CN219918939U

CN219918939U - Testing device

Info

Publication number: CN219918939U
Application number: CN202321708140.5U
Authority: CN
Inventors: 吴佩龙
Original assignee: Shenzhen Sunway Communication Co Ltd
Current assignee: Shenzhen Sunway Communication Co Ltd
Priority date: 2023-06-30
Filing date: 2023-06-30
Publication date: 2023-10-27
Anticipated expiration: 2033-06-30

Abstract

The embodiment of the utility model relates to the technical field of antenna testing, and particularly discloses a testing device which comprises a bottom frame, a testing jig, a testing instrument and a controller, wherein the bottom frame is provided with a containing groove for containing a test piece to be tested, the testing jig comprises a circuit board, the circuit board is fixed on the bottom frame, the circuit board is provided with a probe, one end of the probe is positioned in the containing groove, the probe is used for being abutted with the piece to be tested positioned in the containing groove, the testing instrument is electrically connected with the circuit board, and the controller is respectively electrically connected with the circuit board and the testing instrument. Through the mode, the embodiment of the utility model can test the performance of the piece to be tested.

Description

Testing device

Technical Field

The embodiment of the utility model relates to the technical field of antenna testing, in particular to a testing device.

Background

Near field communication (Near Field Communication, abbreviated as NFC) is an emerging technology, and electronic devices equipped with NFC antennas can exchange data when they are close to each other, and are widely used in the fields of mobile payment, electronic ticketing, access control, mobile identity recognition, anti-counterfeiting, and the like.

However, in implementing embodiments of the present utility model, the inventors found that: at present, the NFC antenna is manufactured by an FPC and ferrite through an inserting process, and the situation that the ferrite generates magnetic breakage caused by stress in the production process exists, so that the magnetic permeability of the ferrite is reduced, the performance of the NFC antenna is reduced, and the use requirement cannot be met.

Disclosure of Invention

The embodiment of the utility model mainly solves the technical problem of providing a testing device which can test the performance of a piece to be tested.

In order to solve the technical problems, the utility model adopts a technical scheme that: the utility model provides a testing arrangement, including chassis, test fixture, test instrument and controller, the chassis is provided with the storage tank, the storage tank is used for placing the test piece that awaits measuring, the test fixture includes the circuit board, the circuit board is fixed in the chassis, the circuit board is provided with the probe, the one end of probe is located the storage tank, the probe be used for with be located the storage tank await measuring piece butt, test instrument with the circuit board electricity is connected, the controller respectively with the circuit board with the test instrument electricity is connected.

Optionally, the chassis is provided with mounting groove and logical groove, the circuit board is fixed in the mounting groove, logical groove respectively with the mounting groove with the holding groove intercommunication, the one end of probe passes logical groove is located the holding groove.

Optionally, the test fixture includes a first connection wire, and one end of the first connection wire is electrically connected with the circuit board;

the testing device comprises a connecting block, and the other end of the first connecting wire is fixed on the connecting block.

Optionally, the chassis is provided with the opening, the opening with the mounting groove intercommunication, the connecting block is located the opening part, the other end of first connecting wire is passed the opening is fixed in the connecting block.

Optionally, the test fixture includes drive assembly and supports and hold the piece, support and hold the piece and be located the storage tank top, drive assembly connect in the chassis, drive assembly with support and hold the piece and be connected, drive assembly is used for the drive support and hold the piece and go up and down, when support and hold the piece and be located the decline position, support and hold the piece with test piece to be measured and support, so that test piece to be measured with probe butt.

Optionally, the driving assembly includes a driving member and a connecting plate, the driving member is fixed on the chassis, and the connecting plate is respectively connected with the driving member and the supporting member.

Optionally, the driving assembly includes a lifting plate, and the lifting plate is respectively connected with the connecting plate and the driving piece.

Optionally, the driving assembly includes a guide rail seat, the guide rail seat is provided with a chute, the guide rail seat is fixed in the chassis, and the lifter plate slides and sets up in the chute.

