CN211293925U - Automatic frequency hopping performance testing device for scanning frequency of capacitive touch screen - Google Patents
Automatic frequency hopping performance testing device for scanning frequency of capacitive touch screen Download PDFInfo
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- CN211293925U CN211293925U CN202020274186.0U CN202020274186U CN211293925U CN 211293925 U CN211293925 U CN 211293925U CN 202020274186 U CN202020274186 U CN 202020274186U CN 211293925 U CN211293925 U CN 211293925U
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Abstract
The utility model discloses a capacitive touch screen scanning frequency automatic frequency hopping capability test device, capacitive touch screen is including the touch-control tablet, the touch-control tablet is including the touch-control chip, testing arrangement is including the computer, the touch-control debugging board, low frequency signal generator, the cell-phone, the charger, first terminal and second terminal electric connection are in the same induction channel of touch-control tablet, first terminal passes through wire electric connection in low frequency signal generator, the output cable of charger is pegged graft in the cell-phone, and charge to the cell-phone by the charger, the ground wire and the second terminal electric connection of charger output cable, touch-control debugging board electric connection is between touch-control chip and computer, the signal of telecommunication of second terminal access is as interference signal and load in the touch-control tablet. The utility model discloses can realize touch-control chip according to the performance test of outside common mode interference condition automatic adjustment operating frequency.
Description
Technical Field
The utility model relates to a testing arrangement of capacitive touch screen especially relates to a capacitive touch screen scanning frequency automatic frequency hopping capability test device.
Background
In the existing touch control technology field, display screen interference and power supply common mode interference are important reasons influencing touch control performance, when the working frequency of a touch control chip is the same as or close to the interference frequency, the touch control performance is greatly interfered, and when the touch control performance is serious, the phenomena of jumping and point elimination occur, so that the touch control cannot work normally. However, the existing testing technology only simply tests the anti-interference capability of the touch product, and cannot reflect the real frequency hopping performance of the touch product, and further cannot objectively quantify how much frequency and how much interference amplitude the touch product is subjected to before the touch product jumps to a new working frequency, and in addition, the performance such as the response time in the frequency hopping process, whether the frequency selection is reasonable and the like cannot be visualized.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model lies in, to prior art's not enough, provide a capacitive touch screen scanning frequency automatic frequency hopping capability test device, this testing arrangement utilizes charger fixed interference frequency crowd to combine low frequency signal generator to produce adjustable interference signal, and then realizes the capability test of touch-control chip according to outside common mode interference condition automatic adjustment operating frequency.
In order to solve the technical problem, the utility model adopts the following technical scheme.
A capacitive touch screen scanning frequency automatic frequency hopping performance testing device comprises a touch sensing board, wherein the touch sensing board comprises a touch chip, the testing device comprises a computer, a touch debugging board, a low-frequency signal generator, a mobile phone, a charger, a first binding post and a second binding post, the first binding post and the second binding post are electrically connected with the same sensing channel of the touch sensing board, the first binding post is electrically connected with the low-frequency signal generator through a lead, an output cable of the charger is plugged in the mobile phone and charges the mobile phone through the charger, a ground wire of the output cable of the charger is electrically connected with the second binding post, the touch debugging board is electrically connected between the touch chip and the computer, an electric signal accessed by the second binding post is used as an interference signal and is loaded on the touch sensing board, the low-frequency signal generator is used for generating frequency signals of multiple frequency bands and loading the frequency signals to the touch control induction plate through the first binding post, and when the charger and/or the low-frequency signal generator are started, the computer collects interference data and frequency hopping data generated by the touch control induction plate through the touch control debugging plate and the touch control chip.
Preferably, a preset distance is arranged between the first binding post and the second binding post.
Preferably, the distance between the first terminal and the second terminal is 50 mm.
Preferably, the first terminal and the second terminal are both copper columns with the diameter of 8 mm.
Preferably, the touch chip is connected to the touch debugging board through an I2C interface.
Preferably, the touch debugging board is connected to the computer through a USB cable.
The utility model discloses a capacitive touch screen scanning frequency automatic frequency hopping capability test device has combined charger or power that has fixed interference frequency crowd to and the nimble adjustable low frequency signal generator of frequency and range, and then simulate out the true applied scene of capacitanc touch-control product, detect out the interference killing feature who is surveyed capacitanc touch-control product more accurately. Compared with the prior art, the utility model discloses the biggest interference signal that touch-control product can resist under fixed frequency is gone out in quantization that can be comparatively accurate to and interference signal does not influence the frequency bandwidth that touch-control product normally worked, realized better that touch-control product is according to the performance test of outside common mode interference condition automatic adjustment operating frequency.
Drawings
FIG. 1 is a block diagram of a device for testing the scanning frequency automatic frequency hopping performance of a capacitive touch screen;
FIG. 2 is a schematic diagram of the test interference during the interference test according to the preferred embodiment of the present invention;
fig. 3 is a schematic diagram of a frequency hopping process in a preferred embodiment of the present invention.
Detailed Description
The present invention will be described in more detail with reference to the accompanying drawings and examples.
The utility model discloses a capacitive touch screen scanning frequency automatic frequency hopping performance testing device, please refer to fig. 1, the capacitive touch screen comprises a touch sensing board 100, the touch sensing board 100 comprises a touch chip, the testing device comprises a computer 1, a touch debugging board 2, a low frequency signal generator 3, a mobile phone 4, a charger 5, a first binding post 6 and a second binding post 7, the first binding post 6 and the second binding post 7 are electrically connected with the same induction channel of the touch sensing board 100, the first binding post 6 is electrically connected with the low frequency signal generator 3 through a wire, an output cable of the charger 5 is inserted in the mobile phone 4, the mobile phone 4 is charged by the charger 5, a ground wire of the output cable of the charger 5 is electrically connected with the second binding post 7, the touch debugging board 2 is electrically connected between the touch chip and the computer 1, the electrical signal accessed by the second terminal 7 is used as an interference signal and is loaded on the touch sensing panel 100, the low-frequency signal generator 3 is used for generating frequency signals of multiple frequency bands and is loaded on the touch sensing panel 100 through the first terminal 6, and when the charger 5 and/or the low-frequency signal generator 3 are started, the computer 1 collects interference data and frequency hopping data generated by the touch sensing panel 100 through the touch debugging panel 2 and the touch chip.
The testing device combines the charger or the power supply with the fixed interference frequency group and the low-frequency signal generator with flexibly adjustable frequency and amplitude, so that the real application scene of the capacitive touch product is simulated, and the anti-interference capability of the capacitive touch product to be tested is more accurately detected. Compared with the prior art, the utility model discloses the biggest interference signal that touch-control product can resist under fixed frequency is gone out in quantization that can be comparatively accurate to and interference signal does not influence the frequency bandwidth that touch-control product normally worked, realized better that touch-control product is according to the performance test of outside common mode interference condition automatic adjustment operating frequency.
Based on the above principle, the utility model discloses testing arrangement utilizes the fixed interference frequency crowd of charger to combine low frequency signal generator to produce adjustable interference signal, and then realizes that touch-control chip is according to the capability test of outside common mode interference condition automatic adjustment operating frequency.
As a preferred arrangement, a predetermined distance is provided between the first terminal 6 and the second terminal 7.
Further, the distance between the first post 6 and the second post 7 is 50 mm. The first binding post 6 and the second binding post 7 are both copper posts with the diameter of 8 mm. Wherein a diameter of 8mm can better simulate a human finger.
In order to realize reliable signal transmission, in this embodiment, the touch chip is connected to the touch debugging panel 2 through an I2C interface. Further, the touch control debugging board 2 is connected to the computer 1 through a USB cable.
The utility model discloses a capacitive touch screen scanning frequency automatic frequency hopping capability test device, its specific test procedure and theory of operation please see following embodiment:
example one
Firstly, a circuit structure is established, please refer to fig. 1, a touch chip is designed on a touch sensing board, and usually has a plurality of driving channels (tx channels) and sensing channels (rx channels), the touch chip on the touch sensing board is firstly connected to a touch debugging board through an I2C interface, and the touch debugging board is connected to a computer through a USB cable; two copper columns with the diameter of 8mm are placed on the same induction channel of the touch induction board, and the distance between the two copper columns is about 50 mm; the copper columns are connected to the signal output end of the low-frequency signal generator through a wire, the other copper column is connected to a ground wire of a charging power line which is charging the mobile phone through a wire, and the charger refers to a power supply which is actually used by various chargers or touch products to be tested and has different common-mode interferences; and the computer is provided with preset testing tool software.
When the test is started, the output signal of the low-frequency signal generator is closed, the charger charges the mobile phone normally, the power supply of the touch control debugging board is turned on, and the touch control testing tool software in the computer is turned on. Capacitance data of each node on the touch sensing panel can appear in the test tool software, and then the noise scanning function is turned on, at this time, as shown in fig. 2, the interference situation of each frequency point in the working frequency range of the touch chip can be seen.
Referring to fig. 2, it can be seen from the test interference diagram of fig. 2 that the operating frequency of the touch chip is about 15KHz, and in the range from 1K to 150KHz, common mode interference of the charger or the power supply exists in many frequency bands, interference conditions of each frequency band are different, and meanwhile, some frequency bands with smaller interference exist, that is, clean frequency bands.
Secondly, the output signal function of the low-frequency signal generator is started, the frequency setting range is plus or minus 5KHz of the current working frequency of the touch product, if the current working frequency is 15KHz, the current working frequency is adjusted upwards to 20KHz from 10KHz according to 1KHz stepping, the output amplitude of the low-frequency signal generator is two types, one type is low interference amplitude (for example, 200mV, the standard setting is used for looking at the self anti-interference capability of a chip), no matter how many interference signal frequencies are adjusted, the scanning working frequency of the touch chip is not changed, and the test data is normal, no jumping point or no fading point.
