CN215768688U - Crystal oscillator testing device - Google Patents
Crystal oscillator testing device Download PDFInfo
- Publication number
- CN215768688U CN215768688U CN202122200618.0U CN202122200618U CN215768688U CN 215768688 U CN215768688 U CN 215768688U CN 202122200618 U CN202122200618 U CN 202122200618U CN 215768688 U CN215768688 U CN 215768688U
- Authority
- CN
- China
- Prior art keywords
- passive
- active
- crystal oscillator
- test
- slot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Oscillators With Electromechanical Resonators (AREA)
Abstract
The application relates to a crystal oscillator testing device, which comprises a substrate, a testing groove, an active output module, a passive oscillation starting module and a power supply module, wherein the testing groove, the active output module, the passive oscillation starting module and the power supply module are arranged on the substrate; the test slots include an active test slot and a passive test slot; the active output module is connected with an output terminal of the active test slot and used for receiving an active test signal output by an active crystal oscillator in the active test slot; the passive oscillation starting module is connected with the passive test slot and is used for starting oscillation of a passive crystal oscillator in the passive test slot so as to output a passive test signal output by the passive crystal oscillator in the passive test slot; the power module is used for respectively supplying power to the active test slot, the passive oscillation starting module and the active output module. The method and the device have the effect of reducing the test cost of testing various different crystal oscillators.
Description
Technical Field
The application relates to the field of crystal oscillator detection, in particular to a crystal oscillator testing device.
Background
The crystal oscillator is one of the most commonly used electronic components in an electronic circuit, and the crystal oscillator has a wide variety of types, for example, the crystal oscillator can be divided into an active crystal oscillator and a passive crystal oscillator, the active crystal oscillators of different types have different working voltages, and the passive crystal oscillator is further divided into a patch type passive crystal oscillator and a plug-in type passive crystal oscillator according to different packaging forms.
At present, a crystal oscillator test board is often used for testing a crystal oscillator, when testing one type of crystal oscillator, a crystal oscillator test board matched with the type of crystal oscillator needs to be used for testing, and when testing various types of crystal oscillators, various crystal oscillator test boards are needed for testing, so that the more the types of the crystal oscillators are tested, the greater the test cost is.
SUMMERY OF THE UTILITY MODEL
In order to reduce the test cost of testing multiple different types of crystal oscillators, the application provides a crystal oscillator testing device.
The application provides a crystal oscillator testing arrangement adopts following technical scheme:
a crystal oscillator testing device comprises a substrate, and a testing groove, an active output module, a passive oscillation starting module and a power supply module which are arranged on the substrate; the test slots include active test slots and passive test slots; the active output module is connected with the output terminal of the active test slot and used for receiving an active test signal output by an active crystal oscillator in the active test slot; the passive oscillation starting module is connected with the passive test slot and is used for starting oscillation of a passive crystal oscillator in the passive test slot so as to output a passive test signal output by the passive crystal oscillator in the passive test slot; the power module is used for respectively supplying power to the active test slot, the passive oscillation starting module and the active output module.
By adopting the technical scheme, the power supply module supplies power to the active test slot, the passive oscillation starting module and the active output module, when the active test slot is electrified, the output terminal of the active test slot outputs an active test signal, and the active output module receives and outputs the active test signal; when the passive oscillation starting module is connected with the power supply, the passive oscillation starting module starts oscillation of the passive crystal oscillator, the passive oscillation starting module receives a passive test signal output by the passive crystal oscillator in the passive test slot and outputs the passive test signal, namely, the crystal oscillator testing device can measure the active crystal oscillator and the passive crystal oscillator, the active crystal oscillator is not required to be tested by independently depending on the active test board, the passive test board is not required to be tested by independently depending on the passive test board, and the test cost for testing different types of crystal oscillators is reduced.
Optionally, the substrate is divided into an active area and an inactive area, the active test slot and the active output module are both located in the active area, and the passive test slot and the passive oscillation starting module are both located in the inactive area.
Through adopting above-mentioned technical scheme, the division of active area and passive area makes active test groove and passive test groove separately, conveniently tests active crystal oscillator and passive crystal oscillator, thereby avoids active crystal oscillator and passive crystal oscillator chaotic when the test and leads to measurement of efficiency to reduce.
Optionally, the active output module includes: the input end of the operational amplifier is connected with the output terminal of the active test slot and is used for processing and outputting data information contained in the active test signal; and the active output port is connected with the output end of the operational amplifier and used for receiving and outputting the active test signal processed by the operational amplifier.
The operational amplifier is used for distorting and amplifying data of the active test signal, reducing the distortion degree of the active test signal and amplifying the active test signal, and improving the reliability of a test result contained in the active test signal.
Optionally, the passive test slot includes: the chip mounting groove is internally provided with a groove package which is adaptive to the chip mounting type passive crystal oscillator; and the insertion groove is internally provided with an insertion groove package which is adapted to the insertion type passive crystal oscillator.
By adopting the technical scheme, the groove package is used for placing the surface mount type passive crystal oscillator, so that the surface mount groove can test the surface mount type passive crystal oscillator; the socket package is used for fixing the plug-in passive crystal oscillator, so that the socket can test the plug-in passive crystal oscillator. By adopting the technical means, the surface mounting groove correspondingly tests the surface mounting type passive crystal oscillator, and the insertion groove correspondingly tests the plug-in type passive crystal oscillator, so that the test cost for testing the surface mounting type passive crystal oscillator and the plug-in type passive crystal oscillator is reduced.
Optionally, the passive oscillation starting module includes: the passive oscillation starting chip is used for starting oscillation of the surface mount type passive crystal oscillator and the plug-in type passive crystal oscillator and outputting passive test signals output by the surface mount type passive crystal oscillator and the plug-in type passive crystal oscillator; and the passive output port is connected with the output pin of the passive oscillation starting chip and used for receiving and outputting the passive test signal.
Optionally, the passive oscillation starting chip is an SN74 passive oscillation starting chip.
Optionally, the patch slot or/and the insertion slot is configured with an adjustable capacitance module, one end of the adjustable capacitance module is connected with the patch slot or/and the insertion slot, and the other end is grounded.
Optionally, the adjustable capacitor module includes a fixed capacitor and an adjustable capacitor, a common end of the fixed capacitor connected to the adjustable capacitor is connected to the patch slot or/and the insertion slot, and a short connector is disposed at an end of the adjustable capacitor close to the patch slot or/and the insertion slot.
By adopting the technical scheme, when the capacitance of the chip groove is smaller than the matching capacitance of the chip passive crystal oscillator, the short circuit device is in short circuit connection to increase the capacitance of the chip groove, so that the capacitance of the chip groove can meet the matching capacitance of the chip passive crystal oscillator; when the capacitance of the insertion groove is smaller than the matching capacitance of the insertion passive crystal oscillator, the short circuit device is in short circuit connection, so that the capacitance of the insertion groove is increased, and the capacitance of the insertion groove can meet the matching capacitance of the insertion passive crystal oscillator. By adopting the technical means, the chip slot and the insertion slot can be adapted to more passive crystal oscillators, and the test cost for testing various passive crystal oscillators is reduced.
In summary, the present application includes at least one of the following beneficial technical effects:
1. the passive test groove is divided into a patch groove and an insertion groove, a groove package is arranged in the patch groove and is used for contacting the patch type passive crystal oscillator with the patch groove, and therefore the patch groove can test the patch type passive crystal oscillator; the slot package is arranged in the insertion slot and used for fixing the plug-in passive crystal oscillator, so that the plug-in passive crystal oscillator can be tested by the slot. The test cost for testing the patch type passive crystal oscillator and the plug-in type passive crystal oscillator is reduced by adopting the patch groove and the insertion groove.
Drawings
Fig. 1 is a schematic structural diagram of a crystal oscillator test apparatus in an embodiment of the present application.
Fig. 2 is a system diagram of a crystal oscillator test apparatus in an embodiment of the present application.
Fig. 3 is a circuit diagram of a power module in an embodiment of the present application.
Description of reference numerals: 1. a substrate; 11. an active region; 12. a non-source region; 13. an electrical connection port; 2. a power supply module; 3. an active test slot; 4. a passive test slot; 41. a patch slot; 42. inserting the groove; 5. an active output module; 51. an operational amplifier; 52. an active output port; 6. a passive oscillation starting module; 61. a passive oscillation starting chip; 62. a passive output port; 7. an adjustable capacitance module; 71. and a short-circuit device.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
Referring to fig. 1 and 2, the crystal oscillator testing device includes a substrate 1, and a power module 2, a test slot, an active output module 5, and a passive oscillation starting module 6, which are disposed on the substrate 1, where the test slot includes an active test slot 3 and a passive test slot 4, the active output module 5 is connected to an output terminal of the active test slot 3 and outputs an active test signal, the passive oscillation starting module 6 is connected to the passive test slot 4 and is configured to start oscillation of a passive crystal oscillator in the passive test slot 4, after the passive crystal oscillator starts oscillation, the passive oscillation starting module 6 outputs a passive test signal, the power module 2 is configured to supply power to the active test slot 3, the active output module 5, and the passive oscillation starting module 6, so that the active test slot 3 is powered to test the active crystal oscillator, the active output module 5 is powered to receive the active test signal and output the active test signal, and the passive oscillation starting module 6 is powered to provide an oscillation starting voltage for the passive crystal oscillator, the crystal oscillator testing device can meet the testing requirements of the active crystal oscillator and the passive crystal oscillator, and the testing cost of the active crystal oscillator and the passive crystal oscillator is reduced.
