CN106771417A - A kind of probe in detecting mechanism of pin of electronic device - Google Patents
A kind of probe in detecting mechanism of pin of electronic device Download PDFInfo
- Publication number
- CN106771417A CN106771417A CN201710111564.6A CN201710111564A CN106771417A CN 106771417 A CN106771417 A CN 106771417A CN 201710111564 A CN201710111564 A CN 201710111564A CN 106771417 A CN106771417 A CN 106771417A
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- probe
- installation portion
- plate
- installing plate
- location
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention relates to electronic device detection field, a kind of particularly probe in detecting mechanism of the pin of electronic device of compatible various pin specifications.The invention discloses a kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set of probe assembly, every group of probe assembly includes at least two probe installation portions being arranged on pedestal, at least one probe is set on each probe installation portion, at least one of which probe installation portion is set with respect to the base runner, wherein at least one in the probe installation portion that the relative base runner of regulation is set, probe location thereon is set to change, so that corresponding to the different Pin locations of electronic device.The present invention is switched fast the pin of electronic device detection by can just realize various pin specifications after simple adjustment, greatly shorten the producing line adjustment time required for detection when product changes, it is time saving and energy saving, it is simple convenient, and greatly reduce the technical requirements to employee.
Description
Technical field
The invention belongs to electronic device detection field, draw more particularly to a kind of electronic device of compatible various pin specifications
The probe in detecting mechanism of pin.
Background technology
Device for switching be the electric current that refers to close, carry and cut-off under normal loop condition and can close, in regulation
The switching device of the electric current under abnormal loop condition is carried and cut-off in time.It is frequently necessary to when device for switching dispatches from the factory split powered-down
Each index of device carries out on off test, such as pressure-resistant, break-make, mechanical life, coil resistance detection.
For example for the relay in solder machine, it is necessary to which its coil resistance is detected, typically by a spy
Probe insertion relay coil pin in pin detection plate is detected that existing detection is mostly using one block of probe in detecting plate
A kind of relay coil pin specification of correspondence, and the model of relay has many kinds, causing the specification of its coil pin also has very
It is various, so it is accomplished by processing drawing for many money probe in detecting plates, high cost, management storage inconvenience, and the relay for detecting
During pin format change, probe in detecting plate need to be carried out dismounting and change, then electrical wiring could be detected again, be wasted time and energy,
Efficiency is low, high cost, and the technical requirements to employee are high.
Equally, when other electronic devices are detected, because its pin specification is different, it is also desirable to change corresponding probe in detecting
Plate, then electrical wiring could again be detected that waste time and energy, efficiency is low, high cost, the technical requirements to employee are high.
The content of the invention
A kind of compatible various pin of electronic device specification detections are provided present invention aim at solving the above problems, it is time saving
Laborsaving, efficiency high, low cost greatly reduces the probe in detecting mechanism to the pin of electronic device of the technical requirements of employee.
Therefore, the invention discloses a kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set
Probe assembly, every group of probe assembly includes at least two probe installation portions being arranged on pedestal, is set on each probe installation portion
At least one probe is put, at least one of which probe installation portion is set with respect to the base runner, the relative base runner of regulation sets
Wherein at least one in the probe installation portion put, makes probe location thereon change, so as to correspond to electronic device
Different Pin locations.
Further, the probe assembly includes at least two probe installation portions being arranged on pedestal, and each probe is installed
At least one probe is set, and at least one of which probe installation portion is set with respect to the base runner, the relative pedestal of regulation in portion
Wherein at least one in the probe installation portion that activity is set, makes probe location thereon change.
Further, the quantity of every group of probe installation portion of probe assembly is two, respectively the first probe installation portion
With the second probe installation portion, the first probe installation portion and the second probe installation portion are set with respect to the base runner, regulation the
One probe installation portion and/or the second probe installation portion, to adjust the probe on the first probe installation portion and installed in the
The spacing between probe on two probe installation portions, or the first probe installation portion and the second probe installation portion are adjusted in synchronism, with
The position of probe of the regulation on the first probe installation portion and the probe opposite base on the second probe installation portion.
Further, the first probe installation portion is provided with a probe, and the second probe installation portion is provided with two
Probe.
