CN210358168U

CN210358168U - Small-size SLT test sorting system

Info

Publication number: CN210358168U
Application number: CN201921177325.1U
Authority: CN
Inventors: 朱新亚
Original assignee: Twinsolution Technology (suzhou) Ltd
Current assignee: Twinsolution Technology (suzhou) Ltd
Priority date: 2019-07-25
Filing date: 2019-07-25
Publication date: 2020-04-21
Anticipated expiration: 2029-07-25

Abstract

The utility model relates to a small-size SLT test sorting system, including industrial computer, unipolar servo, four-axis manipulator, sucking disc module, a plurality of duplex position pressure heads, CCD orientation module and detection machine, four-axis manipulator, sucking disc module, unipolar servo, CCD orientation module and detection machine are connected respectively to the industrial computer, sucking disc module fixed connection four-axis manipulator, duplex position pressure head fixed connection unipolar is servo. The utility model discloses small-size SLT test sorting system has realized that the automatic detection of semiconductor is selected separately, and electric and mechanical structure is simple and easy relatively, and four-axis manipulator cooperation CCD location has the precision higher, moves advantages such as faster.

Description

Small-size SLT test sorting system

Technical Field

The utility model relates to a SLT test technical field, concretely relates to small-size SLT test sorting system.

Background

With the more frequent updating of mobile phones and computers, the semiconductor industry is rapidly developing, and many semiconductor factories introduce large-scale automated testing (high and low temperature, etc.) and packaging equipment to ensure the usage amount of chips. There are many laboratories or small non-production plants, the space is too small to use such large automation equipment, and such equipment uses too many electrical components, which makes the electrical assembly and programming complicated.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a small-size SLT test sorting system for the laboratory and the workshop in the little space of solution prior art can't use large-scale automation equipment to carry out the problem that the chip detected.

The utility model provides a small-size SLT test sorting system, including industrial computer, unipolar servo, four-axis manipulator, sucking disc module, a plurality of duplex position pressure head, CCD orientation module and detection machine, four-axis manipulator, sucking disc module, unipolar servo, CCD orientation module and detection machine are connected respectively to the industrial computer, sucking disc module fixed connection four-axis manipulator, duplex position pressure head fixed connection unipolar is servo.

Further, the device also comprises an optical fiber sensor used for detecting whether the chip exists or not, wherein the optical fiber sensor is connected with an industrial personal computer.

Further, the industrial personal computer is in communication connection with the factory tester through an RS232 protocol.

Furthermore, the industrial personal computer is communicated with the single-axis servo and the four-axis manipulator through an Ethernet/IP protocol.

And the system further comprises an input keyboard module and an output signal lamp module which are electrically connected with the industrial personal computer, various parameter control information is input through the input keyboard module, and the working state of the system is displayed through the output signal lamp module.

Adopt above-mentioned the utility model discloses technical scheme's beneficial effect is:

the utility model discloses small-size SLT test sorting system has realized that the automatic detection of semiconductor is selected separately, and electric and mechanical structure is simple and easy relatively, and four-axis manipulator cooperation CCD location has the precision higher, moves advantages such as faster.

Drawings

Fig. 1 is the structure schematic diagram of the small-sized SLT testing and sorting system of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention.

As shown in fig. 1, the utility model provides a small-size SLT test sorting system, including industrial computer, unipolar servo, four-axis manipulator, sucking disc module, a plurality of duplex position pressure head, CCD orientation module and detection machine, four-axis manipulator, sucking disc module, unipolar servo, CCD orientation module and detection machine are connected respectively to the industrial computer, sucking disc module fixed connection four-axis manipulator, duplex position pressure head fixed connection unipolar is servo.

The device also comprises an optical fiber sensor used for detecting whether the chip exists or not, wherein the optical fiber sensor is connected with an industrial personal computer.

The industrial personal computer is in communication connection with the factory testing machine through an RS232 protocol and is in communication with the single-shaft servo and the four-shaft manipulator through an Ethernet/IP protocol.

The industrial personal computer is electrically connected with the input keyboard module and the output signal lamp module.

The working flow of the sorting system is as follows: an operator places a full-chip tray in a tray area to be tested and places an empty tray in a Pass tray area and a Fail tray area respectively, after an automatic process begins, a four-axis manipulator moves to the tray area to be tested and absorbs a chip to be tested in cooperation with a sucker module, then the four-axis manipulator moves the sucker module absorbing the chip to be tested to a CCD positioning module for secondary positioning, then the chip is placed in a Socket of an empty double-station pressure head, a single-axis servo drives the double-station pressure head to press down, the Socket contacts a detector at the bottom to start detection, the detector is a PCB testing machine, the chip is connected with the PCB testing machine through the Socket, the function of the chip can be tested, after the detection is finished, the testing machine distinguishes that the current chip is Pass or Fail, information is transmitted to an industrial personal computer, the industrial personal computer controls the action of the four-axis manipulator, and the chip is placed in the corresponding tray area in cooperation with the sucker module, so repeatedly, accomplish the detection of all chips, when optical fiber sensor detected the chip in the district charging tray that awaits measuring and took when finishing, the action of industrial computer control four-axis manipulator, the cooperation sucking disc module is placed empty charging tray and is distinguished the empty charging tray to remind the staff to add new charging tray that awaits measuring.

To sum up, the utility model discloses small-size SLT test sorting system has realized that the automatic detection of semiconductor is selected separately, and electric and mechanical structure is simple and easy relatively, and four-axis manipulator cooperation CCD location has the precision higher, moves advantages such as faster.

Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention.

Claims

1. The utility model provides a small-size SLT test sorting system, its characterized in that, includes industrial computer, unipolar servo, four-axis manipulator, sucking disc module, a plurality of duplex position pressure heads, CCD orientation module and detection machine, four-axis manipulator, sucking disc module, unipolar servo, CCD orientation module and detection machine are connected respectively to the industrial computer, sucking disc module fixed connection four-axis manipulator, duplex position pressure head fixed connection unipolar servo.

2. The compact SLT testing and sorting system of claim 1, further including a fiber sensor for detecting the presence of a chip, the fiber sensor being connected to an industrial personal computer.

3. The compact SLT test sorting system of claim 1, wherein the industrial personal computer is communicatively coupled to the factory tester via an RS232 protocol.

4. The compact SLT test sorting system of claim 1, wherein the industrial personal computer communicates with the single axis servo, four axis robot via Ethernet/IP.

5. The compact SLT testing and sorting system of claim 1, further including an input keyboard module and an output signal light module electrically connected to the industrial personal computer.