CN208834720U - A kind of Electronic Paper TFT glass substrate detection device - Google Patents
A kind of Electronic Paper TFT glass substrate detection device Download PDFInfo
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- CN208834720U CN208834720U CN201821495194.7U CN201821495194U CN208834720U CN 208834720 U CN208834720 U CN 208834720U CN 201821495194 U CN201821495194 U CN 201821495194U CN 208834720 U CN208834720 U CN 208834720U
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- glass substrate
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Abstract
A kind of Electronic Paper TFT glass substrate detection device, it is characterized by: it includes workbench, workbench is equipped with bracket, and the localization tool for positioning TFT glass substrate, the clamping device that can be moved along a straight line up and down is equipped on bracket positioned at the surface of localization tool, for clamping the electrode plate being oppositely arranged with TFT glass substrate, it further include the testing host of setting on the table, testing host includes main control module, multiple test resistances and test probe assembly, ground connection is after each testing capacitor is connected with each test resistance respectively to form multiple RC charge-discharge circuits, main control module is electrically connected the practical charge and discharge time for detecting each charge-discharge circuit with each charge-discharge circuit respectively.Without attaching, Electronic Paper, testing efficiency are higher, testing result is more acurrate reliable with TFT glass substrate detection device for the Electronic Paper.
Description
Technical field
The utility model relates to electronic paper technology fields, and in particular to a kind of Electronic Paper TFT glass substrate detection device.
Background technique
Electronic Paper can not be carried out with TFT glass substrate due to being single layer TFT structure electrode from showing, so mesh at present
Preceding attached to Electronic Paper on TFT glass substrate, just can simply be surveyed by test point to TFT glass substrate
Examination.Once TFT glass substrate is problematic, Electronic Paper is also and then scrapped；And to be surveyed when detecting completely black complete white, odd spaced points,
Even spaced points, odd interval horizontal line, even interval horizontal line, odd interval vertical line, even interval vertical line and etc., under testing efficiency is very low；
It furthermore is observed using naked eyes, it is easy to it malfunctions, it is relatively low so as to cause reliability.
Utility model content
Technical problem to be solved by the utility model is: providing one kind, without attaching, Electronic Paper, testing efficiency are higher, detect
As a result more acurrate reliable Electronic Paper TFT glass substrate detection device.
The technical solution of the utility model is: a kind of Electronic Paper TFT glass substrate detection device, feature exist
In: it includes workbench, and the workbench is equipped with bracket and the localization tool for positioning TFT glass substrate, the branch
The clamping device that can be moved along a straight line up and down is equipped on frame positioned at the surface of localization tool, for clamping and TFT glass substrate phase
To the electrode plate of setting, the electrode plate from top to bottom successively includes insulating substrate, metal material layer or ITO layer, insulating layer, institute
It states metal material layer or ITO layer is divided into multiple plate regions, the size of each plate regions and the pixel ITO of TFT glass substrate
The testing capacitor in the same size for being used to form multiple parallel connections of N*M pixel of layer, N >=1, M >=1 further include being arranged in work
Make the testing host on platform, the testing host includes main control module, multiple test resistances and test probe assembly, each survey
Examination capacitor is grounded to form multiple RC charge-discharge circuits after connect respectively with each test resistance, the main control module respectively with respectively fill
Discharge circuit is electrically connected the practical charge and discharge time for detecting each charge-discharge circuit, one end of the test probe assembly and master
Module electrical connection is controlled, the other end is used to be connected to each other with the drive module of TFT glass substrate.
After adopting the above structure, the utility model has the advantage that
The pixel ITO layer of TFT glass substrate is envisioned for electricity with TFT glass substrate detection device by the utility model Electronic Paper
The side electrode plate of appearance, by the other side electrode plate of setting one corresponding thereto, to form the testing capacitor of multiple parallel connections, then
The test resistance being connected in series with each testing capacitor is set on testing host to form RC charge-discharge circuit again, passes through test in this way
The output voltage that the main control module of mainboard controls each pixel can carry out charge and discharge to RC charge-discharge circuit, what contrasting detection arrived
The charge and discharge time of practical charge and discharge time and standard can be detected TFT substrate and damages with the presence or absence of pixel, entirely detected
Cheng Wuxu attaches Electronic Paper, the waste of Electronic Paper will not be caused when TFT glass substrate is damaged, and need to only detect charge and discharge
The electric time, detection efficiency is higher, is furthermore detected by testing host automatically and replaces artificial detection, and testing result is more acurrate reliable.