Optionally, the test fixture further includes a switch, the switch is fixed to the chassis, and the switch is connected to the driving member.

Optionally, the test fixture further includes a detecting member, the detecting member is fixed in the driving member, the detecting member is electrically connected with the controller, and the detecting member is used for detecting whether the telescopic rod of the driving member extends out to the position, so as to detect whether the supporting member is located at the descending position.

In the embodiment of the utility model, the testing device comprises a chassis, a testing jig, a testing instrument and a controller, wherein the chassis is provided with a containing groove, the containing groove is used for containing the test piece to be tested, the testing jig comprises a circuit board, the circuit board is fixed on the chassis, the circuit board is provided with a probe, one end of the probe is positioned in the containing groove, the probe is used for abutting against the test piece to be tested positioned in the containing groove, the testing instrument is electrically connected with the circuit board, and the controller is respectively electrically connected with the circuit board and the testing instrument. Because the performance parameters are preset in the test instrument, in the production process, the test piece to be tested is placed in the accommodating groove manually, so that the test piece is abutted against the probe, the electric connection between the circuit board and the test piece to be tested is realized, the controller controls the test instrument to test the test piece to be tested, and whether the test piece to be tested is qualified or not can be judged by comparing the performance parameters obtained by the test with the performance parameters preset.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings that are needed in the embodiments of the present utility model will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present utility model, and other drawings may be obtained according to the drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a test apparatus according to an embodiment of the present utility model;

FIG. 2 is a schematic structural diagram of a chassis of a testing device according to an embodiment of the present utility model;

FIG. 3 is a schematic structural view of a bottom plate of a chassis of a testing device according to an embodiment of the present utility model;

fig. 4 is a schematic structural diagram of a test fixture of a test device according to an embodiment of the present utility model;

FIG. 5 is a schematic structural diagram of a connection block of a test device according to an embodiment of the present utility model;

fig. 6 is a schematic connection diagram of a controller, a test instrument, a circuit board of a test fixture, a detection piece of the test fixture and an alarm of the test device according to the embodiment of the utility model.

Reference numerals illustrate:

100. a testing device; 1. a chassis; 11. a bottom plate; 111. a receiving groove; 112. a mounting groove; 113. a through groove; 114. an opening; 115. avoiding the notch; 12. a support leg; 13. a cover plate; 14. a switch mounting base; 2. testing a jig; 21. a circuit board; 211. a probe; 22. a drive assembly; 221. a mounting plate; 222. a driving member; 223. a lifting plate; 224. a connecting plate; 225. a guide rail seat; 2251. a chute; 23. a holding member; 24. a switch; 3. a connecting block; 31. a fixing hole; 4. a test instrument; 25. a detecting member; 5. a controller; 6. an alarm.

Detailed Description

In order that the utility model may be readily understood, a more particular description thereof will be rendered by reference to specific embodiments that are illustrated in the appended drawings. It will be understood that when an element is referred to as being "locked" to another element, it can be directly on the other element or one or more intervening elements may be present therebetween. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or one or more intervening elements may be present therebetween. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this utility model belongs. The terminology used in the description of the utility model herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. The term "and/or" as used in this specification includes any and all combinations of one or more of the associated listed items.

Referring to fig. 1, 2 and 6, a testing apparatus 100 includes a chassis 1, a testing jig 2, a connecting block 3, a testing instrument 4 and a controller 5. The underframe 1 is used for placing a test piece to be tested. The test fixture 2 is connected to the chassis 1, and the test fixture 2 is used for being electrically connected with a test piece to be tested. The connecting block 3 is fixed on the chassis 1, and the connecting block 3 is fixed with a part of the test jig 2 so that the test jig 2 is electrically connected with the test instrument 4. The testing instrument 4 is used for testing the performance of the test piece to be tested, and comparing the performance parameters obtained through testing with preset performance parameters so as to judge whether the test piece to be tested is qualified or not. The controller 5 is electrically connected with the test fixture 2 and the test instrument 4 respectively, and the controller 5 is used for controlling the test instrument 4 to test the workpiece to be tested according to the information of the test fixture 2.

In some embodiments, the test piece to be tested is an NFC antenna.

For the above-described chassis 1, referring to fig. 2 and 3, the chassis 1 includes a bottom plate 11, legs 12, and a cover plate 13. The base plate 11 is connected to the legs 12 and the cover plate 13, respectively. The base plate 11 is provided with a receiving groove 111, a mounting groove 112, a through groove 113, and an opening 114. The accommodating groove 111 is disposed on the first surface of the bottom plate 11, and the accommodating groove 111 is used for accommodating a test piece to be tested. The mounting groove 112 is disposed on a second surface of the base plate 11, and the second surface is opposite to the first surface, and the mounting groove 112 is configured to receive a portion of the test fixture 2. The through groove 113 is disposed at the bottom of the mounting groove 112, the through groove 113 is respectively communicated with the accommodating groove 111 and the mounting groove 112, and the through groove 113 is used for allowing another part of the test fixture 2 to pass through. The opening 114 is disposed on the second surface of the base plate 11, the opening 114 is in communication with the mounting slot 112, and the opening 114 is used for allowing a part of the test fixture 2 to pass through. The cover plate 13 covers the notch of the mounting groove 112, so that the mounting groove 112 is separated from the outside, and foreign matters are prevented from entering the mounting groove 112 to contact with another part of the test fixture 2. Legs 12 are fixed to the second surface of the base plate 11, the legs 12 being adapted to support the base plate 11.

For the above-mentioned test fixture 2, please refer to fig. 4, the test fixture 2 includes a circuit board 21, a first connecting wire (not shown), a driving assembly 22, a supporting member 23 and a switch 24. The circuit board 21 is fixed in the mounting groove 112. The circuit board 21 is provided with a probe 211, one end of the probe 211 penetrates through the through groove 113 and is located in the accommodating groove 111, and the probe 211 is used for being abutted with a test piece to be tested located in the accommodating groove 111 so as to realize electrical connection between the test piece to be tested and the circuit board 21. One end of the first connection wire is electrically connected to the circuit board 21, and the other end of the first connection wire is fixed to the connection block 3 through the opening 114. The driving assembly 22 is respectively connected with the bottom plate 11 and the supporting piece 23, the switch 24 is fixed on the bottom plate 11, the switch 24 is connected with the driving assembly 22, and the driving assembly 22 is used for driving the supporting piece 23 to move up and down relative to the bottom plate 11 seat. The drive assembly 22 includes a mounting plate 221, a drive 222, a lifter plate 223, a connecting plate 224, and a rail mount 225. The mounting plate 221 is fixed to the base plate 11. The driving member 222 is fixed to the mounting plate 221. The lifter plate 223 is connected to the driving member 222. The connection plate 224 is connected to one side of the elevation plate 223. The guide rail seat 225 is fixed on the bottom plate 11, the guide rail seat 225 is provided with a sliding groove 2251, the sliding groove 2251 accommodates the other side of the lifting plate 223, the lifting plate 223 can slide along the sliding groove 2251, and the guide rail seat 225 is used for preventing the lifting plate 223 from shaking during sliding. The supporting piece 23 is located above the accommodating groove 111, the supporting piece 23 is connected with the connecting plate 224, the supporting piece 23 can do lifting motion relative to the accommodating groove 111, wherein the driving piece 222 is used for driving the supporting piece 23 to do lifting motion, when the supporting piece 23 is located at the descending position, the supporting piece 23 supports against the test piece to be tested, so that the test piece to be tested is abutted against the probe 211, the test piece to be tested is electrically connected with the circuit board 21, and poor contact between the test piece to be tested and the probe 211 is avoided, so that test errors are caused. The switch 24 is connected to the base plate 11, the switch 24 is connected to the driving member 222, and the switch 24 is used for controlling the driving member 222 to start or stop.

In some embodiments, the driving member 222 is a cylinder, the switch 24 is a pneumatic valve switch, the chassis 1 further includes a switch mount 14, the base plate 11 is provided with a relief notch 115, and the switch mount 14 is connected to the first surface of the base plate 11 and is located above the relief notch 115. The pneumatic valve switch is fixed to the switch mounting base 14, and a part of the switch mounting base 14 is located at the avoidance notch 115, so that the pneumatic valve switch is connected to the bottom plate 11. However, the structure of the driving member 222 and the switch 24 is not limited thereto, and the driving member 222 may be an electric cylinder, and the switch 24 may be a button, both of which are electrically connected to the controller 5.

In some embodiments, the test fixture 2 further includes a detecting member 25, where the detecting member 25 is fixed to the driving member 222, and the detecting member 25 is used for detecting whether the telescopic rod of the driving member 222 is extended to a position, so as to detect whether the supporting member 23 is located at the lowered position. The detecting member 25 may be a magnetic switch, but is not limited thereto as long as it can detect that the telescopic rod of the driving member 222 is extended in place.

For the connection block 3, referring to fig. 5, the connection block 3 is fixed at the opening 114, the connection block 3 is provided with a fixing hole 31, and the fixing hole 31 is used for fixing the other end of the first connection line, so that the first connection line is connected with the second connection line of the test instrument 4, and the circuit board 21 is electrically connected with the test instrument 4.

It should be noted that: the first connection line is an SMA Cable line and the second connection line of the test instrument 4 is an N-SMA RF Cable line.

In some embodiments, the test apparatus 4 is a network analyzer, where the test apparatus 4 may be preset with performance parameters, acceptable display information, and unacceptable display information, for example, when the performance parameters of the test apparatus 4 for testing the test piece to be tested are within a preset performance parameter range, the network analyzer outputs acceptable display information, and when the performance parameters of the test apparatus 4 for testing the test piece to be tested are outside the preset performance parameter range, the network analyzer outputs unacceptable display information for observation by a tester.

For the above-mentioned controller 5, please refer to fig. 6, the controller 5 is electrically connected with the circuit board 21, the testing apparatus 4 and the detecting member 25, respectively. The controller 5 is used for controlling the test instrument 4 according to the detection information of the detecting member 25. When the piece to be tested is tested, the piece to be tested is manually placed in the accommodating groove 111, the switch 24 is then turned on, the driving piece 222 drives the abutting piece 23 to descend, when the abutting piece 23 is located at the descending position, the abutting piece 23 abuts against the piece to be tested, so that the piece to be tested abuts against the probe 211, the controller 5 controls the testing instrument 4 to test the piece to be tested, the performance parameters obtained through the testing are compared with the performance parameters preset, when the performance parameters are located in the performance parameters preset, the test piece to be tested is qualified, the testing instrument 4 outputs qualified display information, otherwise, the test piece to be tested is unqualified, and the testing instrument 4 outputs unqualified display information. And the tester places the tested test pieces according to the qualified and unqualified classification according to the display information of the test instrument 4.

In some embodiments, the test device 100 further comprises an alarm 6, the alarm 6 being secured to the base plate 11, the alarm 6 being electrically connected to the controller 5. When the test piece to be tested is qualified, the controller 5 and the controller 5 alarm 6 flash the first type of light, when the test piece to be tested is unqualified, the controller 5 and the controller 5 alarm 6 flash the second type of light, and the test personnel can observe through different lights more conveniently.