In order to avoid confusion during testing of the active crystal oscillator and the passive crystal oscillator, the substrate 1 is divided into an active area 11 and a passive area 12, the active test slot 3 and the active output module 5 are positioned in the active area 11, and the active crystal oscillator is placed in the active test slot 3; the passive test slot 4 and the passive oscillation starting module 6 are positioned in the passive area 12, wherein a patch type passive crystal oscillator and a plug-in type passive crystal oscillator are placed in the passive test slot 4.
An electrical connection port 13 is further disposed on the substrate 1, and the electrical connection port 13 is connected to an external power source for connecting a fixed voltage to the power module 2, in this example, the fixed voltage connected to the electrical connection port 13 is 5V.
Referring to fig. 2 and 3, the power module 2 provides three specifications of test voltages for the active test slot 3, and the power module 2 also provides a working voltage for the active output module 5 and a vibration voltage for the passive vibration module 6.
In order to enable the power module 2 to output the test voltage, the operating voltage and the start-up voltage, the power module 2 is provided with an input terminal e and four output terminals, wherein the four output terminals are an output terminal a, an output terminal b, an output terminal c and an output terminal d. The output terminal a is connected with the active output module 5 and outputs 5V test voltage, the output terminal c is connected with the passive oscillation starting module 6 and outputs 3.3V test voltage, a voltage stabilizer is connected between the output terminal a and the output terminal c and converts the 5V test voltage into the 3.3V test voltage, the output terminal b is connected with the input terminal of the active test slot 3, and the d is grounded. When the active crystal oscillator is tested, if the test voltage of the active crystal oscillator is 5V, the output terminal a is connected with the output terminal b, and the output terminal b outputs the voltage of 5V to the active test slot 3; if the test voltage of the active crystal oscillator is 3.3V, connecting the output terminal b with the output terminal c, and outputting the voltage of 3.3V to the active test slot 3 by the output terminal b; if the test voltage of the active crystal oscillator is not 5V or 3.3V, the test voltage which is the same as the working voltage of the active crystal oscillator is externally connected from the output terminal e and then is output to the active test slot 3 by the output terminal b.
In this example, the voltage regulator is an ADP151 voltage regulator.
The active test slot 3 is used for testing the active crystal oscillator and an output terminal of the active test slot 3 outputs an active test signal of the active crystal oscillator. In this example, in order to avoid the problem of test result deviation caused by poor contact between the active test slots 3 and the active crystal oscillator, two active test slots 3 are provided, one active test slot 3 is provided on one side of the power module 2, and since the active crystal oscillator usually adopts a patch type package, a groove package adapted to the patch type active crystal oscillator is provided in each of the two active test slots 3.
In order to facilitate transmission of active test signals output by the output terminals of the two active test slots 3, the active output module 5 is arranged between the two active test slots 3, the active output module 5 includes an operational amplifier 51 and an active output port 52, the working voltage of the operational amplifier 51 is 5V, the input end of the operational amplifier 51 is connected with the output terminal a of the power module 2, the input end of the operational amplifier 51 is further connected with the output terminals of the two active test slots 3, and the operational amplifier 51 is used for performing distortion processing on the active test signals output by the output terminals of the two active test slots 3 and amplifying and outputting the active test signals; the active output port 52 is connected to the output terminal of the operational amplifier 51, and the active output port 52 receives and outputs the active test signal.
In the present example, the operational amplifier 51 is an AD8045 operational amplifier.
In order to enable the passive test slot 4 to accommodate both the surface mount type passive crystal oscillator and the insertion type passive crystal oscillator, the passive test slot 4 is divided into a chip slot 41 and an insertion slot 42. A groove package adapted to the surface mount type passive crystal oscillator is arranged in the surface mount groove 41, and the groove package is used for connecting the surface mount type passive crystal oscillator with the surface mount groove 41, so that the surface mount groove 41 tests the surface mount type passive crystal oscillator and outputs a passive test signal through an output terminal of the surface mount groove 41; the insertion slot 42 is provided therein with an insertion slot package adapted to the insertion passive crystal oscillator, and the insertion slot package is used to fix the insertion passive crystal oscillator, so that the insertion slot 42 tests the insertion passive crystal oscillator and outputs a passive test signal from an output terminal of the insertion slot 42.
The adjustable capacitor module 7 is connected with the passive test slot 4 and used for improving or reducing the working capacitance of the passive test slot 4, the adjustable capacitor module 7 comprises a fixed capacitor and a short circuit device 71 connected with the fixed capacitor in series, and when the capacitance of the passive test slot 4 is smaller than the matching capacitance of the passive crystal oscillator, the input terminal and the output terminal of the short circuit device 71 are in short circuit, so that the capacitance of the passive test slot 4 is increased, and the passive crystal oscillator is matched with the passive test slot 4 and located in the passive test slot 4. In this example, in order to make the chip pocket 41 satisfy the matching capacitance of the chip-type passive crystal oscillator and the insertion pocket 42 satisfy the matching capacitance of the plug-in type passive crystal oscillator, one tunable capacitance module 7 is provided on each of the input terminal and the output terminal of the chip pocket 41 and the input terminal and the output terminal of the insertion pocket 42.
The passive oscillation starting module 6 comprises a passive oscillation starting chip 61 and a passive output port 62, the passive oscillation starting chip 61 is used for starting oscillation of the passive crystal oscillator and outputting a passive test signal, the passive output port 62 is connected with an output pin of the passive oscillation starting chip 61, and the passive output port 62 is used for receiving the passive test signal and outputting the passive test signal. Specifically, one passive oscillation starting chip 61 may provide oscillation starting voltages for the patch type passive crystal oscillator in the patch slot 41 and the plug-in type passive crystal oscillator in the insertion slot 42, respectively; two passive oscillation starting chips 61 may also be provided, one of which provides an oscillation starting voltage for the patch-type passive crystal oscillator in the patch slot 41, and the other of which provides an oscillation starting voltage for the plug-in passive crystal oscillator in the insertion slot 42, in this example, for convenience of separately packaging the patch slot 41 and the insertion slot 42, two passive oscillation starting chips 61 are provided, and each passive oscillation starting chip 61 corresponds to one passive output port 62, and the passive oscillation starting chip 61 employs an SN74 passive oscillation starting chip.
The implementation principle of the crystal oscillator testing device in the embodiment of the application is as follows: firstly, a power module 2 supplies power to an active test slot 3, an active output module 5 and a passive oscillation starting module 6; then, the active test slot 3 is used for placing the active crystal oscillator and outputting an active test signal output by the active crystal oscillator in the active test slot 3, the active output module 5 outputs the active test signal after distorting and amplifying the active test signal, the passive oscillation starting module 6 is connected with the passive crystal oscillator with the start of oscillation starting position in the passive test slot 4, the passive oscillation starting module 6 receives and outputs the passive test signal output by the passive crystal oscillator in the passive test slot 4, the crystal oscillator testing device can test the active crystal oscillator and the passive crystal oscillator, and the testing cost for testing the active crystal oscillator and the passive crystal oscillator is reduced.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.
Claims (8)
1. A crystal oscillator testing device is characterized in that: the device comprises a substrate (1), and a test slot, an active output module (5), a passive oscillation starting module (6) and a power module (2) which are arranged on the substrate (1);
the test slots include an active test slot (3) and a passive test slot (4);
the active output module (5) is connected with an output terminal of the active test slot (3) and is used for receiving an active test signal output by an active crystal oscillator in the active test slot (3);
the passive oscillation starting module (6) is connected with the passive test slot (4) and is used for starting oscillation of a passive crystal oscillator in the passive test slot (4) so as to output a passive test signal output by the passive crystal oscillator in the passive test slot (4);
the power module (2) is used for respectively supplying power to the active test slot (3), the passive oscillation starting module (6) and the active output module (5).
2. The crystal oscillator test apparatus according to claim 1, characterized in that: the substrate (1) is divided into an active area (11) and a passive area (12), the active test slots (3) and the active output modules (5) are located in the active area (11), and the passive test slots (4) and the passive vibration starting modules (6) are located in the passive area (12).
3. The crystal oscillator test apparatus according to claim 1, characterized in that: the active output module (5) comprises:
the input end of the operational amplifier (51) is connected with the output terminal of the active test slot (3) and is used for processing and outputting data information contained in the active test signal; and
and the active output port (52) is connected with the output end of the operational amplifier (51) and is used for receiving and outputting the active test signal processed by the operational amplifier (51).
4. The crystal oscillator test apparatus according to claim 1, characterized in that: the passive test slot (4) comprises: the chip mounting structure comprises a chip mounting groove (41), wherein a groove package which is adaptive to a chip mounting type passive crystal oscillator is arranged in the chip mounting groove (41); and
and the insertion groove (42) is internally provided with an insertion groove package which is matched with the insertion type passive crystal oscillator.
5. The crystal oscillator test apparatus according to claim 1, characterized in that: the passive oscillation starting module (6) comprises:
the passive oscillation starting chip (61) is used for starting oscillation of the surface mount type passive crystal oscillator and the plug-in type passive crystal oscillator and outputting passive test signals output by the surface mount type passive crystal oscillator and the plug-in type passive crystal oscillator; and
and the passive output port (62) is connected with the output pin of the passive oscillation starting chip (61) and is used for receiving and outputting a passive test signal.
6. The crystal oscillator test apparatus according to claim 5, wherein: the passive oscillation starting chip (61) is an SN74 passive oscillation starting chip.
7. The crystal oscillator test apparatus according to claim 4, wherein: the patch slot (41) or/and the insertion slot (42) is/are provided with an adjustable capacitor module (7), one end of the adjustable capacitor module (7) is connected with the patch slot (41) or/and the insertion slot (42), and the other end is grounded.
8. The crystal oscillator test apparatus according to claim 7, wherein: adjustable capacitor module (7) are including fixed electric capacity and short circuit ware (71), fixed electric capacity with the common terminal that adjustable electric capacity is connected with paster groove (41) or/and insertion slot (42), the one end that adjustable electric capacity is close to paster groove (41) or/and insertion slot (42) is provided with short circuit ware (71).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122200618.0U CN215768688U (en) | 2021-09-11 | 2021-09-11 | Crystal oscillator testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122200618.0U CN215768688U (en) | 2021-09-11 | 2021-09-11 | Crystal oscillator testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215768688U true CN215768688U (en) | 2022-02-08 |
Family
ID=80086825
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122200618.0U Active CN215768688U (en) | 2021-09-11 | 2021-09-11 | Crystal oscillator testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215768688U (en) |
-
2021
- 2021-09-11 CN CN202122200618.0U patent/CN215768688U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| WO2011036718A1 (en) | Probe apparatus and testing apparatus | |
| CN101452097A (en) | Optical transceiver | |
| US6771088B2 (en) | Method and apparatus for testing semiconductor devices using the back side of a circuit board | |
| KR970073264A (en) | CARD SYSTEM AND MAKING METHOD OF THE SAME | |
| CN111060778A (en) | Intermediate connecting member and testing device | |
| CN215768688U (en) | Crystal oscillator testing device | |
| CN214895487U (en) | Fuel cell voltage inspection connecting structure and voltage inspection integrated assembly mounting structure | |
| CN218584902U (en) | Power-on aging device for quartz crystal resonator | |
| MY115457A (en) | Structure of ic device interface unit | |
| CN115902310A (en) | Multi-package LCR (liquid crystal storage controller) quick adaptation testing device and operation method thereof | |
| CN211297203U (en) | Jig for connecting board card | |
| US7357646B1 (en) | Removable electronic assembly that requires validation | |
| CN111161788A (en) | Aging testing device of memory | |
| CN218824585U (en) | Aging daughter board, aging test assembly and performance test assembly | |
| CN219226663U (en) | Adapter plate and DDR5 memory bank adapter plate | |
| CN217643852U (en) | PCB board | |
| CN221078871U (en) | Testing device of JDSPF28335 type digital signal processor circuit based on J750EX-HD | |
| KR20040033683A (en) | Printed Circuit board | |
| US8421490B2 (en) | Loading card for measuring voltages | |
| CN102693175A (en) | Mainboard test system and test jig thereof | |
| CN218003680U (en) | Testing device | |
| CN216053014U (en) | USB expansion module control circuit and device | |
| CN219715670U (en) | Test panel and performance test assembly | |
| CN215866790U (en) | Test fixture for semiconductor device | |
| CN219106525U (en) | Test fixture for radio frequency module packaged by patch |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |