharge protection structure for USB interface Expired - Lifetime CN2750618Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200420047020 CN2750618Y (en) 2004-06-12 2004-06-12 An electrostatic discharge protection structure for USB interface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200420047020 CN2750618Y (en) 2004-06-12 2004-06-12 An electrostatic discharge protection structure for USB interface

Publications (1)

Publication Number Publication Date
CN2750618Y true CN2750618Y (en) 2006-01-04

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CN 200420047020 Expired - Lifetime CN2750618Y (en) 2004-06-12 2004-06-12 An electrostatic discharge protection structure for USB interface

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101364731B (en) * 2007-08-06 2010-10-06 北京中电华大电子设计有限责任公司 Electrostatic discharge protecting circuit for USB interface chip
CN101566871B (en) * 2009-05-15 2011-01-05 深圳创维-Rgb电子有限公司 USB protection device
CN102685124A (en) * 2012-05-07 2012-09-19 成都国腾实业集团有限公司 Cloud-terminal user recognizer
WO2016179829A1 (en) * 2015-05-14 2016-11-17 Texas Instruments Incorporated Usb controller esd protection apparatus and method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101364731B (en) * 2007-08-06 2010-10-06 北京中电华大电子设计有限责任公司 Electrostatic discharge protecting circuit for USB interface chip
CN101566871B (en) * 2009-05-15 2011-01-05 深圳创维-Rgb电子有限公司 USB protection device
CN102685124A (en) * 2012-05-07 2012-09-19 成都国腾实业集团有限公司 Cloud-terminal user recognizer
WO2016179829A1 (en) * 2015-05-14 2016-11-17 Texas Instruments Incorporated Usb controller esd protection apparatus and method
JP2018526809A (en) * 2015-05-14 2018-09-13 日本テキサス・インスツルメンツ株式会社 USB controller ESD protection apparatus and method
US10424950B2 (en) 2015-05-14 2019-09-24 Texas Instruments Incorporated USB controller ESD protection apparatus and method

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CX01 Expiry of patent term

Expiration termination date: 20140612

Granted publication date: 20060104