CN211602945U

CN211602945U - Sample plate

Info

Publication number: CN211602945U
Application number: CN201922207734.8U
Authority: CN
Inventors: 陈睿; 夏浩涵
Original assignee: Shanghai Ruiyu Biotech Co Ltd
Current assignee: Shanghai Ruiyu Biotech Co Ltd
Priority date: 2019-12-11
Filing date: 2019-12-11
Publication date: 2020-09-29
Anticipated expiration: 2029-12-11

Abstract

The utility model relates to a sample plate. The sample plate comprises: a sample tank for holding a sample; and a scale pattern for determining the magnification of the microscopy apparatus. By using the sample plate, the magnification of the microscope apparatus can be accurately calculated.

Description

Sample plate

Technical Field

The utility model relates to an optical microscopy field particularly, relates to a sample board.

Background

At present, the existing sample plate for cell counting or analysis usually includes 1 or more sample grooves, and the sample grooves are used for accommodating cell samples to be detected, and then parameters such as the number, concentration, size and the like of the cells are obtained through a microscopic imaging system and an image analysis system. However, the detection of these parameters depends on the observation capabilities of the microscope or microscopic imaging system, wherein the most important and important characteristic parameter is the magnification, and the actual magnification of many commercially available microscopic instruments is not consistent with its nominal value.

At present, the calibration and calibration of the microscope magnification mainly adopts a micrometer or a similar micrometer technology, and the actual magnification of the microscope is calibrated through the matching of an eyepiece micrometer and an objective micrometer. For example, the actual magnification of the microscope is calculated by comparing the dimensions obtained in the microscopic imaging system with the known dimensions of the spaces in the ruler. However, these techniques have certain defects, when the eyepiece or the objective lens is replaced, the calibration needs to be performed again, and the sample to be detected needs to be taken down at this time, which causes repetition and trouble of operation, needs to search for the original observation field again, and causes the movement of the sample in the sample tank to affect the observation result.

Therefore, the method has very important significance for measuring the magnification of a microscope or a microscopic imaging system, and the existing cell counting plate does not have the capability of accurately calibrating the magnification of the microscope, so that the detected parameters are inconsistent with the actual parameters, and the accuracy of the final result is influenced

SUMMERY OF THE UTILITY MODEL

According to an aspect of the present invention, there is provided a sample plate, comprising: a sample tank for holding a sample; and a scale pattern for determining the magnification of the microscopy apparatus.

In some embodiments according to the invention, the scale pattern is located at the bottom of the sample trench.

In some embodiments according to the invention, the sample plate comprises a plurality of sample grooves, the scale pattern being provided at the bottom of each sample groove.

In some embodiments according to the invention, the scale pattern is located near the sample trench.

In some embodiments according to the invention, the scale pattern comprises a first scale line extending in a first direction.

In some embodiments according to the invention, the scale pattern comprises a plurality of first scale markings, and the plurality of first scale markings are arranged in a second direction different from the first direction.

In some embodiments according to the invention, the first direction is perpendicular to the second direction.

In some embodiments according to the invention, the sample trench extends in the first direction or the second direction.

In some embodiments according to the invention, the scale pattern further comprises second scale markings extending in a second direction.

In some embodiments according to the invention, the scale pattern further comprises a first marker for determining the extending direction and the arrangement direction of the sample grooves.

In some embodiments according to the invention, the first identifier comprises a first arrow and a second arrow perpendicular to each other.

In some embodiments according to the invention, the scale pattern further comprises a second identification for identifying the sample plate.

In some embodiments according to the invention, the scale pattern further comprises a third identification for identifying the sample trench.

Other features of the present invention and advantages thereof will become apparent from the following detailed description of exemplary embodiments of the invention, which proceeds with reference to the accompanying drawings.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention.

The invention will be more clearly understood from the following detailed description, with reference to the accompanying drawings, in which:

fig. 1 shows a schematic view of a microscopy apparatus according to some embodiments of the present invention.