And thirdly, testing the frequency hopping performance, setting the amplitude of the low-frequency signal generator to be 3V (strong interference signal), adjusting the output frequency upwards from 10KHz according to 1KHz steps, checking which frequencies the interference frequency is adjusted to, adjusting the scanning working frequency of the touch chip to a new clean frequency band, and simultaneously testing whether the touch function is normal and whether a skip point or a vanishing point exists in the frequency hopping process.
Then, as shown in the schematic diagram of the frequency hopping process in fig. 3, when the operating frequency of the touch chip is subjected to a strong interference signal at 15KHz, the frequency hopping mechanism is triggered, the operating frequency of the touch chip jumps from 15KHz (the position marked by 1 in fig. 3) to 118KHz (the position marked by 2 in fig. 3), and the 4 th step and the 5 th step are repeated, except that the frequency setting of the low-frequency signal generator is calculated from plus or minus 5KHz of 118KHz (i.e., 113KHz to 123 KHz).
Then, the working frequency of the touch chip is jumped from 118KHz to 89KHz (the position marked with 3 in fig. 3), the output signal of the low-frequency signal generator is adjusted to repeat the 4 th step and the 5 th step, the whole repetition frequency is determined according to how many clean working frequencies are stored in the touch chip, at present, 5 clean frequency points are generally stored conventionally, and the stored clean frequency points are set by calculation according to the external noise scanned when the touch chip is just powered on to work.
Finally, if all stored clean frequencies are subjected to strong interference and normal work of the touch chip is affected, the touch chip starts a noise scanning mechanism and re-scans 5 clean frequency points with minimum relative interference.
The utility model discloses a capacitive touch screen scanning frequency automatic frequency hopping capability test device, it utilizes charger fixed interference frequency crowd to combine low frequency signal generator to produce adjustable interference signal, and then realizes that the touch chip is according to the capability test of outside common mode interference condition automatic adjustment operating frequency, in addition, the utility model discloses also be applicable to the frequency hopping capability test when other products need the automatic change operating frequency because of external common mode interference when its operating frequency.
The above is only the embodiment of the present invention, and is not intended to limit the present invention, and all modifications, equivalent replacements or improvements made within the technical scope of the present invention should be included within the protection scope of the present invention.
Claims (6)
1. A capacitive touch screen scanning frequency automatic frequency hopping performance testing device comprises a touch sensing board, wherein the touch sensing board comprises a touch chip, and is characterized in that the testing device comprises a computer, a touch debugging board, a low-frequency signal generator, a mobile phone, a charger, a first binding post and a second binding post, the first binding post and the second binding post are electrically connected with the same sensing channel of the touch sensing board, the first binding post is electrically connected with the low-frequency signal generator through a lead, an output cable of the charger is plugged in the mobile phone and charges the mobile phone through the charger, a ground wire of the output cable of the charger is electrically connected with the second binding post, the touch debugging board is electrically connected between the touch chip and the computer, an electric signal accessed by the second binding post is used as an interference signal and is loaded on the touch sensing board, the low-frequency signal generator is used for generating frequency signals of multiple frequency bands and loading the frequency signals to the touch control induction plate through the first binding post, and when the charger and/or the low-frequency signal generator are started, the computer collects interference data and frequency hopping data generated by the touch control induction plate through the touch control debugging plate and the touch control chip.
2. The device for testing the automatic frequency hopping performance of the scanning frequency of the capacitive touch screen as claimed in claim 1, wherein a preset distance is arranged between the first binding post and the second binding post.
3. The device for testing the scanning frequency automatic frequency hopping performance of the capacitive touch screen as claimed in claim 2, wherein the distance between the first binding post and the second binding post is 50 mm.
4. The device for testing the scanning frequency automatic frequency hopping performance of the capacitive touch screen as claimed in claim 1, wherein the first binding post and the second binding post are copper posts with a diameter of 8 mm.
5. The device for testing the automatic frequency hopping performance of the scanning frequency of the capacitive touch screen as claimed in claim 1, wherein the touch chip is connected to the touch debugging panel through an I2C interface.
6. The device as claimed in claim 5, wherein the touch control debugging board is connected to the computer through a USB cable.
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| CN202020274186.0U CN211293925U (en) | 2020-03-09 | 2020-03-09 | Automatic frequency hopping performance testing device for scanning frequency of capacitive touch screen |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024002213A1 (en) * | 2022-07-01 | 2024-01-04 | 格科微电子（上海）有限公司 | Common-mode interference elimination method for scanning detection device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024002213A1 (en) * | 2022-07-01 | 2024-01-04 | 格科微电子（上海）有限公司 | Common-mode interference elimination method for scanning detection device |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: A capacitive touch screen scanning frequency automatic frequency hopping performance test device Effective date of registration: 20211117 Granted publication date: 20200818 Pledgee: Shenzhen hi tech investment small loan Co.,Ltd. Pledgor: SHENZHEN BETTERLIFE ELECTRONIC SCIENCE AND TECHNOLOGY Co.,Ltd. Registration number: Y2021980012684 |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |