CN211264169U - Automatic testing device for logic control unit - Google Patents
Automatic testing device for logic control unit Download PDFInfo
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- CN211264169U CN211264169U CN201921941195.4U CN201921941195U CN211264169U CN 211264169 U CN211264169 U CN 211264169U CN 201921941195 U CN201921941195 U CN 201921941195U CN 211264169 U CN211264169 U CN 211264169U
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Abstract
The utility model provides an automatic testing device for a logic control unit, which comprises a control management unit, a communication management unit, an output control unit and an input detection unit; the control management unit is respectively connected with the communication management unit, the output control unit and the input detection unit, and is used for sending a test instruction to the output control unit and receiving detection data sent by the input detection unit; the communication management unit is used for receiving the state information of the logic control unit to be tested; the output control unit is connected with the input interface of the logic control unit to be tested and is used for carrying out signal conversion and transmission on the test instruction; the input detection unit is connected with an output interface of the logic control unit to be detected and is used for carrying out signal conversion and transmission on detection data; the management unit, the output control unit, the input detection unit and the communication management unit are matched to realize the test of the logic control unit, so that the test efficiency and the test accuracy are improved.
Description
Technical Field
The utility model relates to an automatic technical field especially relates to an automatic testing arrangement for logic control unit.
Background
On the track traffic vehicles such as a magnetic levitation train, an inter-city train and the like, in order to realize the intelligentization, the miniaturization and the centralization of the train control, a logic control unit (hereinafter abbreviated as LCU) is more and more widely adopted to replace a relay combination circuit on the train, so that the transmission of basic hard line control signals of the train and the realization of simple control logic are realized.
SUMMERY OF THE UTILITY MODEL
In view of the above, an object of the present invention is to provide an automatic testing apparatus for a logic control unit, so as to perform a complete and comprehensive test on the logic control unit.
In view of the above, the present invention provides an automated testing device for a logic control unit, the device comprising a control management unit, a communication management unit, an output control unit and an input detection unit;
the control management unit is respectively connected with the communication management unit, the output control unit and the input detection unit, and is used for sending a test instruction to the output control unit and receiving detection data sent by the input detection unit;
the communication management unit is used for receiving the state information of the logic control unit to be tested;
the output control unit is connected with the input interface of the logic control unit to be tested and is used for carrying out signal conversion and transmission on the test instruction;
the input detection unit is connected with the output interface of the logic control unit to be detected, and the input detection unit is used for carrying out signal conversion and transmission on detection data.
Optionally, the apparatus further comprises a test terminal;
the test terminal is in communication connection with the communication management unit; the control management unit is respectively in communication connection with the communication management unit, the output control unit and the input detection unit; the interface of the communication management unit is connected with the LCU communication management unit interface in the logic control unit to be tested through a state feedback communication line;
the control management unit is also used for receiving the test instruction sent by the communication management unit and sending the detection data to the communication management unit;
the communication management unit is also used for receiving and transmitting the test instruction, receiving and transmitting the detection data and receiving and transmitting the state information of the logic control unit to be tested;
the test terminal is used for generating and sending the test instruction, receiving the detection data and the state information of the logic control unit to be tested, and comparing the state information of the logic control unit to be tested with the test instruction or the detection data.
Optionally, the test terminal is a test computer.
Optionally, the communication management unit and the test terminal, the communication management unit and the control management unit, the control management unit and the output control unit, and the control management unit and the input detection unit are respectively in communication connection through communication lines.
Optionally, the control management unit is a processor, and the communication management unit, the output control unit, and the input detection unit are communication boards respectively; the control management unit is connected with the output control unit, the input detection unit and the communication management unit through PCI buses respectively;
the control management unit is also used for generating the test instruction, receiving the state information of the logic control unit to be tested sent by the communication management unit, and comparing the state information with the test instruction or the detection data;
the communication management unit is also used for sending the state information of the logic control unit to be tested to the control management unit.