Fig. 2 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 3 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 4 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 5 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 6A illustrates a scale pattern on a sample plate according to some embodiments of the present invention.

Fig. 6B illustrates an image of a scale pattern on a sample plate according to some embodiments of the invention.

Fig. 7 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 8 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 9 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 10 shows a schematic view of a sample plate according to some embodiments of the present invention.

Fig. 11 illustrates a set of scale lines in a scale pattern on a sample plate according to some embodiments of the present invention.

Fig. 12 illustrates a flow chart of the operation of a microscopy apparatus according to some embodiments of the present invention.

Fig. 13 shows a schematic view of the pixel arrangement direction of the image sensor.

Note that in the embodiments described below, the same reference numerals are used in common between different drawings to denote the same portions or portions having the same functions, and a repetitive description thereof will be omitted. In this specification, like reference numerals and letters are used to designate like items, and therefore, once an item is defined in one drawing, further discussion thereof is not required in subsequent drawings.

For convenience of understanding, the positions, sizes, ranges, and the like of the respective structures shown in the drawings and the like do not sometimes indicate actual positions, sizes, ranges, and the like. Therefore, the disclosed invention is not limited to the positions, dimensions, ranges, and the like disclosed in the drawings and the like.

Detailed Description

Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: unless specifically stated otherwise, the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention.

The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.

In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.

Fig. 1 shows a schematic view of a microscopy apparatus according to an embodiment of the present invention.

As shown in fig. 1, the microscopy apparatus 100 comprises an image sensor 101, a memory 102, a processor 103, an optical imaging device 104, a sample stage 105 and a light source 106. In operation, a sample plate to be observed is arranged on the sample stage 105. Light from the light source 106 is directed onto the sample plate. The optical imaging device 104 may include, for example, an objective lens and an eyepiece lens (not shown), each of which may be made up of one or more sets of lenses. The optical image formed by the optical device 104 is received by the image sensor 101 and converted into a digital image by the image sensor 101. The image sensor may be, for example, a Charge Coupled Device (CCD), a Complementary Metal Oxide Semiconductor (CMOS), or the like. In some embodiments according to the present invention, image capturing devices, such as cell phones, cameras, etc., which also include image sensors and are capable of capturing images of samples in the sample plate via the optical device 104, may also be disposed in the optical path.

The digital image obtained by the image sensor 101 is stored in the memory 102, and the processor 103 may read the digital image in the memory 102 and process the digital image.

Fig. 2 shows a schematic view of a sample plate according to some embodiments of the present invention. As shown in fig. 2, the sample plate 200 includes a plurality of sample wells 201, and a sample to be observed and photographed can be accommodated in the sample wells 201. In addition, the sample plate 200 has a scale pattern 202.

In the exemplary embodiment shown in fig. 2, the scale pattern 202 is located at the bottom of the sample well (i.e., on the surface of the sample well that is in contact with the sample therein). In obtaining an image of a sample by the microscopy apparatus 100, the optical imaging device 104 is typically focused on the bottom of the sample well, and positioning the scale pattern 202 on the bottom of the sample well allows a sharp image of the scale pattern to be obtained at the same time as the image of the sample is obtained. The scale pattern 202 is a line segment in the horizontal direction and has a length L. For example, in some exemplary embodiments, L may be 1 μm-100 μm. With this scale pattern 202, the magnification of the microscope device 100 can be accurately calculated.

For example, as shown in fig. 13, for the image sensor 101 in which pixels are uniformly arranged in two directions (X direction and Y direction) perpendicular to each other, it is assumed that coordinates of both ends of a line segment of the scale pattern 202 in a digital image generated by the image sensor 101 are (X1, Y1) and (X2, Y2), respectively. Here, coordinates (x1, y1) and (x2, y2) represent the positions of pixels corresponding to both ends of the line segment on the image sensor 101. The size K of the line image formed on the image sensor 101 by the line segments on the sample plate can be calculated according to formula (1):

K＝D·sqrt[(x2-x1)²+(y2-y1)²](1)

where D is the pitch of adjacent pixels in the image sensor 101, i.e., the distance from the center of one pixel to the center of an adjacent pixel along the X-direction or the Y-direction. The function sqrt represents calculating the square root.

Then, the magnification M of the optical imaging device 104 of the microscope apparatus 100 can be calculated according to the following formula (2):

M＝K/L (2)

in the above manner, the actual magnification of the microscope device 100 can be accurately obtained.

In the above exemplary embodiment, the pixel array of the image sensor 101 is a rectangular array, and the pitches of adjacent pixels are the same in the X direction and the Y direction. In other embodiments according to the present invention, the pitch of adjacent pixels of the image sensor 101 is different in the X-direction and the Y-direction. For example, if the pitch of the adjacent pixels in the X direction is D1 and the pitch of the adjacent pixels in the Y direction is D2, the size K of the line image formed on the image sensor 101 by the line segment on the sample plate can be calculated according to the following formula (3):

K＝sqrt[(D1)²·(x2-x1)²+(D2)²·(y2-y1)²](3)

then, the actual magnification M of the microscope device 100 can be calculated according to the above formula (2).

The above calculation of the actual magnification may be performed by, for example, the processor 103 of the microscopy apparatus 100. For example, the pitches of adjacent pixels of the image sensor 101 may be stored in the memory 102 in advance. After the image sensor 101 generates a digital image of the sample plate 200, the digital image is stored in the memory 102.

The processor 103 then reads the digital image from the memory 102, identifying the scale pattern in the digital image. Next, the processor 103 may read the pitch of the adjacent pixels of the image sensor 101 from the memory and calculate the actual magnification M of the microscopic device 101 according to the above equations (1) - (3).

Furthermore, in some embodiments according to the present invention, for a sample plate 200 having a plurality of sample wells 201, the magnification M may also be calculated in the following manner.

For the sample plate 200 shown in fig. 2 having three sample grooves 201, it is possible to calculate the corresponding magnifications M1, M2, and M3, respectively, based on the scale pattern 202 on each sample groove 201, and then calculate the actual magnification M of the microscope device by equation (4).

M＝(M1+M2+M3)/3 (4)

That is, the average of the magnifications M1, M2, and M3 was taken as the actual magnification M of the microscope apparatus. By adopting the mode, the calculation error can be reduced, and the accuracy of the magnification is further improved.

Further, in other embodiments according to the present invention, the sum K' of the line segments of each scale pattern 202 may be calculated by the following formula (5).

K’＝D·sqrt[(x2-x1)²+(y2-y1)²]

+D·sqrt[(x3-x4)²+(y3-y4)²]

+D·sqrt[(x5-x6)²+(y5-y6)²](5)

Where, (x1, y1) and (x2, y2) are coordinates in a digital image of both ends of a line segment of the scale pattern of the first sample groove 202 in the upper part of fig. 2, (x3, y3) and (x4, y4) are coordinates in a digital image of both ends of a line segment of the scale pattern of the second sample groove 202 in the middle part of fig. 2, (x5, y5) and (x6, y6) are coordinates in a digital image of both ends of a line segment of the scale pattern of the third sample groove 202 in the lower part of fig. 2.

Then, the actual magnification M of the microscopic device can be calculated by equation (6).

M＝K’/(3L) (6)

By adopting the mode, the calculation error can be reduced, and the accuracy of the magnification is further improved.

The above briefly describes how the actual magnification of the microscope device 100 is calculated from the scale pattern on the sample plate. It should be understood that the present invention is not limited to the above-described manner. Other ways of calculating the actual magnification of the microscopy apparatus 100 from the scale pattern may be used by those skilled in the art, given the teachings and teachings of the present invention.

Fig. 3 shows a schematic view of a sample plate according to some embodiments of the present invention. As shown in fig. 3, the sample plate 300 includes a plurality of sample wells 301, and a sample to be observed and photographed can be accommodated in the sample wells 301. In addition, the sample plate 300 has a scale pattern 302.

In the exemplary embodiment shown in fig. 3, the scale pattern 302 is located at the bottom of the sample trench. The scale pattern 302 is equally spaced scale lines (first scale lines) each extending in the horizontal direction (first direction), and each having a spacing D in the vertical direction (second direction). In some exemplary embodiments according to the present invention, the spacing D may be, for example, 1 μm to 10 μm. With the scale pattern 302, the magnification of the microscope apparatus can be accurately calculated.

For example, the processor 103 may obtain the coordinates (x1 ', y 1') of one point on one scale line in the scale pattern 302 and the coordinates (x2 ', y 2') of the intersection of the passing point (x1 ', y 1') with the adjacent scale line in the direction perpendicular to the scale line, from the digital image generated by the image sensor 101.

The actual magnification of the microscopy apparatus 100 may be calculated using a method similar to that described above.

In the example shown in fig. 3, there are a plurality of graduation marks 302 on each sample well. In the case where the magnification of the microscope device 100 is large, the actual magnification can be accurately obtained even if only a part of a single sample well is included in the field of view.

Fig. 4 shows a schematic view of a sample plate 400 according to some embodiments of the present invention. As shown in fig. 4, in the sample plate 400, a scale pattern 402 is provided outside the sample groove 401. In this way, interference of the scale pattern 402 with the sample in the sample well 401 can be avoided, and the sample can be observed and analyzed more clearly. To obtain a sharp image of the scale pattern 402, the scale pattern 402 may be in the same plane as the sample trench bottom.

Fig. 5 shows a schematic view of a sample plate 500 according to some embodiments of the present invention. As shown in fig. 5, the sample plate 500 includes a plurality of sample wells 501. A cross-shaped scale pattern 502 is provided at the bottom of each sample well 501. The scale pattern 502 includes two line segments perpendicular to each other, and the lengths of the two line segments may be the same or different. For example, one line segment (i.e., a first tick mark) extends in the horizontal direction and the other line segment (i.e., a second tick mark) extends in the vertical direction.

The magnification of the microscopy apparatus can also be calculated from a digital image taken by the image sensor 101 using the scale pattern 502 on the sample plate 500 of fig. 5. For example, the magnification of the microscope device may be calculated from the above equations (1) to (2) and the length of any one of the two line segments in the scale pattern 502. Alternatively, the magnification may be calculated separately from each of the two line segments, and then the average of the two magnifications may be taken as the magnification of the microscope apparatus.

In addition, the scale pattern 502 on the sample plate 500 of FIG. 5 can also be used to identify and correct distortions of the microscopy apparatus 100. For example, in the case where there is no distortion in the optical imaging device 104 of the microscope device 100, the image of the scale pattern 502 should also be two line segments perpendicular to each other, as shown in fig. 6A. However, if there is distortion in the optical imaging device 104 of the microscope device 100, the two line segments in the image of the scale pattern 502 will no longer be perpendicular, as shown in fig. 6B. Based on the images of the two line segments, processor 103 may identify that there is distortion in the optical imaging device of microscopy apparatus 100. Further, the processor 103 may also correct the digital image generated by the image sensor 101 based on known parameters such as the size of the scale pattern 502, thereby improving the image quality.

The above describes a sample plate according to the present invention and how to obtain the magnification of the microscopic means according to the scale pattern on the sample plate. It should be understood that the present application is not limited to the above-described embodiments.

For example, fig. 7 shows a schematic view of a sample plate 700 according to some embodiments of the present invention. As shown in fig. 7, the sample plate 700 includes a plurality of sample grooves 701 extending in a horizontal direction, and a scale pattern 702 is provided on the bottom of each sample groove 701. The scale pattern 702 includes a plurality of scale marks each extending in a horizontal direction (first direction), and the plurality of scale marks are arranged in a direction of an imaginary line 703 (second direction). The direction of the dotted line 703 is not a vertical direction perpendicular to the horizontal direction. In this way, the scale pattern 702 can be made to cover a large area of the sample trench 701. This form of the scale pattern 702 ensures that at least one complete graduation mark appears in the field of view when the magnification of the microscope device 100 is large and the field of view covers only a portion of the sample well 701. Thus, regardless of the position of the sample in the sample tank 701, the magnification of the microscope apparatus can be accurately calculated.

Furthermore, in some embodiments according to the present invention, the orientation of the sample plate and the sample grooves may also be determined according to a scale pattern on the sample plate. For example, the sample plate 300 shown in fig. 3 includes a plurality of sample wells 301 arranged in the vertical direction, and each sample well 301 extends in the horizontal direction.

When the samples in the sample wells 301 are observed and photographed by the microscope 100, there is often no way to observe and photograph the samples in all the sample wells 301 at the same time due to the field of view or the like. Therefore, it is necessary to translate the sample stage 105 so that the sample plate is translated in the field of view to view and photograph different sample wells 301 or different parts of the same sample well 301 on the sample plate 300.

As shown in fig. 3, each scale line in the scale pattern 302 extends in the horizontal direction, i.e., the extending direction of the scale line is the same as the extending direction of the sample grooves, and the arrangement direction of the plurality of scale lines coincides with the arrangement direction of the plurality of sample grooves. Therefore, although only a part of the sample well is shown in the view of the microscopy apparatus or the photographed image, the processor 103 or the operator may determine the extending direction and the arrangement direction of the sample well according to the extending direction and the arrangement direction of the graduation marks, and move the sample plate 300 on the sample stage 105 according to the determined extending direction and the arrangement direction of the sample well, thereby realizing observation and photographing of different sample wells 301 or different regions of the same sample well 301.

Fig. 8 shows a schematic view of a sample plate 800 according to further embodiments of the present invention. As shown in fig. 8, the sample plate 800 includes a plurality of sample wells 801 extending in a horizontal direction, and the plurality of sample wells 801 are arranged in a vertical direction. A scale pattern 802 is provided at the bottom of each sample groove 801. The scale pattern 802 contains a first mark for determining the arrangement direction and the extending direction of the sample groove 801. The first indication is constituted by two

arrows

803 and 804 perpendicular to each other, wherein the arrow 803 extends in a vertical direction and the arrow 804 extends in a horizontal direction. In this example, the longer arrows indicate the direction in which the sample wells are arranged, and the shorter arrows indicate the direction in which the sample wells extend. As shown in FIG. 8, the length of the arrow 803 is larger than the length of the arrow 804, and therefore, it can be determined that a plurality of sample wells 801 are arranged in the vertical direction according to the extending direction of the arrow 803, and that the sample wells 802 extend in the horizontal direction according to the extending direction of the arrow 804.

Fig. 9 shows a schematic view of a sample plate 900 according to some embodiments of the present invention. As shown in fig. 9, the sample plate 900 includes a plurality of sample wells 901 arranged in a horizontal direction, and each sample well 901 extends in the horizontal direction. The bottom of each sample groove 901 is provided with a scale pattern 902. The scale pattern 902 includes a first mark for determining the arrangement direction and the extending direction of the sample well 901. The first mark is constituted by

arrows

903 and 904, wherein the longer arrow 903 indicates the direction in which the sample wells 901 are arranged, and the shorter arrow 904 indicates the direction in which the sample wells 901 extend. Thus, by the extending directions of the

arrows

903 and 904, it can be determined that a plurality of sample wells 901 are arranged in the horizontal direction, and each sample well 901 also extends in the horizontal direction.

Fig. 10 shows a schematic view of a sample plate 1000 according to some embodiments of the present invention. As shown in fig. 10, the sample plate 1000 includes a plurality of sample grooves 1001 arranged in a vertical direction, and each sample groove 1001 extends in a horizontal direction. A scale pattern 1002 is provided on the bottom of the sample tank 1001. The scale pattern 1002 includes a second mark 1004 for identifying the sample plate and a third mark 1003 for identifying the sample groove. The second marker 1004 and the third marker 1003 are constituted by a plurality of scale marks which are arranged in the horizontal direction and each of which extends in the vertical direction. The leftmost tick mark 1005 and the rightmost tick mark 1006 represent the beginning and end of the second marking 1004 and the third marking 1003. The second indicium 1004 and the third indicium 1003 are between the tick mark 1005 and the tick mark 1006. The number of the sample plate and the number of the sample well can be determined from the second mark 1004 and the third mark 1003, respectively.

As shown in fig. 10, in the lower sample groove 1001, the third mark 1003 includes two graduation marks, and the number of the sample groove in which the third mark 1003 is located can be determined as 11. In the upper sample well 1001, the third mark 1003 includes 1 graduation mark, and a graduation mark is absent in front of the graduation mark according to the interval between the graduation marks, so that the number of the sample well in which the third mark 1003 is located can be determined as 01. Similarly, for the third mark 1003 in the middle sample groove 1001, the number of the sample groove can be determined to be 10.

Similarly, in the second mark 1004, if the missing graduation mark is determined to represent 0 according to the space between the graduation marks, the sample plate 1000 may be determined to have the number 1101.

Furthermore, in some embodiments according to the present invention, other ways of representing 0 and 1 in the numbers may also be employed. For example, in a set of tick marks as shown in fig. 11, 0 and 1 may be represented by tick marks of different lengths, respectively. Wherein the longer scale lines represent 1 and the shorter scale lines represent 0. A set of tick marks in fig. 11 may be identified as 1011011.

It is to be appreciated that other ways of combining the first indicia, second indicia, third indicia and the graduation marks may be used by those skilled in the art as a scale pattern in light of the teachings and teachings of the present invention.

Fig. 12 illustrates a flow chart of the operation of the microscopy apparatus 100 according to some embodiments of the present invention.

As shown in fig. 12, first, a sample plate is placed on the sample stage 105 (step 1201). In the sample well of the sample plate there is a sample to be observed and photographed.

A digital image of the sample is then generated by the image sensor 101 (step 1202). An optical image formed by the optical imaging device 104 of the microscopy apparatus 100 is received by the image sensor 101 and a digital image is generated. The digital image may be stored in memory 102.

Next, the processor 103 may read the digital image from the memory 102 and perform various processing (step 1203). For example, as described above, the magnification of the microscope device 100 may be calculated from the scale pattern in the digital image, the extending direction and the arrangement direction of the sample grooves may be determined, the (number of the) sample plate may be identified, or the (number of the) sample grooves may be identified, and the like.

In addition, in some embodiments according to the present disclosure, the following technical solutions may also be adopted:

1. a sample plate, comprising:

a sample tank for holding a sample; and

a scale pattern for determining magnification.

2. Sample plate according to claim 1, characterized in that the scale pattern is located at the bottom of the sample well.

3. A sample plate according to claim 2, characterized in that the sample plate comprises a plurality of sample wells, at the bottom of each sample well the scale pattern is provided.

4. The sample plate of claim 1, wherein the scale pattern is located adjacent to the sample wells.

5. The sample plate of any of claims 1-4, wherein the scale pattern comprises a first graduation mark extending in a first direction.

6. The sample plate of claim 5, wherein the scale pattern comprises a plurality of first graduation marks, and wherein the plurality of first graduation marks are arranged in a second direction different from the first direction.

7. The sample plate of claim 6, wherein the first direction is perpendicular to the second direction.

8. The sample plate according to claim 6 or 7, wherein the sample well extends in the first direction or the second direction.

9. The sample plate of any of claims 6-8, wherein the scale pattern further comprises a second graduation mark extending in a second direction.

10. The sample plate according to any one of claims 1 to 9, wherein the scale pattern further comprises a first mark for determining an extending direction and an arrangement direction of the sample grooves.

11. The sample plate of claim 10, wherein the first identifier comprises a first arrow and a second arrow perpendicular to each other.

12. Sample plate according to any of claims 1-11, wherein the scale pattern further comprises a second identifier for identifying the sample plate.

13. The sample plate of claim 12, wherein the scale pattern further comprises a third mark for identifying the sample well.

The terms "front," "back," "top," "bottom," "over," "under," and the like in the description and in the claims, if any, are used for descriptive purposes and not necessarily for describing permanent relative positions. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in other orientations than those illustrated or otherwise described herein.

As used herein, the word "exemplary" means "serving as an example, instance, or illustration," and not as a "model" that is to be replicated accurately. Any implementation exemplarily described herein is not necessarily to be construed as preferred or advantageous over other implementations. Furthermore, there is no intention to be bound by any expressed or implied theory presented in the preceding technical field, background, brief summary or the detailed description.

As used herein, the term "substantially" is intended to encompass any minor variation resulting from design or manufacturing imperfections, device or component tolerances, environmental influences, and/or other factors. The word "substantially" also allows for differences from a perfect or ideal situation due to parasitic effects, noise, and other practical considerations that may exist in a practical implementation.

The above description may indicate elements or nodes or features being "connected" or "coupled" together. As used herein, unless expressly stated otherwise, "connected" means that one element/node/feature is directly connected to (or directly communicates with) another element/node/feature, either electrically, mechanically, logically, or otherwise. Similarly, unless expressly stated otherwise, "coupled" means that one element/node/feature may be mechanically, electrically, logically, or otherwise joined to another element/node/feature in a direct or indirect manner to allow for interaction, even though the two features may not be directly connected. That is, coupled is intended to include both direct and indirect joining of elements or other features, including connection with one or more intermediate elements.

In addition, certain terminology may also be used in the following description for the purpose of reference only, and thus is not intended to be limiting. For example, the terms "first," "second," and other such numerical terms referring to structures or elements do not imply a sequence or order unless clearly indicated by the context.

It will be further understood that the terms "comprises/comprising," "includes" and/or "including," when used herein, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

In the present disclosure, the term "providing" is used broadly to encompass all ways of obtaining an object, and thus "providing an object" includes, but is not limited to, "purchasing," "preparing/manufacturing," "arranging/setting," "installing/assembling," and/or "ordering" the object, and the like.

Those skilled in the art will appreciate that the boundaries between the above described operations merely illustrative. Multiple operations may be combined into a single operation, single operations may be distributed in additional operations, and operations may be performed at least partially overlapping in time. Moreover, alternative embodiments may include multiple instances of a particular operation, and the order of operations may be altered in various other embodiments. However, other modifications, variations, and alternatives are also possible. The specification and drawings are, accordingly, to be regarded in an illustrative rather than a restrictive sense.

Although some specific embodiments of the present invention have been described in detail by way of illustration, it should be understood by those skilled in the art that the above illustration is only for purposes of illustration and is not intended to limit the scope of the invention. The embodiments disclosed herein may be combined in any combination without departing from the spirit and scope of the present invention. It will also be appreciated by those skilled in the art that various modifications may be made to the embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.

Claims

1. A sample plate, comprising:

a sample tank for holding a sample; and

a scale pattern for determining magnification.

2. A sample plate as claimed in claim 1, wherein the scale pattern is located at the bottom of the sample well.

3. A sample plate as claimed in claim 2, characterized in that the sample plate comprises a plurality of sample grooves, at the bottom of each sample groove the scale pattern is provided.

5. The sample plate of any of claims 1-4, wherein the scale pattern comprises first graduation marks extending in a first direction.

6. The sample plate of claim 5, wherein the scale pattern comprises a plurality of first tick marks, and wherein the plurality of first tick marks are aligned in a second direction different from the first direction.

8. The sample plate according to claim 6, wherein the sample wells extend in the first direction or the second direction.

9. The sample plate of claim 6, wherein the scale pattern further comprises a second graduation mark extending in a second direction.

10. The sample plate according to any one of claims 1 to 4, wherein the scale pattern further comprises a first mark for determining an extending direction and an arrangement direction of the sample grooves.

12. The sample plate of any of claims 1-4, wherein the scale pattern further comprises a second identifier for identifying the sample plate.

13. The sample plate of claim 12, wherein the scale pattern further comprises a third mark for identifying the sample slot.