Further, the first adjusting part, the second adjusting part, the first probe installing plate and second are additionally provided with the pedestal
Probe installing plate, the first probe installation portion of every group of probe assembly is fixedly installed on the first probe installing plate, every group of probe
Second probe installation portion of component is fixedly installed on the second probe installing plate, first adjusting part be used for adjust this first
Probe installing plate is moved relative to the pedestal, and second adjusting part is used to adjust the second probe installing plate relative to the pedestal
It is mobile.
Further, the quantity of probe assembly is 4 groups, and the first probe installation portion and the second probe installation portion quantity are equal
It it is 4, the first probe installing plate and the second probe installing plate are the platy structure of strip, and the first probe installing plate is along long
The one side in degree direction is spaced fixes this 4 the first probe installation portions, and the distance of the first adjacent probe installation portion is A,
Second probe installing plate one side along its length is spaced fixes this 4 the second probe installation portions, the second adjacent spy
The distance of pin installation portion is B, 4 the first probe installation portions and 4 the second probe installation portion intermeshings so that 4 first spies
Pin installation portion and 4 the second probe installation portions are staggered, the width apart from A more than the second probe installation portion, apart from B more than the
The width of one probe installation portion so that the first probe installation portion and the second probe installation portion can along the first probe installing plate and
The length direction of the second probe installing plate is relatively distant from or near motion.
Further, first adjusting part and the second adjusting part include the first regulating bolt, the second regulating bolt, the
Three regulating bolts, spring guide, compression spring, the first location-plate and the second location-plate, first location-plate and the second location-plate
Spacing is fixedly installed on pedestal, and the first probe installing plate and the second probe installing plate are located at the first location-plate and the second location-plate
Between, the first probe installing plate and the second probe installing plate are less than first along the length in the first location-plate and the second location-plate direction
Spacing between location-plate and the second location-plate, first regulating bolt is bolted through the first location-plate and props up the first probe peace
The first end of plate is filled, second regulating bolt is bolted through the second location-plate and props up the second end of the first probe installing plate, should
3rd regulating bolt is bolted through the second location-plate and props up the second end of the second probe installing plate, and spring guide one end is fixed on
The inner side of the first location-plate, other end activity is located in the first end of the second probe installing plate, and the compression spring is set in spring
On guide rod and it is respectively held against the first end of the second probe installing plate and the inner side of the first location-plate.
Further, also including the first adjustment seat and the second adjustment seat that are fixed on pedestal, first adjustment seat and
Second adjustment seat is located at the outside of the first location-plate and the second location-plate respectively, and first regulating bolt and the second regulating bolt are also
The first adjustment seat is bolted through, the 3rd regulating bolt is also bolted through the second adjustment seat.
Further, also including the first guide plate and the second guide plate, first guide plate and the second guide plate are fixed on
It is located on pedestal and respectively the outside of the first probe installing plate and the second probe installing plate, first guide plate and the second guide plate
The first guide chute and the second guide chute are respectively equipped with, the outside difference of the first probe installing plate and the second probe installing plate
It is slidably arranged in the first guide chute and the second guide chute.
Further, the pedestal is provided with installation portion, and the installation portion is provided with least two mounting holes.
Further, the pedestal includes substrate, and the first probe installing plate and the second probe installing plate are movably arranged on base
On plate, the substrate is provided with the slot to make way that probe can be allowed to move, and substrate bottom surface is stretched out in the lower end of probe through slot to make way.
Advantageous Effects of the invention：
The present invention switches quick, pole in the detection of the electronic device by can just realize various pin specifications after simple adjustment
It is big to shorten the producing line adjustment time that product is remodeled or changed required for class detection, it is time saving and energy saving without changing probe in detecting mechanism,
Simple convenient, efficiency high, low cost, and the technical requirements to employee are greatly reduced, additionally, probe in detecting mechanism specification is only
Need one kind, convenient manufacture, management and storage, further reduces cost.