In the embodiment of the utility model, the testing device 100 comprises a chassis 1, a testing jig 2, a testing instrument 4 and a controller 5, wherein the chassis 1 is provided with a containing groove 111, the containing groove 111 is used for containing a test piece to be tested, the testing jig 2 comprises a circuit board 21, the circuit board 21 is fixed on the chassis 1, the circuit board 21 is provided with a probe 211, one end of the probe 211 is positioned in the containing groove 111, the probe 211 is used for being abutted with the test piece positioned in the containing groove 111, the testing instrument 4 is electrically connected with the circuit board 21, and the controller 5 is respectively electrically connected with the circuit board 21 and the testing instrument 4. Because the performance parameters are preset in the test instrument 4, in the production process, the test piece to be tested is manually placed in the accommodating groove 111, so that the test piece is abutted against the probe 211, the electric connection between the circuit board 21 and the test piece to be tested is realized, the controller 5 controls the test instrument 4 to test the test piece to be tested, and whether the test piece to be tested is qualified or not can be judged by comparing the performance parameters obtained by the test with the preset performance parameters.

It should be noted that the description of the present utility model and the accompanying drawings illustrate preferred embodiments of the present utility model, but the present utility model may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, which are not to be construed as additional limitations of the utility model, but are provided for a more thorough understanding of the present utility model. The above-described features are further combined with each other to form various embodiments not listed above, and are considered to be the scope of the present utility model described in the specification; further, modifications and variations of the present utility model may be apparent to those skilled in the art in light of the foregoing teachings, and all such modifications and variations are intended to be included within the scope of this utility model as defined in the appended claims.

Claims

1. A test device for a test piece to be tested, comprising:

the underframe is provided with a containing groove which is used for placing the test piece to be tested;

the test fixture comprises a circuit board, wherein the circuit board is fixed on the underframe, the circuit board is provided with a probe, one end of the probe is positioned in the accommodating groove, and the probe is used for being abutted with the to-be-tested piece positioned in the accommodating groove;

the testing instrument is electrically connected with the circuit board;

and the controller is respectively and electrically connected with the circuit board and the testing instrument.

2. The test device of claim 1, wherein the test device comprises a plurality of test elements,

the chassis is provided with mounting groove and logical groove, the circuit board is fixed in the mounting groove, logical groove respectively with the mounting groove with the holding groove intercommunication, the one end of probe passes logical groove is located the holding groove.

3. The test device according to claim 2, wherein,

the test fixture comprises a first connecting wire, and one end of the first connecting wire is electrically connected with the circuit board;

4. The test device according to claim 3, wherein,

the chassis is provided with the opening, the opening with the mounting groove intercommunication, the connecting block is located the opening part, the other end of first connecting wire is passed the opening is fixed in the connecting block.

5. The test device of claim 1, wherein the test device comprises a plurality of test elements,

the test fixture comprises a driving assembly and a supporting piece, wherein the supporting piece is located above the containing groove, the driving assembly is connected to the bottom frame and connected with the supporting piece, the driving assembly is used for driving the supporting piece to lift, and when the supporting piece is located at a descending position, the supporting piece supports against the test piece to be tested, so that the test piece to be tested is in supporting connection with the probe.

6. The test device of claim 5, wherein the test device comprises a plurality of test elements,

the driving assembly comprises a driving piece and a connecting plate, wherein the driving piece is fixed on the underframe, and the connecting plate is respectively connected with the driving piece and the supporting piece.

7. The test device of claim 6, wherein the test device comprises a plurality of test elements,

the driving assembly comprises a lifting plate, and the lifting plate is respectively connected with the connecting plate and the driving piece.

8. The test device of claim 7, wherein the test device comprises a plurality of test elements,

the driving assembly comprises a guide rail seat, the guide rail seat is provided with a sliding groove, the guide rail seat is fixed on the underframe, and the lifting plate is slidably arranged on the sliding groove.

9. The test device of claim 6, wherein the test device comprises a plurality of test elements,

the test fixture further comprises a switch, the switch is fixed to the bottom frame, and the switch is connected with the driving piece.

10. The test device according to any one of the claims 6-9, wherein,

the test fixture further comprises a detection piece, the detection piece is fixed to the driving piece, the detection piece is electrically connected with the controller, and the detection piece is used for detecting whether the telescopic rod of the driving piece stretches out and reaches a position, so that whether the supporting piece is located at the descending position or not is detected.