CN109243343B - TFT glass substrate detection method and device for electronic paper - Google Patents
TFT glass substrate detection method and device for electronic paper Download PDFInfo
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- CN109243343B CN109243343B CN201811061329.3A CN201811061329A CN109243343B CN 109243343 B CN109243343 B CN 109243343B CN 201811061329 A CN201811061329 A CN 201811061329A CN 109243343 B CN109243343 B CN 109243343B
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- 239000000758 substrate Substances 0.000 title claims abstract description 95
- 239000011521 glass Substances 0.000 title claims abstract description 81
- 238000001514 detection method Methods 0.000 title claims abstract description 53
- 238000012360 testing method Methods 0.000 claims abstract description 126
- 239000003990 capacitor Substances 0.000 claims abstract description 50
- 239000007769 metal material Substances 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims abstract description 15
- 239000000523 sample Substances 0.000 claims description 15
- 238000010586 diagram Methods 0.000 claims description 5
- SLXKOJJOQWFEFD-UHFFFAOYSA-N 6-aminohexanoic acid Chemical compound NCCCCCC(O)=O SLXKOJJOQWFEFD-UHFFFAOYSA-N 0.000 claims 2
- 238000007599 discharging Methods 0.000 abstract 2
- 239000010410 layer Substances 0.000 description 41
- 238000001179 sorption measurement Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000010893 paper waste Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
A TFT glass substrate detection method for electronic paper is characterized in that: it comprises the following steps: (1) An insulating substrate is taken, a metal material layer or an ITO layer is covered on the insulating substrate, and then an insulating layer is covered on the metal material layer or the ITO layer, so that an electrode plate is formed; (2) Relatively attaching one surface of the electrode plate with the insulating layer to the pixel ITO layer of the TFT glass substrate to form a plurality of parallel test capacitors, wherein each test capacitor and each test resistor form an RC charge-discharge circuit; (3) A main control module sends control signals for controlling the output voltage of each pixel point of the TFT glass substrate; (4) The main control module acquires the actual charging and discharging time of each RC charging and discharging circuit in real time. The method does not need to attach electronic paper, has higher test efficiency and more accurate and reliable detection result. In addition, a TFT glass substrate detection device for electronic paper is provided.
Description
Technical Field
The invention relates to the technical field of electronic paper, in particular to a method and a device for detecting a TFT glass substrate for electronic paper.
Background
At present, a TFT glass substrate for electronic paper is only provided with a single-layer TFT structure electrode, and self-display cannot be performed, so that at present, the method for attaching the electronic paper to the TFT glass substrate is adopted, and the TFT glass substrate can be simply tested through a test point. Once the TFT glass substrate has a problem, the electronic paper is scrapped; in addition, the testing efficiency is very low when the steps of full black and full white, odd interval points, even interval points, odd interval transverse lines, even interval transverse lines, odd interval vertical lines, even interval vertical lines and the like are required to be tested during the detection; in addition, the observation by naked eyes is easy to make mistakes, so that the reliability is low.
Disclosure of Invention
The invention aims to solve the technical problems that: the TFT glass substrate detection method for the electronic paper is free from attaching electronic paper, high in test efficiency and accurate and reliable in detection result.
The technical scheme of the invention is as follows: a TFT glass substrate detection method for electronic paper is characterized in that: it comprises the following steps:
(1) An insulating substrate is taken, a metal material layer or an ITO layer is covered on the insulating substrate, the metal material layer or the ITO layer is divided into a plurality of polar plate areas, the size of each polar plate area is consistent with the size of N x M pixel points of a pixel ITO layer of a TFT glass substrate, N is more than or equal to 1, M is more than or equal to 1, and then an insulating layer is covered on the metal material layer or the ITO layer, so that an electrode plate is formed;
(2) The method comprises the steps of relatively attaching one surface of an electrode plate with an insulating layer to a pixel ITO layer of a TFT glass substrate, so that a plurality of parallel test capacitors are formed between the electrode plate with a plurality of electrode plate areas and the TFT glass substrate, and each test capacitor is respectively connected with a test resistor arranged on a test main board in series and then grounded to form an RC charge-discharge circuit;
(3) A main control module arranged on the test main board sends control signals for controlling output voltages of all pixel points of the TFT glass substrate to a driving module of the TFT glass substrate through a test probe assembly;
(4) The main control module of the test main board acquires the actual charge and discharge time of each RC charge and discharge circuit in real time and compares the actual charge and discharge time with the standard charge and discharge time of each RC charge and discharge circuit preset by the main control module of the test main board, so as to judge whether the TFT glass substrate has pixel point damage.
