CN206330670U - The measurement apparatus of surface temperature and emissivity - Google Patents
The measurement apparatus of surface temperature and emissivity Download PDFInfo
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- CN206330670U CN206330670U CN201621431817.5U CN201621431817U CN206330670U CN 206330670 U CN206330670 U CN 206330670U CN 201621431817 U CN201621431817 U CN 201621431817U CN 206330670 U CN206330670 U CN 206330670U
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Abstract
The utility model discloses a kind of surface temperature and the measurement apparatus of emissivity.Measurement apparatus includes reflection converter, optical receiver and data handling system, reflecting converter includes reflector and absorption tube, reflector has through hole, absorption tube switches relative to reflector between the first measurement position and the second measurement position, in the first measurement position, the light inputting end of absorption tube is near to or in contact with measured surface, so that optical receiver directly receives self-radiation light and the first electric signal of formation that measured surface is sent；In the second measurement position, the light inputting end of absorption tube is located at outside the through hole of reflector or through hole, so that reflected radiation light and the second electric signal of formation between self-radiation light and the reflecting surface and measured surface of reflector that optical receiver reception measured surface is sent；Data handling system is according to the first electric signal and the second electric signal formation surface temperature and emissivity.The utility model energy accurate measurement surface temperature and emissivity.
Description
Technical field
The utility model is related to field of measuring technique, the measurement apparatus of more particularly to a kind of surface temperature and emissivity.
Background technology
During using Radiation Temperature Measurement Instrument measurement surface temperature, the measurement of surface temperature is influenceed by emissivity, is always that metering is surveyed
One of examination field is without the problem solved.Widely used various Radiation Temperature Measurement Instruments are in laboratory standard in the prior art
Demarcated under the conditions of measurement instrument --- blackbody radiation source (emissivity ≈ 1).In measurement, according to radiation signal and calibration equation
Measurement temperature T can be obtained.However, the emissivity of actual object is less than 1, the simply brightness temperature obtained during measurement is not
Real surface temperature.The emissivity of actual object is complicated, unascertainable, with the component of object, surface state, wavelength
It is relevant with temperature.So only knowing the value of emissivity, real surface temperature could be obtained.
For the influence of emissivity is reduced or eliminated, a kind of thermometry of the online black matrix based on reflector is suggested
(M.D.Drury,K.P.Perry,and T.Land,“Pyrometers for surface temperature
measurement,”J.Iron St.Inst.,vol.169,pp.245–250,1951.)：Covered on high temperature surface one it is cold
The reflector of high reflectance constitutes a cavity, there are multiple reflections between measured surface and reflector, measured surface it is effective
Radiation increase, close to black body radiation state, i.e., effective emissivity is close to 1.1994, thank to plant et al. and propose that ' Equations of The Second Kind is black
Body radiation source ' concept (thanking plant etc., the measurement of industrial radiation testing temperature, publishing house of Northeastern University, 1994)：If " non-transparent material shape
Into isothermal level and ideal reflector constitute closed cavity, then the radiation sent from the arbitrary face source of isothermal level is the isothermal level
Black body radiation under source temperature." principle accordingly, by the preposition reflector of Radiation Temperature Measurement Instrument, it is possible to increase effective emissivity, so that
Reduce measurement error.
Notification number is that EP1103801B1 patent and Publication No. EP0942269A1 patent application are based on principles above
Disclose a kind of thermometry and measurement apparatus：Strengthened using a kind of gold-plated hyperbolic-type concave mirror as emissivity
Instrument, Net long wave radiation is increased using multipath effect, so as to reduce measurement error.However, not actually existing ideally-reflecting
Body, its reflectivity is less than 1, and has on reflector light radiation hole and the gap between measured surface, and cavity is not closed, so
Its effective emissivity can not reach 1, therefore this invention can reduce rather than be completely eliminated the influence of emissivity, still require that user is defeated
Enter the empirical value of effective emissivity, the empirical value in EP1103801B1 is set to 0.95.To thoroughly eliminate emissivity influence,
Accurate measurement surface temperature is, it is necessary to accurately solve the expression formula of effective emissivity, and above-mentioned two inventions can not be measured
Emissivity, can only measurement surface temperature.