Brief description of the drawings
Fig. 1 is the front view of the probe in detecting mechanism of the embodiment of the present invention；
Fig. 2 is the left view of the probe in detecting mechanism of the embodiment of the present invention；
Fig. 3 is the top view of the probe in detecting mechanism of the embodiment of the present invention；
Fig. 4 is the stereogram of the probe in detecting mechanism of the embodiment of the present invention；
Fig. 5 is the exploded view of the probe in detecting mechanism of the embodiment of the present invention；
Fig. 6 is for placing relay pin 5 pin bit architecture schematic diagrames in the embodiment of the present invention；
Fig. 7 is detects schematic diagram of the detection positioned at the pin of 1-3-5 pins position in the embodiment of the present invention.
Specific embodiment
In conjunction with the drawings and specific embodiments, the present invention is further described.
A kind of probe in detecting mechanism of pin of electronic device, including a pedestal and at least one set of probe assembly, every group of probe
Component sets at least two probes, and the position of wherein at least one probe can change, so as to draw corresponding to electronic device is different
Placement of foot.
Further, the probe assembly includes at least two probe installation portions being arranged on pedestal, and each probe is installed
At least one probe is set, and at least one of which probe installation portion is set with respect to the base runner, the relative pedestal of regulation in portion
Wherein at least one in the probe installation portion that activity is set, makes probe location thereon change.
In this specific embodiment, as Figure 1-5, pedestal 1 includes the installation portion of the L-type of substrate 12 and of a strip
11, the top of installation portion 11 is fixed on the bottom surface of substrate 12, in the present embodiment, adopts and is screwed, certainly, in other embodiments
In can also using bonding or be integrally formed wait fixation.The bottom of installation portion 11 is provided with mounting hole 111, and quantity is 2, but not with
This is limited, for probe in detecting mechanism to be screwed installed in testing equipment.
In this specific embodiment, the quantity of probe assembly 2 is 4 groups, certainly, in other implementations, the quantity of probe assembly 2
4 groups can be less than or more than 4 groups, with specific reference to being actually needed determination.Probe assembly 2 includes two probe installation portions, respectively
It is the first probe installation portion 211 and the second probe installation portion 221, certainly in other implementations, probe assembly 2 can include 3
The individual or probe installation portion of more than 3, determines with specific reference to actual demand.The first probe installation portion 211 and the second probe
Installation portion 221 is movably arranged on substrate 12, and the first probe installation portion 211 and the second probe installation portion 221 can be relatively moved,
The first probe installation portion 211 and/or the second probe installation portion 221 are adjusted, is arranged on the first probe installation portion 211 with adjusting
Spacing between probe 7 and the probe 7 on the second probe installation portion 221, or it is adjusted in synchronism the first probe installation portion
211 and the second probe installation portion 221, to adjust the probe 7 on the first probe installation portion 211 and installed in the second probe
The position of the opposing substrate 12 of probe 7 on installation portion 221, so as to realize the detection of the electronic device of different pin specifications.
In some embodiments, it is also possible to be that the first probe installation portion 211 or the second probe installation portion 221 are fixedly installed on
On substrate 12, the second probe installation portion 221 or the first probe installation portion 211 are movably arranged on substrate 12.For probe assembly 2
The probe installation portion for including 3 or more than 3 similarly can be that part probe installation portion is fixedly installed on the substrate 12, portion
Probe installation portion is divided to be movably arranged on substrate 12, or whole show is set on the substrate 12.
In this specific embodiment, the quantity of probe 7 on the first probe installation portion 211 is one, the second probe installation portion 221
On the quantity of probe 7 be two, three shapes of probe 7 are in a row, certainly, other implementation in, the spy of the first probe installation portion 211
The quantity of probe 7 of the quantity of pin 7 and the second probe installation portion 221 can be selected according to actual conditions, it is also possible to be provided with many
Row's probe 7, this is that those skilled in the art can realize easily, is no longer described in detail.
Probe 7 is separately fixed at the first probe installation portion 211 and the second probe installation portion 221, and through the first probe peace
The upper and lower surface of the probe installation portion 221 of dress portion 211 and second, substrate 12 is provided with a strip slot to make way 121, and the bottom of probe 7 is worn
Cross slot to make way 121 and stretch out the bottom surface of substrate 12, facilitate wiring.
In this specific embodiment, 4 equal stationary arrangements of the first probe installation portion 211 are in the first probe installing plate 21,4
The equal stationary arrangement of two probe installation portion 221 in the second probe installing plate 22, so, by adjusting the first probe installing plate 21 and the
Two probe installing plates 22 just can simultaneously adjust 4 the first probe installation portions 211 and 4 the second probe installation portions 221, regulation effect
Rate is high, and certainly, in other embodiments, 4 the first probe installation portions 211 and 4 the second probe installation portions 221 can also be point
Vertical, can individually adjust.First probe installing plate 21 and the second probe installing plate 22 are movably arranged on substrate 12 and can phases
To movement.Certainly, in other implementations, or the first probe installing plate 21 or the second probe installing plate 22 are fixedly installed on
On substrate 12, the second probe installing plate 22 or the first probe installing plate 21 are movably arranged on substrate 12
In this specific embodiment, the first probe installing plate 21 and the second probe installing plate 22 are the platy structure of strip,
The length direction of one probe installing plate 21 and the second probe installing plate 22 is identical with the length direction of substrate 12, and the first probe is installed
The one side along its length of plate 21 is spaced fixes 4 the first probe installation portions 211, the first adjacent probe installation portion
211 distance is A, and the second probe installing plate 22 one side along its length is spaced fixes 4 the second probe installation portions
221, the distance of the second adjacent probe installation portion 221 is B, 4 the first probe installation portions 211 and 4 the second probe installation portions
221 intermeshings so that 4 the first probe installation portions 211 and 4 the second probe installation portions 221 along substrate 12 length direction
It is staggered, the first probe is more than apart from B along the width of the length direction of substrate 12 more than the second probe installation portion 221 apart from A
Installation portion 211 along the length direction of substrate 12 width so that the first probe installation portion 211 and the second probe installation portion 221
Can be relatively distant from or be close to along the length direction of substrate 12 and move.In this specific implementation, the first probe installing plate 21 and 4
First probe installation portion 211 is formed in one part, and the second probe installing plate 22 and 4 the second probe installation portions 221 are integrated into
Type part.
Further, the first adjusting part and the second adjusting part are additionally provided with substrate 12, first adjusting part is used
Moved relative to substrate 12 in the first probe installation portion 211 is adjusted, second adjusting part is used to adjust the installation of the second probe
Moved relative to substrate 12 in portion 221.
In this specific embodiment, the first adjusting part and the second adjusting part include that the first regulating bolt 31, second is adjusted
Bolt 32, the 3rd regulating bolt 33, spring guide 35, compression spring 34, the first location-plate 36 and the second location-plate 37, first determines
The spacing of position plate 36 and second location-plate 37 is fixed on the two ends along its length of substrate 12, the first probe installing plate 211 and second
Probe installing plate 221 is located between the first location-plate 36 and the second location-plate 37, between the first location-plate 36 and the second location-plate 37
Away from the length more than the first probe installing plate 211 and the second probe installing plate 221, first regulating bolt 31 is bolted through
One location-plate 36 simultaneously props up the first end of the first probe installing plate 211, and second regulating bolt 32 is bolted through the second positioning
Plate 37 simultaneously props up the second end of the first probe installing plate 211, and the 3rd regulating bolt 33 is bolted through the second location-plate 37 simultaneously
The second end of the second probe installing plate 221 is propped up, the one end of spring guide 35 is fixed on the inner side of the first location-plate 36, and the other end is lived
The dynamic first end for being located in the second probe installing plate 221, the compression spring set 34 is located on spring guide 35 and is respectively held against
The inner side of the first end of the second probe installing plate 221 and the first location-plate 36.By rotating the first regulating bolt 31 of regulation and the
Two regulating bolts 32, can adjust the first probe installing plate 211 and move along its length, by rotating the 3rd regulating bolt of regulation
33, the second probe installing plate 221 can be adjusted and moved along its length, in the present embodiment, adjusted using bolt, simple structure,
Low cost, certainly, in other embodiments, it would however also be possible to employ screw mandrel coordinates other regulative modes such as motor, and this is this area skill
What art personnel can realize easily, no longer describe in detail.
