CN220040496U

CN220040496U - Switching device and function testing device

Info

Publication number: CN220040496U
Application number: CN202320304411.4U
Authority: CN
Inventors: 曾勇; 王磊
Original assignee: Weilai Automobile Technology Anhui Co Ltd
Current assignee: Weilai Automobile Technology Anhui Co Ltd
Priority date: 2023-02-21
Filing date: 2023-02-21
Publication date: 2023-11-17
Anticipated expiration: 2033-02-21

Abstract

The utility model provides a switching device and a function testing device, wherein the switching device is used for connecting a mainboard to be tested with a testing mainboard in a function testing process, and the switching device comprises: a probe assembly for connecting with a connector to be tested of a motherboard to be tested and including a socket in which a plurality of probes are arranged in a matrix; the switching connector is used for being connected with the test connector of the test main board; the probe assembly and the transfer connector are respectively positioned at two sides of the transfer main board, and the transfer main board is used for connecting the probe with corresponding pins of the transfer connector; the probe is connected with the connector to be tested by one arc end and is connected with the switching main board by the other arc end. According to the switching device disclosed by the utility model, the protection of the mainboard to be tested can be realized.

Description

Switching device and function testing device

Technical Field

The present utility model relates to a switching device for use in a functional test process and a functional test device comprising such a switching device for connecting a test motherboard of the functional test device to the switching device.

Background

In the production process of the main board, for example, in the production process of a PCB board (Printed Circuit Board ), in order to ensure the quality of the PCB board, various tests are required to be performed on the PCB board in the early stage, that is, functional tests (Functional Circuit Test, abbreviated as FCT) are performed on the PCB board.

In performing a functional test, a gold finger is generally used as an adapter for connecting a motherboard to be tested and a test motherboard (i.e., a test motherboard). From the prior art, two designs are mainly known, one of which is that a test motherboard is exposed from a connector pad and a probe tail end is pressed against the pad by a fixing structure, the probe tail end is connected with a golden finger and fixed together on the motherboard to be tested, wherein a functional test is performed after the golden finger is connected with a connector of the test motherboard. Secondly, the main board to be tested is directly connected with the test main board through a golden finger, wherein one end of the golden finger is fixed on the test main board and is connected with the golden finger through a flexible flat cable, and the other end of the golden finger is connected with a high-speed connector of the main board to be tested.

However, the golden finger itself is costly and is easily damaged and scrapped after multiple insertions and removals, which in turn increases the cost of the functional test. In addition, the indirect connection scheme by means of the golden finger is complex in structure and is not suitable for batch manufacturing of functional test equipment.

Disclosure of Invention

According to various aspects, the present utility model aims to provide a switching device for connecting a test motherboard and a motherboard under test in a functional test and a functional test device comprising such a switching device.

In addition, the utility model aims to solve or alleviate other technical problems in the prior art.

The present utility model solves the above-mentioned problems by providing a switching device for connecting a motherboard under test with a test motherboard during a functional test, comprising:

a probe assembly for connecting with a connector to be tested of a motherboard to be tested and including a socket in which a plurality of probes are arranged in a matrix;

the switching connector is used for being connected with the test connector of the test main board;

the probe assembly and the transfer connector are respectively positioned at two sides of the transfer main board, and the transfer main board is used for connecting the probe with corresponding pins of the transfer connector;

the probe is connected with the connector to be tested by one arc end and is connected with the switching main board by the other arc end.

According to an aspect of the utility model, the adapter device is provided with the arc-shaped end portion being arranged in a semicircle in a cross section parallel to the longitudinal axis of the probe.

According to the switching device provided by one aspect of the utility model, the outer periphery of the probe is pressed between the elastic terminals of the connector to be tested, and the compression amount of the elastic terminals in the assembled state is 0.05mm to 0.1mm.

According to an aspect of the present utility model, the socket includes a base plate for being fixed to the adapter motherboard and a receiving chamber protruding from the base plate, the receiving chamber being open in a direction away from the base plate and having at least one insulating partition provided therein, the insulating partition having a plurality of recesses for receiving probes, respectively.