Optionally, the communication management unit is connected to an interface of the logic control unit to be tested through a communication interface, where the communication interface includes a CAN bus interface, an RS485/422 interface, an RS232 interface, or an ethernet interface.
Optionally, the output control unit is provided with an output IO interface.
Optionally, the input detection unit is provided with an input IO interface.
Optionally, the device further comprises a display card and a display, the display card is connected with the control management unit through a PCI bus, the control management unit generates a display signal by controlling the display card, and the display displays the test result.
Optionally, the apparatus further comprises an input device for inputting the test instruction.
From the above, the utility model provides an automatic testing arrangement for logic control unit, including control management unit, communication management unit, output control unit and input detecting element; the control management unit sends a test instruction to the output control unit, the output control unit converts the test instruction into an input signal and sends the input signal to an input interface of the logic control unit to be tested, the input detection unit receives an output signal sent by the output interface of the logic control unit to be tested and converts the output signal into detection data, then the detection data is sent to the control management unit, and meanwhile, the communication management unit receives input state information and output state information fed back by the logic control unit to be tested, so that the control management unit, the output control unit, the input detection unit and the communication management unit are matched to realize the test of the logic control unit, the manual intervention test is avoided, and the test efficiency and the test accuracy are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an automated testing apparatus for a logic control unit according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of another automatic testing apparatus for a logic control unit according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings.
It should be noted that unless otherwise defined, technical or scientific terms used in the embodiments of the present invention should have the ordinary meaning as understood by those having ordinary skill in the art to which the present disclosure belongs. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
Typical LCU equipment is composed of a series of switching value input channels, switching value output channels and a control circuit, wherein the switching value input channels collect external input signals, generate corresponding logic output according to internal solidification logic of the control circuit, and output voltage signals through output channels. Meanwhile, in order to realize informatization management, common LCU equipment is provided with a communication interface, and the input state and the generated output state acquired by the LCU equipment are transmitted to an upper-layer vehicle information system through the communication interface.
At present, the main test means for the IO logic control device are divided into two types, one is manual test, and the other is automatic test.
The basic mode of manual testing is to use a set of manual testing tool, connect the testing tool with the input/output channel of the tested product through a cable, and trigger a testing instruction by manually shifting a switch on the testing tool or clicking a screen virtual button by a mouse to generate external excitation to the tested product; obtaining a test result by observing an indicator lamp on the test tool or observing feedback display on a test computer screen; however, this type of testing is inefficient and, due to manual intervention, may introduce errors into the testing process.
The automatic test mode is that the controlled accompanying test equipment is controlled by a computer, external excitation is generated on the tested equipment, the feedback state of the test equipment is automatically obtained by a computer acquisition technology, the feedback result is compared with an expected test result, whether the test is passed or not is judged, and the automatic test function is realized; however, the test mode does not test the signal physical parameters and the index range of the tested channel, and is not suitable for testing the LCU equipment.
In order to solve the technical problem, an embodiment of the present invention provides an automatic testing apparatus for a logic control unit, which includes a control management unit, a communication management unit, an output control unit and an input detection unit; the control management unit sends a test instruction to the output control unit, the output control unit converts the test instruction into an input signal and sends the input signal to an input interface of the logic control unit to be tested, the input detection unit receives an output signal sent by the output interface of the logic control unit to be tested and converts the output signal into detection data, then the detection data is sent to the control management unit, and meanwhile, the communication management unit receives input state information and output state information of the logic control unit to be tested, so that the control management unit, the output control unit, the input detection unit and the communication management unit are matched to realize testing of the logic control unit, manual intervention testing is avoided, and testing efficiency and testing accuracy are improved.
The embodiment of the utility model provides an automatic testing arrangement for logic control unit, this automatic testing arrangement includes control management unit, communication management unit, output control unit and input detecting element;
the control management unit is simultaneously and respectively connected with the communication management unit, the output control unit and the input detection unit; the control management unit is connected with the output control unit and sends a test instruction to the output control unit; the control management unit is connected with the input detection unit and receives the detection data sent by the input detection unit.
The communication management unit receives state information of the logic control unit to be tested, and the state information of the logic control unit to be tested comprises input state information of the logic control unit to be tested and output state information of the logic control unit to be tested.
The output control unit is connected with an input interface of the logic control unit to be tested; the output control unit receives the test instruction sent by the control management unit, converts the test instruction into an input signal, and then sends the input signal to the logic control unit to be tested through the input interface of the logic control unit to be tested.
The input detection unit is connected with an output interface of the logic control unit to be detected; the input detection unit receives an output signal sent by the logic control unit to be detected through an output interface of the logic control unit to be detected, converts the output signal into detection data, and then sends the detection data to the control management unit.
Fig. 1 is the embodiment of the utility model provides a pair of automatic testing arrangement for logic control unit, as shown in fig. 1, this automatic testing arrangement includes control management unit 1, communication management unit 2, output control unit 3, input detecting element 4 and test terminal, and wherein test terminal is test computer 5.
The test computer 5 is in communication connection with the communication management unit 2, and the communication interface 21 of the communication management unit 2 is connected with the interface 81 of the logic control unit to be tested through the LCU state feedback communication line 9; in practical applications, the communication interface 21 of the communication management unit 2 is connected to the interface 81 of the LCU communication management unit 8 in the logic control unit to be tested through the LCU status feedback communication line 9.
The communication management unit 2 is respectively connected with the test computer 5 and the control management unit 1, the control management unit 1 is also respectively connected with the output control unit 3 and the input detection unit 4 in a communication way, the output control unit 3 is connected with the input interface 6 of the logic control unit to be tested, and the input detection unit 4 is connected with the output interface 7 of the logic control unit to be tested.
The output control unit 3 receives the test instruction sent by the control management unit 1, converts the test instruction into an input signal, and then sends the input signal to the logic control unit to be tested through the input interface 6 of the logic control unit to be tested. In practical applications, the input signal may be a hard-wired signal, and is not limited specifically.
The input detection unit 4 receives an output signal sent by the logic control unit to be detected through the output interface 7 of the logic control unit to be detected, converts the output signal into detection data, and then sends the detection data to the control management unit 1. In practical applications, the output signal may be a hard-wired signal, and is not limited specifically.
In practical application, the input detection unit 4 is controlled by the control management unit 1, and the control management unit 1 controls the input detection unit 4 to adjust the resistance value of the load resistor of the input channel therein, set the load of the input channel to a high-resistance state and a maximum power load state required by the technical specification of the LCU, and detect the voltage and current of the load of the input channel at the moment.
The control management unit 1 receives the test instruction sent by the communication management unit 2 and sends the test instruction to the output control unit 3, and receives the detection data sent by the input detection unit 4 and sends the detection data to the communication management unit 2.
The communication management unit 2 receives a test instruction sent by the test computer 5 and sends the test instruction to the control management unit 1, receives detection data sent by the control management unit 1 and sends the detection data to the test computer 5, and receives state information of the logic control unit to be tested and sends the state information of the logic control unit to be tested to the test computer 5; the state information of the logic control unit to be tested comprises input state information of the logic control unit to be tested and output state information of the logic control unit to be tested.
The test computer 5 generates a test instruction, sends the test instruction to the communication management unit 2, receives the detection data fed back by the communication management unit 2, compares the detection data with the output state information of the logic control unit to be tested, and compares the test instruction with the input state information of the logic control unit to be tested; in practical application, the passing condition of the test can be determined according to specific test items, for example, if the passing condition is that the test data is consistent with the output state information of the logic control unit to be tested and the test instruction is consistent with the input state information of the logic control unit to be tested, the test is passed; alternatively, the passing condition may be that the detection data is consistent with the output state information of the logic control unit to be tested or that the test instruction is consistent with the input state information of the logic control unit to be tested.