Certainly, in order that regulation is more accurate, can also be adjusted in the first regulating bolt 31, the second regulating bolt the 32, the 3rd
Graduated scale is set above bolt 33 or the grade of substrate 12, for clear and definite first probe installing plate 211 and the second probe installing plate 221
Displacement, to carry out more accurate more convenient adjustment.
Further, in order that the first probe installing plate 211 and the second probe installing plate 221 move more steady reliability, also
Including the first guide plate 41 and the second guide plate 42, the guide plate 42 of first guide plate 41 and second is fixed on pedestal and divides
Wei Yu not the first probe installing plate 211 and the second probe installing plate 222 outside along its length, the He of the first guide plate 41
Second guide plate 42 is respectively equipped with the first guide chute 411 and the second guide chute 421, the He of the first probe installing plate 211
The outside of the second probe installing plate 221 is slidably arranged in the first guide chute 411 and the second guide chute 421 respectively.
Further, in order that the structure of the first regulating bolt 31, the second regulating bolt 32 and the 3rd regulating bolt 33 more
It is firm, also including being fixed on first adjustment seat 51 and the second adjustment seat 52 at the both ends along its length of substrate 12, described the
One adjustment seat 51 and the second adjustment seat 52 are located at the outside of the first location-plate 36 and the second location-plate 37, first regulation respectively
Bolt 31 is also bolted through the first adjustment seat 51, and spring guide 35 sets through the first location-plate 36 and with the fixation of the first adjustment seat 51
Put, the regulating bolt 33 of second regulating bolt 32 and the 3rd is also bolted through the second adjustment seat 52.Certainly, in some embodiments
In, it is also possible to only the first adjustment seat 51, there is no the second adjustment seat 52.
Detection process：For example when detecting relay, will be corresponding in the 5 pins position shown in relay pin from Fig. 6
Pin position stretch out, if any relay be from 1-3-5 pins position stretch out, some relays be from 1-5 pins position stretch out, have plenty of
Go out to stretch out from 2-4 pins, when detecting these pins, probe in detecting mechanism is fixed on testing equipment by installation portion 11
On, then by adjusting the first regulating bolt 31, the second regulating bolt 32 and/or the 3rd regulating bolt 33, pacify the first probe
The dress probe installing plate 221 of plate 211 and/or second is moved, so as to adjust the distance between probe 7 and the position relative to substrate 12
（And the Pin locations of relay）, probe 7 is corresponded to 1-3-5 pins position, 1-5 pins position, 2-4 pins position, it is possible to realize
To 1-3-5 pins（As shown in Figure 7）, 1-5 pins, the detection of 2-4 pins.
, in the detection of the electronic device by can just realize various pin specifications after simple adjustment, switching is soon for the present invention
Speed, greatly shorten product remodel detection required for producing line adjustment time, it is time saving and energy saving without changing probe in detecting mechanism,
Simple convenient, efficiency high, low cost, and the technical requirements to employee are greatly reduced, additionally, probe in detecting mechanism specification is only
Need one kind, convenient manufacture, management and storage, further reduces cost.
Although specifically showing and describing the present invention with reference to preferred embodiment, those skilled in the art should be bright
In vain, do not departing from the spirit and scope of the present invention that appended claims are limited, in the form and details can be right
The present invention makes a variety of changes, and is protection scope of the present invention.
Claims (10)
1. a kind of probe in detecting mechanism of pin of electronic device, an including pedestal and at least one set of probe assembly, it is characterised in that：
Every group of probe assembly includes at least two probe installation portions being arranged on pedestal, and at least one is set on each probe installation portion
Probe, at least one of which probe installation portion is set with respect to the base runner, the probe that the relative base runner of regulation is set
Wherein at least one in installation portion, makes probe location thereon change, so that corresponding to the different pin of electronic device
Position.
2. the probe in detecting mechanism of pin of electronic device according to claim 1, it is characterised in that：Every group of probe assembly
The quantity of probe installation portion is two, respectively the first probe installation portion and the second probe installation portion, the first probe installation portion
The base runner relative with the second probe installation portion is set, and adjusts the first probe installation portion and/or the second probe installation portion, with
Probe of the regulation on the first probe installation portion and the spacing between the probe on the second probe installation portion, or
The first probe installation portion and the second probe installation portion are adjusted in synchronism, to adjust the probe and peace on the first probe installation portion
The position of the probe opposite base on the second probe installation portion.
3. the probe in detecting mechanism of pin of electronic device according to claim 2, it is characterised in that：First probe is installed
Portion is provided with a probe, and the second probe installation portion is provided with two probes.
4. the probe in detecting mechanism of pin of electronic device according to claim 2, it is characterised in that：It is additionally provided with the pedestal
First adjusting part, the second adjusting part, the first probe installing plate and the second probe installing plate, every group of first spy of probe assembly
Pin installation portion is fixedly installed on the first probe installing plate, and the second probe installation portion of every group of probe assembly is fixedly installed on
On second probe installing plate, first adjusting part is used to adjusting the first probe installing plate and is moved relative to the pedestal, and this
Two adjusting parts are used to adjust the second probe installing plate relative to pedestal movement.
5. the probe in detecting mechanism of pin of electronic device according to claim 4, it is characterised in that：The quantity of probe assembly
It is 4 groups, the first probe installation portion and the second probe installation portion quantity are 4, the first probe installing plate and the second probe
Installing plate is the platy structure of strip, and the first probe installing plate one side along its length is spaced fixes this 4
First probe installation portion, the distance of the first adjacent probe installation portion is A, the second probe installing plate one side along its length
It is spaced and fixes this 4 the second probe installation portions, the distance of the second adjacent probe installation portion is B, and 4 the first probes are installed
Portion and 4 the second probe installation portion intermeshings so that 4 the first probe installation portions and 4 the second probe installation portions interlock and set
Put, the width apart from A more than the second probe installation portion, the width apart from B more than the first probe installation portion, so that the first probe
Installation portion and the second probe installation portion can do relatively remote along the length direction of the first probe installing plate and the second probe installing plate
From or near motion.
6. the probe in detecting mechanism of pin of electronic device according to claim 4, it is characterised in that：First adjusting part
Include the first regulating bolt, the second regulating bolt, the 3rd regulating bolt, spring guide, compression spring, the with the second adjusting part
One location-plate and the second location-plate, first location-plate and the second location-plate spacing are fixedly installed on pedestal, the first probe peace
Dress plate and the second probe installing plate are located between the first location-plate and the second location-plate, and the first probe installing plate and the second probe are pacified
Dress plate, less than the spacing between the first location-plate and the second location-plate, is somebody's turn to do along the length in the first location-plate and the second location-plate direction
First regulating bolt is bolted through the first location-plate and props up the first end of the first probe installing plate, and second regulating bolt is spirally connected
Through the second location-plate and the second end of the first probe installing plate is propped up, the 3rd regulating bolt is bolted through the second location-plate simultaneously
The second end of the second probe installing plate is propped up, spring guide one end is fixed on the inner side of the first location-plate, and other end activity wears
In the first end of the second probe installing plate, the compression spring is set on spring guide and is respectively held against the second probe installing plate
The inner side of first end and the first location-plate.
7. the probe in detecting mechanism of pin of electronic device according to claim 6, it is characterised in that：Also include being fixed on base
The first adjustment seat and the second adjustment seat on seat, first adjustment seat and the second adjustment seat are located at the first location-plate and second respectively
The outside of location-plate, first regulating bolt and the second regulating bolt are also bolted through the first adjustment seat, the 3rd regulation spiral shell
Bolt is also bolted through the second adjustment seat.
8. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：Also include the
One guide plate and the second guide plate, first guide plate and the second guide plate are fixed on pedestal and respectively positioned at the first probe peace
The outside of dress plate and the second probe installing plate, first guide plate and the second guide plate are respectively equipped with the first guide chute and second
The outside of guide chute, the first probe installing plate and the second probe installing plate is slidably arranged in the first guide chute and respectively
In two guide chutes.
9. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：On the pedestal
Installation portion is provided with, the installation portion is provided with least two mounting holes.
10. the probe in detecting mechanism of the pin of electronic device according to claim 4 or 5 or 6, it is characterised in that：The pedestal
Including substrate, the first probe installing plate and the second probe installing plate are movably arranged on substrate, and the substrate is provided with and can allow probe
Substrate bottom surface is stretched out in mobile slot to make way, the lower end of probe through slot to make way.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710111564.6A CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710111564.6A CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
Publications (2)
| Publication Number | Publication Date |
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| CN106771417A true CN106771417A (en) | 2017-05-31 |
| CN106771417B CN106771417B (en) | 2023-08-08 |
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| CN201710111564.6A Active CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108490223A (en) * | 2018-03-28 | 2018-09-04 | Tcl王牌电器(惠州)有限公司 | Beat high-voltage testing device |
| CN111044919A (en) * | 2019-12-06 | 2020-04-21 | 广东恒翼能科技有限公司 | Probe module and modularized lithium battery testing device |
| WO2023102999A1 (en) * | 2021-12-08 | 2023-06-15 | 歌尔股份有限公司 | Exercise data collection device, method and apparatus, and wearable device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005274487A (en) * | 2004-03-26 | 2005-10-06 | Micronics Japan Co Ltd | Probe system |
| CN102565564A (en) * | 2010-12-30 | 2012-07-11 | 塔工程有限公司 | Array detection device |
| CN103235163A (en) * | 2013-03-28 | 2013-08-07 | 顺德中山大学太阳能研究院 | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries |
| CN103852605A (en) * | 2012-11-30 | 2014-06-11 | 西安上尚机电有限公司 | Novel installation device for LED power supply testing probe |
| CN204088271U (en) * | 2014-07-08 | 2015-01-07 | 浙江格普新能源科技有限公司 | A kind of photovoltaic one-sheet test device |
| CN204462207U (en) * | 2015-03-31 | 2015-07-08 | 重庆松普电器有限公司 | Probe regulating device |
| CN105510801A (en) * | 2015-11-30 | 2016-04-20 | 上海斐讯数据通信技术有限公司 | Test fixture |
| CN206479564U (en) * | 2017-02-28 | 2017-09-08 | 厦门宏发工业机器人有限公司 | A kind of probe in detecting mechanism of pin of electronic device |
-
2017
- 2017-02-28 CN CN201710111564.6A patent/CN106771417B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005274487A (en) * | 2004-03-26 | 2005-10-06 | Micronics Japan Co Ltd | Probe system |
| CN102565564A (en) * | 2010-12-30 | 2012-07-11 | 塔工程有限公司 | Array detection device |
| CN103852605A (en) * | 2012-11-30 | 2014-06-11 | 西安上尚机电有限公司 | Novel installation device for LED power supply testing probe |
| CN103235163A (en) * | 2013-03-28 | 2013-08-07 | 顺德中山大学太阳能研究院 | Test probe with adjustable probe-needle gaps for testing contact resistances of solar batteries |
| CN204088271U (en) * | 2014-07-08 | 2015-01-07 | 浙江格普新能源科技有限公司 | A kind of photovoltaic one-sheet test device |
| CN204462207U (en) * | 2015-03-31 | 2015-07-08 | 重庆松普电器有限公司 | Probe regulating device |
| CN105510801A (en) * | 2015-11-30 | 2016-04-20 | 上海斐讯数据通信技术有限公司 | Test fixture |
| CN206479564U (en) * | 2017-02-28 | 2017-09-08 | 厦门宏发工业机器人有限公司 | A kind of probe in detecting mechanism of pin of electronic device |
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| CN108490223A (en) * | 2018-03-28 | 2018-09-04 | Tcl王牌电器(惠州)有限公司 | Beat high-voltage testing device |
| CN108490223B (en) * | 2018-03-28 | 2021-07-06 | Tcl王牌电器(惠州)有限公司 | High voltage testing device |
| CN111044919A (en) * | 2019-12-06 | 2020-04-21 | 广东恒翼能科技有限公司 | Probe module and modularized lithium battery testing device |
| CN111044919B (en) * | 2019-12-06 | 2021-01-15 | 广东恒翼能科技有限公司 | Probe module and modularized lithium battery testing device |
| WO2023102999A1 (en) * | 2021-12-08 | 2023-06-15 | 歌尔股份有限公司 | Exercise data collection device, method and apparatus, and wearable device |
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