CN218122164U

CN218122164U - Integrated circuit chip aging testing device

Info

Publication number: CN218122164U
Application number: CN202221070966.9U
Authority: CN
Inventors: 姜豪; 王�琦
Original assignee: Jiangsu Haina Electronic Technology Co ltd
Current assignee: Jiangsu Haina Electronic Technology Co ltd
Priority date: 2022-05-07
Filing date: 2022-05-07
Publication date: 2022-12-23
Anticipated expiration: 2032-05-07

Abstract

The utility model discloses an integrated circuit chip aging testing device, including test box and bellows, the rear side inner wall of test box is provided with connection socket, connection socket's preceding lateral wall fixedly connected with chip, the rear side inner wall fixed mounting of test box has temperature sensor, the inboard top fixed mounting of test box has the hot plate, the top fixed mounting of bellows has the controller. This integrated circuit chip aging testing device, through the temperature condition in the temperature sensor real-time detection test box, thereby regulate and control its inside temperature according to the temperature environment of required test, heat the air in the test box through the hot plate, improve its test temperature, it rotates to drive the flabellum through the motor, thereby drive the air through bellows, the trunk line, the branch pipeline gets into the test box, blow off by ventilative otter board, reduce its test temperature, through opening and shutting of solenoid valve control branch pipeline, thereby make the multiunit chip carry out the test of different temperatures.

Description

Integrated circuit chip aging testing device

Technical Field

The utility model relates to a chip aging testing technical field especially relates to an integrated circuit chip aging testing device.

Background

The integrated circuit is a miniature electronic device, and is formed by interconnecting all the electric elements of a circuit, and the integrated circuit chip is an electric element formed from silicon base plate, circuit and fixed seal ring grounding ring, and all the electric elements are mutually connected by means of integrated circuit.

Traditional aging testing device just keeps apart chip and external world to detect its life, be not convenient for carry out different pyrometry according to required measurement environment, and be difficult to detect the multiunit chip simultaneously.

SUMMERY OF THE UTILITY MODEL

Not enough to prior art, the utility model provides an integrated circuit chip aging testing device has solved current aging testing device and has not been convenient for carry out different pyrometry, and is difficult to carry out the problem that detects to the multiunit chip.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides an integrated circuit chip aging testing device, includes test box and bellows, the rear side inner wall of test box is provided with the connection socket, the preceding lateral wall fixedly connected with chip of connection socket, the rear side inner wall fixed mounting of test box has temperature sensor, the inboard top fixed mounting of test box has the hot plate, the top fixed mounting of bellows has the controller.

Preferably, the number of the test boxes is multiple groups, and the multiple groups of test boxes are arranged in an array and are fixedly mounted with each other, so that the multiple groups of chips are tested under different conditions.

Preferably, the articulated chamber door of installing of preceding lateral wall of test box, and the chamber door is made for transparent material to the staff of being convenient for observes the ageing condition of chip, the preceding lateral wall of chamber door is inlayed and is installed ventilative otter board.

Preferably, the rear side wall fixed mounting of bellows has the trunk line, the fixed surface of trunk line installs the branch pipeline, the surface of branch pipeline is provided with the solenoid valve, the free end of branch pipeline is fixed mounting with the rear side wall of test box.

Preferably, a dust screen is inlaid in one side wall of the air box, a motor is fixedly mounted at the bottom of the inner side of the air box through a connecting rod, and fan blades are fixedly mounted on the surface of the output end of the motor.

Preferably, the number of the motors is two, and the two groups of motors are arranged in the same direction, so that the wind power is improved, and the temperature regulation rate is increased.

Preferably, the fan blades are arranged in a circular array.

Compared with the prior art, the beneficial effects of the utility model are that: this integrated circuit chip aging testing device, through the temperature condition in the temperature sensor real-time detection test box, thereby regulate and control its inside temperature according to the temperature environment of required test, heat the air in the test box through the hot plate, improve its test temperature, it rotates to drive the flabellum through the motor, thereby drive the air through bellows, the trunk line, the branch pipeline gets into the test box, blow off by ventilative otter board, reduce its test temperature, through opening and shutting of solenoid valve control branch pipeline, thereby make the multiunit chip carry out the test of different temperatures.

Drawings

FIG. 1 is a schematic structural view of the isometric test of the present invention;

fig. 2 is a schematic rear view of the present invention;

fig. 3 is a first partial sectional structural view of the present invention;

fig. 4 is a schematic structural view of a second partial cross-section of the present invention.

In the figure: 1. a test box; 2. a box door; 3. a gas-permeable net plate; 4. a connecting socket; 5. a chip; 6. a temperature sensor; 7. heating plates; 8. an air box; 9. a controller; 10. a main pipeline; 11. dividing pipelines; 12. an electromagnetic valve; 13. a dust screen; 14. a motor; 15. and fan blades.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Example (b): referring to fig. 1-4, the utility model provides a technical scheme, an integrated circuit chip aging testing device, which comprises a plurality of testing boxes 1 and an air box 8, wherein the testing boxes 1 are provided with a plurality of groups, and the groups of testing boxes 1 are fixedly arranged with each other in an array arrangement, so as to test a plurality of groups of chips 5 under different conditions, a box door 2 is hinged on the front side wall of the testing box 1, the box door 2 is made of transparent material, so as to facilitate workers to observe the aging condition of the chips 5, a breathable net plate 3 is embedded on the front side wall of the box door 2, a connecting socket 4 is arranged on the rear side inner wall of the testing box 1, the chip 5 is fixedly connected on the front side wall of the connecting socket 4, a temperature sensor 6 is fixedly arranged on the rear side inner wall of the testing box 1, the temperature condition in the testing box 1 is detected in real time through the temperature sensor 6, so as to regulate and control the internal temperature according to the temperature environment to be tested, the top of the inner side of the test box 1 is fixedly provided with a heating plate 7, the air in the test box 1 is heated through the heating plate 7, the test temperature is improved, the top of the air box 8 is fixedly provided with a controller 9, the rear side wall of the air box 8 is fixedly provided with a main pipeline 10, the surface of the main pipeline 10 is fixedly provided with a branch pipeline 11, the surface of the branch pipeline 11 is provided with an electromagnetic valve 12, the opening and closing of the branch pipeline 11 are controlled through the electromagnetic valve 12, so that the multiple groups of chips 5 are tested at different temperatures, the free end of the branch pipeline 11 and the rear side wall of the test box 1 are fixedly arranged, a dust screen 13 is embedded and installed on one side wall of the air box 8, the bottom of the inner side of the air box 8 is fixedly provided with motors 14 through connecting rods, the number of the motors 14 is two groups, and the two groups of motors 14 are arranged in the same direction, so as to improve the wind power and accelerate the temperature regulation rate, the output end surface fixed mounting of motor 14 has flabellum 15, and flabellum 15 is the setting of arranging of circular array, drives flabellum 15 through motor 14 and rotates to drive the air and get into test box 1 through bellows 8, trunk line 10, branch pipeline 11, blow off by ventilative otter board 3, reduce its test temperature.

When in use: when using this integrated circuit chip aging testing device, the staff opens chamber door 2, to await measuring chip 5 is placed and is fixed in connection socket 4 department in test box 1, close chamber door 2, according to the required test operating temperature of every group chip 5, through the temperature conditions in the 6 real-time detection test box 1 of temperature sensor, heat the air in test box 1 through hot plate 7, improve test temperature, through opening and shutting of solenoid valve 12 control correspondence subchannel line 11, and drive flabellum 15 through motor 14 and rotate, thereby drive the air through bellows 8, trunk line 10, subchannel line 11 gets into test box 1, blow off by ventilative otter board 3, reduce test temperature, thereby carry out the test of different temperatures to multiunit chip 5.

To sum up, this integrated circuit chip aging testing device, through the temperature condition in the 6 real-time detection test box 1 of temperature sensor, thereby regulate and control its inside temperature according to the temperature environment of required test, heat the air in the test box 1 through hot plate 7, improve its test temperature, drive flabellum 15 through motor 14 and rotate, thereby drive the air through bellows 8, trunk line 10, branch pipeline 11 gets into test box 1, blow off by ventilative otter board 3, reduce its test temperature, through opening and shutting of solenoid valve 12 control branch pipeline 11, thereby make multiunit chip 5 carry out the test of different temperatures, the problem that current aging testing device is not convenient for carry out different pyrometry has been solved, and be difficult to detect multiunit chip.

It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides an integrated circuit chip aging testing device, includes test box (1) and bellows (8), its characterized in that, the rear side inner wall of test box (1) is provided with connection socket (4), the preceding lateral wall fixedly connected with chip (5) of connection socket (4), the rear side inner wall fixed mounting of test box (1) has temperature sensor (6), the inboard top fixed mounting of test box (1) has hot plate (7), the top fixed mounting of bellows (8) has controller (9).

2. The IC chip burn-in test apparatus according to claim 1, wherein the number of the test boxes (1) is multiple, and the multiple test boxes (1) are fixedly mounted to each other in an array arrangement.

3. The IC chip aging testing device according to claim 1, wherein the front side wall of the testing box (1) is hinged with a box door (2), the box door (2) is made of transparent material, and the front side wall of the box door (2) is embedded with a breathable screen (3).

4. The integrated circuit chip aging testing device according to claim 1, wherein the rear side wall of the air box (8) is fixedly provided with a main pipe (10), the surface of the main pipe (10) is fixedly provided with a branch pipe (11), the surface of the branch pipe (11) is provided with an electromagnetic valve (12), and the free end of the branch pipe (11) is fixedly arranged with the rear side wall of the testing box (1).

5. The integrated circuit chip aging testing device according to claim 1, wherein a dust screen (13) is embedded in one side wall of the air box (8), a motor (14) is fixedly installed at the bottom of the inner side of the air box (8) through a connecting rod, and fan blades (15) are fixedly installed on the surface of the output end of the motor (14).

6. The IC chip burn-in tester of claim 5, wherein the number of the motors (14) is two, and the two sets of motors (14) are arranged in the same direction.

7. The IC chip burn-in apparatus of claim 5, wherein the fan blades (15) are arranged in a circular array.