In practical application, a test program runs in the test computer 5, when testing, based on a start instruction of a user, the test program calls a pre-stored test script according to a test item, the test script may include a plurality of test instructions, then sends the test instructions to the communication management unit 2, after sending the test instructions, the test program receives test data from the input test unit fed back by the communication management unit 2 and state information fed back by the logic control unit to be tested through a state feedback communication line, then compares the test data with output state information of the logic control unit to be tested according to a test passing condition of the test item, and simultaneously compares the test instructions with input state information of the logic control unit to be tested, if the test result passes, the test is correct, and displays the test result to the user through a display interface of the test computer 5, and the test program executes the next test; if the test result is not passed, the test program records the test error record, displays the test result to the user through the display interface of the test computer 5, and continues to execute the next test item or terminate the current test process according to the user setting.
In practical applications, the communication management unit 2 and the test computer 5, the communication management unit 2 and the control management unit 1, the control management unit 1 and the output control unit 3, and the control management unit 1 and the input detection unit 4 are respectively connected by communication lines.
Fig. 2 is the embodiment of the present invention provides an automatic testing device for logic control unit, as shown in fig. 2, the automatic testing device is centrally disposed in a terminal computer, and the automatic testing device includes a control management unit 1, a communication management unit 2, an output control unit 3 and an input detection unit 4.
The control management unit 1 is connected with the output control unit 3, the input detection unit 4 and the communication management unit 2 through a PCI bus respectively, the output control unit 3 is connected with an input interface 6 of the logic control unit to be tested, the input detection unit 4 is connected with an output interface 7 of the logic control unit to be tested, the communication management unit 2 is connected with an interface 8 of the logic control unit to be tested, and specifically, the communication management unit 2 is connected with an interface 81 of an LCU communication management unit 8 in the logic control unit to be tested.
The automatic test device also comprises a display card 10 and a display, wherein the display card 10 is connected with the control management unit 1 through a PCI bus. The control manager 1 generates a display signal by controlling the display card 10 and displays the test result through the display.
The automatic testing device also comprises an input device, and a user starts or stops a testing instruction through the input device; in practical applications, the input device may be a mouse, a keyboard, a tablet, or the like, and is not limited specifically.
The output control unit 3 is a communication board card provided with an output IO interface and is arranged on a PCI slot of the terminal computer; the output control unit 3 receives the test instruction sent by the control management unit 1 through the PCI bus, converts the test instruction into an input signal, and then sends the input signal to the logic control unit to be tested through the input interface 6 of the logic control unit to be tested. In practical applications, the input signal may be a hard-wired signal, and is not limited specifically.
The input detection unit 4 is a communication board card provided with an input IO interface and is arranged on a PCI slot of the terminal computer; the input detection unit 4 receives an output signal sent by the logic control unit to be detected through the output interface 7 of the logic control unit to be detected, converts the output signal into detection data, and then sends the detection data to the control management unit 1 through the PCI bus. In practical applications, the output signal may be a hard-wired signal, and is not limited specifically.
In practical application, the input detection unit 4 is controlled by the control management unit 1, and the control management unit 1 controls the input detection unit 4 to adjust the resistance value of the load resistor of the input channel therein, set the load of the input channel to a high-resistance state and a maximum power load state required by the technical specification of the LCU, and detect the voltage and current of the load of the input channel at the moment.
The control management unit 1 is a processor of a terminal computer, in which test software is run, and when testing, based on the user's start instruction, the test software calls a pre-stored test script according to the test item, the test script may include a plurality of test instructions, then sending a test instruction to the output control unit 3, after sending the test instruction, the test program receives the test data sent by the input test unit 4 and the state information of the logic control unit to be tested fed back by the communication management unit 2, then according to the condition that the test item passes the test, the test data is compared with the output state information of the logic control unit to be tested, and simultaneously the test instruction is compared with the input state information of the logic control unit to be tested, if the test result passes, the test is correct, the test result is displayed to the user through the display, and the test program executes the next test; if the test result is not passed, the test program records the test error record, displays the test result to the user through the display, and continues to execute the next test item or terminates the current test process according to the user setting.
