CN211652584U - Appearance detection system for capacitance probe - Google Patents

Appearance detection system for capacitance probe Download PDF

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Publication number
CN211652584U
CN211652584U CN201922350652.9U CN201922350652U CN211652584U CN 211652584 U CN211652584 U CN 211652584U CN 201922350652 U CN201922350652 U CN 201922350652U CN 211652584 U CN211652584 U CN 211652584U
Authority
CN
China
Prior art keywords
light source
capacitor
electric capacity
coaxial light
anchor clamps
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201922350652.9U
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Chinese (zh)
Inventor
邹逸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuxi Sim Vision Technology Co ltd
Original Assignee
Wuxi Sim Vision Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuxi Sim Vision Technology Co ltd filed Critical Wuxi Sim Vision Technology Co ltd
Priority to CN201922350652.9U priority Critical patent/CN211652584U/en
Application granted granted Critical
Publication of CN211652584U publication Critical patent/CN211652584U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model discloses an electric capacity probe outward appearance detecting system, including transfer chain, electric capacity anchor clamps, area source, coaxial light source, industry camera and computer control ware, the electric capacity anchor clamps set up on the transfer chain, the area source sets up in electric capacity anchor clamps below, coaxial light source sets up in electric capacity anchor clamps top, industry camera sets up in the coaxial light source top, industry camera, electric capacity anchor clamps all link to each other with computer control ware. The utility model has the advantages that the capacitor is clamped and conveyed by the capacitor clamp, and the detection is convenient; the area light source is adopted for supplementing light from the bottom of the capacitor, and the coaxial light source is adopted for supplementing light from the probe at the top of the capacitor, so that the illumination brightness and uniformity are higher, and the reflection degree is lower, and a clear image at the probe of the capacitor can be obtained for analysis and processing; the utility model discloses simple structure, it is convenient to detect.

Description

Appearance detection system for capacitance probe
The technical field is as follows:
the utility model relates to an electric capacity probe outward appearance detects technical field, especially relates to an electric capacity probe outward appearance detecting system.
Background art:
the appearance of the capacitor probe is required to be detected before the capacitor probe is used as a part of a capacitor, defective products such as scratches and indentations are eliminated, at present, the detection of the capacitor probe is mainly manual detection, and the manual detection is low in efficiency and poor in precision.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information constitutes prior art already known to a person skilled in the art.
The utility model has the following contents:
an object of the utility model is to provide a capacitance probe outward appearance detecting system to overcome the defect among the above-mentioned prior art.
In order to achieve the above object, the utility model provides a capacitance probe outward appearance detecting system, including transfer chain, electric capacity anchor clamps, area source, coaxial light source, industry camera and computer control ware, the electric capacity anchor clamps set up on the transfer chain, the area source sets up in electric capacity anchor clamps below, coaxial light source sets up in electric capacity anchor clamps top, the industry camera sets up in the coaxial light source top, industry camera, electric capacity anchor clamps all link to each other with computer control ware.
A high-brightness lens is arranged above the coaxial light source, and light absorption cloth is arranged on the side face of the coaxial light source.
The center lines of the industrial camera, the coaxial light source and the area light source are on the same line.
The industrial camera adopts a telecentric lens.
Compared with the prior art, the utility model discloses following beneficial effect has:
the utility model has the advantages that the capacitor is clamped and conveyed by the capacitor clamp, and the detection is convenient; the area light source is adopted for supplementing light from the bottom of the capacitor, and the coaxial light source is adopted for supplementing light from the probe at the top of the capacitor, so that the illumination brightness and uniformity are higher, and the reflection degree is lower, and a clear image at the probe of the capacitor can be obtained for analysis and processing; the utility model discloses simple structure, it is convenient to detect.
Description of the drawings:
fig. 1 is a schematic diagram of a capacitance probe appearance inspection system according to the present invention;
the reference signs are: the device comprises a transmission line 1, a capacitance clamp 2, a surface light source 3, a coaxial light source 4, a highlight increasing lens 41, light absorption cloth 42, an industrial camera 5, a computer controller 6 and a capacitor 7.
The specific implementation mode is as follows:
the following detailed description of the embodiments of the present invention is provided, but it should be understood that the scope of the present invention is not limited by the embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
As shown in fig. 1, an appearance inspection system for a capacitance probe comprises a conveying line 1, a capacitance clamp 2, a surface light source 3, a coaxial light source 4, an industrial camera 5 and a computer controller 6, wherein the capacitance clamp 2 is arranged on the conveying line 1, the surface light source 3 is arranged below the capacitance clamp 2, the coaxial light source 4 is arranged above the capacitance clamp 2, the industrial camera 5 is arranged above the coaxial light source 4, and the industrial camera 5 and the capacitance clamp 2 are both connected with the computer controller 6.
A high-brightness lens 41 is arranged above the coaxial light source 4, and a light absorption cloth 42 is arranged on the side surface.
The center lines of the industrial camera 5, the coaxial light source 4 and the area light source 3 are on the same line.
The industrial camera 5 employs a telecentric lens.
During implementation, the capacitor clamp 2 clamps the capacitor 7, a probe of the capacitor 7 faces upwards, the computer controller 6 controls the capacitor clamp 2 to move along the conveying line 1, when the capacitor clamp 2 moves to a position above the surface light source 3, the surface light source 3 performs light supplement on the capacitor 7 from the bottom of the capacitor 7, the coaxial light source 4 performs light supplement on the probe above the capacitor 7, the industrial camera 5 acquires an image of the probe above the capacitor 7 from the highlight lens 41 above the coaxial light source 4, and the image is sent to the computer controller 6 for analysis and identification so as to remove a product with a defect at the probe; the arrangement of the high brightness lens 41 and the light absorption cloth 42 can improve the concentration of light so as to obtain a clear image; the utility model discloses simple structure can effectively improve detection efficiency and detect the precision.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.

Claims (4)

1. A capacitance probe appearance detection system is characterized in that: the device comprises a conveying line, a capacitor clamp, a surface light source, a coaxial light source, an industrial camera and a computer controller, wherein the capacitor clamp is arranged on the conveying line, the surface light source is arranged below the capacitor clamp, the coaxial light source is arranged above the capacitor clamp, the industrial camera is arranged above the coaxial light source, and the industrial camera and the capacitor clamp are connected with the computer controller.
2. The capacitive probe appearance inspection system of claim 1, wherein: a high-brightness lens is arranged above the coaxial light source, and light absorption cloth is arranged on the side face of the coaxial light source.
3. The capacitive probe appearance inspection system of claim 1, wherein: the center lines of the industrial camera, the coaxial light source and the area light source are on the same line.
4. The capacitive probe appearance inspection system of claim 1, wherein: the industrial camera adopts a telecentric lens.
CN201922350652.9U 2019-12-24 2019-12-24 Appearance detection system for capacitance probe Expired - Fee Related CN211652584U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201922350652.9U CN211652584U (en) 2019-12-24 2019-12-24 Appearance detection system for capacitance probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201922350652.9U CN211652584U (en) 2019-12-24 2019-12-24 Appearance detection system for capacitance probe

Publications (1)

Publication Number Publication Date
CN211652584U true CN211652584U (en) 2020-10-09

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201922350652.9U Expired - Fee Related CN211652584U (en) 2019-12-24 2019-12-24 Appearance detection system for capacitance probe

Country Status (1)

Country Link
CN (1) CN211652584U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116046798A (en) * 2023-03-30 2023-05-02 合肥新晶集成电路有限公司 Automatic needle cleaning method, automatic needle cleaning system and wafer acceptance test method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116046798A (en) * 2023-03-30 2023-05-02 合肥新晶集成电路有限公司 Automatic needle cleaning method, automatic needle cleaning system and wafer acceptance test method

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CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20201009