According to an aspect of the present utility model, the probe is pressed into the base plate and accommodated in the recess, and the probe is connected with one end thereof to the connector to be tested and is penetrated out of the base plate with the other end thereof for connection to the adapter board.

According to an aspect of the utility model, the arcuate end of the probe for the connector to be tested is flush with or below the receiving chamber along the longitudinal axis.

According to the switching device provided by one aspect of the utility model, the bottom plate of the probe assembly is fixed on the switching main plate by means of a threaded fastener.

According to an aspect of the utility model, the receiving chamber comprises a plurality of walls in a closed connection, welded to the base plate.

According to another aspect of the present utility model, there is further provided a functional testing apparatus for performing a functional test on a motherboard to be tested, where the functional testing apparatus includes a testing motherboard, an external testing device, and the switching apparatus set forth above, where the testing motherboard is connected to the external testing device, and the switching apparatus connects the motherboard to be tested to the testing motherboard.

The switching device of the type can realize the protection effect on the mainboard to be tested through the design of the arc-shaped end part.

Drawings

The above and other features of the present utility model will become apparent with reference to the accompanying drawings, in which,

FIG. 1 schematically illustrates an exploded view of a switching device according to the present utility model with respect to a motherboard under test and a test motherboard;

FIG. 2 shows the probe assembly of the adapter with the connector under test;

FIG. 3 shows an enlarged view of a portion of the probe assembly according to FIG. 2;

fig. 4 schematically shows a simplified assembly of the arcuate end of the probe with the spring terminal.

Detailed Description

It is to be understood that, according to the technical solution of the present utility model, those skilled in the art may propose various alternative structural modes and implementation modes without changing the true spirit of the present utility model. Accordingly, the following detailed description and drawings are merely illustrative of the utility model and are not intended to be exhaustive or to limit the utility model to the precise form disclosed.

Terms of orientation such as up, down, left, right, front, rear, front, back, top, bottom, etc. mentioned or possible to be mentioned in the present specification are defined with respect to the configurations shown in the drawings, which are relative concepts, and thus may be changed according to different positions and different use states thereof. These and other directional terms should not be construed as limiting terms. Furthermore, the terms "first," "second," "third," and the like are used for descriptive and distinguishing purposes only and are not to be construed as indicating or implying a relative importance of the corresponding components.

Referring to fig. 1, there is shown an overall illustration of a switching device 100 for connecting a motherboard 200 under test to a test motherboard 300 of a functional test device, which is connected to an external test device, such as a computer device, that performs computing tasks during functional testing. It is known or should be known to those skilled in the art that the prefix "test" in the related art terminology referred to herein is intended to distinguish from the prefix "test" to which the technology belongs, for example, a motherboard to be tested (which should be understood as a motherboard for which functional testing is required), and which can be understood as an integral part of functional test equipment for performing functional testing. Specifically, the "connector to be tested" hereinafter belongs to the motherboard to be tested; the test board is understood to be a test board which is used for functional testing and is matched with the board to be tested, and accordingly, the test connector belongs to the test board and, in its entirety, to the functional testing device. The main board to be tested, the test main board and the computer equipment form a passage through the switching device so as to facilitate the subsequent real-time function test process.

The adapter device 100 comprises a probe assembly 110, an adapter connector 120 and an adapter motherboard 130, which are only schematically shown in fig. 1 as a frame, wherein the probe assembly 110 and the adapter connector 120 are arranged on mutually opposite sides of the adapter motherboard 130, respectively. Specifically, the probe assembly 110 is disposed on the upper side of the interposer motherboard 130 and is used for connecting with the upper motherboard 200 under test, and the interposer connector 120 is disposed on the lower side of the interposer motherboard 130 and is used for connecting with the lower motherboard 300 under test. The probe assembly 110 is connected to a connector 210, such as a connector female, in particular a high-speed connector female, of the motherboard 200 to be tested; the adapter connector 120 is connected to a test connector 310 of the test motherboard 300, in particular to a high-speed connector, wherein the test connector 310 can optionally be configured identically to a connector female of the motherboard 200 to be tested and can be referred to as a connector male. In a specific embodiment, the probe assembly 110 of the adapter device 100 is connected to the high-speed connector female of the motherboard 200 to be tested, and the adapter connector 120 is connected to the connector male of the motherboard 300 to be tested and is configured identically to the high-speed connector female of the motherboard 200 to be tested. The term "identically configured" refers to pins for connection.

Referring to fig. 2, there is shown a perspective view of a probe assembly 110 including a socket 111 for receiving and carrying probes 112, together with a connector under test 210 mated therewith, wherein a plurality of probes 112 are arranged in a matrix in the socket 111. The socket 111 can be fastened to the adapter motherboard 130 by means of threaded fasteners such that the probes correspond to the connecting pins on the adapter motherboard. One of the free ends of the probes 112 is used for connection to the connector 210 to be tested and the other free end is used for connection to the adapter motherboard 130, in particular to the adapter PCB. The two free ends of the probe 112 are embodied here as rounded arc-shaped ends 1121, which are shown enlarged in fig. 3 and 4. That is, the free end portion is arcuate or dome-shaped in cross-section parallel to the longitudinal axis of the probe, which extends along the length of the probe. Instead of the usual rectangular cross section and right-angled plug-in operation, the design of such an arcuate end portion makes it possible to reduce damage to the elastic terminals of the connector to be tested of the motherboard to be tested and thus to achieve a protective effect.

Alternatively, the arcuate end 1121 of the probe 112 has a semi-circular cross-section in a direction parallel to the longitudinal axis, which may be machined during production, for example, by a high precision lathe to achieve a clamping process to ensure the desired arc. The curvature of the arcuate end 1121 and the length of the probe along the longitudinal axis thereof are set according to the actual situation or probe size and are not further limited herein.

With the probe assembly 110 assembled with the connector under test 210, each probe 112 is clamped between the spring terminals 211 of the connector under test 210, respectively, wherein the spring terminals 211 exert a clamping force on the probes 112 that acts as a fixture due to being compressed and rest against the outer periphery of the probes 112. Here, the design of the arcuate end portion makes it possible to reduce the amount of compression of the elastic terminal, which may alternatively be set to 0.1mm or less, for example, between 0.05mm and 0.1mm. The compression amount can be realized by ensuring the probe position degree, the probe position guide and the fixture pressing positioning through high-precision lathe machining. By reducing the compression amount of the elastic terminals, the elastic fatigue of the elastic terminals can be reduced and thus further protection of the motherboard to be tested is achieved. Furthermore, in this way, the risk of performance degradation such as non-rebound of the elastic terminal and abrasion of the plating layer due to continuous insertion and extraction can be reduced, whereby connection reliability can be improved and functional test stability can be ensured.

In order to clearly illustrate the clamping action and the compression amount, fig. 4 schematically shows one elastic terminal 211 and one probe 112 as an object of the action thereof in an initial state. The compression amount L is understood to be the amount of compression required for the elastic terminal 211 to be converted from the uncompressed initial state to the compressed state, and the extension can be understood as such from fig. 4, the amount of compression of the portion of the elastic terminal 211 for contact with the probe. As shown in fig. 4, the compression amount L is the distance between the above-mentioned portion in the initial state and the outer periphery of the probe. It should be noted that the spring terminals 211 are not embedded in the outer periphery of the probes 112, but are shown in an abstract drawing for ease of understanding only in fig. 4.

The structure of the probe assembly 110 is described in detail below in conjunction with fig. 2 and 3. The socket 111 of the probe module 110 has a base plate 1111, through which a through-hole is formed, and a receiving chamber 1112, through which the through-hole is fastened to the adapter main plate 130 by means of a threaded fastener, such as a screw. The receiving chamber 1112 protrudes from the base plate 1111 and is open in the direction away from the base plate, which is closed laterally by a plurality of walls which are connected to one another in a closed manner and can be welded to the base plate 1111 or integrally formed with the base plate 1111. In the receiving chamber, at least one insulating partition 1113 is provided protruding from the base plate 1111, which can be welded to the base plate 1111 or can be integrally formed with the base plate 1111. The insulating spacer 1113 regularly has a plurality of recesses, in particular semicircular recesses, in which the individual probes 112 are accommodated with play relative to the inner wall of the recess. By means of the insulating spacer and the recess, a more precise positioning with the connector 210 to be tested, in particular with the spring terminals 211 thereof, can be achieved during assembly, i.e. during the plugging operation.