The communication management unit 2 is a communication board card provided with a PCI interface and is arranged on a PCI slot of the terminal computer; the communication management unit 2 is connected with an interface 21 of the logic control unit to be tested through a communication interface in the communication management unit; in practical application, the communication interface of the communication management unit 2 may be a CAN bus interface, an RS485/422 interface, an RS232 interface, or an ethernet interface, and is not limited specifically. The communication management unit 2 receives the state information of the logic control unit to be tested and sends the state information of the logic control unit to be tested to the control management unit 1 through the PCI bus for analysis processing.
The utility model discloses the application example that adopts the automatic testing arrangement that provides in FIG. 1 or FIG. 2 to test to different test items is still provided, specifically as follows:
1) testing an LCU input voltage threshold;
by adopting the automatic testing device provided in fig. 1, according to the maximum input effective voltage value of the LCU input channel required by the LCU technical specification, the testing computer 5 sends a testing instruction to the communication management unit 2, the communication management unit 2 sends the testing instruction to the control management unit 1, the control management unit 1 sends the testing instruction to the output control unit 3, and the output control unit 3 designates a certain output channel of the testing device and generates an output voltage according to the maximum effective input voltage value required by the LCU technical specification; the communication management unit 2 in the test apparatus then reads the status information of the LCU from the status feedback communication line of the LCU under test and feeds it back to the test computer 5, and the test computer 5 detects whether the input signal is correctly received by the LCU. Or, by using the automatic testing apparatus provided in fig. 2, according to the maximum input effective voltage value of the LCU input channel required by the LCU specification, the control and management unit 1 sends a test instruction to the output control unit 3 through the PCI bus, and the output control unit 3 designates a certain output channel of the testing apparatus and generates an output voltage according to the maximum effective input voltage value required by the LCU specification; the communication management unit 2 in the testing apparatus then reads the status information of the LCU through the communication interface therein and feeds back to the control management unit 1, and the control management unit 1 detects whether the LCU has correctly received the input signal.
By adopting the automatic testing device provided in fig. 1, according to the minimum input effective voltage value of the LCU input channel required by the LCU technical specification, the testing computer 5 sends a testing instruction to the communication management unit 2, the communication management unit 2 sends the testing instruction to the control management unit 1, the control management unit 1 sends the testing instruction to the output control unit 3, the output control unit 3 designates a certain output channel of the testing tool and generates an output voltage according to the minimum effective input voltage value required by the LCU technical specification; the communication management unit 2 in the test apparatus then reads the status information of the LCU from the status feedback communication line of the LCU under test and feeds it back to the test computer 5, and the test computer 5 detects whether the input signal is correctly received by the LCU. Or, by using the automatic testing apparatus provided in fig. 2, according to the minimum input effective voltage value of the LCU input channel required by the LCU specification, the control and management unit 1 sends a test instruction to the output control unit 3 through the PCI bus, and the output control unit 3 designates a certain output channel of the testing apparatus and generates an output voltage according to the minimum effective input voltage value required by the LCU specification; the communication management unit 2 in the testing apparatus then reads the status information of the LCU through the communication interface therein and feeds back to the control management unit 1, and the control management unit 1 detects whether the LCU has correctly received the input signal.
