CN218036972U

CN218036972U - Test tool for integrated circuit chip

Info

Publication number: CN218036972U
Application number: CN202222046232.3U
Authority: CN
Inventors: 刘海波
Original assignee: Shenzhen Huaju Chuangxin Technology Co ltd
Current assignee: Shenzhen Huaju Chuangxin Technology Co ltd
Priority date: 2022-08-04
Filing date: 2022-08-04
Publication date: 2022-12-13
Anticipated expiration: 2032-08-04

Abstract

The utility model discloses a test fixture of integrated circuit chip belongs to integrated circuit chip technical field. The test tool comprises a test seat, wherein the interior of the test seat is hollow; two groups of test blocks connected through a screw rod are arranged in the test seat at intervals, and the two groups of test blocks are close to or far away from each other through the rotation of the screw rod; and each group of test blocks is provided with a plurality of test contacts, and the test contacts are contacted with pins of the integrated circuit chip for testing. The two groups of test blocks of the test tool are connected through the screw rod, and through the rotation of the screw rod, the two groups of test blocks are close to or far away from each other, so that the test tool can adapt to integrated circuit chips with different model sizes, and is uniformly distributed with two rows of test contacts and two rows of test contacts which are respectively contacted with the end part and the bending part of the integrated circuit chip pin, so that the end part or the bending part of the integrated circuit chip pin can be tested simultaneously or respectively.

Description

Test tool for integrated circuit chip

Technical Field

The utility model relates to an integrated circuit chip technical field, in particular to integrated circuit chip's test fixture.

Background

The integrated circuit chip is a miniature electronic device capable of realizing a certain circuit function, in order to ensure the stable and smooth work of the integrated circuit chip, the integrated circuit chip needs to be tested to screen out defective products, and the testing tool is used for fixing the integrated circuit chip so as to be convenient for stabilizing a tool for testing the integrated circuit chip.

The integrated circuit chip usually needs to be subjected to electric detection on pins of the integrated circuit chip during detection, but the traditional test tool can only detect the integrated circuit chips in the same batch, but cannot detect the integrated circuit chips in various models.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an integrated circuit chip's test fixture can test the integrated circuit chip of multiple model size.

In order to solve the technical problem, the utility model provides a test tool for an integrated circuit chip, which comprises a test seat, wherein the test seat is hollow;

two groups of test blocks are arranged in the test seat at intervals, the two groups of test blocks are connected through a screw rod, and the two groups of test blocks are close to or far away from each other through the rotation of the screw rod;

and each group of test blocks is provided with a plurality of test contacts, and the test contacts are contacted with pins of the integrated circuit chip for testing.

Preferably, the two groups of test blocks are symmetrically arranged inside the test seat, and the two groups of test blocks slide back and forth in the test seat along the same horizontal plane.

Preferably, the lead screw runs through test seat and two sets of test piece, just the lead screw pass through the bearing with test seat rotates to be connected, with two sets of test piece threaded connection.

Preferably, one group of the test blocks is in forward threaded connection with the screw rod, the other group of the test blocks is in reverse threaded connection with the screw rod, and when the screw rod rotates, the two groups of the test blocks can be close to or far away from each other.

Preferably, the plurality of test contacts are sequentially arranged in the contact grooves of the test block, each contact groove is internally provided with a spring, and the test contacts are pressed against pins of the integrated circuit chip under the action of the springs.

Preferably, two rows of the test contacts are uniformly distributed on each group of the test blocks, and the two rows of the test contacts are respectively contacted with the end parts and the bending parts of the pins of the integrated circuit chip.

Preferably, the distance between adjacent test contacts in the same row is equal to the distance between pins of the integrated circuit chip, so that each pin of the integrated circuit chip is in contact with two test contacts.

Preferably, a plurality of guide rods penetrate through the test seat and are connected with the test block in a sliding mode.

Preferably, the guide rods comprise four guide rods which are symmetrically distributed on two sides of the screw rod.

