CN211905198U - Ionization analysis device - Google Patents
Ionization analysis device Download PDFInfo
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- CN211905198U CN211905198U CN202020385997.8U CN202020385997U CN211905198U CN 211905198 U CN211905198 U CN 211905198U CN 202020385997 U CN202020385997 U CN 202020385997U CN 211905198 U CN211905198 U CN 211905198U
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- cavity
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- analysis device
- sampling probe
- ionization analysis
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- 238000004458 analytical method Methods 0.000 title claims abstract description 37
- 239000000523 sample Substances 0.000 claims abstract description 57
- 238000005070 sampling Methods 0.000 claims abstract description 40
- 239000000126 substance Substances 0.000 claims abstract description 13
- 238000001179 sorption measurement Methods 0.000 claims abstract description 4
- 239000007789 gas Substances 0.000 claims description 43
- 238000000034 method Methods 0.000 claims description 5
- 230000001276 controlling effect Effects 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 230000004888 barrier function Effects 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 description 18
- 238000007789 sealing Methods 0.000 description 7
- 238000002470 solid-phase micro-extraction Methods 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000001601 dielectric barrier discharge ionisation Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000000752 ionisation method Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 239000003463 adsorbent Substances 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004205 dimethyl polysiloxane Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 238000011065 in-situ storage Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 2
- -1 polydimethylsiloxane Polymers 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000000638 solvent extraction Methods 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 230000005526 G1 to G0 transition Effects 0.000 description 1
- 238000000944 Soxhlet extraction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000000622 liquid--liquid extraction Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
The utility model provides an ionization analysis device, which comprises an ion source and a detector; the sampling probe is suitable for being inserted into the cavity; the adsorption substance is arranged on the outer wall of the sampling probe extending into the cavity; the cavity is provided with a first opening, a second opening and a third opening; the interior of the cavity is communicated with the ion source through a first opening, the sampling probe penetrates through the third opening to enter the cavity, and the interior of the cavity is communicated with the detector through a second opening; the sample adsorbed on the adsorbing substance is ionized by the ion source and then enters the detector through the second opening; the gas passing through the heater enters the cavity; seals are disposed at the first, second, and third openings. The utility model has the advantages of high efficiency of sampling and ionization, wide application range, etc.
Description
Technical Field
The present invention relates to ionization, and more particularly to ionization analysis devices.
Background
Pretreatment is an essential step for complicated sample analysis, but the time consumed by pretreatment often accounts for more than two-thirds of the analysis process. With the continuous development of the instrument level and the analysis technology, the sample pretreatment becomes a bottleneck restricting the rapid analysis and detection.
Solid Phase Microextraction (SPME) is a relatively new sample pretreatment technique that is based on the partitioning of target compounds between the extraction coating (stationary phase) and the solution. Compared with the traditional sample pretreatment technology such as liquid-liquid extraction, Soxhlet extraction and the like, the method has the advantages of less sample consumption, simple and convenient operation, no secondary pollution and the like. Currently, SPME is commonly used in conjunction with GC or LC for analysis of volatile or thermally labile substances. The disadvantages are that: the combination of GC or LC increases the complexity of the instrument to a certain extent, and is not suitable for rapid detection or in-situ detection.
Currently, researchers have attempted to use SPME directly in conjunction with an in situ ionization ion source. The patent TWI488215B proposes a mass spectrometry system based on a solid phase microextraction probe, wherein a heating unit instantaneously vaporizes a substance to be detected on the solid phase microextraction probe, and a charge generating unit sprays charged liquid drops to fuse with the vaporized substance to be detected, so as to form ions of the substance to be detected to enter mass spectrometry. However, the ionization process is in an open environment, the fusion of the vaporized to-be-detected object and the charged liquid drop is easily interfered by the environment, and experimental errors are caused.
SUMMERY OF THE UTILITY MODEL
For solving the not enough among the above-mentioned prior art scheme, the utility model provides a sample and ionization high efficiency, wide ionization analytical equipment of range of application.