After the method is adopted, the invention has the following advantages:
according to the TFT glass substrate detection method for the electronic paper, the pixel ITO layer of the TFT glass substrate is assumed to be one side electrode plate of the capacitor, a plurality of parallel test capacitors are formed by arranging the other side electrode plate opposite to the one side electrode plate, then the test resistor connected with each test capacitor in series is arranged on the test main board to form the RC charge-discharge circuit, so that the RC charge-discharge circuit can be charged and discharged by controlling the output voltage of each pixel point through the main control module of the test main board, whether the pixel point of the TFT glass substrate is damaged or not can be detected by comparing the detected actual charge-discharge time with the standard charge-discharge time, the whole detection process does not need to attach electronic paper, the electronic paper waste is avoided when the TFT glass substrate is damaged, the detection efficiency is high only by detecting the charge-discharge time, and in addition, the detection result is more accurate and reliable by automatically detecting the test main board instead of manual detection.
Preferably, in the step (1), the value range of N is 4-10, and the value range of m is 4-10. The arrangement can ensure the accuracy of the detection result, can ensure that the detection circuit is not too complex, and improves the detection efficiency.
Preferably, in the step (1), the dielectric constant of the insulating layer is greater than 10 and the thickness is less than 2 μ. The arrangement can enable the accuracy of the test capacitor to be higher and the performance to be better, so that the detection result is more accurate.
Preferably, in the step (3), the main control module controls the TFT glass substrate to output odd-interval pixel points and even-interval pixel points through the test probe assembly, and each pixel point outputs alternating voltage of +15V and 0V. This arrangement can make the detection result more accurate.
The invention aims to solve the other technical problems that: the TFT glass substrate detection device for the electronic paper is free from attaching electronic paper, high in test efficiency and accurate and reliable in detection result.
The other technical solution of the invention is as follows: the TFT glass substrate detection device for the electronic paper is characterized in that: the test device comprises a workbench, a support and a positioning jig used for positioning a TFT glass substrate are arranged on the workbench, a clamping device capable of moving linearly up and down is arranged right above the positioning jig on the support and used for clamping electrode plates oppositely arranged with the TFT glass substrate, the electrode plates sequentially comprise an insulating substrate, a metal material layer or an ITO layer and an insulating layer from top to bottom, the metal material layer or the ITO layer is divided into a plurality of electrode plate areas, the size of each electrode plate area is consistent with the size of N x M pixel points of the pixel ITO layer of the TFT glass substrate and used for forming a plurality of parallel test capacitors, N is larger than or equal to 1, M is larger than or equal to 1, the test device further comprises a test main board arranged on the workbench, the test main board comprises a main control module, a plurality of test resistors and test probe assemblies, each test capacitor is connected with each test resistor in series and then grounded to form a plurality of RC charge-discharge circuits, the main control module is electrically connected with each charge-discharge circuit respectively and is used for detecting the actual charge-discharge time of each charge-discharge circuit relatively, one end of each test probe assembly is electrically connected with the main control module, and the main control module is electrically connected with the main control module and the TFT module to the drive the TFT glass substrate.
After the structure is adopted, the invention has the following advantages:
the TFT glass substrate detection device for the electronic paper provided by the invention has the advantages that the pixel ITO layer of the TFT glass substrate is assumed to be one side electrode plate of the capacitor, a plurality of parallel test capacitors are formed by arranging one other side electrode plate opposite to the one side electrode plate, then, the test resistor connected with each test capacitor in series is arranged on the test main board to form the RC charge-discharge circuit, so that the RC charge-discharge circuit can be charged and discharged by controlling the output voltage of each pixel point through the main control module of the test main board, the detected actual charge-discharge time and the standard charge-discharge time are compared, whether the pixel point damage exists on the TFT substrate can be detected, the whole detection process does not need to attach electronic paper, the waste of the electronic paper is not caused when the TFT glass substrate is damaged, the detection efficiency is high only by detecting the charge-discharge time, and in addition, the automatic detection of the test main board replaces manual detection, and the detection result is more accurate and reliable.
Preferably, the clamping device comprises a vacuum suction head for horizontally sucking the electrode plate and an up-and-down linear driving device for driving the vacuum suction head to move up and down linearly. The vacuum suction head is simple in structure and reliable in adsorption, and the electrode plate can be conveniently taken down to readjust the position of the vacuum suction head, so that the vacuum suction head can be accurately aligned with the TFT glass substrate, and the accuracy of the test capacitor is higher, and the detection result is more accurate.
Description of the drawings:
FIG. 1 is a schematic view of an electrode plate according to the present invention;
FIG. 2 is a schematic diagram of a TFT glass substrate detection device for electronic paper according to the present invention;
FIG. 3 is a schematic diagram of the cooperation of the electrode plate, TFT glass substrate and test resistor of the present invention;
FIG. 4 is a schematic diagram of an equivalent circuit of an electrode plate, a TFT glass substrate and a test resistor according to the invention;
FIG. 5 is a voltage waveform of a test capacitor detected on an RC charge-discharge circuit of the present invention;
FIG. 6 shows the output of odd-spaced pixels from a TFT glass substrate according to the invention;
FIG. 7 shows the output even-space pixel points of the TFT glass substrate of the present invention;
in the figure: the device comprises a 1-insulating substrate, a 2-metal material layer or an ITO layer, a 3-insulating layer, a pixel point of a 4-TFT glass substrate, a 5-polar plate area, a 6-test capacitor, a 7-storage capacitor, an 8-test resistor, a 9-workbench, a 10-positioning jig, an 11-clamping device, a 12-test main board, a 13-test probe assembly, a 14-vacuum suction head and a 15-up-down linear driving device.
Detailed Description
The invention will be further described with reference to the accompanying drawings, in conjunction with examples.
Example 1:
a TFT glass substrate detection method for electronic paper comprises the following steps:
(1) As shown in fig. 1 and 3, an insulating substrate 1 is taken, the insulating substrate 1 may be made of PET material, a metal material layer or an ITO layer 2 is covered on the insulating substrate 1, the metal material layer or the ITO layer 2 is divided into a plurality of electrode plate areas 5, the size of each electrode plate area 5 is consistent with the size of n×m pixel points of the pixel ITO layer of the TFT glass substrate, N is greater than or equal to 1, M is greater than or equal to 1, and then an insulating layer 3 is covered on the metal material layer or the ITO layer 2, thereby forming an electrode plate;
(2) The method comprises the steps of relatively attaching one surface of an electrode plate with an insulating layer 3 to a pixel ITO layer of a TFT glass substrate, so that a plurality of parallel test capacitors 6 are formed between the electrode plate with a plurality of electrode plate areas and the TFT glass substrate, and each test capacitor 6 is respectively connected with a test resistor 8 arranged on a test main board 12 in series and then grounded to form an RC charge-discharge circuit;
(3) A main control module arranged on the test main board 12 sends control signals for controlling the output voltage of each pixel point 4 of the TFT glass substrate to a driving module of the TFT glass substrate through a test probe assembly 13;
(4) The main control module of the test main board 12 acquires the actual charge and discharge time of each RC charge and discharge circuit in real time, and compares the actual charge and discharge time with the standard charge and discharge time of each RC charge and discharge circuit preset by the main control module, so as to judge whether the pixel point 4 of the TFT glass substrate is damaged, and the main control module of the test main board 12 can detect the voltage waveform of the test capacitor 6 only by connecting the main control module to the two ends of the test capacitor 6 of each RC charge and discharge circuit, thereby acquiring the corresponding actual charge and discharge time.
According to the TFT glass substrate detection method for the electronic paper, the pixel ITO layer of the TFT glass substrate is assumed to be one side electrode plate of the capacitor, a plurality of parallel test capacitors 6 are formed by arranging one other side electrode plate opposite to the one side electrode plate, then a test resistor 8 connected with each test capacitor 6 in series is arranged on a test main board 12 to form an RC charge-discharge circuit, so that the RC charge-discharge circuit can be charged and discharged by controlling the output voltage of each pixel point 4 through the main control module of the test main board 12, whether the pixel points 4 are damaged or not can be detected by comparing the detected actual charge-discharge time with the standard charge-discharge time, electronic paper is not required to be attached in the whole detection process, waste of the electronic paper is not caused when the TFT glass substrate is damaged, the detection efficiency is high only by detecting the charge-discharge time, and in addition, the detection result is more accurate and reliable by automatically detecting the test main board 12 instead of manual detection.
Preferably, in the step (1), the value range of N is 4-10, and the value range of m is 4-10. The arrangement can ensure the accuracy of the detection result, can ensure that the detection circuit is not too complex, and improves the detection efficiency.
Preferably, in the step (1), the dielectric constant of the insulating layer 3 is greater than 10 and the thickness is less than 2 μ, such as ZNO. The arrangement can enable the test capacitor 6 to have higher precision and better performance, thereby enabling the detection result to be more accurate.
Preferably, in the step (3), the main control module controls the TFT glass substrate to output odd-interval pixel points and even-interval pixel points through the test probe assembly 13, and each pixel point outputs +15v and 0V alternating voltage. This arrangement can make the detection result more accurate.
In this embodiment, n=8, m=8, and 64 pixel points 4 are assumed to be provided in one electrode plate area 5, and the capacitance calculation formula c=εs/4pi Kd is simplified to c=εs/d, where ε is the dielectric constant, S is the facing area of the capacitor electrode plate, and d is the distance of the capacitor electrode plate; calculating the test capacitance value C corresponding to each pixel point 4 according to the simplified formula pixel Since the test is alternately performed by the pixel points with odd intervals and the pixel points with even intervals, the test capacitance value C of each region area ＝32*C pixel The method comprises the steps of carrying out a first treatment on the surface of the Because of the TFT glass substrate, each pixel point 4 is provided with a storage capacitor 7 which is also connected in parallel with a test capacitor 6, each test capacitor 6 in each region is connected in series with a test resistor 8 to form an RC circuit, and an equivalent circuit diagram is shown in figure 4; high precision of electrode plate and TFT glass substrate is requiredThe alignment error is smaller than 20um, as shown in fig. 5, 6 and 7, the main control module controls the TFT glass substrate to output odd-interval pixel points and even-interval pixel points through the test probe assembly 13, and each pixel point 4 outputs alternating voltage of +15V and 0V; theoretically, RC charge-discharge time t=rc×ln [ (V1-V0)/(V1-Vt)]Wherein V1 is input voltage, V0 is initial voltage of the capacitor, VT is full voltage, and the capacitor is basically stable when being charged to 90 percent; because the actual charge-discharge time is the sum of the charge-discharge time of the storage capacitor of each pixel point 4 of the TFT glass substrate and the charge-discharge time of the test capacitor 6, the complete standard charge-discharge time is designed in the main control module in advance as a judgment standard; when the pixel 4 is damaged, the test capacitance value of the corresponding RC charge-discharge circuit can change, so that the actual charge-discharge time of the RC charge-discharge circuit obtained through detection can deviate from the standard charge-discharge time, and whether the pixel 4 is damaged can be detected.
Example 2:
as shown in fig. 1 to 4, a TFT glass substrate detection device for electronic paper includes a workbench 9, a support and a positioning jig 10 for positioning the TFT glass substrate are disposed on the workbench 9, a clamping device 11 capable of moving linearly up and down is disposed on the support and located right above the positioning jig 10, and is used for clamping an electrode plate disposed opposite to the TFT glass substrate, the electrode plate sequentially includes an insulating substrate 1, a metal material layer or ITO layer 2 and an insulating layer 3 from top to bottom, the metal material layer or ITO layer 2 is divided into a plurality of electrode plate areas 5, the size of each electrode plate area 5 is consistent with the size of n×m pixel points of the pixel ITO layer of the TFT glass substrate to form a plurality of parallel test capacitors 6, N is greater than or equal to 1, M is greater than or equal to 1, and further includes a test main board 12 disposed on the workbench 9, the test main board 12 includes a main control module, a plurality of test resistors 8 and a test probe assembly 13, the test capacitors 6 are respectively connected with the test resistors 8 in series to form a plurality of RC charge/discharge areas, the main control module is respectively connected with the other end of the test probe assembly for the actual charge/discharge of the TFT glass substrate, and the test probe assembly is connected in series with one end of the test circuit.
The TFT glass substrate detection device for the electronic paper provided by the invention has the advantages that the pixel ITO layer of the TFT glass substrate is assumed to be one side electrode plate of the capacitor, a plurality of parallel test capacitors 6 are formed by arranging one other side electrode plate opposite to the one side electrode plate, then the test resistor 8 connected with each test capacitor 6 in series is arranged on the test main board 12 to form an RC charge-discharge circuit, the RC charge-discharge circuit can be charged and discharged by controlling the output voltage of each pixel point 4 through the main control module of the test main board 12, whether the pixel points 4 are damaged or not can be detected by comparing the detected actual charge-discharge time with the standard charge-discharge time, the whole detection process does not need to attach electronic paper, the electronic paper is not wasted when the TFT glass substrate is damaged, the detection efficiency is high only by detecting the charge-discharge time, and in addition, the detection result is more accurate and reliable by automatically detecting the test main board 12 instead of manual detection.
Preferably, the clamping device 11 includes a vacuum suction head 14 for horizontally sucking the electrode plate and an up-down linear driving device 15 for driving the vacuum suction head 14 to move up and down linearly, the vacuum suction head 14 and the up-down linear driving device 15 may be a conventional one, and the up-down linear driving device 15 may be a cylinder, a quick press, or the like. The vacuum suction head 14 has simple structure and reliable adsorption, and can conveniently take down the electrode plate to readjust the position, so that the electrode plate can be accurately aligned with the TFT glass substrate, and the accuracy of the test capacitor 6 is higher, and the detection result is more accurate.
Claims (3)
1. A TFT glass substrate detection method for electronic paper is characterized in that: it comprises the following steps:
the method comprises the steps of (1) taking an insulating substrate (1), covering a metal material layer or an ITO layer (2) on the insulating substrate (1), dividing the metal material layer or the ITO layer (2) into a plurality of polar plate areas (5), wherein the size of each polar plate area (5) is consistent with the size of N x M pixel points of a pixel ITO layer of a TFT glass substrate, N is more than or equal to 1, M is more than or equal to 1, and then covering an insulating layer (3) on the metal material layer or the ITO layer (2), so that an electrode plate is formed;
(2) The method comprises the steps of oppositely attaching one surface of an electrode plate with an insulating layer (3) to a pixel ITO layer of a TFT glass substrate, so that a plurality of parallel test capacitors (6) are formed between the electrode plate with a plurality of electrode plate areas (5) and the TFT glass substrate, and each test capacitor (6) is connected in series with a test resistor (8) arranged on a test main board (12) and then grounded to form an RC charge-discharge circuit;
(3) A main control module arranged on a test main board (12) sends control signals for controlling output voltage of each pixel point (4) of the TFT glass substrate to a driving module of the TFT glass substrate through a test probe assembly (13);
(4) The main control module of the test main board (12) acquires the actual charge and discharge time of each RC charge and discharge circuit in real time, and compares the actual charge and discharge time with the standard charge and discharge time of each RC charge and discharge circuit preset by the main control module, so as to judge whether the TFT glass substrate has pixel point (4) damage or not, and the method specifically comprises the following steps: simplifying a capacitance calculation formula C=epsilon S/4 pi Kd into C=epsilon S/d, wherein epsilon is the dielectric constant, S is the facing area of a capacitance polar plate, and d is the distance of the capacitance polar plate; calculating a test capacitance value C corresponding to each pixel point according to the simplified formula pixel Since the test is alternately performed by the pixel points with odd intervals and the pixel points with even intervals, the test capacitance value C of each region area =32*C pixel The method comprises the steps of carrying out a first treatment on the surface of the Because of the TFT glass substrate, each pixel point 4 is provided with a storage capacitor 7 which is also connected in parallel with a test capacitor 6, each test capacitor 6 in each region is connected in series with a test resistor 8 to form an RC circuit, and an equivalent circuit diagram is shown in figure 4; the electrode plate and the TFT glass substrate are required to be aligned with high precision, the error is smaller than 20um, as shown in fig. 5, 6 and 7, the main control module controls the TFT glass substrate to output odd-interval pixel points and even-interval pixel points through the test probe assembly 13, and each pixel point 4 outputs alternating voltage of +15V and 0V; theoretically, RC charge-discharge time t=rc×ln [ (V1-V0)/(V1-Vt)]Wherein V1 is input voltage, V0 is initial voltage of the capacitor, VT is full voltage, and the capacitor is basically stable when being charged to 90 percent; because the actual charge-discharge time is the sum of the charge-discharge time of the storage capacitor and the test capacitor of each pixel point of the TFT glass substrate, the charge-discharge time is preset in the main control moduleThe well-designed standard charge and discharge time is used as a judgment standard; when the pixel point is damaged, the test capacitance value of the corresponding RC charge-discharge circuit can change, so that the actual charge-discharge time of the RC charge-discharge circuit obtained through detection can deviate from the standard charge-discharge time, and whether the pixel point is damaged or not can be detected.
2. The TFT glass substrate detection device for the electronic paper is characterized in that: the test device comprises a workbench (9), wherein a bracket and a positioning jig (10) for positioning a TFT glass substrate are arranged on the workbench (9), a clamping device (11) capable of moving linearly up and down is arranged right above the positioning jig (10) on the bracket and used for clamping an electrode plate which is arranged opposite to the TFT glass substrate, the electrode plate sequentially comprises an insulating substrate (1), a metal material layer or an ITO layer (2) and an insulating layer (3) from top to bottom, the metal material layer or the ITO layer (2) is divided into a plurality of electrode plate areas (5), the size of each electrode plate area (5) is consistent with the size of N, M pixel points of the pixel ITO layer of the TFT glass substrate and used for forming a plurality of parallel test capacitors (6), the value range of N is 4-10, the value range of M is 4-10, the dielectric coefficient of the insulating layer (3) is larger than 10, the thickness is smaller than 2 mu, the test device further comprises a test main board (12) which is arranged on the workbench (9), the test main board (12) comprises a main control module, a plurality of test probes (8) and a plurality of test circuit (13) which are connected with a plurality of charge and discharge modules (13) respectively in series with one end of the test modules respectively, and the test modules are connected with the charge and discharge modules respectively, and the test modules are connected with the charge and the discharge modules respectively, and the discharge modules are connected with the test modules respectively, and the charge modules are in charge and the discharge modules respectively, and the test modules are in charge and the test modules and the test circuit are respectively and the test circuit charge and the test circuit and have the test circuit. The main control module controls the TFT glass substrate to output odd-interval pixel points and even-interval pixel points through the test probe assembly (13), and each pixel point outputs alternating voltage of +15V and 0V.
3. The TFT glass substrate detection apparatus for electronic paper as set forth in claim 2, wherein: the clamping device (11) comprises a vacuum suction head (14) for horizontally adsorbing the electrode plates and an up-and-down linear driving device (15) for driving the vacuum suction head (14) to move up and down linearly.
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR980003682A (en) * | 1996-06-05 | 1998-03-30 | 오우라 히로시 | LCD Substrate Inspection Apparatus and Method |
| CN1742210A (en) * | 2003-01-27 | 2006-03-01 | 安捷伦科技有限公司 | Probe device and display substrate testing apparatus using same |
| CN101452119A (en) * | 2007-12-03 | 2009-06-10 | 比亚迪股份有限公司 | TFT photoelectric parameter testing jig |
| CN101677094A (en) * | 2008-09-17 | 2010-03-24 | 北京京东方光电科技有限公司 | Thin film transistor (TFT) performance testing device, manufacturing method thereof and TFT performance testing method |
| CN102308202A (en) * | 2009-02-04 | 2012-01-04 | 株式会社岛津制作所 | TFT array inspection method and TFT array inspection apparatus |
| CN208834720U (en) * | 2018-09-12 | 2019-05-07 | 江西兴泰科技有限公司 | A kind of Electronic Paper TFT glass substrate detection device |
-
2018
- 2018-09-12 CN CN201811061329.3A patent/CN109243343B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR980003682A (en) * | 1996-06-05 | 1998-03-30 | 오우라 히로시 | LCD Substrate Inspection Apparatus and Method |
| CN1742210A (en) * | 2003-01-27 | 2006-03-01 | 安捷伦科技有限公司 | Probe device and display substrate testing apparatus using same |
| CN101452119A (en) * | 2007-12-03 | 2009-06-10 | 比亚迪股份有限公司 | TFT photoelectric parameter testing jig |
| CN101677094A (en) * | 2008-09-17 | 2010-03-24 | 北京京东方光电科技有限公司 | Thin film transistor (TFT) performance testing device, manufacturing method thereof and TFT performance testing method |
| CN102308202A (en) * | 2009-02-04 | 2012-01-04 | 株式会社岛津制作所 | TFT array inspection method and TFT array inspection apparatus |
| CN208834720U (en) * | 2018-09-12 | 2019-05-07 | 江西兴泰科技有限公司 | A kind of Electronic Paper TFT glass substrate detection device |
Non-Patent Citations (1)
| Title |
|---|
| 完全非接触式液晶玻璃基板缺陷检测技术研究;刘正勇;刘晏;王广炎;陈友东;;机器人技术与应用(03);全文 * |
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