CN206479564U - A kind of probe in detecting mechanism of pin of electronic device - Google Patents
A kind of probe in detecting mechanism of pin of electronic device Download PDFInfo
- Publication number
- CN206479564U CN206479564U CN201720184180.2U CN201720184180U CN206479564U CN 206479564 U CN206479564 U CN 206479564U CN 201720184180 U CN201720184180 U CN 201720184180U CN 206479564 U CN206479564 U CN 206479564U
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- probe
- installation portion
- plate
- installing plate
- location
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Abstract
The utility model is related to electronic device detection field, particularly a kind of probe in detecting mechanism of the pin of electronic device of compatible a variety of pin specifications.The utility model discloses a kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set of probe assembly, every group of probe assembly includes at least two probe installation portions being arranged on pedestal, at least one probe is set on each probe installation portion, at least one of which probe installation portion is set with respect to the base runner, wherein at least one in the probe installation portion that the relative base runner of regulation is set, probe location thereon is set to change, so that corresponding to the different Pin locations of electronic device.The utility model can just realize being switched fast for the pin of electronic device detection of a variety of pin specifications after simple adjustment, greatly shorten the producing line adjustment time required for detection when product changes, it is time saving and energy saving, it is simple convenient, and greatly reduce the technical requirements to employee.
Description
Technical field
The utility model belongs to electronic device detection field, more particularly to a kind of electronics device of compatible a variety of pin specifications
The probe in detecting mechanism of part pin.
Background technology
Device for switching is the electric current for referring to close, carry and cut-off under normal loop condition and can closed, defined
The switching device of the electric current under abnormal loop condition is carried and cut-off in time.It is frequently necessary to when device for switching dispatches from the factory split powered-down
Each index of device carries out on off test, such as pressure-resistant, break-make, mechanical life, coil resistance detection.
For example for the relay in solder machine, it is necessary to which its coil resistance is detected, typically by a spy
Probe insertion relay coil pin in pin detection plate is detected that existing detection is using one block of probe in detecting plate mostly
A kind of relay coil pin specification of correspondence, and the model of relay has many kinds, causing the specification of its coil pin also has very
It is a variety of, so it is accomplished by processing drawing for many money probe in detecting plates, cost height, management storage inconvenience, and the relay detected
During pin format change, probe in detecting plate need to be subjected to dismounting and change, then electrical wiring could be detected again, be wasted time and energy,
Efficiency is low, and cost is high, and the technical requirements to employee are high.
Equally, when detecting other electronic devices, because its pin specification is different, it is also desirable to change corresponding probe in detecting
Plate, then electrical wiring could be detected again, be wasted time and energy, and efficiency is low, and cost is high, and the technical requirements to employee are high.
The content of the invention
The utility model purpose is to solve the above problems and provides a kind of compatible a variety of pin of electronic device specification detections,
Time saving and energy saving, efficiency high, cost is low, greatly reduces the probe detector of the pin of electronic device to the technical requirements of employee
Structure.
Therefore, the utility model discloses a kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least
One group of probe assembly, every group of probe assembly includes at least two probe installation portions being arranged on pedestal, each probe installation portion
Upper at least one probe of setting, at least one of which probe installation portion is set with respect to the base runner, and the relative pedestal of regulation is lived
Wherein at least one in dynamic probe installation portion set, makes probe location thereon change, so that corresponding to electronics
The different Pin locations of device.
Further, the probe assembly includes at least two probe installation portions being arranged on pedestal, and each probe is installed
At least one probe is set, and at least one of which probe installation portion is set with respect to the base runner, the relative pedestal of regulation in portion
Wherein at least one in the probe installation portion that activity is set, makes probe location thereon change.
Further, the quantity of the probe installation portion of every group of probe assembly is two, respectively the first probe installation portion
With the second probe installation portion, the first probe installation portion and the second probe installation portion are set with respect to the base runner, regulation the
One probe installation portion and/or the second probe installation portion, to adjust the probe that is arranged on the first probe installation portion and installed in the
The spacing between probe on two probe installation portions, or the first probe installation portion and the second probe installation portion are adjusted in synchronism, with
Regulation is arranged on the position of the probe on the first probe installation portion and the probe opposite base on the second probe installation portion.
Further, the first probe installation portion is provided with a probe, and the second probe installation portion is provided with two
Probe.
