CN220773103U - Pin tool for testing electronic components - Google Patents
Pin tool for testing electronic components Download PDFInfo
- Publication number
- CN220773103U CN220773103U CN202321824451.8U CN202321824451U CN220773103U CN 220773103 U CN220773103 U CN 220773103U CN 202321824451 U CN202321824451 U CN 202321824451U CN 220773103 U CN220773103 U CN 220773103U
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- China
- Prior art keywords
- guide rail
- electronic components
- fixed
- carrier plate
- conductive column
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- 238000012360 testing method Methods 0.000 title claims abstract description 35
- 238000005192 partition Methods 0.000 claims description 8
- 230000003014 reinforcing effect Effects 0.000 claims description 5
- 238000003780 insertion Methods 0.000 abstract description 3
- 230000037431 insertion Effects 0.000 abstract description 3
- 239000011295 pitch Substances 0.000 abstract 2
- 238000005728 strengthening Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model provides a pin fixture for testing electronic components, which comprises a connecting rod, wherein two ends of the connecting rod are respectively connected and fixed with a first conductive column for being inserted into an insertion port of test equipment, one ends of the two first conductive columns are respectively connected and fixed with a guide rail strip, one side of the guide rail strip, which is away from the first conductive column, is provided with a slot, one sides of the two guide rail strips, which are away from the first conductive column, are respectively and slidingly connected with a carrier plate, one side of the carrier plate, which is connected and fixed with an insertion block, one side of the upper surface of the carrier plate is provided with a second conductive column, one side of the upper surface of the carrier plate, which is away from the second conductive column, is provided with a screw hole, and a limit screw is connected in the screw hole in a threaded manner. Electronic components with different pin pitches can be matched with the plug interfaces with fixed pitches on the test equipment.
Description
Technical Field
The utility model relates to a pin tool for testing electronic components, and belongs to the field of electronic component testing.
Background
The electronic components are components of electronic components, small-sized machines and instruments, and are a general term for electronic components such as capacitors, transistors, hairsprings, springs and the like. In the factory test of electronic components, pins on the electronic components need to be inserted into corresponding plug interfaces on test equipment, at present, the distance between the plug interfaces on the test equipment is fixed, and the distance between two pins on the electronic components is different due to different types of electronic components, so that the plug interfaces with fixed distance on the test equipment are difficult to be suitable for the electronic components with different pin distances, namely, the pin fixture for testing the electronic components with different pin distances is not suitable for the requirements of testing the electronic components, and therefore, a pin fixture for testing the electronic components is required to be designed, wherein the electronic components with different pin distances can be matched with the plug interfaces with fixed distance on the test equipment.
Disclosure of Invention
Aiming at the defects existing in the prior art, the utility model aims to provide a pin fixture for testing electronic components, so as to solve the problems in the prior art.
In order to achieve the above object, the present utility model is realized by the following technical scheme: the utility model provides a pin frock of electronic components test, includes the connecting rod, the first conductive column that is arranged in installing in test equipment interface is all connected and fixed with at the both ends of connecting rod, two first conductive column one end is all connected and is fixed with the guide rail strip, guide rail strip and connecting rod parallel arrangement, the slot has been seted up to the one side that the guide rail strip deviates from first conductive column, the slot is arranged along the length direction of guide rail strip, two equal sliding connection in one side that the guide rail strip deviates from first conductive column has the carrier plate, the one side of carrier plate face guide rail strip is connected and is fixed with the spliced block, spliced block slidable mounting is in the slot, the second conductive column is installed to carrier plate upper surface one side, set up in the second conductive column with the concentric circular chamber of arranging of second conductive column that is used for installing the last pin of electronic components, the diameter of circular chamber internal diameter is the same with the diameter of pin on the electronic components, first conductive column is connected with the second conductive column through the wire, one side that the carrier plate upper surface kept away from the second conductive column has been seted up, the internal thread is connected with spacing screw to the one end that the slot is connected with the limit screw and extends to the slot mutually.
Further, the upper surface of the second conductive column is recessed downwards to form a horn mouth with a wide upper part and a narrow lower part, and the horn mouth and the circular cavity are concentrically arranged.
Further, the two ends of the connecting rod are connected and fixed with positioning rings, and the two first conductive columns are respectively fixed in the two positioning rings.
Further, the middle positions of the surfaces of the two guide rail strips facing the connecting rod are respectively connected and fixed with a reinforcing rib, and one end, far away from the guide rail strips, of each reinforcing rib is connected and fixed with the connecting rod.
Further, a first positioning hole for limiting the end position of the lead is formed in the outer surface of one end, close to the guide rail, of the second conductive column, and a second positioning hole for limiting the end position of the lead is formed in the outer surface of one end, close to the guide rail, of the first conductive column.
Further, an insulating partition plate is arranged between the two guide rail strips, and the insulating partition plate is fixedly connected with the two guide rail strips.
Further, the cross section of the slot is T-shaped, and the cross section of the plug block is T-shaped.
Further, a round opening is formed in one side, far away from the screw holes, of the upper surface of the carrier plate, and one end of the second conductive column is fixed in the round opening.
The utility model has the beneficial effects that:
1. the first conductive columns matched with the plug interfaces on the test equipment are arranged at the two ends of the connecting rod, the first conductive columns are connected with the second conductive columns when wires are utilized, the relative positions of the carrier plate and the guide rail strips are adjusted according to the distance between the two pins on the electronic component, the carrier plate drives the plug blocks to slide along the slots, the distance between the two second conductive columns is further enlarged or reduced until the distance between the two second conductive columns meets the requirement of the distance between the two pins on the electronic component, and the limit screws in the screw holes are screwed, so that one ends of the limit screws extend into the slots and are tightly attached to the bottoms in the slots, the fixing of the relative positions of the carrier plate and the guide rail strips is completed, and the electronic components with different pin distances can be matched with the plug interfaces with fixed distances on the test equipment.
2. The upper surface of the second conductive column is downwards recessed to form a horn mouth with a wide upper part and a narrow lower part, so that the difficulty of inserting pins on the electronic component into the round cavity is reduced, and more efforts are not required to align the pins on the electronic component with the round cavity.
Drawings
Other features, objects and advantages of the present utility model will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
fig. 1 is a schematic structural diagram of a pin fixture for testing electronic components according to the present utility model;
FIG. 2 is a schematic diagram illustrating the assembly of a socket block and a carrier in a pin fixture for testing electronic components according to the present utility model;
FIG. 3 is a cross-sectional view of a second conductive post in a pin tool for testing electronic components according to the present utility model;
in the figure: the device comprises a connecting rod 1, a positioning ring 2, a first conductive column 3, a slot 4, a guide rail 5, a carrier plate 6, a limit screw 7, a second conductive column 8, a horn mouth 9, an insulating partition plate 10, a reinforcing rib 11, a screw hole 12, a round mouth 13, a plug block 14, a round cavity 15 and a positioning hole 16.
Detailed Description
The utility model is further described in connection with the following detailed description, in order to make the technical means, the creation characteristics, the achievement of the purpose and the effect of the utility model easy to understand.
Referring to fig. 1, the present utility model provides a technical solution: the utility model provides a pin frock of electronic components test, including connecting rod 1, the both ends of connecting rod 1 are all connected and are fixed with holding ring 2, all connect and be fixed with in two holding rings 2 and be used for installing the first conductive column 3 in test equipment interface, two first conductive column 3 one end all connect and be fixed with connecting rod 1 parallel arrangement's guide rail strip 5, two guide rail strips 5 are all connected and are fixed with strengthening rib 11 towards connecting rod 1's one side middle part position, wherein strengthening rib 11 is kept away from guide rail strip 5's one end and is connected fixedly with connecting rod 1, holding ring 2, strengthening rib 11's design has improved connecting rod 1, first conductive column 3 and guide rail strip 5 and has formed structural stability.
Referring to fig. 1, fig. 2 and fig. 3, a slot 4 with a T-shaped cross section is formed on one surface of the guide rail strip 5, which faces away from the first conductive column 3, the slot 4 is arranged along the length direction of the guide rail strip 5, one sides of the two guide rail strips 5, which face the guide rail strip 5, are both slidingly connected with a carrier plate 6, an inserting block 14 with a T-shaped cross section is fixedly connected to one surface of the carrier plate 6, the inserting block 14 is slidingly mounted in the slot 4, the insertion of the carrier plate 6 and the guide rail strip 5 is completed, a second conductive column 8 is mounted in a round opening 13 formed on one side of the upper surface of the carrier plate 6, a round cavity 15 which is concentrically arranged with the second conductive column 8 and used for inserting pins on electronic components is formed in the second conductive column 8, wherein the inner diameter of the round cavity 15 is the same as the diameter of the pins on the electronic components, the upper surface of the second conductive column 8 is downwards recessed to form a horn opening 9 which is wider at the upper part and narrower than the lower part, and the horn opening 9 which is concentrically arranged with the round cavity 15 is formed on the upper surface of the second conductive column 8, thus the difficulty of reducing the cost of inserting pins on the round cavity 15 on the electronic components and the electronic components.
Referring to fig. 1, fig. 2 and fig. 3, the first locating hole 16 for limiting the end position of the wire is provided on the outer surface of one end of the second conductive column 8 near the guide rail bar 5, the second locating hole for limiting the end position of the wire is provided on the outer surface of one end of the first conductive column 3 near the guide rail bar 5, the two ends of the wire are respectively fixed in the first locating hole 16 and the second locating hole, the first conductive column 3 forms an electrical connection relationship with the second conductive column 8 through the wire, the screw hole 12 provided on one side of the carrier plate 6 far away from the second conductive column 8 is connected with the limit screw 7 in an internal thread manner, one end of the limit screw 7 extends into the slot 4 and contacts with the bottom in the slot 4, the first conductive column 3 matched with the plug-in port on the test device is mounted at both ends of the connecting rod 1, the first conductive column 3 is connected with the second conductive column 8 when the wire is used, the relative position of the carrier plate 6 and the guide rail bar 5 is adjusted according to the distance between the two pins on the electronic component, the carrier plate 6 drives the plug-in block 14 to slide along the slot 4, the two second conductive columns 8 or the two pins 8 do not extend to the same distance as the two pins 7 are required to be tightly matched with the slot 4, and the two pins 7 are not matched with the two pins 6, the two pins are tightly connected with the corresponding pins 4, and the two pins are required to be tightly screwed to the corresponding to the two pins 4, and the two pins 4 are not matched with the corresponding position of the corresponding pins 4, and the corresponding position of the two pins 4 is fixed to the corresponding position to the position 4.
Referring to fig. 1, an insulating partition board 10 is disposed between two guide rail strips 5, where the insulating partition board 10 is connected and fixed with the two guide rail strips 5, so that under the blocking of the insulating partition board 10, the two second conductive columns 8 are prevented from contacting each other, and short circuit is prevented.
Although the present disclosure describes embodiments, not every embodiment is described in terms of a single embodiment, and such description is for clarity only, and one skilled in the art will recognize that the embodiments described in the disclosure as a whole may be combined appropriately to form other embodiments that will be apparent to those skilled in the art.
Claims (8)
1. The utility model provides a pin frock of electronic components test, includes connecting rod (1), its characterized in that: the utility model discloses a test device, including connecting rod (1), connecting rod (5), guide rail (8), socket (4) have been seted up to the one side that guide rail (5) deviate from first conductive post (3), socket (4) are arranged along the length direction of guide rail (5), two the one side that guide rail (5) deviate from first conductive post (3) is all sliding connection with carrier plate (6), carrier plate (6) are connected and are fixed with grafting piece (14) in the one side connection of guide rail (5), grafting piece (14) slidable mounting is in socket (4), second conductive post (8) are installed to carrier plate (6) upper surface one side, cavity (15) that are used for installing pin on the electronic components concentric arrangement with second conductive post (8) are seted up in second conductive post (8), carrier plate (6) face is connected with carrier plate (6) face and is fixed with grafting piece (14), screw diameter (12) are kept away from on first conductive post (8) on the same circular screw diameter (12), one end of the limit screw (7) extends into the slot (4) and is contacted with the inner bottom of the slot (4).
2. The pin fixture for testing electronic components of claim 1, wherein: the upper surface of the second conductive column (8) is recessed downwards to form a horn mouth (9) with a wide upper part and a narrow lower part, and the horn mouth (9) and the circular cavity (15) are concentrically arranged.
3. The pin fixture for testing electronic components of claim 1, wherein: the two ends of the connecting rod (1) are connected and fixed with positioning rings (2), and the two first conductive columns (3) are respectively fixed in the two positioning rings (2).
4. The pin fixture for testing electronic components of claim 1, wherein: two guide rail strips (5) are connected and fixed with reinforcing ribs (11) at the middle position of one surface of the guide rail strip (5) facing the connecting rod (1), and one end, far away from the guide rail strips (5), of each reinforcing rib (11) is connected and fixed with the connecting rod (1).
5. The pin fixture for testing electronic components of claim 1, wherein: the second conductive column (8) is close to the first locating hole (16) that is used for limiting the wire tip position of being offered to the one end surface that is close to guide rail strip (5), the second locating hole that is used for limiting the wire tip position is offered to the one end surface that is close to guide rail strip (5) of first conductive column (3).
6. The pin fixture for testing electronic components of claim 1, wherein: an insulating partition board (10) is arranged between the two guide rail strips (5), and the insulating partition board (10) is fixedly connected with the two guide rail strips (5).
7. The pin fixture for testing electronic components of claim 1, wherein: the cross section of the slot (4) is T-shaped, and the cross section of the plug block (14) is T-shaped.
8. The pin fixture for testing electronic components of claim 1, wherein: a round opening (13) is formed in one side, far away from the screw hole (12), of the upper surface of the carrier plate (6), and one end of the second conductive column (8) is fixed in the round opening (13).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321824451.8U CN220773103U (en) | 2023-07-12 | 2023-07-12 | Pin tool for testing electronic components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321824451.8U CN220773103U (en) | 2023-07-12 | 2023-07-12 | Pin tool for testing electronic components |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220773103U true CN220773103U (en) | 2024-04-12 |
Family
ID=90605554
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321824451.8U Active CN220773103U (en) | 2023-07-12 | 2023-07-12 | Pin tool for testing electronic components |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220773103U (en) |
-
2023
- 2023-07-12 CN CN202321824451.8U patent/CN220773103U/en active Active
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