Preferably, the inner hexagonal holes are formed in the two ends of the screw rod, and the screw rod can be rotated from the two sides of the screw rod.

Compared with the prior art, the beneficial effects of the utility model are that:

1. two groups of test blocks of the test tool of the integrated circuit chip are connected through a screw rod, and the two groups of test blocks are close to or far away from each other through the rotation of the screw rod, so that the test tool is suitable for the integrated circuit chips with different types and sizes;

2. the test tool for the integrated circuit chip is characterized in that two rows of test contacts are uniformly distributed on each group of test blocks of the test tool for the integrated circuit chip, and the two rows of test contacts are respectively contacted with the end parts and the bending parts of the pins of the integrated circuit chip and can simultaneously or respectively test the end parts or the bending parts of the pins of the integrated circuit chip.

Drawings

Fig. 1 is a schematic structural diagram of a test fixture for an integrated circuit chip according to the present invention;

fig. 2 is a top view of a testing tool for an integrated circuit chip provided by the present invention;

fig. 3 is a schematic view of a radial internal structure of a test fixture for an integrated circuit chip according to the present invention;

fig. 4 is a schematic view of an axial internal structure of a test fixture for an integrated circuit chip according to the present invention;

FIG. 5 is a schematic structural view of a test fixture loaded with an integrated circuit chip according to the present invention;

fig. 6 is a schematic view of a radial internal structure of the test fixture loaded with the integrated circuit chip according to the present invention;

fig. 7 is a schematic view of the axial internal structure of the test fixture loaded with the integrated circuit chip.

In the figure: 1. a test seat; 2. a test block; 3. a screw rod; 4. testing the contact; 5. a spring; 6. a guide rod; 100. an integrated circuit chip; 200. and (6) chip pins.

Detailed Description

The invention is described in further detail below with reference to the figures and the specific embodiments. The advantages and features of the present invention will become more fully apparent from the following description and appended claims. It should be noted that the drawings are in simplified form and are not to precise scale, and are provided for convenience and clarity in order to facilitate the description of the embodiments of the present invention.

In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, are not to be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.

The utility model provides a test tool of an integrated circuit chip, please refer to fig. 1 and fig. 2, comprising a test seat 1, wherein the test seat 1 is hollow; two groups of test blocks 2 are arranged in the test seat 1 at intervals, the two groups of test blocks 2 are connected through a screw rod 3, and the two groups of test blocks 2 are close to or far away from each other through the rotation of the screw rod 3; thereby adapting to integrated circuit chips of different model sizes; and a plurality of test contacts 4 are arranged on each group of test blocks 2, and are contacted with pins of the integrated circuit chip through the test contacts 4 for testing.

Specifically, referring to fig. 3 and 4, two sets of the test blocks 2 are symmetrically disposed inside the test seat 1, and the two sets of the test blocks 2 slide back and forth in the test seat 1 along the same horizontal plane.

Further, the screw rod 3 penetrates through the test seat 1 and the two sets of test blocks 2, the screw rod 3 is rotatably connected with the test seat 1 through a bearing and is in threaded connection with the two sets of test blocks 2, one set of the test blocks 2 is in forward threaded connection with the screw rod 3, the other set of the test blocks 2 is in reverse threaded connection with the screw rod 3, and when the screw rod 3 rotates, the two sets of test blocks 2 can be close to or away from each other so as to clamp or loosen the integrated circuit chip 100 to be detected, as shown in fig. 5.

Furthermore, hexagonal hole in all having seted up at 3 both ends of lead screw, follow through the hexagon socket wrench 3 both sides homoenergetic of lead screw are rotated lead screw 3 to realize two sets ofly the regulation of distance between test piece 2.

Specifically, referring to fig. 5 to 7, a plurality of test contacts 4 are sequentially installed in contact slots of the test block 2, a spring 5 is respectively arranged in each contact slot, the test contacts 4 are pressed against pins of an integrated circuit chip under the action of the spring 5, two rows of the test contacts 4 are uniformly distributed on each group of the test block 2, the two rows of the test contacts 4 are respectively contacted with the end portions and the bent portions of the pins of the integrated circuit chip, and the distance between adjacent test contacts 4 in the same row is equal to the distance between the pins of the integrated circuit chip, so that each pin of the integrated circuit chip is contacted with two of the test contacts 4, and the two rows of the test contacts are respectively contacted with the end portions and the bent portions of the pins of the integrated circuit chip in different electrical connection manners, so as to simultaneously or respectively test the end portions or the bent portions of the pins of the integrated circuit chip.

Specifically, run through in the test seat 1 and be provided with many guide bars 6, just guide bar 6 pass and with test piece 2 sliding connection test piece 2 slip in-process plays the guide effect for two sets of test piece 2 can be followed the stable removal in coplanar, be close to each other or keep away from each other promptly.

In some embodiments, the four guide rods 6 are symmetrically distributed on two sides of the screw rod 3, and can effectively guide two groups of the test blocks 2 to stably move along the same plane, i.e. to approach or move away from each other.

The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any changes and modifications made by those skilled in the art according to the above disclosure are all within the scope of the appended claims.

Claims

1. The test tool for the integrated circuit chip is characterized by comprising a test seat (1), wherein the test seat (1) is hollow;

two groups of test blocks (2) are arranged in the test seat (1) at intervals, the two groups of test blocks (2) are connected through a screw rod (3), and the two groups of test blocks (2) are close to or far away from each other through the rotation of the screw rod (3);

and each group of test blocks (2) is provided with a plurality of test contacts (4), and the test contacts (4) are contacted with pins of the integrated circuit chip to carry out testing.

2. The test tool of the integrated circuit chip according to claim 1, wherein the two sets of test blocks (2) are symmetrically disposed inside the test seat (1), and the two sets of test blocks (2) slide back and forth in the test seat (1) along a same horizontal plane.

3. The test tool of the integrated circuit chip according to claim 2, wherein the lead screw (3) penetrates through the test socket (1) and the two sets of test blocks (2), and the lead screw (3) is rotatably connected with the test socket (1) through a bearing and is in threaded connection with the two sets of test blocks (2).

4. The test tool for the integrated circuit chip according to claim 3, wherein one group of the test blocks (2) is in forward threaded connection with the screw rod (3), the other group of the test blocks (2) is in reverse threaded connection with the screw rod (3), and when the screw rod (3) rotates, the two groups of the test blocks (2) can be close to or far away from each other.

5. The test tool of the integrated circuit chip according to claim 1, wherein a plurality of the test contacts (4) are sequentially installed in contact grooves of the test block (2), each contact groove is provided with a spring (5), and the test contacts (4) are pressed against pins of the integrated circuit chip under the action of the springs (5).

6. The test tooling of claim 5, wherein two rows of the test contacts (4) are uniformly distributed on each group of the test blocks (2), and the two rows of the test contacts (4) are respectively contacted with the end parts and the bending parts of the pins of the integrated circuit chip.

7. The test tool for the integrated circuit chip according to claim 6, wherein the distance between adjacent test contacts (4) in the same row is equal to the distance between pins of the integrated circuit chip, so that each pin of the integrated circuit chip is in contact with two test contacts (4).

8. The test tool of the integrated circuit chip according to claim 1, wherein a plurality of guide rods (6) penetrate through the test base (1), and the guide rods (6) penetrate through and are connected with the test block (2) in a sliding manner.

9. The test tool for the integrated circuit chip according to claim 8, wherein the number of the guide rods (6) is four, and the four guide rods are symmetrically distributed on two sides of the screw rod (3).

10. The test tool of the integrated circuit chip according to claim 1, wherein hexagonal socket holes are formed at both ends of the screw rod (3), and the screw rod (3) can be rotated from both sides of the screw rod (3).