The utility model aims at realizing through the following technical scheme:
an ionization analysis device comprising an ion source and a detector; the ionization analysis device further includes:
a sampling probe adapted to be inserted into a cavity;
the adsorption substance is arranged on the outer wall of the sampling probe extending into the cavity;
a cavity having a first opening, a second opening, and a third opening; the interior of the cavity is communicated with the ion source through a first opening, the sampling probe penetrates through the third opening to enter the cavity, and the interior of the cavity is communicated with the detector through a second opening; the sample adsorbed on the adsorbing substance is ionized by the ion source and then enters the detector through the second opening;
the heater is used for enabling the gas passing through the heater to enter the cavity;
a seal disposed at the first, second, and third openings.
Compared with the prior art, the utility model discloses the beneficial effect who has does:
1. the ionization is stable and efficient;
in the application, the heated gas is firstly vaporized and extends into a sample adsorbed on a sampling probe in a cavity, and then is ionized by a plasma beam, the ionization process is generated in the closed cavity, the influence of the external environment is avoided, and the ionization process is stable and efficient;
2. sampling is efficient;
the operation can be completed only by inserting the sample probe stained with the sample into the analysis device, so that the operation is efficient and rapid;
3. the application range is wide;
the application is suitable for detecting samples with various properties such as polarity, non-polarity and the like;
the method does not need an auxiliary solvent, and can be used for rapid analysis of samples in various forms such as gas, liquid and solid.
Drawings
The disclosure of the present invention will become more readily understood with reference to the accompanying drawings. As is readily understood by those skilled in the art: these drawings are only intended to illustrate the technical solution of the present invention and are not intended to limit the scope of the present invention. In the figure:
FIG. 1 is a simplified schematic diagram of an ionization analysis device according to an embodiment of the present invention;
fig. 2 is another schematic diagram of an ionization analysis device according to an embodiment of the present invention.
Detailed Description
Fig. 1-2 and the following description depict alternative embodiments of the invention to teach those skilled in the art how to make and reproduce the invention. For the purpose of teaching the present invention, some conventional aspects have been simplified or omitted. Those skilled in the art will appreciate variations or substitutions from these embodiments that will be within the scope of the invention. Those skilled in the art will appreciate that the features described below can be combined in various ways to form multiple variations of the invention. Accordingly, the present invention is not limited to the following alternative embodiments, but is only limited by the claims and their equivalents.
Example 1:
fig. 1 schematically shows a schematic view of an ionization analyzer according to embodiment 1 of the present invention, and as shown in fig. 1, the ionization analyzer includes:
the ion source 1 and the ion detector 5 are the prior art in the field, and the specific structure and the working mode are not described again;
a sampling probe 11, for example of tubular configuration, said sampling probe 11 being suitable for being inserted into the cavity 2;
an adsorbent (not shown) disposed on an outer wall of a portion of the sampling probe adapted to protrude into the cavity, the adsorbent adapted to adsorb a sample to be measured;
the cavity 2 is in a T-shaped or cross-shaped structure, the cavity 2 is provided with a first opening, a second opening and a third opening, the interior of the cavity is communicated with the ion source through the first opening, the sampling probe penetrates through the third opening to enter the cavity, and the interior of the cavity is communicated with the ion detector through the second opening; the sample adsorbed on the sampling probe is ionized by the ion source and then enters the detector through the second opening;
the heater 4, the gas after said heater 4 enters said cavity 2;
and the sealing elements 21-24 are arranged at the first opening, the second opening and the third opening, so that the cavity is a closed space isolated from the outside.
According to the ionization analysis device, preferably, the ion source 1 is a dielectric barrier discharge ion source, and the inert gas passing through the heater enters the ion source.
According to the ionization analysis device, the heated gas enters the cavity in a selectable mode:
the gas passing through the heater passes through a third opening; alternatively, the first and second electrodes may be,
and the gas passing through the heater enters the cavity through an additionally arranged fourth opening, and the third opening and the fourth opening are oppositely arranged.
According to the ionization analyzer, in order to restrict the flow direction of the heated gas, a sleeve is further provided outside the sampling probe, and a gas passage is formed between the sleeve and the sampling probe; the sleeve is provided with a gas inlet, and gas passing through the heater enters the gas channel through the gas inlet.
According to the ionization analysis device, in order to restrict the flow direction of the heated gas, a sleeve is further arranged in the cavity, and the sampling probe extending into the cavity is positioned in the sleeve and extends out of the sleeve; gas enters the space between the sampling probe and the cannula and is heated by the heater within the cavity.
According to the ionization analysis device described above, in order to adjust the gas flow rate, further, the ionization analysis device further includes:
and the flow control unit is used for respectively controlling the flow of the gas entering the cavity and/or the ion source.
According to the above ionization analysis device, in order to adjust the gas temperature, further, the ionization analysis device further includes:
a temperature control unit controlling power of the heater.
Example 2:
an application example of the ionization analyzing apparatus according to embodiment 1 of the present invention.
In the present application example, as shown in fig. 1, the sampling probe 11 is a hollow tube with one end closed, the hollow tube is made of insulating materials such as glass, quartz, and ceramics, and the closed end has an adsorbing substance such as polydimethylsiloxane; the ion source 1 communicates with the first opening through the seal 21 using DBDI; the cavity 2 is in a cross shape and is provided with a first opening, a second opening, a third opening and a fourth opening which are opposite, and each opening is provided with a sealing element 21-24, such as a sealing ring; the closed end of the sampling probe 11 is adapted to extend through the seal 22 at the third opening into the centre of the chamber; inert gases such as nitrogen, helium, argon and the like enter the heater 4 after passing through a pressure stabilizing valve and a pipeline 41, and then respectively enter the DBDI and the cavity 2 through a flow control unit (a combination of a regulating valve and a flow sensor) and pipelines 42-43, wherein the gas pipeline 43 is inserted into the sealing element 24 at the fourth opening, so that the heated gas is sent into the cavity 2, and a sample on the closed end of the sampling probe 11 is swept; the ion detector 5 communicates with the second opening through the seal 23; the temperature control unit controls the power of the heater, so that the gas temperature reaches 50-300 ℃.
Example 3:
an application example of the ionization analyzing apparatus according to embodiment 1 of the present invention.
In the present application example, as shown in fig. 2, the sampling probe 11 is a hollow tube with one end closed, the hollow tube is made of insulating materials such as glass, quartz, and ceramics, and the closed end has an adsorbing substance such as polydimethylsiloxane; the ion source communicates with the first opening through seal 21 using DBDI; the cavity 2 is in a T shape and is provided with a third opening, a first opening and a second opening which are opposite, and each opening is provided with a sealing element 21-23, such as a sealing ring; the closed end of the sampling probe 11 is suitable for penetrating through the sealing member 22 at the third opening and then extending into the center of the cavity 2; inert gases such as nitrogen, helium, argon and the like enter the heater 4 after passing through a pressure stabilizing valve and a pipeline 41, and then respectively enter the DBDI and the cavity 2 after passing through a flow control unit (a combination of a regulating valve and a flow sensor) and pipelines 42-43, wherein the gas pipeline 43 is inserted into the third opening, so that the heated gas is sent into the cavity 2, and a sample on the closed end of the sampling probe 11 is swept; the ion detector 5 communicates with the second opening through the seal 23; the temperature control unit controls the power of the heater, so that the gas temperature reaches 50-300 ℃.
Example 4:
according to the utility model embodiment 1's application example of ionization analysis device, different from embodiment 3 is:
a sleeve is fixed on the outer side of the sampling probe, a gas channel is formed between the sleeve and the sampling probe, and the closed end of the sampling probe extends out of the sleeve; the sleeve is provided with a gas inlet, and gas passing through the heater enters the gas channel through the gas inlet; the gas inlet is far away from the closed end of the sampling probe, and is positioned outside the cavity when the sampling probe and the sleeve are inserted into the cavity; the gas passing through the heater is communicated with the gas inlet through a pipeline, so that the gas is sent into the cavity.
Example 4:
according to the utility model embodiment 1's application example of ionization analysis device, different from embodiment 3 is:
a sleeve is arranged in the cavity, the sampling probe extending into the cavity is positioned in the sleeve, and the closed end of the sampling probe extends out of the sleeve; the gas after flow control enters the space between the sampling probe and the sleeve and is heated by the heater in the cavity.
Claims (10)
1. An ionization analysis device comprising an ion source and a detector; the method is characterized in that: the ionization analysis device further includes:
a sampling probe adapted to be inserted into a cavity;
the adsorption substance is arranged on the outer wall of the sampling probe extending into the cavity;
a cavity having a first opening, a second opening, and a third opening; the interior of the cavity is communicated with the ion source through a first opening, the sampling probe penetrates through the third opening to enter the cavity, and the interior of the cavity is communicated with the detector through a second opening; the sample adsorbed on the adsorbing substance is ionized by the ion source and then enters the detector through the second opening;
the heater is used for enabling the gas passing through the heater to enter the cavity;
a seal disposed at the first, second, and third openings.
2. The ionization analysis device according to claim 1, wherein: the ion source is a dielectric barrier discharge ion source, and inert gas passing through the heater enters the ion source.
3. The ionization analysis device according to claim 1, wherein: and the gas passing through the heater enters the cavity through a third opening or an additionally arranged fourth opening, and the third opening and the fourth opening are oppositely arranged.
4. The ionization analysis device according to claim 1, wherein: a sleeve is arranged on the outer side of the sampling probe, and a gas channel is formed between the sleeve and the sampling probe; the sleeve is provided with a gas inlet, and gas passing through the heater enters the gas channel through the gas inlet.
5. The ionization analysis device according to claim 1, wherein: a sleeve is arranged in the cavity, and the sampling probe extending into the cavity is positioned in the sleeve and extends out of the sleeve; gas enters the space between the sampling probe and the cannula and is heated by the heater within the cavity.
6. The ionization analysis device according to claim 1, wherein: the cavity is T-shaped or cross-shaped.
7. The ionization analysis device according to claim 1, wherein: the sampling probe adopts a hollow pipe with a closed end, and the adsorption substance is arranged on the outer wall of the closed end.
8. The ionization analysis device according to claim 1, wherein: the ionization analysis device further includes:
and the flow control unit is used for respectively controlling the flow of the gas entering the cavity and/or the ion source.
9. The ionization analysis device of claim 8, wherein: the flow control unit comprises a regulating valve and a flow sensor.
10. The ionization analysis device according to claim 1, wherein: the ionization analysis device further includes:
a temperature control unit controlling power of the heater.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020385997.8U CN211905198U (en) | 2020-03-24 | 2020-03-24 | Ionization analysis device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020385997.8U CN211905198U (en) | 2020-03-24 | 2020-03-24 | Ionization analysis device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211905198U true CN211905198U (en) | 2020-11-10 |
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ID=73269739
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020385997.8U Active CN211905198U (en) | 2020-03-24 | 2020-03-24 | Ionization analysis device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211905198U (en) |
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2020
- 2020-03-24 CN CN202020385997.8U patent/CN211905198U/en active Active
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Address after: West side of 1st floor, 1st floor, Building A, No. 288 Jingu Middle Road (East), Yinzhou District, Ningbo City, Zhejiang Province, 315000 Patentee after: CHINA INNOVATION INSTRUMENT Co.,Ltd. Country or region after: China Address before: Room 304, D Building, Kexin Building, 655 Xueshi Road, Yinzhou District, Ningbo City, Zhejiang Province, 315000 Patentee before: CHINA INNOVATION INSTRUMENT Co.,Ltd. Country or region before: China |