By adopting the automatic testing device provided in fig. 1, according to the typical input effective voltage value (generally, the intermediate value of the maximum and minimum input effective voltage values) of the LCU input channel required by the LCU technical specification, the testing computer 5 sends a testing instruction to the communication management unit 2, the communication management unit 2 sends the testing instruction to the control management unit 1, the control management unit 1 sends the testing instruction to the output control unit 3, the output control unit 3 designates a certain output channel of the testing tool and generates an output voltage according to the typical effective input voltage value required by the LCU technical specification; the communication management unit 2 in the test apparatus then reads the status information of the LCU from the status feedback communication line of the LCU under test and feeds it back to the test computer 5, and the test computer 5 detects whether the input signal is correctly received by the LCU. Or, by using the automatic testing apparatus provided in fig. 2, according to the typical input effective voltage value of the LCU input channel required by the LCU specification, the control and management unit 1 sends a test instruction to the output control unit 3 through the PCI bus, and the output control unit 3 designates a certain output channel of the testing apparatus and generates an output voltage according to the typical input effective voltage value required by the LCU specification; the communication management unit 2 in the testing apparatus then reads the status information of the LCU through the communication interface therein and feeds back to the control management unit 1, and the control management unit 1 detects whether the LCU has correctly received the input signal.
If all three tests pass, the input voltage threshold of the channel of the tested LCU passes the test.
2) And LCU output logic test:
by adopting the automatic testing device provided in fig. 1, according to a certain input and output logic description of a functional logic truth table of the LCU technical specification, the testing computer 5 sends a testing instruction to the communication management unit 2, the communication management unit 2 sends the testing instruction to the control management unit 1, the control management unit 1 sends the testing instruction to the output control unit 3, and the output control unit 3 receives the testing instruction, converts the testing instruction into a group of input combined signals, and then sends the input combined signals to the LCU to be tested; the input detection unit 4 receives an output signal sent by the LCU to be detected and converts the output signal into detection data; meanwhile, the communication management unit 2 receives the output status information and the input status information of the tested LCU. Or, by using the automatic testing apparatus provided in fig. 2, according to a certain input/output logic description of the functional logic truth table of the LCU technical specification, the control and management unit 1 sends a test instruction to the output control unit 3 through the PCI bus, and the output control unit 3 receives the test instruction and converts the test instruction into a group of input combination signals, and then sends the input combination signals to the LCU to be tested; the input detection unit 4 receives an output signal sent by the LCU to be detected and converts the output signal into detection data; meanwhile, the communication management unit 2 receives the output status information and the input status information of the tested LCU.
Detecting whether the LCU to be tested generates correct response to the input signals of each group; if the tested LCU generates correct response to all the combined input signals, the detection data is consistent with the output state information of the tested LCU, and the test instruction is consistent with the input state information of the tested LCU, the output logic test of the LCU is passed.
3) And testing the load of the output belt of the LCU:
by adopting the automatic testing device provided in fig. 1 or fig. 2, the control management unit 1 controls the input detection unit 4, sets the input load resistance of the input channel in the input detection unit 4 to be in a high-resistance state, and measures whether the output voltage value of the tested LCU meets the range requirement of the output voltage in the technical specification of the LCU;
the control management unit 1 continuously sets the input load resistor by controlling the input detection unit 4, gradually reduces the resistance value of the input load resistor, monitors the voltage U and the load current I applied to two ends of the input load resistor in real time, and detects whether the output voltage U value of the LCU at the moment meets the range requirement on the output voltage in the LCU technical specification when the value of multiplying the U by the I reaches the maximum output power value of the LCU output channel specified by the LCU technical specification;
if both tests pass, the output of the channel of the tested LCU passes the load test.
4) LCU output delay test
Using the automated testing apparatus provided in fig. 1 or fig. 2, the automated testing apparatus generates a set of valid inputs according to the description of the functional logic truth table of the LCU specification, and records the time when the valid inputs are generated; simultaneously detecting an output signal generated by the LCU to be detected, and recording the time of generating the output signal; the difference value of the recorded output signal generation time minus the recorded effective input generation time is compared with the signal output delay parameters in the LCU technical specification by the automatic testing device to judge whether the requirements are met.
The automatic testing device cancels the generated effective input signal, records the time for canceling the input signal and detects and records the time for resetting the output signal of the tested LCU; the automatic test tool compares the difference value of the recorded LCU reset output signal time minus the recorded cancellation input signal time with a signal cancellation delay parameter in an LCU technical specification to judge whether the requirements are met;
if both tests pass, the output delay test of the channel of the tested LCU passes.
5) Full traversal testing
The automatic testing device provided in fig. 1 or fig. 2 is adopted to perform the combination test on the above 4 tests, that is, the LCU output logic test, the output load test and the output delay test are simultaneously performed when the LCU input voltage threshold test is performed, and various combination tests are performed on the above 4 tests; since the test takes a long time, the coverage degree of the combined test is determined according to the actual situation.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also technical features in the above embodiments or in different embodiments can be combined, steps can be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity.
In addition, well known power/ground connections to Integrated Circuit (IC) chips and other components may or may not be shown in the provided figures for simplicity of illustration and discussion, and so as not to obscure the invention. Furthermore, devices may be shown in block diagram form in order to avoid obscuring the invention, and also in view of the fact that specifics with respect to implementation of such block diagram devices are highly dependent upon the platform within which the present invention is to be implemented (i.e., specifics should be well within purview of one skilled in the art). Where specific details (e.g., circuits) are set forth in order to describe example embodiments of the invention, it should be apparent to one skilled in the art that the invention can be practiced without, or with variation of, these specific details. Accordingly, the description is to be regarded as illustrative instead of restrictive.
While the present invention has been described in conjunction with specific embodiments thereof, many alternatives, modifications, and variations of these embodiments will be apparent to those skilled in the art in light of the foregoing description. For example, other memory architectures (e.g., dynamic ram (dram)) may use the discussed embodiments.
The present embodiments are intended to embrace all such alternatives, modifications and variances which fall within the broad scope of the appended claims. Therefore, any omission, modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (7)
1. An automatic test device for a logic control unit is characterized by comprising a control management unit, a communication management unit, an output control unit and an input detection unit;
the control management unit is respectively connected with the communication management unit, the output control unit and the input detection unit, and is used for sending a test instruction to the output control unit and receiving detection data sent by the input detection unit;
the communication management unit is used for receiving the state information of the logic control unit to be tested;
the output control unit is connected with the input interface of the logic control unit to be tested and is used for carrying out signal conversion and transmission on the test instruction;
the input detection unit is connected with the output interface of the logic control unit to be detected, and the input detection unit is used for carrying out signal conversion and transmission on detection data.
2. The automated testing device for the logic control unit according to claim 1, wherein the control management unit is a processor, and the communication management unit, the output control unit, and the input detection unit are communication boards respectively; the control management unit is connected with the output control unit, the input detection unit and the communication management unit through PCI buses respectively;
the control management unit is also used for generating the test instruction, receiving the state information of the logic control unit to be tested sent by the communication management unit, and comparing the state information with the test instruction or the detection data;
the communication management unit is also used for sending the state information of the logic control unit to be tested to the control management unit.
3. The automated testing device for logic control units according to claim 2, wherein the communication management unit is connected with the interface of the logic control unit to be tested through a communication interface, and the communication interface comprises a CAN bus interface, an RS485/422 interface, an RS232 interface or an ethernet interface.
4. The automated testing apparatus for logic control units according to claim 2, wherein the output control unit is provided with an output IO interface.
5. The automated testing device for logic control units according to claim 2, wherein the input detection unit is provided with an input IO interface.
6. The automated testing device for the logic control unit according to claim 2, further comprising a display card and a display, wherein the display card is connected with the control management unit through the PCI bus, and the control management unit generates a display signal by controlling the display card and displays the test result through the display.
7. The automated test equipment for logic control units of claim 2, further comprising an input device for initiating or terminating a test instruction.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921941195.4U CN211264169U (en) | 2019-11-11 | 2019-11-11 | Automatic testing device for logic control unit |
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