Preferably, the clamping device includes for the vacuum cups of Level Adsorption electrode plate and for driving vacuum
The linear drive apparatus up and down that suction nozzle moves along a straight line up and down.The simple, adsorption reliability using vacuum cups structure, and can also facilitate
Remove electrode plate and readjust its position, can with TFT glass substrate accurate alignment so that testing capacitor precision is more
Height, testing result are more acurrate.
Preferably, the value range of N is 4-10, the value range of M is 4-10.The setting both can guarantee testing result
Accuracy, and detection circuit can be made too complicated, improve detection efficiency.
Preferably, the dielectric coefficient of insulating layer is greater than 10, thickness is less than 2 μ.The setting can make testing capacitor precision more
Height, performance is more preferable, to keep testing result more acurrate.
Detailed description of the invention:
Fig. 1 is the structural schematic diagram of the utility model electrode plate；
Fig. 2 is the structural schematic diagram of the utility model Electronic Paper TFT glass substrate detection device；
Fig. 3 be the utility model electrode plate, TFT glass substrate, test resistance cooperation schematic diagram；
Fig. 4 be the utility model electrode plate, TFT glass substrate, test resistance schematic equivalent circuit；
Fig. 5 is the voltage waveform of the testing capacitor detected in a certain RC charge-discharge circuit of the utility model；
Fig. 6 is that the utility model TFT glass substrate exports odd spaced image vegetarian refreshments；
Fig. 7 is that the utility model TFT glass substrate exports even spaced image vegetarian refreshments；
In figure: 1- insulating substrate, 2- metal material layer or ITO layer, 3- insulating layer, the pixel of 4-TFT glass substrate, 5-
Plate regions, 6- testing capacitor, 7- storage capacitance, 8- test resistance, 9- workbench, 10- localization tool, 11- clamping device,
12- testing host, 13- test probe assembly, 14- vacuum cups, 15- or more linear drive apparatus.
Specific embodiment
With reference to the accompanying drawing, and in conjunction with the embodiments the utility model is described further.
Embodiment:
As shown in Figures 1 to 4, a kind of Electronic Paper TFT glass substrate detection device, it includes workbench 9, the work
Platform 9 is equipped with bracket and the localization tool 10 for positioning TFT glass substrate, is located at localization tool 10 on the bracket
Surface is equipped with the clamping device 11 that can be moved along a straight line up and down, for clamping the electrode plate being oppositely arranged with TFT glass substrate, institute
State electrode plate from top to bottom successively include insulating substrate 1, metal material layer or ITO layer 2, insulating layer 3, the metal material layer or
ITO layer 2 is divided into multiple plate regions 5, N*M picture of the pixel ITO layer of the size and TFT glass substrate of each plate regions 5
The testing capacitor 6 in the same size for being used to form multiple parallel connections of vegetarian refreshments, N >=1, M >=1 further includes the survey being arranged on workbench 9
Mainboard 12 is tried, the testing host 12 includes main control module, multiple test resistances 8 and test probe assembly 13, each test
Ground connection to be after capacitor 6 is connected with each test resistance 8 respectively to form multiple RC charge-discharge circuits, the main control module respectively with respectively fill
Discharge circuit is electrically connected the practical charge and discharge time for detecting each charge-discharge circuit, one end of the test probe assembly 13 with
Main control module electrical connection, the other end are used to be connected to each other with the drive module of TFT glass substrate.
The pixel ITO layer of TFT glass substrate is envisioned for electricity with TFT glass substrate detection device by the utility model Electronic Paper
The side electrode plate of appearance, by the other side electrode plate of setting one corresponding thereto, to form the testing capacitor 6 of multiple parallel connections, so
The test resistance 8 being connected in series with each testing capacitor 6 is set on testing host 12 to form RC charge-discharge circuit again afterwards, is led in this way
Cross testing host 12 main control module control each pixel 4 output voltage can to RC charge-discharge circuit carry out charge and discharge, it is right
Than the charge and discharge time of the practical charge and discharge time and standard that detect, TFT glass substrate can be detected with the presence or absence of pixel 4
Damage, entire detection process are not necessarily to attach Electronic Paper, and the waste of Electronic Paper will not be caused when TFT glass substrate is damaged,
And the charge and discharge time need to be only detected, detection efficiency is higher, and furthermore by testing host 12, detection replaces artificial detection, detection automatically
As a result more acurrate reliable.
Preferably, the clamping device 11 includes for the vacuum cups 14 of Level Adsorption electrode plate and for driving
Linear drive apparatus 15 up and down that about 14 vacuum cups moves along a straight line, vacuum cups 14 and upper and lower linear drive apparatus 15 use
The prior art, upper and lower linear drive apparatus 15 is such as cylinder, fast ram pressure., suction simple using 14 structure of vacuum cups
It is attached reliable, and can also conveniently remove electrode plate and readjust its position, can with TFT glass substrate accurate alignment, thus
So that 6 precision of testing capacitor is higher, testing result is more acurrate.
Preferably, the value range of N is 4-10, the value range of M is 4-10.The setting both can guarantee testing result
Accuracy, and detection circuit can be made too complicated, improve detection efficiency.
Preferably, the dielectric coefficient of insulating layer 3 is greater than 10, thickness is less than 2 μ, such as ZNO.The setting can make test electricity
Hold that 6 precision are higher, and performance is more preferable, to keep testing result more acurrate.
The step of being detected using above-mentioned Electronic Paper with TFT glass substrate detection device is as follows:
(1) electrode plate is taken, the one side by electrode plate with insulating layer 3 is opposite with the pixel ITO layer of TFT glass substrate to be attached,
So as to multiple testing capacitors 6 in parallel are formed between electrode plate and TFT glass substrate with multiple plate regions, each test electricity
Ground connection is used to form RC charge-discharge circuit after appearance 6 is connected with the test resistance 8 being arranged on testing host 12 respectively；
(2) probe assembly 13 is tested to TFT glass substrate by one from the main control module being arranged on testing host 12
Drive module sends the control signal for controlling the output voltage of each pixel 4 of TFT glass substrate；
(3) the practical charge and discharge time of each RC charge-discharge circuit is obtained in real time by the main control module of testing host 12, and with
The standard charge and discharge time of itself preset each RC charge-discharge circuit is compared, and judges whether TFT glass substrate is deposited with this
It is damaged in pixel 4, as long as the main control module of testing host 12 is connected to the both ends of the testing capacitor 6 of each RC charge-discharge circuit i.e.
The voltage waveform of testing capacitor 6 can be detected, so as to obtain the corresponding practical charge and discharge time.
Preferably, main control module is odd by the test control TFT glass substrate output of probe assembly 13 in the step (2)
Spaced image vegetarian refreshments and even spaced image vegetarian refreshments, each pixel output+15V and 0V alternating voltage.The setting can make testing result more
Accurately.
In the present embodiment, N=8, M=8, one plate regions 5 are set and assume there are 64 pixels 4, capacitor is calculated public
Formula C=ε S/4 π Kd is reduced to C=ε S/d, and wherein ε is dielectric constant, and S is capacitor plate positive area, d be capacitor plate away from
From；The corresponding testing capacitor value C of each pixel 4 is calculated according to above-mentioned simplified formulapixel, it is between surprise when due to test
It is alternately exported every pixel and even spaced image vegetarian refreshments, therefore the testing capacitor value C in each regionarea=32*Cpixel；Due to
TFT glass substrate, each pixel 4 come with storage capacitance 7, it with testing capacitor 6 be also it is in parallel, each region is respectively surveyed
Examination capacitor 6 connects to form RC circuit with a test resistance 8, and equivalent circuit diagram is as shown in Figure 4；It is required that electrode plate and TFT glass
Substrate high-precision aligns, and error is less than 20um, and as shown in Fig. 5, Fig. 6, Fig. 7, main control module is controlled by test probe assembly 13
TFT glass substrate exports odd spaced image vegetarian refreshments and even spaced image vegetarian refreshments, each 4 output+15V of pixel and 0V alternating voltage；Reason
By upper RC charge and discharge time t=RC*ln [(V1-V0)/(V1-Vt)], wherein V1 is input voltage, and v0 is capacitance initial voltage, VT
For full of voltage, usual capacitor is charged to 90% and basically reaches stabilization；Since the practical charge and discharge time is TFT glass substrate in fact
The sum of the storage capacitors of each pixel 4 and the charge and discharge time of testing capacitor 6, therefore we design in main control module in advance
The intact standard charge and discharge time is as criterion；When there is the damage of pixel 4, the test electricity of corresponding RC charge-discharge circuit
Capacitance can change, and the practical charge and discharge time of the RC charge-discharge circuit of detection acquisition in this way can be with the standard charge and discharge time
It deviates, so can be detected TFT glass substrate and damaged with the presence or absence of pixel 4.
Claims (4)
1. a kind of Electronic Paper TFT glass substrate detection device, it is characterised in that: it includes workbench (9), the workbench
(9) it is equipped with bracket and the localization tool (10) for positioning TFT glass substrate, is located at localization tool on the bracket
(10) surface is equipped with the clamping device (11) that can move along a straight line up and down, for clamp and TFT glass substrate is oppositely arranged
Electrode plate, the electrode plate from top to bottom successively include insulating substrate (1), metal material layer or ITO layer (2), insulating layer (3),
The metal material layer or ITO layer (2) are divided into multiple plate regions (5), the size and TFT glass base of each plate regions (5)
The testing capacitor (6) in the same size for being used to form multiple parallel connections of N*M pixel of the pixel ITO layer of plate, N >=1, M >=1,
It further include the testing host (12) being arranged on workbench (9), the testing host (12) includes main control module, multiple tests electricity
(8) and test probe assembly (13) are hindered, ground connection is after each testing capacitor (6) is connected in series with each test resistance (8) respectively with shape
At multiple RC charge-discharge circuits, the main control module is electrically connected with each charge-discharge circuit for detecting each charge-discharge circuit respectively
One end of practical charge and discharge time, test probe assembly (13) are electrically connected with main control module, and the other end is used for and TFT glass
The drive module of substrate is connected to each other.
2. a kind of Electronic Paper according to claim 1 TFT glass substrate detection device, it is characterised in that: the clamping
Device (11) includes for the vacuum cups (14) of Level Adsorption electrode plate and for driving vacuum cups (14) straight line up and down
The linear drive apparatus up and down (15) of movement.
3. a kind of Electronic Paper according to claim 1 TFT glass substrate detection device, it is characterised in that: the value model of N
It encloses for 4-10, the value range of M is 4-10.
4. a kind of Electronic Paper according to claim 1 TFT glass substrate detection device, it is characterised in that: the insulation
The dielectric coefficient of layer (3) is greater than 10, and thickness is less than 2 μ.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821495194.7U CN208834720U (en) | 2018-09-12 | 2018-09-12 | A kind of Electronic Paper TFT glass substrate detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821495194.7U CN208834720U (en) | 2018-09-12 | 2018-09-12 | A kind of Electronic Paper TFT glass substrate detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208834720U true CN208834720U (en) | 2019-05-07 |
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ID=66312952
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201821495194.7U Active CN208834720U (en) | 2018-09-12 | 2018-09-12 | A kind of Electronic Paper TFT glass substrate detection device |
Country Status (1)
| Country | Link |
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| CN (1) | CN208834720U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109243343A (en) * | 2018-09-12 | 2019-01-18 | 江西兴泰科技有限公司 | A kind of Electronic Paper TFT glass substrate detection method and device |
| CN112230487A (en) * | 2020-09-22 | 2021-01-15 | 江西兴泰科技有限公司 | Electronic paper module and method for detecting edge breakage and dark cracking thereof |
-
2018
- 2018-09-12 CN CN201821495194.7U patent/CN208834720U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109243343A (en) * | 2018-09-12 | 2019-01-18 | 江西兴泰科技有限公司 | A kind of Electronic Paper TFT glass substrate detection method and device |
| CN109243343B (en) * | 2018-09-12 | 2024-04-05 | 江西兴泰科技股份有限公司 | TFT glass substrate detection method and device for electronic paper |
| CN112230487A (en) * | 2020-09-22 | 2021-01-15 | 江西兴泰科技有限公司 | Electronic paper module and method for detecting edge breakage and dark cracking thereof |
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| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 343000 Jizhou Industrial Park, Ji'an City, Jiangxi Province Patentee after: Jiangxi Xingtai Technology Co.,Ltd. Address before: 343000 Jizhou Industrial Park, Ji'an City, Jiangxi Province Patentee before: JIANGXI XINGTAI TECHNOLOGY Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder |