CN211955230U - Microscope device, image processing device, and microscopic analysis system - Google Patents
Microscope device, image processing device, and microscopic analysis system Download PDFInfo
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- CN211955230U CN211955230U CN201922207815.8U CN201922207815U CN211955230U CN 211955230 U CN211955230 U CN 211955230U CN 201922207815 U CN201922207815 U CN 201922207815U CN 211955230 U CN211955230 U CN 211955230U
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Abstract
The utility model relates to a microscopic device, image processing apparatus and microscopic analysis system. An image processing apparatus comprising: a receiving device configured to receive a digital image formed by a microscopy device, the digital image comprising a scale pattern; a storage device configured to store the digital image; and a processor configured to determine a magnification of the microscopy apparatus from the scale pattern.
Description
Technical Field
The utility model relates to a microscopic device, image processing apparatus and microscopic analysis system.
Background
At present, the existing sample plate for cell counting or analysis usually includes 1 or more sample grooves, and the sample grooves are used for accommodating cell samples to be detected, and then parameters such as the number, concentration, size and the like of the cells are obtained through a microscopic imaging system and an image analysis system. However, the detection of these parameters depends on the observation capabilities of the microscope or microscopic imaging system, wherein the most important and important characteristic parameter is the magnification, and the actual magnification of many commercially available microscopic instruments is not consistent with its nominal value.
At present, the calibration and calibration of the microscope magnification mainly adopts a micrometer or a similar micrometer technology, and the actual magnification of the microscope is calibrated through the matching of an eyepiece micrometer and an objective micrometer. For example, the actual magnification of the microscope is calculated by comparing the dimensions obtained in the microscopic imaging system with the known dimensions of the spaces in the ruler. However, these techniques have certain defects, when the eyepiece or the objective lens is replaced, the calibration needs to be performed again, and the sample to be detected needs to be taken down at this time, which causes repetition and trouble of operation, needs to search for the original observation field again, and causes the movement of the sample in the sample tank to affect the observation result.
Therefore, the method has very important significance for measuring the magnification of a microscope or a microscopic imaging system, and the existing cell counting plate does not have the capability of accurately calibrating the magnification of the microscope, so that the detected parameters are inconsistent with the actual parameters, and the accuracy of the final result is influenced
SUMMERY OF THE UTILITY MODEL
According to an aspect of the present invention, there is provided a microscope device, comprising: an optical imaging apparatus configured to form an optical image of a sample, wherein a scale pattern for determining a magnification of the microscopy apparatus is included in the optical image; an image sensor configured to generate a digital image from the optical image; and a transmitting device configured to transmit the digital image.
In some embodiments according to the invention, the microscopy apparatus further comprises: an input device configured to input pattern information about the scale pattern.
In some embodiments according to the invention, the transmitting means is further configured to transmit the pattern information.
In some embodiments according to the invention, the pattern information comprises at least one of: a size of the scale pattern; an identifier of the scale pattern; and the direction of the scale pattern.
In some embodiments according to the invention, the input device is further configured to input first sample information about the sample.
In some embodiments according to the invention, the first sample information comprises a sample type.
According to another aspect of the present invention, there is provided an image processing apparatus, comprising: a receiving device configured to receive a digital image formed by a microscopy device, the digital image comprising a scale pattern; a storage device configured to store the digital image; a processor configured to determine a magnification of the microscopy apparatus from the scale pattern; and a transmitting device configured to transmit the digital image and the magnification.
In some embodiments according to the invention, the receiving means further receives pattern information about the scale pattern.
In some embodiments according to the invention, the processor is further configured to determine a magnification of the microscopic means from the pattern information.
In some embodiments according to the invention, the processor is further configured to determine an orientation of a sample plate on which the sample is located according to the pattern information.
In some embodiments according to the invention, the processor is further configured to classify the digital image according to the pattern information.
In some embodiments according to the invention, the processor is further configured to generate a first image from the pattern information, and to add the first image to the digital image.
In some embodiments according to the invention, the receiving device further receives first sample information about the sample.
In some embodiments according to the invention, the processor is further configured to classify the digital image according to the first sample information.
In some embodiments according to the invention, the processor is further configured to generate a second image from the first sample information, and to add the second image to the digital image.
In some embodiments according to the invention, the processor is further configured to search the storage device for other images of the same category as the digital image according to the category of the digital image, the image processing device further comprising: a transmitting device configured to transmit the other image.
In some embodiments according to the invention, the processor is further configured to analyze the digital image according to the scale pattern to obtain second sample information about a sample in the digital image.
In some embodiments according to the invention, the processor is further configured to classify the digital image according to the second sample information.
In some embodiments according to the invention, the processor is further configured to search the storage device for other images of the same category as the digital image according to the category of the digital image, the image processing device further comprising: a transmitting device configured to transmit the other image.
In some embodiments according to the invention, the second sample information comprises at least one of: diameter value of the sample; the major and minor axis values of the sample; the size of the shooting field of view; and the concentration value of the sample.
According to yet another aspect of the present invention, there is provided a method of determining magnification of a microscopic device, comprising: acquiring an image captured by the microscopy device, wherein the image comprises a scale pattern on a sample plate; determining a size of an image formed by the scale pattern on the image sensor; and determining the magnification of the microscope device according to the size of the scale pattern on the sample plate and the size of the image formed by the scale pattern on the image sensor.
In some embodiments according to the invention, the size of the image formed by the scale pattern on the image sensor is determined according to the pitch of adjacent pixels of the image sensor of the microscopy apparatus.
In some embodiments according to the invention, the scale pattern comprises a plurality of line segments, the method comprising: calculating a plurality of values of the magnification of the microscopy apparatus from the length of each of the plurality of line segments; and calculating an average of the plurality of values as a magnification of the microscopy apparatus.
In some embodiments according to the invention, the scale pattern comprises a plurality of line segments, the method comprising: calculating a magnification of the microscopic means from a sum of the lengths of the plurality of line segments.
According to a further aspect of the present invention, there is provided a microscopic analysis system comprising: the aforesaid is according to the utility model discloses a microscopic device and the aforesaid is according to the utility model discloses an image processing apparatus.
In some embodiments according to the invention, the microscopic analysis system further comprises: a mobile device configured to receive and display the digital image from the microscopy apparatus or the image processing apparatus.
In some embodiments according to the invention, the mobile device is further configured to send the shooting parameters to the microscopy apparatus; and the microscope device shoots according to the shooting parameters.
According to a further aspect of the present invention, there is provided a microscopic analysis system comprising: the microscope device according to the present invention and the image processing device according to the present invention,
wherein the processor is further configured to analyze the digital image according to the scale pattern to obtain second sample information about a sample in the digital image,
the microscopic analysis system further comprises:
a mobile device configured to receive and display the digital image from the microscopy apparatus or the image processing apparatus,
wherein the mobile device is further configured to receive the second sample information.
According to a further aspect of the present invention, there is provided a microscopic analysis system comprising:
a cloud server, a microscopic device and a mobile device,
wherein the microscopic means comprises:
an optical imaging device configured to take a sample in a sample plate, thereby forming an optical image of the sample, wherein the optical image includes a scale pattern for determining a magnification of the microscopy apparatus;
an image sensor configured to generate a digital image from the optical image;
a transmitting device configured to transmit the digital image; and
a receiving device configured to receive information from the cloud server and a mobile device,
the mobile device is configured to
Receiving digital images from the cloud server and the microscopy device;
sending the shooting parameters to the cloud server and the microscopic device; and
sending the digital image from the microscopy apparatus to the cloud server, the cloud server configured to
Receiving digital images from the microscopy apparatus and the mobile device;
receiving shooting parameters from the mobile equipment and forwarding the shooting parameters to the microscopic device;
sending the digital image from the microscopy apparatus to the mobile device;
the digital image is analyzed and the results of the analysis are sent to the mobile device.
In some embodiments according to the invention, the cloud server is further configured to send updates of applications to the microscopic means and the mobile device.
In some embodiments according to the invention, the sample plate comprises: a sample tank for holding a sample; and a scale pattern for determining magnification.
Other features of the present invention and advantages thereof will become apparent from the following detailed description of exemplary embodiments of the invention, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention.
The invention will be more clearly understood from the following detailed description, with reference to the accompanying drawings, in which:
fig. 1 shows a schematic view of a microscopy apparatus according to some embodiments of the present invention.
Fig. 2 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 3 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 4 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 5 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 6A illustrates a scale pattern on a sample plate according to some embodiments of the present invention.
Fig. 6B illustrates an image of a scale pattern on a sample plate according to some embodiments of the invention.
Fig. 7 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 8 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 9 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 10 shows a schematic view of a sample plate according to some embodiments of the present invention.
Fig. 11 illustrates a set of scale lines in a scale pattern on a sample plate according to some embodiments of the present invention.
Fig. 12 illustrates a flow chart of the operation of a microscopy apparatus according to some embodiments of the present invention.
Fig. 13 shows a schematic diagram of a pixel arrangement direction of an image sensor according to some embodiments of the present invention.
Fig. 14 shows a schematic view of a microscopy apparatus according to some embodiments of the present invention.
Fig. 15 shows a schematic diagram of an image processing apparatus according to some embodiments of the present invention.
Fig. 16 shows a microscopic image according to some embodiments of the present invention.
Fig. 17 shows a microscopic image according to some embodiments of the present invention.
Fig. 18 shows a microscopic image according to some embodiments of the present invention.
Fig. 19 shows a schematic view of a microscopy apparatus according to some embodiments of the present invention.
Fig. 20 shows a microscopic image according to some embodiments of the present invention.
Fig. 21 illustrates a microanalysis system according to some embodiments of the invention.
Note that in the embodiments described below, the same reference numerals are used in common between different drawings to denote the same portions or portions having the same functions, and a repetitive description thereof will be omitted. In this specification, like reference numerals and letters are used to designate like items, and therefore, once an item is defined in one drawing, further discussion thereof is not required in subsequent drawings.
For convenience of understanding, the positions, sizes, ranges, and the like of the respective structures shown in the drawings and the like do not sometimes indicate actual positions, sizes, ranges, and the like. Therefore, the disclosed invention is not limited to the positions, dimensions, ranges, and the like disclosed in the drawings and the like.
Detailed Description
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: unless specifically stated otherwise, the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
Fig. 1 shows a schematic view of a microscopy apparatus according to an embodiment of the present invention.
As shown in fig. 1, the microscopy apparatus 100 comprises an image sensor 101, a memory 102, a processor 103, an optical imaging device 104, a sample stage 105 and a light source 106. In operation, a sample plate to be observed is arranged on the sample stage 105. Light from the light source 106 is directed onto the sample plate. The optical imaging device 104 may include, for example, an objective lens and an eyepiece lens (not shown), each of which may be made up of one or more sets of lenses. The optical image formed by the optical device 104 is received by the image sensor 101 and converted into a digital image by the image sensor 101. The image sensor may be, for example, a Charge Coupled Device (CCD), a Complementary Metal Oxide Semiconductor (CMOS), or the like. In some embodiments according to the present invention, image capturing devices, such as cell phones, cameras, etc., which also include image sensors and are capable of capturing images of samples in the sample plate via the optical device 104, may also be disposed in the optical path.
The digital image obtained by the image sensor 101 is stored in the memory 102, and the processor 103 may read the digital image in the memory 102 and process the digital image.
Fig. 2 shows a schematic view of a sample plate according to some embodiments of the present invention. As shown in fig. 2, the sample plate 200 includes a plurality of sample wells 201, and a sample to be observed and photographed can be accommodated in the sample wells 201. In addition, the sample plate 200 has a scale pattern 202.
In the exemplary embodiment shown in fig. 2, the scale pattern 202 is located at the bottom of the sample well (i.e., on the surface of the sample well that is in contact with the sample therein). In obtaining an image of a sample by the microscopy apparatus 100, the optical imaging device 104 is typically focused on the bottom of the sample well, and positioning the scale pattern 202 on the bottom of the sample well allows a sharp image of the scale pattern to be obtained at the same time as the image of the sample is obtained. The scale pattern 202 is a line segment in the horizontal direction and has a length L. For example, in some exemplary embodiments, L may be 1 μm-100 μm. With this scale pattern 202, the magnification of the microscope device 100 can be accurately calculated.
For example, as shown in fig. 13, for the image sensor 101 in which pixels are uniformly arranged in two directions (X direction and Y direction) perpendicular to each other, it is assumed that coordinates of both ends of a line segment of the scale pattern 202 in a digital image generated by the image sensor 101 are (X1, Y1) and (X2, Y2), respectively. Here, coordinates (x1, y1) and (x2, y2) represent the positions of pixels corresponding to both ends of the line segment on the image sensor 101. The size K of the line image formed on the image sensor 101 by the line segments on the sample plate can be calculated according to formula (1):
K＝D·sqrt[(x2-x1)2+(y2-y1)2] (1)
where D is the pitch of adjacent pixels in the image sensor 101, i.e., the distance from the center of one pixel to the center of an adjacent pixel along the X-direction or the Y-direction. The function sqrt represents calculating the square root.
Then, the magnification M of the optical imaging device 104 of the microscope apparatus 100 can be calculated according to the following formula (2):
M＝K/L (2)
in the above manner, the actual magnification of the microscope device 100 can be accurately obtained.
In the above exemplary embodiment, the pixel array of the image sensor 101 is a rectangular array, and the pitches of adjacent pixels are the same in the X direction and the Y direction. In other embodiments according to the present invention, the pitch of adjacent pixels of the image sensor 101 is different in the X-direction and the Y-direction. For example, if the pitch of the adjacent pixels in the X direction is D1 and the pitch of the adjacent pixels in the Y direction is D2, the size K of the line image formed on the image sensor 101 by the line segment on the sample plate can be calculated according to the following formula (3):
K＝sqrt[(D1)2·(x2-x1)2+(D2)2·(y2-y1)2] (3)
then, the actual magnification M of the microscope device 100 can be calculated according to the above formula (2).
The above calculation of the actual magnification may be performed by, for example, the processor 103 of the microscopy apparatus 100. For example, the pitches of adjacent pixels of the image sensor 101 may be stored in the memory 102 in advance. After the image sensor 101 generates a digital image of the sample plate 200, the digital image is stored in the memory 102.
The processor 103 then reads the digital image from the memory 102, identifying the scale pattern in the digital image. Next, the processor 103 may read the pitch of the adjacent pixels of the image sensor 101 from the memory and calculate the actual magnification M of the microscopic device 101 according to the above equations (1) - (3).
Furthermore, in some embodiments according to the present invention, for a sample plate 200 having a plurality of sample wells 201, the magnification M may also be calculated in the following manner.
For the sample plate 200 shown in fig. 2 having three sample grooves 201, it is possible to calculate the corresponding magnifications M1, M2, and M3, respectively, based on the scale pattern 202 on each sample groove 201, and then calculate the actual magnification M of the microscope device by equation (4).
M＝(M1+M2+M3)/3 (4)
That is, the average of the magnifications M1, M2, and M3 was taken as the actual magnification M of the microscope apparatus. By adopting the mode, the calculation error can be reduced, and the accuracy of the magnification is further improved.
Further, in other embodiments according to the present invention, the sum K' of the line segments of each scale pattern 202 may be calculated by the following formula (5).
K’＝D·sqrt[(x2-x1)2+(y2-y1)2]
+D·sqrt[(x3-x4)2+(y3-y4)2]
+D·sqrt[(x5-x6)2+(y5-y6)2] (5)
Where, (x1, y1) and (x2, y2) are coordinates in a digital image of both ends of a line segment of the scale pattern of the first sample groove 202 in the upper part of fig. 2, (x3, y3) and (x4, y4) are coordinates in a digital image of both ends of a line segment of the scale pattern of the second sample groove 202 in the middle part of fig. 2, (x5, y5) and (x6, y6) are coordinates in a digital image of both ends of a line segment of the scale pattern of the third sample groove 202 in the lower part of fig. 2.
Then, the actual magnification M of the microscopic device can be calculated by equation (6).
M＝K’/(3L) (6)
By adopting the mode, the calculation error can be reduced, and the accuracy of the magnification is further improved.
The above briefly describes how the actual magnification of the microscope device 100 is calculated from the scale pattern on the sample plate. It should be understood that the present invention is not limited to the above-described manner. Other ways of calculating the actual magnification of the microscopy apparatus 100 from the scale pattern may be used by those skilled in the art, given the teachings and teachings of the present invention.
Fig. 3 shows a schematic view of a sample plate according to some embodiments of the present invention. As shown in fig. 3, the sample plate 300 includes a plurality of sample wells 301, and a sample to be observed and photographed can be accommodated in the sample wells 301. In addition, the sample plate 300 has a scale pattern 302.
In the exemplary embodiment shown in fig. 3, the scale pattern 302 is located at the bottom of the sample trench. The scale pattern 302 is equally-spaced scale lines each extending in the horizontal direction (first direction), and each scale line is spaced apart at a distance D in the vertical direction (second direction). In some exemplary embodiments according to the present invention, the spacing D may be, for example, 1 μm to 10 μm. With the scale pattern 302, the magnification of the microscope apparatus can be accurately calculated.
For example, the processor 103 may obtain the coordinates (x1 ', y 1') of one point on one scale line in the scale pattern 302 and the coordinates (x2 ', y 2') of the intersection of the passing point (x1 ', y 1') with the adjacent scale line in the direction perpendicular to the scale line, from the digital image generated by the image sensor 101.
The actual magnification of the microscopy apparatus 100 may be calculated using a method similar to that described above.
In the example shown in fig. 3, there are a plurality of graduation marks 302 on each sample well. In the case where the magnification of the microscope device 100 is large, the actual magnification can be accurately obtained even if only a part of a single sample well is included in the field of view.
Fig. 4 shows a schematic view of a sample plate 400 according to some embodiments of the present invention. As shown in fig. 4, in the sample plate 400, a scale pattern 402 is provided outside the sample groove 401. In this way, interference of the scale pattern 402 with the sample in the sample well 401 can be avoided, and the sample can be observed and analyzed more clearly. To obtain a sharp image of the scale pattern 402, the scale pattern 402 may be in the same plane as the sample trench bottom.
Fig. 5 shows a schematic view of a sample plate 500 according to some embodiments of the present invention. As shown in fig. 5, the sample plate 500 includes a plurality of sample wells 501. A cross-shaped scale pattern 502 is provided at the bottom of each sample well 501. The scale pattern 502 includes two line segments perpendicular to each other, and the lengths of the two line segments may be the same or different.
The magnification of the microscopy apparatus can also be calculated from a digital image taken by the image sensor 101 using the scale pattern 502 on the sample plate 500 of fig. 5. For example, the magnification of the microscope device may be calculated from the above equations (1) to (2) and the length of any one of the two line segments in the scale pattern 502. Alternatively, the magnification may be calculated separately from each of the two line segments, and then the average of the two magnifications may be taken as the magnification of the microscope apparatus.
In addition, the scale pattern 502 on the sample plate 500 of FIG. 5 can also be used to identify and correct distortions of the microscopy apparatus 100. For example, in the case where there is no distortion in the optical imaging device 104 of the microscope device 100, the image of the scale pattern 502 should also be two line segments perpendicular to each other, as shown in fig. 6A. However, if there is distortion in the optical imaging device 104 of the microscope device 100, the two line segments in the image of the scale pattern 502 will no longer be perpendicular, as shown in fig. 6B. Based on the images of the two line segments, processor 103 may identify that there is distortion in the optical imaging device of microscopy apparatus 100. Further, the processor 103 may also correct the digital image generated by the image sensor 101 based on known parameters such as the size of the scale pattern 502, thereby improving the image quality.
The above describes a sample plate according to the present invention and how to obtain the magnification of the microscopic means according to the scale pattern on the sample plate. It should be understood that the present application is not limited to the above-described embodiments.
For example, fig. 7 shows a schematic view of a sample plate 700 according to some embodiments of the present invention. As shown in fig. 7, the sample plate 700 includes a plurality of sample grooves 701 extending in a horizontal direction, and a scale pattern 702 is provided on the bottom of each sample groove 701. The scale pattern 702 includes a plurality of scale marks each extending in a horizontal direction (first direction), and the plurality of scale marks are arranged in a direction of an imaginary line 703 (second direction). The direction of the dotted line 703 is not a vertical direction perpendicular to the horizontal direction. In this way, the scale pattern 702 can be made to cover a large area of the sample trench 701. This form of the scale pattern 702 ensures that at least one complete graduation mark appears in the field of view when the magnification of the microscope device 100 is large and the field of view covers only a portion of the sample well 701. Thus, regardless of the position of the sample in the sample tank 701, the magnification of the microscope apparatus can be accurately calculated.
Furthermore, in some embodiments according to the present invention, the orientation of the sample plate and the sample grooves may also be determined according to a scale pattern on the sample plate. For example, the sample plate 300 shown in fig. 3 includes a plurality of sample wells 301 arranged in the vertical direction, and each sample well 301 extends in the horizontal direction.
When the samples in the sample wells 301 are observed and photographed by the microscope 100, there is often no way to observe and photograph the samples in all the sample wells 301 at the same time due to the field of view or the like. Therefore, it is necessary to translate the sample stage 105 so that the sample plate is translated in the field of view to view and photograph different sample wells 301 or different parts of the same sample well 301 on the sample plate 300.
As shown in fig. 3, each scale line in the scale pattern 302 extends in the horizontal direction, i.e., the extending direction of the scale line is the same as the extending direction of the sample grooves, and the arrangement direction of the plurality of scale lines coincides with the arrangement direction of the plurality of sample grooves. Therefore, although only a part of the sample well is shown in the view of the microscopy apparatus or the photographed image, the processor 103 or the operator may determine the extending direction and the arrangement direction of the sample well according to the extending direction and the arrangement direction of the graduation marks, and move the sample plate 300 on the sample stage 105 according to the determined extending direction and the arrangement direction of the sample well, thereby realizing observation and photographing of different sample wells 301 or different regions of the same sample well 301.
Fig. 8 shows a schematic view of a sample plate 800 according to further embodiments of the present invention. As shown in fig. 8, the sample plate 800 includes a plurality of sample wells 801 extending in a horizontal direction, and the plurality of sample wells 801 are arranged in a vertical direction. A scale pattern 802 is provided at the bottom of each sample groove 801. The scale pattern 802 contains a first mark for determining the arrangement direction and the extending direction of the sample groove 801. The first indication is constituted by two arrows 803 and 804 perpendicular to each other, wherein the arrow 803 extends in a vertical direction and the arrow 804 extends in a horizontal direction. In this example, the longer arrows indicate the direction in which the sample wells are arranged, and the shorter arrows indicate the direction in which the sample wells extend. As shown in FIG. 8, the length of the arrow 803 is larger than the length of the arrow 804, and therefore, it can be determined that a plurality of sample wells 801 are arranged in the vertical direction according to the extending direction of the arrow 803, and that the sample wells 802 extend in the horizontal direction according to the extending direction of the arrow 804.
Fig. 9 shows a schematic view of a sample plate 900 according to some embodiments of the present invention. As shown in fig. 9, the sample plate 900 includes a plurality of sample wells 901 arranged in a horizontal direction, and each sample well 901 extends in the horizontal direction. The bottom of each sample groove 901 is provided with a scale pattern 902. The scale pattern 902 includes a first mark for determining the arrangement direction and the extending direction of the sample well 901. The first mark is constituted by arrows 903 and 904, wherein the longer arrow 903 indicates the direction in which the sample wells 901 are arranged, and the shorter arrow 904 indicates the direction in which the sample wells 901 extend. Thus, by the extending directions of the arrows 903 and 904, it can be determined that a plurality of sample wells 901 are arranged in the horizontal direction, and each sample well 901 also extends in the horizontal direction.
Fig. 10 shows a schematic view of a sample plate 1000 according to some embodiments of the present invention. As shown in fig. 10, the sample plate 1000 includes a plurality of sample grooves 1001 arranged in a vertical direction, and each sample groove 1001 extends in a horizontal direction. A scale pattern 1002 is provided on the bottom of the sample tank 1001. The scale pattern 1002 includes a second mark 1004 for identifying the sample plate and a third mark 1003 for identifying the sample groove. The second marker 1004 and the third marker 1003 are constituted by a plurality of scale marks which are arranged in the horizontal direction and each of which extends in the vertical direction. The leftmost tick mark 1005 and the rightmost tick mark 1006 represent the beginning and end of the second marking 1004 and the third marking 1003. The second indicium 1004 and the third indicium 1003 are between the tick mark 1005 and the tick mark 1006. The number of the sample plate and the number of the sample well can be determined from the second mark 1004 and the third mark 1003, respectively.
As shown in fig. 10, in the lower sample groove 1001, the third mark 1003 includes two graduation marks, and the number of the sample groove in which the third mark 1003 is located can be determined as 11. In the upper sample well 1001, the third mark 1003 includes 1 graduation mark, and a graduation mark is absent in front of the graduation mark according to the interval between the graduation marks, so that the number of the sample well in which the third mark 1003 is located can be determined as 01. Similarly, for the third mark 1003 in the middle sample groove 1001, the number of the sample groove can be determined to be 10.
Similarly, in the second mark 1004, if the missing graduation mark is determined to represent 0 according to the space between the graduation marks, the sample plate 1000 may be determined to have the number 1101.
Furthermore, in some embodiments according to the present invention, other ways of representing 0 and 1 in the numbers may also be employed. For example, in a set of tick marks as shown in fig. 11, 0 and 1 may be represented by tick marks of different lengths, respectively. Wherein the longer scale lines represent 1 and the shorter scale lines represent 0. A set of tick marks in fig. 11 may be identified as 1011011.
It is to be appreciated that other ways of combining the first indicia, second indicia, third indicia and the graduation marks may be used by those skilled in the art as a scale pattern in light of the teachings and teachings of the present invention.
Fig. 12 illustrates a flow chart of the operation of the microscopy apparatus 100 according to some embodiments of the present invention.
As shown in fig. 12, first, a sample plate is placed on the sample stage 105 (step 1201). In the sample well of the sample plate there is a sample to be observed and photographed.
A digital image of the sample is then generated by the image sensor 101 (step 1202). An optical image formed by the optical imaging device 104 of the microscopy apparatus 100 is received by the image sensor 101 and a digital image is generated. The digital image may be stored in memory 102.
Next, the processor 103 may read the digital image from the memory 102 and perform various processing (step 1203). For example, as described above, the magnification of the microscope device 100 may be calculated from the scale pattern in the digital image, the extending direction and the arrangement direction of the sample grooves may be determined, the (number of the) sample plate may be identified, or the (number of the) sample grooves may be identified, and the like.
Fig. 14 illustrates a microscopy apparatus according to some embodiments of the present invention. As shown in fig. 14, the microscope apparatus 1400 is an optical microscope apparatus, and includes an image sensor 1401, a memory 1402, a transmission device 1411, an input device 1410, an optical imaging device 1404, a sample stage 1405, and a light source 1406. Wherein image sensor 1401, optical imaging apparatus 1404, sample stage 1405 and light source 1406 are similar to the corresponding devices in microscopy device 100 shown in fig. 1, and the description is not repeated here.
For example, a sample plate having a scale pattern as described above may be arranged on the sample stage 1405, and the optical imaging apparatus 1404 may form an optical image of the sample. Further, the scale pattern in the sample plate is also included in the optical image. As described above, the scale pattern can be used to determine the magnification of the microscopy apparatus, and can also be used to identify the orientation of the sample plate, identify the sample plate or sample slot, and the like. The image sensor 1401 may convert an optical image into a digital image.
Further, the user of the microscopic device 1400 may input information about the scale pattern (i.e., pattern information) through the input device 1410. The pattern information may contain size information of the scale pattern. For example, when the scale pattern is the scale pattern 202 shown in fig. 2, the pattern information may contain information of the length L of the line segment. When the scale pattern is the scale pattern 302 shown in fig. 3, the pattern information may include information of the pitch D of the scale lines.
Further, the pattern information may contain an identifier of the scale pattern. For example, a user may input a unique code for the scale pattern via input device 1410. The code of the scale pattern may be stored in association with information relating to the scale pattern in a database. By means of the code, the scale pattern corresponding to the code and its related information, such as size, pitch, etc., can be looked up in a database.
In some exemplary embodiments, the type of sample plate may also be identified by a unique code of the scale pattern. For example, in the database, the coding of the scale pattern is also stored in association with the relevant parameters of the sample plate. For example, relevant parameters of the sample plate may include: the type of sample plate, the number of sample wells, the depth of the sample wells, etc.
Further, the user can also input information about the sample (first sample information) through the input device 1410. For example, the type of sample may be included in the information. Thus, with information about the sample, one can determine the type of sample as red blood cells, yeast, algae, etc.
The transmitting apparatus 1411 may transmit the digital image to other devices. For example, the transmitting device 1411 may transmit the digital image to a remote server, such as a cloud server or the like. The server may contain image processing means to further process the received image.
Fig. 19 shows a schematic view of a microscopy apparatus according to some embodiments of the present invention. As shown in fig. 19, the microscope 1900 includes an image sensor 1901, a memory 1902, a transmitting device 1911, an input device 1910, an optical imaging apparatus 1904, a sample stage 1905, and a light source 1906. These components are similar to the corresponding components of the microscopy apparatus 1400 shown in fig. 14 and will not be repeated here. As shown in fig. 19, the microscope 1900 further includes a controller 1912 and a receiving device 1913. The receiving device 1913 may receive information transmitted from an external device, and the controller 1912 may control the operation of the microscope 1900 based on the information. In some embodiments according to the invention, a user may interact with the microscopy apparatus 1900 via a mobile device (e.g., cell phone, tablet, laptop, etc.). For example, the microscope 1900 may transmit the photographed microscope image to a mobile device and display it on the mobile device. The user can adjust photographing parameters (e.g., a magnification, an observation area, etc.) of the microscope 1900 according to the photographed microscope image, and transmit the photographing parameters to the microscope 1900 through a mobile device. Then, the microscope 1900 adjusts and re-photographs the microscope image according to the photographing parameters included in the information transmitted from the mobile device, and transmits a new microscope image to the mobile device.
Furthermore, the interaction between the microscope 1900 and the mobile device may be performed directly or indirectly via, for example, a cloud server, without limitation.
Fig. 15 shows a schematic diagram of an image processing apparatus according to some embodiments of the present invention. As shown in fig. 15, the image processing apparatus 1500 includes a receiving apparatus 1501, a storage apparatus 1502, a processor 1503, and a transmitting apparatus 1504.
The receiving device 1501 may receive the digital image taken by the above-described microscopy apparatus according to the present invention. A scale pattern is contained in the digital image.
Furthermore, in some embodiments according to the present invention, the receiving device 1501 may also receive pattern information and/or first sample information associated with the digital image.
The storage device 1502 may store the digital image and various information received by the reception device 1501.
The processor 1503 may acquire the digital image and various information from the storage device 1502 and process the digital image. For example, the processor 1503 may determine the magnification of the microscopy apparatus from the scale pattern in the digital image.
The transmitting means 1504 may transmit the digital image and information related to the digital image (e.g., magnification, etc.) to, for example, a mobile device or the like.
In some embodiments according to the present invention, since the specifications of the sample plates may be different, the length and/or pitch of the scale lines of the scale pattern on sample plates of different specifications may be different. In this case, the processor 1503 needs to further combine the pattern information associated with the digital image to determine the magnification of the microscopy apparatus.
Furthermore, in some exemplary embodiments according to the present invention, the processor 1503 may further determine an orientation of the sample plate where the sample is located according to the pattern information. For example, when the sample plate is the sample plate 900 shown in fig. 9, the pattern information may indicate that the direction of the arrow is the same as the longitudinal direction of the sample plate 900. Thus, when the processor 1503 recognizes the direction of the arrow of the scale pattern from the digital image, and takes the direction as the longitudinal direction of the sample plate.
Further, in some exemplary embodiments according to the present invention, the processor 1503 may classify the digital image according to the pattern information. For example, the digital images may be classified according to the size of the scale pattern, and the digital images having the scale pattern of the same size may be grouped into one group. When the set of digital images is subsequently viewed, the digital images can be scaled so that the scale patterns are the same size so that the user can visually observe and compare the relative sizes of the samples in each digital image.
Further, in some embodiments according to the invention, the processor 1503 may generate a first image according to the pattern information and add the first image to the digital image. For example, as shown in FIG. 16, for the sample plate shown in FIG. 2, the processor 1503 may obtain the length L of the graduation mark as 5 μm according to the pattern information. The processor 1503 may generate an image (i.e., a first image) 1601 with the text "5 μm" and add the first image to the digital image. In the synthesized digital image, a value of the length L of the tick mark is marked near the tick mark, thereby enabling a user to more intuitively understand the size of the sample when viewing the digital image.
Further, the processor 1503 may classify the digital image according to the first sample information. For example, in the case where the first sample information includes the type of sample, the processor 1503 may group the digital images of the same type of sample.
Furthermore, in some embodiments according to the present invention, the first sample information may further include other information such as a date of manufacture, a date of shooting, a source, copyright information, and the like of the sample. Processor 1503 may also group digital images that are identical in date.
In some embodiments according to the present invention, the processor 1503 may generate a second image from the first sample information and add the second image to the digital image. As shown in fig. 17, when the first sample information indicates that the type of sample is human breast cancer cells (MCF-7 cells), the processor 1503 may generate a second image 1701 containing the text "MCF-7 cells" and add the image 1701 to the digital image. In this way, one can directly know the type of the sample when displaying the digital image, for example on a display.
In some embodiments according to the invention, the client may find and download the digital image from the server. For example, a client may enter a keyword, such as a yeast cell, and send the keyword to a remote server. The server can look up digital images of all sample information including yeast cells in the database based on the key and provide a list or thumbnail of these digital images to the client. The client may select and download selected digital images and their associated information based on information provided by the server. Further, in some embodiments according to the invention, the client may pay a fee to the server to obtain a license for use of the selected digital image. And after the server determines that the client side obtains the use permission, the digital image is sent to the client side.
Further, in some embodiments according to the invention, the processor 1503 may analyze the digital image according to a scale pattern to obtain second sample information about the sample. The second sample information may include, for example: diameter value of the sample, major axis value and minor axis value of the sample, size of the photographing field of view, and concentration of the sample.
For example, fig. 18 shows a schematic diagram of a digital image, according to some embodiments of the invention. As shown in fig. 18, based on the pattern information, the processor 1503 may determine that the length unit of the scale pattern in the digital image is 5 μm. Based on this, the digital image in fig. 18 can be obtained with a magnification of 9.8. Based on the first sample information, the processor 1503 may further determine that the type of sample in the digital image is a yeast cell. Based on this information, the processor 1503 may perform image recognition to identify the yeast cells. For example, the processor 1503 may determine one yeast cell 1802 by image recognition, determine the diameter of the yeast cell 1802 to be 6 μm according to the scale pattern, and store the diameter value in the second sample information.
Further, in some embodiments according to the invention, the processor 1503 may determine a plurality of yeast cells by image recognition, and determine a diameter value for each yeast cell according to the ruler pattern. Then, the processor 1503 stores the average value of the diameter values of all the yeast cells as the diameter value of the yeast cells in the second sample information.
For example, as shown in fig. 18, the processor 1503 may identify yeast cells 1801, 1802, and 1803 from the digital image. From the scale pattern, it was confirmed that the yeast cells had diameters of 9 μm, 6 μm and 9 μm, respectively, and an average diameter of 8 μm. The processor 1503 stores the average diameter value as the diameter value of the sample in the second sample information.
Furthermore, in some embodiments according to the present invention, processor 1503 may identify 393 total yeast cells from the digital image and determine the diameter of each yeast cell, from which an average of the yeast cell diameters may also be obtained and stored in the second sample information.
The processor 1503 may also determine from the digital image the size of the field of view of the shot and the concentration value of the sample. As shown in FIG. 18, the processor 1503 may determine from the scale pattern that the area of the sample plate in the digital image is 0.46X 0.35mm2. Further, as described above, the type of the sample plate can also be determined from the scale pattern, so that the depth of the sample groove of 0.5 μm can be obtained. Thus, the processor 1503 may calculate the concentration of yeast cells to be about 5 × 106/ml。
In addition, the processor 1503 may determine long axis values and short axis values of the sample from the digital image. For example, fig. 20 shows a microscopic image of chlorella according to an embodiment of the present invention. The processor 1503 may determine the minor axis value and the major axis value of each chlorella according to the scale pattern in fig. 20, and further calculate that the minor axis average value of the chlorella is about 17.66 μm and the major axis value is about 19.11 μm.
According to the utility model discloses an embodiment still provides a microscopic analysis system, including above-mentioned microscopic device, image processing apparatus and mobile device etc.. It should be understood that the image processing apparatus of the present invention may be a single server or a plurality of servers, and may also be a cloud server. As shown in fig. 21, the mobile device may control the microscope device (e.g., adjust shooting parameters, etc.) through the cloud server, and may also receive a microscope image shot by the microscope device via the cloud server. The cloud server may push updates of firmware or applications, etc. to the microscopic means and/or the mobile device. Further, a plurality of microscopic devices 1 to N may be simultaneously connected to the cloud server. The mobile device can select to view images taken by a given microscopy apparatus or to control the operation of the microscopy apparatus as desired. The cloud server may store and analyze the microscope images taken by the plurality of microscope devices, and may transmit the microscope images and the analysis results to the mobile apparatus.
Therefore, in the microscopic analysis system of the present invention, the microscopic device may include: an optical imaging device configured to take a sample in a sample plate, thereby forming an optical image of the sample, wherein the optical image includes a scale pattern for determining a magnification of the microscopy apparatus; an image sensor configured to generate a digital image from the optical image; a transmitting device configured to transmit the digital image; and a receiving device configured to receive information from the cloud server and the mobile device.
The mobile device may be configured to: receiving digital images from the cloud server and the microscopy device; sending the shooting parameters to the cloud server and the microscopic device; and sending the digital image from the microscopy apparatus to the cloud server.
The cloud server may be configured to: receiving digital images from the microscopy apparatus and the mobile device; receiving shooting parameters from the mobile equipment and forwarding the shooting parameters to the microscopic device; sending the digital image from the microscopy apparatus to the mobile device; and analyzing the digital image and sending the analysis result to the mobile device.
In addition, in some embodiments according to the present disclosure, the following technical solutions may also be adopted:
1. a microscopy apparatus, comprising:
an optical imaging apparatus configured to form an optical image of a sample, wherein a scale pattern for determining a magnification of the microscopy apparatus is included in the optical image;
an image sensor configured to generate a digital image from the optical image;
a transmitting device configured to transmit the digital image.
2. The microscopy apparatus according to 1, characterized in that,
the optical imaging device is configured to take a picture of a sample on a sample plate to form the optical image, the sample plate comprising the scale pattern.
3. The microscopy apparatus of claim 1, further comprising:
an input device configured to input pattern information about the scale pattern.
4. The microscopy apparatus according to claim 3, wherein the transmission means is further configured to transmit the pattern information.
5. The microscopy apparatus according to 3, wherein the pattern information comprises at least one of:
a size of the scale pattern;
an identifier of the scale pattern; and
the direction of the scale pattern.
6. The microscopy apparatus of claim 3, wherein the input device is further configured to input first sample information about the sample.
7. The microscopy apparatus according to 6, wherein the first sample information comprises a sample type.
8. An image processing apparatus characterized by comprising:
a receiving device configured to receive a digital image formed by a microscopy device, the digital image comprising a scale pattern;
a storage device configured to store the digital image;
a processor configured to determine a magnification of the microscopy apparatus from the scale pattern; and
a transmitting device configured to transmit the digital image and the magnification.
9. The image processing apparatus according to claim 8,
the microscopy device photographs a sample on a sample plate to form the digital image, the sample plate including the scale pattern.
10. The image processing apparatus according to claim 8,
the receiving means also receives pattern information about the scale pattern.
11. The image processing apparatus according to claim 10,
the processor is further configured to determine a magnification of the microscopy apparatus from the pattern information.
12. The image processing apparatus according to claim 10,
the processor is further configured to determine an orientation of a sample plate on which the sample is located based on the pattern information.
13. The image processing apparatus according to claim 10,
the processor is further configured to classify the digital image according to the pattern information.
14. The image processing apparatus according to claim 10,
the processor is further configured to generate a first image from the pattern information and add the first image to the digital image.
15. The image processing apparatus according to claim 10,
the receiving device also receives first sample information about the sample.
16. The image processing apparatus according to claim 15,
the processor is further configured to classify the digital image according to the first sample information.
17. The image processing apparatus according to claim 15,
the processor is further configured to generate a second image from the first sample information and add the second image to the digital image.
18. The image processing apparatus according to claim 13 or 16,
the processor is further configured to look up in the storage for other images of the same category as the digital image according to the category of the digital image,
the image processing apparatus further includes:
a transmitting device configured to transmit the other image.
19. The image processing apparatus according to claim 8,
the processor is further configured to analyze the digital image according to the scale pattern to obtain second sample information about a sample in the digital image.
20. The image processing apparatus according to claim 19,
the processor is further configured to classify the digital image according to the second sample information.
21. The image processing apparatus according to claim 20,
the processor is further configured to look up in the storage for other images of the same category as the digital image according to the category of the digital image,
the image processing apparatus further includes:
a transmitting device configured to transmit the other image.
22. The image processing apparatus according to claim 19,
the second sample information includes at least one of:
diameter value of the sample;
the major and minor axis values of the sample;
the size of the shooting field of view; and
concentration value of the sample.
23. A microanalysis system, comprising:
1-7; and
8-22.
24. The microanalysis system of claim 23, further comprising:
a mobile device configured to receive and display the digital image from the microscopy apparatus or the image processing apparatus.
25. The microanalysis system of claim 24, wherein the mobile device is further configured to receive the second sample information.
26. The microanalysis system as claimed in claim 24, wherein,
the mobile device is further configured to send the photographing parameters to the microscopic means; and
and the microscope device shoots according to the shooting parameters.
27. A microanalysis system, comprising:
a cloud server, a microscopic device and a mobile device,
wherein the microscopic means comprises:
an optical imaging device configured to take a sample in a sample plate, thereby forming an optical image of the sample, wherein the optical image includes a scale pattern for determining a magnification of the microscopy apparatus;
an image sensor configured to generate a digital image from the optical image;
a transmitting device configured to transmit the digital image; and
a receiving device configured to receive information from the cloud server and a mobile device,
the mobile device is configured to
Receiving digital images from the cloud server and the microscopy device;
sending the shooting parameters to the cloud server and the microscopic device; and
sending the digital image from the microscopy apparatus to the cloud server, the cloud server configured to
Receiving digital images from the microscopy apparatus and the mobile device;
receiving shooting parameters from the mobile equipment and forwarding the shooting parameters to the microscopic device;
sending the digital image from the microscopy apparatus to the mobile device;
the digital image is analyzed and the results of the analysis are sent to the mobile device.
28. The microscopy analysis system of claim 27, wherein the cloud server is further configured to send an update of an application to the microscopy apparatus and the mobile device.
29. The microanalysis system of 27, wherein the sample plate comprises: a scale pattern for determining magnification.
The terms "front," "back," "top," "bottom," "over," "under," and the like in the description and in the claims, if any, are used for descriptive purposes and not necessarily for describing permanent relative positions. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in other orientations than those illustrated or otherwise described herein.
As used herein, the word "exemplary" means "serving as an example, instance, or illustration," and not as a "model" that is to be replicated accurately. Any implementation exemplarily described herein is not necessarily to be construed as preferred or advantageous over other implementations. Furthermore, there is no intention to be bound by any expressed or implied theory presented in the preceding technical field, background, brief summary or the detailed description.
As used herein, the term "substantially" is intended to encompass any minor variation resulting from design or manufacturing imperfections, device or component tolerances, environmental influences, and/or other factors. The word "substantially" also allows for differences from a perfect or ideal situation due to parasitic effects, noise, and other practical considerations that may exist in a practical implementation.
The above description may indicate elements or nodes or features being "connected" or "coupled" together. As used herein, unless expressly stated otherwise, "connected" means that one element/node/feature is directly connected to (or directly communicates with) another element/node/feature, either electrically, mechanically, logically, or otherwise. Similarly, unless expressly stated otherwise, "coupled" means that one element/node/feature may be mechanically, electrically, logically, or otherwise joined to another element/node/feature in a direct or indirect manner to allow for interaction, even though the two features may not be directly connected. That is, coupled is intended to include both direct and indirect joining of elements or other features, including connection with one or more intermediate elements.
In addition, certain terminology may also be used in the following description for the purpose of reference only, and thus is not intended to be limiting. For example, the terms "first," "second," and other such numerical terms referring to structures or elements do not imply a sequence or order unless clearly indicated by the context.
It will be further understood that the terms "comprises/comprising," "includes" and/or "including," when used herein, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
In the present disclosure, the term "providing" is used broadly to encompass all ways of obtaining an object, and thus "providing an object" includes, but is not limited to, "purchasing," "preparing/manufacturing," "arranging/setting," "installing/assembling," and/or "ordering" the object, and the like.
Those skilled in the art will appreciate that the boundaries between the above described operations merely illustrative. Multiple operations may be combined into a single operation, single operations may be distributed in additional operations, and operations may be performed at least partially overlapping in time. Moreover, alternative embodiments may include multiple instances of a particular operation, and the order of operations may be altered in various other embodiments. However, other modifications, variations, and alternatives are also possible. The specification and drawings are, accordingly, to be regarded in an illustrative rather than a restrictive sense.
Although some specific embodiments of the present invention have been described in detail by way of illustration, it should be understood by those skilled in the art that the above illustration is only for purposes of illustration and is not intended to limit the scope of the invention. The various embodiments of the invention herein may be combined in any combination without departing from the spirit and scope of the invention. It will also be appreciated by those skilled in the art that various modifications may be made to the embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (29)
1. A microscopy apparatus, comprising:
an optical imaging apparatus configured to form an optical image of a sample, wherein a scale pattern for determining a magnification of the microscopy apparatus is included in the optical image;
an image sensor configured to generate a digital image from the optical image;
a transmitting device configured to transmit the digital image.
2. The microscopy apparatus according to claim 1,
the optical imaging device is configured to take a picture of a sample on a sample plate to form the optical image, the sample plate comprising the scale pattern.
3. The microscopy apparatus of claim 1, further comprising:
an input device configured to input pattern information about the scale pattern.
4. The microscopy apparatus according to claim 3, wherein the transmission apparatus is further configured to transmit the pattern information.
5. The microscopy apparatus according to claim 3, wherein the pattern information comprises at least one of:
a size of the scale pattern;
an identifier of the scale pattern; and
the direction of the scale pattern.
6. The microscopy apparatus according to claim 3, wherein the input device is further configured to input first sample information about the sample.
7. The microscopy apparatus of claim 6, wherein the first sample information comprises a sample type.
8. An image processing apparatus characterized by comprising:
a receiving device configured to receive a digital image of a sample formed by a microscopy device, the digital image comprising a scale pattern;
a storage device configured to store the digital image;
a processor configured to determine a magnification of the microscopy apparatus from the scale pattern; and
a transmitting device configured to transmit the digital image and the magnification.
9. The image processing apparatus according to claim 8,
the microscopy device photographs a sample on a sample plate to form the digital image, the sample plate including the scale pattern.
10. The image processing apparatus according to claim 8,
the receiving means also receives pattern information about the scale pattern.
11. The image processing apparatus according to claim 10,
the processor is further configured to determine a magnification of the microscopy apparatus from the pattern information.
12. The image processing apparatus according to claim 10,
the processor is further configured to determine an orientation of a sample plate on which the sample is located based on the pattern information.
13. The image processing apparatus according to claim 10,
the processor is further configured to classify the digital image according to the pattern information.
14. The image processing apparatus according to claim 10,
the processor is further configured to generate a first image from the pattern information and add the first image to the digital image.
15. The image processing apparatus according to claim 10,
the receiving device also receives first sample information about the sample.
16. The image processing apparatus according to claim 15,
the processor is further configured to classify the digital image according to the first sample information.
17. The image processing apparatus according to claim 15,
the processor is further configured to generate a second image from the first sample information and add the second image to the digital image.
18. The image processing apparatus according to claim 13 or 16,
the processor is further configured to look up in the storage for other images of the same category as the digital image according to the category of the digital image,
the image processing apparatus further includes:
a transmitting device configured to transmit the other image.
19. The image processing apparatus according to claim 8,
the processor is further configured to analyze the digital image according to the scale pattern to obtain second sample information about a sample in the digital image.
20. The image processing apparatus according to claim 19,
the processor is further configured to classify the digital image according to the second sample information.
21. The image processing apparatus according to claim 20,
the processor is further configured to look up in the storage for other images of the same category as the digital image according to the category of the digital image,
the image processing apparatus further includes:
a transmitting device configured to transmit the other image.
22. The image processing apparatus according to claim 19,
the second sample information includes at least one of:
diameter value of the sample;
the major and minor axis values of the sample;
the size of the shooting field of view; and
concentration value of the sample.
23. A microanalysis system, comprising:
the microscopy apparatus of any one of claims 1-7; and
the image processing apparatus of any one of claims 8-22.
24. The microanalysis system of claim 23, further comprising:
a mobile device configured to receive and display the digital image from the microscopy apparatus or the image processing apparatus.
25. The microanalysis system of claim 24,
the mobile device is further configured to send the photographing parameters to the microscopic means; and
and the microscope device shoots according to the shooting parameters.
26. A microanalysis system, comprising:
the microscopy apparatus of any one of claims 1-7; and
the image processing apparatus as set forth in claim 19,
wherein the processor is further configured to analyze the digital image according to the scale pattern to obtain second sample information about a sample in the digital image,
the microscopic analysis system further comprises:
a mobile device configured to receive and display the digital image from the microscopy apparatus or the image processing apparatus,
wherein the mobile device is further configured to receive the second sample information.
27. A microanalysis system, comprising:
a cloud server, a microscopic device and a mobile device,
wherein the microscopic means comprises:
an optical imaging device configured to take a sample in a sample plate, thereby forming an optical image of the sample, wherein the optical image includes a scale pattern for determining a magnification of the microscopy apparatus;
an image sensor configured to generate a digital image from the optical image;
a transmitting device configured to transmit the digital image; and
a receiving device configured to receive information from the cloud server and a mobile device,
the mobile device is configured to
Receiving digital images from the cloud server and the microscopy device;
sending the shooting parameters to the cloud server and the microscopic device; and
sending the digital image from the microscopy apparatus to the cloud server,
the cloud server is configured to
Receiving digital images from the microscopy apparatus and the mobile device;
receiving shooting parameters from the mobile equipment and forwarding the shooting parameters to the microscopic device;
sending the digital image from the microscopy apparatus to the mobile device;
the digital image is analyzed and the results of the analysis are sent to the mobile device.
28. The microscopy analysis system of claim 27, wherein the cloud server is further configured to send an update of an application to the microscopy apparatus and the mobile device.
29. The microanalysis system as claimed in claim 27, wherein the sample plate comprises: a scale pattern for determining magnification.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110836893A (en) * | 2019-12-11 | 2020-02-25 | 上海睿钰生物科技有限公司 | Microscope and image processing apparatus |
| WO2021115259A1 (en) * | 2019-12-11 | 2021-06-17 | 上海睿钰生物科技有限公司 | Algae counting method |
| WO2021115247A1 (en) * | 2019-12-11 | 2021-06-17 | 上海睿钰生物科技有限公司 | Sample plate |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110836893A (en) * | 2019-12-11 | 2020-02-25 | 上海睿钰生物科技有限公司 | Microscope and image processing apparatus |
| WO2021115259A1 (en) * | 2019-12-11 | 2021-06-17 | 上海睿钰生物科技有限公司 | Algae counting method |
| WO2021115247A1 (en) * | 2019-12-11 | 2021-06-17 | 上海睿钰生物科技有限公司 | Sample plate |
| WO2021115265A1 (en) * | 2019-12-11 | 2021-06-17 | 上海睿钰生物科技有限公司 | Microscopic apparatus and image processing apparatus |
| CN110836893B (en) * | 2019-12-11 | 2024-05-14 | 上海睿钰生物科技有限公司 | Microscope device and image processing device |
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