CN219266372U - Quick detach formula probe module - Google Patents

Quick detach formula probe module Download PDF

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Publication number
CN219266372U
CN219266372U CN202320059009.4U CN202320059009U CN219266372U CN 219266372 U CN219266372 U CN 219266372U CN 202320059009 U CN202320059009 U CN 202320059009U CN 219266372 U CN219266372 U CN 219266372U
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CN
China
Prior art keywords
probe
probe set
pcb
electrically connected
lower probe
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Active
Application number
CN202320059009.4U
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Chinese (zh)
Inventor
李建辉
田二阳
宋平团
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Shenzhen Anberg Measurement And Control Technology Co ltd
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Shenzhen Anberg Measurement And Control Technology Co ltd
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Priority to CN202320059009.4U priority Critical patent/CN219266372U/en
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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Abstract

The utility model relates to a quick-dismantling type probe module, which has the technical scheme that the quick-dismantling type probe module comprises: the PCB comprises a fixed block for placing a PCB, a lower probe set for being electrically connected with the PCB, an upper probe set for being electrically connected with the lower probe set and a first FPC flat cable; the lower probe set penetrates through the PCB and then is spliced with the fixed block; the lower probe set is provided with a guide pin; the upper probe set is provided with a guide hole matched with the guide pin; under the condition that the guide pin is inserted into the guide hole, the upper probe set is electrically connected with the lower probe set; the first FPC flat cable is inserted into the upper probe set and is electrically connected with the upper probe set; the application has the advantages of accurate positioning, convenient replacement, convenient test, space reduction during assembly and more convenient assembly.

Description

Quick detach formula probe module
Technical Field
The utility model relates to the technical field of probe modules, in particular to a quick-dismantling type probe module.
Background
Probes are an essential component in most testing processes, such as in the development and production of electronic circuits, where it is often necessary to perform test analysis on the on-off and quality of signals, and where it is necessary to use precision test probes to provide non-destructive extraction of signals to a corresponding test system for integrated analysis.
The publication number that discloses in prior art is CN209028109U, and the file of name quick detach formula probe module mainly discloses, includes: the probe assembly comprises a mounting plate, a limiting plate, a locking structure, a connecting plate and a probe assembly, wherein the mounting plate is connected with an external device, the limiting plate is two groups which are arranged in parallel and symmetrically, a clamping groove used for supporting the edge of the connecting plate is formed in the inner side of the limiting plate, the locking structure is mounted on the mounting plate and corresponds to the position of the connecting plate, the probe assembly is fixedly connected with the connecting plate, the probe assembly can be assembled on the limiting plate through the cooperation of the mounting plate and the limiting plate, the probe assembly is mounted on the external device, the connecting plate can be locked and fixed through the locking structure, the position of the probe assembly cannot deviate, however, the probe assembly is required to be replaced by the locking structure, the probe assembly can be replaced only through the locking and fixing of the connecting plate, and the alignment of the connecting plate and the mounting plate is inconvenient.
Disclosure of Invention
Aiming at the defects in the prior art, the utility model aims to provide a quick-dismantling probe module which has the functional advantages of accurate positioning, convenient replacement, convenient test, reduced space during assembly and more convenient assembly.
The technical aim of the utility model is realized by the following technical scheme:
a quick disconnect probe module, comprising: the PCB comprises a fixed block for placing a PCB, a lower probe set for being electrically connected with the PCB, an upper probe set for being electrically connected with the lower probe set and a first FPC flat cable; the lower probe set penetrates through the PCB and then is spliced with the fixed block; the lower probe set is provided with a guide pin; the upper probe set is provided with a guide hole matched with the guide pin; under the condition that the guide pin is inserted into the guide hole, the upper probe set is electrically connected with the lower probe set; the first FPC flat cable is inserted into the upper probe set and is electrically connected with the upper probe set.
Optionally, the lower probe set includes: a lower probe block and a lower probe; the middle part of the lower probe is arranged on the lower probe block; one end of the lower probe penetrates through the PCB and is then inserted into the fixed block; under the condition that the guide pin is inserted into the guide hole, the lower probe is abutted with the upper probe set, and the lower probe is electrically connected with the upper probe set; the guide pin is arranged on the lower probe block.
Optionally, the upper probe set includes: gland, upper probe block and upper probe; the gland is arranged on the upper probe block; the upper probe is arranged on the gland; the guide hole is formed in the pressing cover; the first FPC flat cable is spliced on the upper probe block; the first FPC flat cable is electrically connected with the upper probe; under the condition that the guide pin is inserted into the guide hole, the upper probe is abutted with the lower probe, and the upper probe is electrically connected with the lower probe.
Optionally, the upper probe block is fixedly connected with the gland to form a plugging groove; the first FPC flat cable is spliced in the splicing groove; one end of the upper probe penetrates through the gland and then enters the inserting groove to be electrically connected with the first FPC flat cable; and under the condition that the guide pin is inserted into the guide hole, the other end of the upper spring needle is abutted with the lower spring needle.
Optionally, the lower probe set further includes: a first magnet; the upper probe set further includes: the second magnet is used for attracting with the first magnet; the first magnet is arranged on the lower probe block; the second magnet is arranged on the pressing cover.
In summary, the utility model has the following beneficial effects: through the arrangement of the lower probe set, the lower probe set is inserted into the fixed block after penetrating through the PCB, so that the PCB on the fixed block can be prevented from being deviated, the fixation of the PCB is realized, and after the test is finished, the lower probe set is taken out from the fixed block and the PCB, so that the replacement of the PCB can be realized, the replacement is convenient, and the test is convenient; by arranging the first FPC flat cable, the space during assembly can be reduced, and the assembly is more convenient; through the setting of guide pin and guiding hole, be convenient for go on accurate location to last probe group and lower probe group to realize going up probe group and lower probe group's electric connection.
Drawings
FIG. 1 is a schematic view of the overall structure of the present utility model;
FIG. 2 is a schematic diagram of the structure of the upper probe set in the present utility model;
fig. 3 is an exploded view of the present utility model.
In the figure: 1. a fixed block; 2. a lower probe set; 21. a lower probe block; 22. a lower probe; 23. a first magnet; 3. an upper probe set; 31. a gland; 32. an upper probe block; 33. a probe is arranged; 34. a plug-in groove; 35. a second magnet; 4. a first FPC bus line; 5. a guide pin; 6. a guide hole; 7. a PCB board; 71. positioning holes; 8. and a second FPC bus.
Detailed Description
In order that the objects, features and advantages of the utility model will be readily understood, a more particular description of the utility model will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings. Several embodiments of the utility model are presented in the figures. This utility model may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
In the present utility model, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances. The terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature.
The present utility model will be described in detail below with reference to the accompanying drawings and examples.
The utility model provides a quick-dismantling type probe module, as shown in figures 1-3, comprising: a fixing block 1 for placing a PCB 7, a lower probe set 2 for electrically connecting with the PCB 7, an upper probe set 3 for electrically connecting with the lower probe set 2, and a first FPC bus 4; the lower probe set 2 penetrates through the PCB 7 and is then spliced with the fixed block 1; the lower probe set 2 is provided with a guide pin 5; a guide hole 6 matched with the guide pin 5 is formed in the upper probe set 3; in the case that the guide pin 5 is inserted into the guide hole 6, the upper probe set 3 is electrically connected with the lower probe set 2; the first FPC flat cable 4 is inserted into the upper probe set 3 and is electrically connected with the upper probe set 3.
In practical application, the fixed block 1 can be arranged on other devices, the upper surface of the fixed block 1 is horizontally arranged, so that the PCB 7 is convenient to place, the PCB 7 is provided with a positioning hole 71 for the lower probe set 2 to pass through, after the lower probe set 2 passes through the positioning hole 71, the lower probe set 2 is electrically connected with the PCB 7, the upper surface of the fixed block 1 is provided with a plugging hole for plugging with the lower probe set 2, through the arrangement of the lower probe set 2, the lower probe set passes through the PCB 7 and then is plugged with the fixed block 1, the PCB 7 on the fixed block 1 can be prevented from being deviated, the PCB 7 is fixed, and after the test is finished, the lower probe set 2 is taken out from the fixed block 1 and the PCB 7, so that the replacement of the PCB 7 can be realized, the replacement is convenient, and the test is convenient; by arranging the first FPC flat cable, the space during assembly can be reduced, and the assembly is more convenient; the quantity of guide pin 5 is two in this application, the quantity of guide pin 5 can increase according to actual conditions in other embodiments, the quantity of guiding hole 6 is the same with the quantity of guide pin 5, through the setting of guide pin 5 and guiding hole 6, be convenient for go up probe group 3 and down probe group 2 and pinpoint, in order to realize the electric connection of probe group 3 and probe group 2 down, in the test process, peg graft on PCB board 7 and have second FPC winding displacement 8, second FPC winding displacement 8 is connected with PCB board 7 electricity, under the condition that guide pin 5 peg graft on guiding hole 6, go up probe group 3 and probe group 2 contact conduction down, the signal on the PCB board 7 is through first FPC winding displacement 4 and the switching of second FPC winding displacement 8 come out, accomplish the test to PCB board 7.
Further, as shown in fig. 3, the lower probe set 2 includes: a lower probe 22 block 21 and a lower probe 22; the middle part of the lower probe 22 is arranged on the lower probe 22 block 21; one end of the lower probe 22 penetrates through the PCB 7 and is then inserted into the fixed block 1; in the case that the guide pin 5 is inserted into the guide hole 6, the lower probe 22 is abutted against the upper probe set 3, and the lower probe 22 is electrically connected with the upper probe set 3; the guide pin 5 is provided on the lower probe 22 block 21.
In practical application, the lower probe 22 piece 21 and the fixed block 1 are arranged in an insulating way, if made of plastic, the lower probe 22 is made of metal and is used for being electrically connected with the PCB 7, specifically, the number of the lower probes 22 can be set according to practical situations, the number of the positioning holes 71 is the same as that of the lower spring pins, one ends of all the lower probes 22 can be inserted into the inserting holes, and under the condition that the guide pins 5 are inserted into the guide holes 6, the other ends of the lower probes 22 are abutted against the upper probe groups 3, so that the upper probe groups 3 are electrically connected with the lower probes 22.
Further, as shown in fig. 2, the upper probe set 3 includes: a gland 31, an upper probe 33 block 32 and an upper probe 33; the gland 31 is arranged on the upper probe 33 block 32; the upper probe 33 is arranged on the gland 31; the guide hole 6 is formed in the gland 31; the first FPC bus 4 is spliced on the upper probe 33 block 32; the first FPC bus 4 is electrically connected with the upper probes 33; when the guide pin 5 is inserted into the guide hole 6, the upper probe 33 abuts against the lower probe 22, and the upper probe 33 is electrically connected to the lower probe 22.
In practical application, the gland 31 and the upper probe 33 block 32 are all arranged in an insulating way, for example, made of plastic, and the upper probe 33 is made of metal and is electrically connected with the first FPC wire 4 and the lower probe 22 respectively; the number of the guide holes 6 is the same as that of the guide pins 5, the number of the upper probes 33 is the same as that of the lower probes 22, and the upper probes 33 and the lower probes 22 are electrically connected by the arrangement of the guide holes 6 and the guide pins 5 so as to conveniently realize the abutting connection of the upper probes 33 and the corresponding lower probes 22.
Further, as shown in fig. 2, the upper probe 33 block 32 and the gland 31 are fixedly connected to form a plugging slot 34; the first FPC bus 4 is spliced in the splicing groove 34; one end of the upper probe 33 passes through the gland 31, passes through the gland 31 and then enters the inserting groove 34 to be electrically connected with the first FPC bus 4; under the condition that the guide pin 5 is inserted into the guide hole 6, the other end of the upper spring needle is abutted with the lower spring needle.
In practical application, through the setting of jack slot 34, the grafting of first FPC winding displacement 4 and last probe group 3 of being convenient for to be convenient for change first FPC winding displacement 4, the equipment is convenient, can replace impaired winding displacement when winding displacement connected state is impaired, improves test efficiency.
Further, as shown in fig. 3, the lower probe set 2 further includes: a first magnet 23; the upper probe set 3 further includes: a second magnet 35 for attracting the first magnet 23; the first magnet 23 is arranged on the lower probe 22 block 21; the second magnet 35 is provided on the pressing cover 31.
In practical application, the quantity of first magnet 23 can increase according to actual conditions, and the quantity of second magnet 35 is the same with the quantity of first magnet 23, through the setting of first magnet 23 and second magnet 35, first magnet 23 and second magnet 35 are mutually actuation, before guide pin 5 pegging graft at guiding hole 6, can play the counterpoint effect to guide pin 5 and guiding hole 6, improves the counterpoint rate of accuracy of upper probe group 3 and lower probe group 2.
According to the quick-disassembly probe module, the lower probe set 2 is arranged, penetrates through the PCB 7 and is spliced with the fixed block 1, so that the PCB 7 on the fixed block 1 can be prevented from being deviated, the fixation of the PCB 7 is realized, and after the test is finished, the lower probe set 2 is taken out from the fixed block 1 and the PCB 7, so that the replacement of the PCB 7 can be realized, the replacement is convenient, and the test is convenient; by arranging the first FPC flat cable, the space during assembly can be reduced, and the assembly is more convenient; through the setting of guide pin 5 and guiding hole 6, be convenient for go on pining to last probe group 3 and lower probe group 2 to realize going up probe group 3 and the electrical connection of probe group 2 down.
The above description is only a preferred embodiment of the present utility model, and the protection scope of the present utility model is not limited to the above examples, and all technical solutions belonging to the concept of the present utility model belong to the protection scope of the present utility model. It should be noted that modifications and adaptations to the present utility model may occur to one skilled in the art without departing from the principles of the present utility model and are intended to be within the scope of the present utility model.

Claims (5)

1. A quick detach formula probe module, characterized in that includes: the PCB comprises a fixed block for placing a PCB, a lower probe set for being electrically connected with the PCB, an upper probe set for being electrically connected with the lower probe set and a first FPC flat cable; the lower probe set penetrates through the PCB and then is spliced with the fixed block; the lower probe set is provided with a guide pin; the upper probe set is provided with a guide hole matched with the guide pin; under the condition that the guide pin is inserted into the guide hole, the upper probe set is electrically connected with the lower probe set; the first FPC flat cable is inserted into the upper probe set and is electrically connected with the upper probe set.
2. The quick release probe module of claim 1, wherein the lower probe set comprises: a lower probe block and a lower probe; the middle part of the lower probe is arranged on the lower probe block; one end of the lower probe penetrates through the PCB and is then inserted into the fixed block; under the condition that the guide pin is inserted into the guide hole, the lower probe is abutted with the upper probe set, and the lower probe is electrically connected with the upper probe set; the guide pin is arranged on the lower probe block.
3. The quick release probe module of claim 2, wherein the upper probe set comprises: gland, upper probe block and upper probe; the gland is arranged on the upper probe block; the upper probe is arranged on the gland; the guide hole is formed in the pressing cover; the first FPC flat cable is spliced on the upper probe block; the first FPC flat cable is electrically connected with the upper probe; under the condition that the guide pin is inserted into the guide hole, the upper probe is abutted with the lower probe, and the upper probe is electrically connected with the lower probe.
4. The quick release probe module of claim 3, wherein the upper probe block is fixedly connected with the gland to form a socket; the first FPC flat cable is spliced in the splicing groove; one end of the upper probe penetrates through the gland and then enters the inserting groove to be electrically connected with the first FPC flat cable; and under the condition that the guide pin is inserted into the guide hole, the other end of the upper probe is abutted with the lower probe.
5. The quick release probe module of claim 3, wherein the lower probe set further comprises: a first magnet; the upper probe set further includes: the second magnet is used for attracting with the first magnet; the first magnet is arranged on the lower probe block; the second magnet is arranged on the pressing cover.
CN202320059009.4U 2023-01-04 2023-01-04 Quick detach formula probe module Active CN219266372U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202320059009.4U CN219266372U (en) 2023-01-04 2023-01-04 Quick detach formula probe module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202320059009.4U CN219266372U (en) 2023-01-04 2023-01-04 Quick detach formula probe module

Publications (1)

Publication Number Publication Date
CN219266372U true CN219266372U (en) 2023-06-27

Family

ID=86868250

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202320059009.4U Active CN219266372U (en) 2023-01-04 2023-01-04 Quick detach formula probe module

Country Status (1)

Country Link
CN (1) CN219266372U (en)

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