Further, the first adjusting part, the second adjusting part, the first probe installing plate and second are additionally provided with the pedestal
Probe installing plate, the first probe installation portion of every group of probe assembly is fixedly installed on the first probe installing plate, every group of probe
Second probe installation portion of component is fixedly installed on the second probe installing plate, first adjusting part be used for adjust this first
Probe installing plate is moved relative to the pedestal, and second adjusting part is used to adjust the second probe installing plate relative to the pedestal
It is mobile.
Further, the quantity of probe assembly is 4 groups, and the first probe installation portion and the second probe installation portion quantity are equal
For 4, the first probe installing plate and the second probe installing plate are the platy structure of strip, and the first probe installing plate is along long
The one side in degree direction, which is spaced, fixes this 4 the first probe installation portions, and the distance of the first adjacent probe installation portion is A,
The one side of second probe installing plate along its length, which is spaced, fixes this 4 the second probe installation portions, the second adjacent spy
The distance of pin installation portion is B, 4 the first probe installation portions and 4 the second probe installation portion intermeshings so that 4 first spies
Pin installation portion and 4 the second probe installation portions are staggered, and the width of the second probe installation portion is more than apart from A, are more than the apart from B
The width of one probe installation portion so that the first probe installation portion and the second probe installation portion can along the first probe installing plate and
The length direction of second probe installing plate is relatively distant from or close to motion.
Further, first adjusting part and the second adjusting part include the first regulating bolt, the second regulating bolt, the
Three regulating bolts, spring guide, compression spring, the first location-plate and the second location-plate, first location-plate and the second location-plate
Spacing is fixedly installed on pedestal, and the first probe installing plate and the second probe installing plate are located at the first location-plate and the second location-plate
Between, the length of the first probe installing plate and the second probe installing plate along the first location-plate and the second location-plate direction is less than first
Spacing between location-plate and the second location-plate, first regulating bolt is bolted through the first location-plate and props up the first probe peace
The first end of plate is filled, second regulating bolt is bolted through the second location-plate and props up the second end of the first probe installing plate, should
3rd regulating bolt is bolted through the second location-plate and props up the second end of the second probe installing plate, and spring guide one end is fixed on
The inner side of first location-plate, other end activity is located in the first end of the second probe installing plate, and the compression spring is set in spring
On guide rod and it is respectively held against the first end of the second probe installing plate and the inner side of the first location-plate.
Further, in addition to the first adjustment seat and the second adjustment seat that are fixed on pedestal, first adjustment seat and
Second adjustment seat is located at the outside of the first location-plate and the second location-plate respectively, and first regulating bolt and the second regulating bolt are also
The first adjustment seat is bolted through, the 3rd regulating bolt is also bolted through the second adjustment seat.
Further, in addition to the first guide plate and the second guide plate, first guide plate and the second guide plate are fixed on
It is located on pedestal and respectively the outside of the first probe installing plate and the second probe installing plate, first guide plate and the second guide plate
The first guide chute and the second guide chute are respectively equipped with, the outside difference of the first probe installing plate and the second probe installing plate
It is slidably arranged in the first guide chute and the second guide chute.
Further, the pedestal is provided with installation portion, and the installation portion is provided with least two mounting holes.
Further, the pedestal includes substrate, and the first probe installing plate and the second probe installing plate are movably arranged on base
On plate, the substrate is provided with the slot to make way that probe can be allowed to move, and substrate bottom surface is stretched out in the lower end of probe through slot to make way.
Advantageous effects of the present utility model：
The utility model is in the detection for the electronic device that a variety of pin specifications can be just realized after simple adjustment, switching
Quickly, the producing line adjustment time that product is remodeled or changed required for class detection is greatly shortened, without changing probe in detecting mechanism, is saved
Shi Shengli, simple convenient, efficiency high, cost is low, and greatly reduces the technical requirements to employee, in addition, probe detector
Structure specification only needs one kind, and convenient manufacture, management and storage further reduce cost.
Brief description of the drawings
Fig. 1 is the front view of the probe in detecting mechanism of the utility model embodiment；
Fig. 2 is the left view of the probe in detecting mechanism of the utility model embodiment；
Fig. 3 is the top view of the probe in detecting mechanism of the utility model embodiment；
Fig. 4 is the stereogram of the probe in detecting mechanism of the utility model embodiment；
Fig. 5 is the exploded view of the probe in detecting mechanism of the utility model embodiment；
Fig. 6 is 5 pin bit architecture schematic diagrames for being used to place relay pin in the utility model embodiment；
Fig. 7 is located at the detects schematic diagram of the pin of 1-3-5 pins position for detection in the utility model embodiment.
Embodiment
The utility model is further illustrated in conjunction with the drawings and specific embodiments.
A kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set of probe assembly, every group of probe
Component sets at least two probes, and the position of wherein at least one probe can change, so as to draw corresponding to electronic device is different
Placement of foot.
Further, the probe assembly includes at least two probe installation portions being arranged on pedestal, and each probe is installed
At least one probe is set, and at least one of which probe installation portion is set with respect to the base runner, the relative pedestal of regulation in portion
Wherein at least one in the probe installation portion that activity is set, makes probe location thereon change.
In this specific embodiment, as Figure 1-5, pedestal 1 includes the installation portion of the L-type of substrate 12 and one of a strip
11, the top of installation portion 11 is fixed in the bottom surface of substrate 12, the present embodiment, is adopted and is screwed, certainly, in other embodiments
In can also using bonding or be integrally formed wait fixation.The bottom of installation portion 11 be provided with mounting hole 111, quantity be 2, but not with
This is limited, for probe in detecting mechanism to be screwed installed in detection device.
In this specific embodiment, the quantity of probe assembly 2 is 4 groups, certainly, in other implementations, the quantity of probe assembly 2
4 groups can be less than or more than 4 groups, with specific reference to being actually needed determination.Probe assembly 2 includes two probe installation portions, respectively
For the first probe installation portion 211 and the second probe installation portion 221, certainly in other implementations, probe assembly 2 can include 3
The individual or probe installation portion of more than 3, is determined with specific reference to actual demand.The first probe installation portion 211 and the second probe
Installation portion 221 is movably arranged on substrate 12, and the first probe installation portion 211 and the second probe installation portion 221 can be relatively moved,
The first probe installation portion 211 and/or the second probe installation portion 221 are adjusted, is arranged on adjusting on the first probe installation portion 211
Spacing between probe 7 and probe 7 on the second probe installation portion 221, or it is adjusted in synchronism the first probe installation portion
211 and the second probe installation portion 221, to adjust the probe 7 that is arranged on the first probe installation portion 211 and installed in the second probe
The position of the opposing substrate 12 of probe 7 on installation portion 221, so as to realize the detection of the electronic device of different pin specifications.
In some embodiments, it is also possible to be that the first probe installation portion 211 or the second probe installation portion 221 are fixedly installed on
On substrate 12, the second probe installation portion 221 or the first probe installation portion 211 are movably arranged on substrate 12.For probe assembly 2
The probe installation portion for including 3 or more than 3 similarly can be that part probe installation portion is fixedly installed on the substrate 12, portion
Probe installation portion is divided to be movably arranged on substrate 12, or whole show is set on the substrate 12.
In this specific embodiment, the quantity of probe 7 on the first probe installation portion 211 is one, the second probe installation portion 221
On the quantity of probe 7 be two, three shapes of probe 7 are in a row, certainly, in other implementations, the spy of the first probe installation portion 211
The quantity of pin 7 and the quantity of probe 7 of the second probe installation portion 221 can be selected according to actual conditions, can also be provided with many
Probe 7 is arranged, this is that those skilled in the art can realize easily, is no longer described in detail.
Probe 7 is separately fixed at the first probe installation portion 211 and the second probe installation portion 221, and through the first probe peace
The upper and lower surface of the probe installation portion 221 of dress portion 211 and second, substrate 12 is provided with a strip slot to make way 121, and the bottom of probe 7 is worn
Cross slot to make way 121 and stretch out the bottom surface of substrate 12, facilitate wiring.
In this specific embodiment, 4 equal stationary arrangements of the first probe installation portion 211 are in the first probe installing plate 21,4
The equal stationary arrangement of two probe installation portion 221 is in the second probe installing plate 22, so, by adjusting the first probe installing plate 21 and the
Two probe installing plates 22 can just adjust 4 the first probe installation portions 211 and 4 the second probe installation portions 221, regulation effect simultaneously
Rate is high, certainly, in other embodiments, and 4 the first probe installation portions 211 and 4 the second probe installation portions 221 can also be point
Vertical, can individually it adjust.First probe installing plate 21 and the second probe installing plate 22 are movably arranged on substrate 12 and can phases
To movement.Certainly, in other implementations or the first probe installing plate 21 or the second probe installing plate 22 are fixedly installed on
On substrate 12, the second probe installing plate 22 or the first probe installing plate 21 are movably arranged on substrate 12.
In this specific embodiment, the first probe installing plate 21 and the second probe installing plate 22 are the tabular knot of strip
The length direction of structure, the first probe installing plate 21 and the second probe installing plate 22 is identical with the length direction of substrate 12, and first visits
The one side of pin installing plate 21 along its length, which is spaced, fixes 4 the first probe installation portions 211, adjacent the first probe peace
The distance in dress portion 211 is A, and the one side of the second probe installing plate 22 along its length, which is spaced, fixes 4 the second probe peaces
Dress portion 221, the distance of the second adjacent probe installation portion 221 is B, 4 the first probe installation portions 211 and 4 the second probe peaces
Dress portion 221 is intermeshed so that the length of 4 the first probe installation portions 211 and 4 the second probe installation portions 221 along substrate 12
Direction is staggered, and the width of length direction of the second probe installation portion 221 along substrate 12 is more than apart from A, is more than first apart from B
The width of length direction of the probe installation portion 211 along substrate 12, so that the first probe installation portion 211 and the second probe installation portion
221 can be relatively distant from along the length direction of substrate 12 or close to moving.In this specific implementation, the first probe installing plate 21 with
4 the first probe installation portions 211 are formed in one part, and the second probe installing plate 22 is integrated with 4 the second probe installation portions 221
Molding part.
Further, the first adjusting part and the second adjusting part are additionally provided with substrate 12, first adjusting part is used
Moved in adjusting the first probe installation portion 211 relative to substrate 12, second adjusting part is used to adjust the installation of the second probe
Moved relative to substrate 12 in portion 221.
In this specific embodiment, the first adjusting part and the second adjusting part are adjusted including the first regulating bolt 31, second
Bolt 32, the 3rd regulating bolt 33, spring guide 35, compression spring 34, the first location-plate 36 and the second location-plate 37, first determines
The spacing of position 36 and second location-plate of plate 37 is fixed on the two ends of substrate 12 along its length, the first probe installing plate 211 and second
Probe installing plate 221 is located between the first location-plate 36 and the second location-plate 37, between the first location-plate 36 and the second location-plate 37
Length away from more than the first probe installing plate 211 and the second probe installing plate 221, first regulating bolt 31 is bolted through
One location-plate 36 and the first end for propping up the first probe installing plate 211, second regulating bolt 32 are bolted through the second positioning
Plate 37 and the second end for propping up the first probe installing plate 211, the 3rd regulating bolt 33 are bolted through the second location-plate 37 simultaneously
The second end of the second probe installing plate 221 is propped up, the one end of spring guide 35 is fixed on the inner side of the first location-plate 36, and the other end is lived
The dynamic first end for being located in the second probe installing plate 221, the compression spring set 34 is located on spring guide 35 and is respectively held against
The inner side of the first end of second probe installing plate 221 and the first location-plate 36.By rotating the first regulating bolt 31 of regulation and the
Two regulating bolts 32, can adjust the first probe installing plate 211 and move along its length, by rotating the 3rd regulating bolt of regulation
33, the second probe installing plate 221 can be adjusted and moved along its length, in the present embodiment, adjusted using bolt, it is simple in construction,
Cost is low, certainly, in other embodiments, it would however also be possible to employ screw mandrel coordinates other regulative modes such as motor, and this is this area skill
What art personnel can realize easily, no longer describe in detail.
Certainly, in order that regulation is more accurate, it can also be adjusted in the first regulating bolt 31, the second regulating bolt the 32, the 3rd
Graduated scale is set above bolt 33 or the grade of substrate 12, for clear and definite first probe installing plate 211 and the second probe installing plate 221
Displacement, to be more accurately more convenient adjustment.
Further, in order that the first probe installing plate 211 and the second probe installing plate 221 move more steady reliable, also
Including the first guide plate 41 and the second guide plate 42, the guide plate 42 of the first guide plate 41 and second is fixed on pedestal and divided
Wei Yu not the outside of the first probe installing plate 211 and the second probe installing plate 222 along its length, the He of the first guide plate 41
Second guide plate 42 is respectively equipped with the first guide chute 411 and the second guide chute 421, the He of the first probe installing plate 211
The outside of second probe installing plate 221 is slidably arranged in the first guide chute 411 and the second guide chute 421 respectively.
Further, in order that the structure of the first regulating bolt 31, the second regulating bolt 32 and the 3rd regulating bolt 33 more
It is firm, in addition to be fixed on first adjustment seat 51 and the second adjustment seat 52 at the both ends of substrate 12 along its length, described the
One adjustment seat 51 and the second adjustment seat 52 are located at the outside of the first location-plate 36 and the second location-plate 37, first regulation respectively
Bolt 31 is also bolted through the first adjustment seat 51, and spring guide 35 is set through the first location-plate 36 and with the fixation of the first adjustment seat 51
Put, the regulating bolt 33 of the second regulating bolt 32 and the 3rd is also bolted through the second adjustment seat 52.Certainly, in some embodiments
In, can also there was only the first adjustment seat 51, without the second adjustment seat 52.
Detection process：For example be when detecting relay, will be corresponding in 5 pins position shown in relay pin from Fig. 6
Pin position is stretched out, if any relay be to be stretched out from 1-3-5 pins position, some relays are stretched out from 1-5 pins position, are had plenty of
Go out to stretch out from 2-4 pins, when detecting these pins, probe in detecting mechanism is fixed on detection device by installation portion 11
On, then by adjusting the first regulating bolt 31, the second regulating bolt 32 and/or the 3rd regulating bolt 33, pacify the first probe
The dress probe installing plate 221 of plate 211 and/or second is moved, so as to adjust the distance between probe 7 and the position relative to substrate 12
（And the Pin locations of relay）, probe 7 is corresponded to 1-3-5 pins position, 1-5 pins position, 2-4 pins position, it is possible to realize
To 1-3-5 pins（As shown in Figure 7）, 1-5 pins, the detection of 2-4 pins.
The utility model is in the detection for the electronic device that a variety of pin specifications can be just realized after simple adjustment, switching
Quickly, greatly shorten product remodel detection required for producing line adjustment time, without changing probe in detecting mechanism, time saving province
Power, simple convenient, efficiency high, cost is low, and greatly reduces the technical requirements to employee, in addition, probe in detecting mechanism is advised
Lattice only need one kind, and convenient manufacture, management and storage further reduce cost.
Although specifically showing and describing the utility model with reference to preferred embodiment, those skilled in the art should
This is understood, is not departing from the spirit and scope of the present utility model that appended claims are limited, in form and details
On the utility model can be made a variety of changes, be protection domain of the present utility model.
Claims (10)
1. a kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set of probe assembly, it is characterised in that：
Every group of probe assembly includes setting at least one at least two probe installation portions being arranged on pedestal, each probe installation portion
Probe, at least one of which probe installation portion is set with respect to the base runner, the probe that the relative base runner of regulation is set
Wherein at least one in installation portion, makes probe location thereon change, so that corresponding to the different pin of electronic device
Position.
2. the probe in detecting mechanism of pin of electronic device according to claim 1, it is characterised in that：Every group of probe assembly
The quantity of probe installation portion is two, respectively the first probe installation portion and the second probe installation portion, the first probe installation portion
The base runner relative with the second probe installation portion is set, the first probe installation portion of regulation and/or the second probe installation portion, with
Regulation is arranged on the spacing between the probe on the first probe installation portion and the probe on the second probe installation portion, or
The first probe installation portion and the second probe installation portion are adjusted in synchronism, to adjust the probe being arranged on the first probe installation portion and peace
The position of probe opposite base on the second probe installation portion.
3. the probe in detecting mechanism of pin of electronic device according to claim 2, it is characterised in that：First probe is installed
Portion is provided with a probe, and the second probe installation portion is provided with two probes.
4. the probe in detecting mechanism of pin of electronic device according to claim 2, it is characterised in that：Is additionally provided with pedestal
One adjusting part, the second adjusting part, the first probe installing plate and the second probe installing plate, the first probe of every group of probe assembly
Installation portion is fixedly installed on the first probe installing plate, and the second probe installation portion of every group of probe assembly is fixedly installed on
On two probe installing plates, first adjusting part is used to adjust the first probe installing plate relative to pedestal movement, and this second
Adjusting part is used to adjust the second probe installing plate relative to pedestal movement.
5. the probe in detecting mechanism of pin of electronic device according to claim 4, it is characterised in that：The quantity of probe assembly
For 4 groups, the first probe installation portion and the second probe installation portion quantity are 4, the first probe installing plate and the second probe
Installing plate is the platy structure of strip, and the one side of the first probe installing plate along its length, which is spaced, fixes this 4
First probe installation portion, the distance of the first adjacent probe installation portion is A, the one side of the second probe installing plate along its length
It is spaced and fixes this 4 the second probe installation portions, the distance of the second adjacent probe installation portion is B, and 4 the first probes are installed
Portion and 4 the second probe installation portion intermeshings so that 4 the first probe installation portions and 4 the second probe installation portions, which interlock, to be set
Put, the width of the second probe installation portion is more than apart from A, the width of the first probe installation portion is more than apart from B, so that the first probe
Installation portion and the second probe installation portion can do relatively remote along the length direction of the first probe installing plate and the second probe installing plate
From or close to motion.
6. the probe in detecting mechanism of pin of electronic device according to claim 4, it is characterised in that：First adjusting part
Include the first regulating bolt, the second regulating bolt, the 3rd regulating bolt, spring guide, compression spring, the with the second adjusting part
One location-plate and the second location-plate, first location-plate and the second location-plate spacing are fixedly installed on pedestal, the first probe peace
Fill plate and the second probe installing plate is located between the first location-plate and the second location-plate, the first probe installing plate and the second probe peace
The spacing that length of the plate along the first location-plate and the second location-plate direction is less than between the first location-plate and the second location-plate is filled, should
First regulating bolt is bolted through the first location-plate and props up the first end of the first probe installing plate, and second regulating bolt is spirally connected
Through the second location-plate and the second end of the first probe installing plate is propped up, the 3rd regulating bolt is bolted through the second location-plate simultaneously
The second end of the second probe installing plate is propped up, spring guide one end is fixed on the inner side of the first location-plate, and other end activity is worn
In the first end of the second probe installing plate, the compression spring is set on spring guide and is respectively held against the second probe installing plate
The inner side of first end and the first location-plate.
7. the probe in detecting mechanism of pin of electronic device according to claim 6, it is characterised in that：Also include being fixed on base
The first adjustment seat and the second adjustment seat on seat, first adjustment seat and the second adjustment seat are located at the first location-plate and second respectively
The outside of location-plate, first regulating bolt and the second regulating bolt are also bolted through the first adjustment seat, the 3rd regulation spiral shell
Bolt is also bolted through the second adjustment seat.
8. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：Also include the
One guide plate and the second guide plate, first guide plate and the second guide plate, which are fixed on pedestal and are located at the first probe respectively, pacifies
The outside of plate and the second probe installing plate is filled, first guide plate and the second guide plate are respectively equipped with the first guide chute and second
The outside of guide chute, the first probe installing plate and the second probe installing plate is slidably arranged in the first guide chute and respectively
In two guide chutes.
9. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：On the pedestal
Provided with installation portion, the installation portion is provided with least two mounting holes.
10. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：The pedestal
Including substrate, the first probe installing plate and the second probe installing plate are movably arranged on substrate, and the substrate is provided with can allow probe
Substrate bottom surface is stretched out in mobile slot to make way, the lower end of probe through slot to make way.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720184180.2U CN206479564U (en) | 2017-02-28 | 2017-02-28 | A kind of probe in detecting mechanism of pin of electronic device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720184180.2U CN206479564U (en) | 2017-02-28 | 2017-02-28 | A kind of probe in detecting mechanism of pin of electronic device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206479564U true CN206479564U (en) | 2017-09-08 |
Family
ID=59747232
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720184180.2U Withdrawn - After Issue CN206479564U (en) | 2017-02-28 | 2017-02-28 | A kind of probe in detecting mechanism of pin of electronic device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206479564U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771417A (en) * | 2017-02-28 | 2017-05-31 | 厦门宏发工业机器人有限公司 | A kind of probe in detecting mechanism of pin of electronic device |
-
2017
- 2017-02-28 CN CN201720184180.2U patent/CN206479564U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771417A (en) * | 2017-02-28 | 2017-05-31 | 厦门宏发工业机器人有限公司 | A kind of probe in detecting mechanism of pin of electronic device |
| CN106771417B (en) * | 2017-02-28 | 2023-08-08 | 厦门宏发工业机器人有限公司 | Probe detection mechanism of electronic device pin |
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