Alternatively, each probe 112 is pressed into a through-hole (not shown) of the base plate 1111 and held in a recess of the insulating spacer 1113 substantially perpendicular to the plane of the base plate. Specifically, referring to fig. 3, probes 112 pass out from below for connection with an underlying adapter motherboard 130.

Alternatively, the probes 112 are completely housed in the housing chamber 1112, in particular, in a direction of the longitudinal axis of the probes perpendicular to the plane of the base plate, the probes 112 are at most flush with the insulating barrier 1113, i.e. the protruding height of the probes from the base plate is at most equal to the height of the insulating barrier in the same direction. Further alternatively, the protruding height of the probes 1112 from the base plate 1111 is smaller than the height of the insulating partition 1113 in the same direction, in such a manner that the probes can be protected.

In summary, the switching device of this type can realize the protection of the motherboard to be tested through the design of the arc-shaped end part. In another embodiment of the present utility model, by designing the probe size such that the compression amount of the elastic terminals of the connector of the motherboard to be tested is reduced, it is possible to reduce the elastic fatigue thereof and thereby further protect the motherboard to be tested. In another embodiment of the present utility model, the protection of the probe can be achieved by improving the height of the probe relative to the insulating barrier.

The utility model also relates to a functional test device, which generally comprises a test main board, external test equipment connected with the test main board and the switching device for connecting the test main board and the main board to be tested. For the sake of simplicity, no further parts of the functional test device, such as the relevant fastening devices, transport devices, are described here. In addition, the description of the function test device with respect to the switching device can be referred to correspondingly, which is not repeated.

It should be understood that all of the above preferred embodiments are exemplary and not limiting, and that various modifications or variations of the above-described specific embodiments, which are within the spirit of the utility model, should be made by those skilled in the art within the legal scope of the utility model.

Claims

1. The utility model provides a switching device, its in the function test in-process is used for being connected the mainboard that awaits measuring with test mainboard, its characterized in that includes:

2. The adapter according to claim 1, wherein in a cross section parallel to the longitudinal axis of the probe, the arcuate end portions are arranged in a semicircle.

3. The adapter according to claim 2, wherein the outer periphery of the probe is pressed between elastic terminals of the connector to be tested, the elastic terminals having a compression amount of 0.05mm to 0.1mm in an assembled state.

4. The adapter according to claim 1, wherein the socket comprises a base plate for fixing to the adapter motherboard and a receiving chamber protruding from the base plate, the receiving chamber being open in a direction away from the base plate and having at least one insulating partition provided therein, the insulating partition having a plurality of recesses for receiving probes respectively.

5. The adapter according to claim 4, wherein the probe is pressed into the base plate and accommodated in the recess, the probe being connected with its one end to the connector to be tested and with its other end penetrating out of the base plate for connection to the adapter motherboard.

6. The adapter according to claim 5, wherein along the longitudinal axis of the probe, the arcuate end of the probe for the connector to be tested is flush with or below the receiving chamber.

7. The adapter according to claim 6, wherein the bottom plate of the probe assembly is secured to the adapter motherboard by means of threaded fasteners.

8. The adapter according to claim 6, wherein the receiving chamber comprises a plurality of walls in a closed connection, the plurality of walls being welded to the base plate.

9. A functional testing apparatus for performing functional testing on a motherboard under test, wherein the functional testing apparatus comprises a testing motherboard, an external testing device, and a switching apparatus according to any one of claims 1 to 8, wherein the testing motherboard is connected to the external testing device, and the switching apparatus connects the motherboard under test to the testing motherboard.