Publication No. CN102353691A Chinese patent application and Publication No. CN102252755A patent of invention Shen
It please individually disclose Multispectral Emissivity on-line measurement device and the side of a kind of front reflector based on dome-type and cylinder type
Method.Reflector in the invention can be moved on guide rail, can be done and be switched on two kinds of radiation regimes：1) reflector is moved into detection
In the visual field, detection obtains radiation signal by the light beam in light radiation hole2) reflector is removed outside field range again, obtained
Self-radiation signal under the effect of areflexia deviceAccording to formulaAcquisition emissivity ε (λ,
T), wherein f (ε (λ, T)) is reflector effective emissivity function.
During the utility model is realized, inventor has found Publication No. CN102353691A Chinese patent application
Still there is following weak point with Publication No. CN102252755A patent of invention：
First, from precision aspect：1) reflector in above-mentioned two patent document needs to be arranged on guide rail, to realize
It is mobile above measured surface, gap is certainly existed with measured surface, the radius that measured surface is sent can be escaped from gap,
So as to influence measurement accuracy；Meanwhile, theoretical calculation understands that dome-type reflector pair and the distance between measured surface are especially quick
Sense, if the centre of sphere deviates measured surface, can cause the drastically decline of effective emissivity, so influence of the bottom surface gap to measurement accuracy
Significantly.2) reflector has destruction to measured surface temperature field, thus reflector can not measure for a long time (high chief is bright etc.,
The research of radiation pyrometer preceded with a reflector, 1984, Fig. 5).When measuring 700 DEG C of stainless steel such as reflector, measured surface temperature
Covered in reflector and rise within 1 second about 4 DEG C, rise 6 DEG C within 2 seconds.So quickly measurement is needed, and above-mentioned patent is in two kinds of radiation
Switch in state, at least need the distance of mobile twice of reflector radius, the inevitably fail temperature in handoff procedure,
So as to influence measurement accuracy.3) above-mentioned two patent is when reflector is removed, and measured surface exposes in space, ambient background spoke
Penetrating can be reflexed to by surface to be measured in optical laying probe, so measurement signal can be disturbed by background radiation, can be only applied to
Used in the preferable laboratory surrounded with cold wall, it is impossible to apply in industry spot.4) above-mentioned two patent only surveys normal direction hair
Rate is penetrated, and is unable to measurement direction emissivity.
Second, application aspect.The measurement apparatus of 2 patents disclosed above must install guide rail and support frame before measuring,
And ensure adjustment guide rail and tested surface level, when the size of reflector is identical, it is necessary to which the covering for being at least doubled in reflector is empty
Between for its movement.Required installing space is big, require high, and high cost, portability are poor, are influenceed greatly, to be not suitable for having by background radiation
The industry spot of strong background radiation, the limited occasion in such as space, or need the occasion of rapid and convenient measurement or can not install to lead
The occasion of rail support.Such as the significant steel mill's Steel In Reheating Furnace base surface of background radiation, continuous casting billet surface etc..
Utility model content
The purpose of this utility model, which is that offer is a kind of, can more accurately measure the surface temperature and emissivity of measured surface
Measurement apparatus.
The utility model first aspect provides the measurement apparatus of a kind of surface temperature and emissivity, and the measurement apparatus includes
Converter, optical receiver and data handling system are reflected, the optical receiver is coupled with the reflection converter, the light-receiving
Device receives radius sent by the measured surface and by the reflection converter and changes the radius
For electric signal, the data handling system couples to receive the electric signal and according to the electric signal shape with the optical receiver
Into the measured surface temperature and emissivity, the reflection converter includes reflector and absorption tube, and the reflector has logical
Hole, the absorption tube is changeably set relative to the reflector locations so that the absorption tube is in the first measurement position and second
Switch between measurement position, wherein, in first measurement position, the absorption tube is arranged in the reflection by the through hole
The inside of device is to the light inputting end of the absorption tube near to or in contact with the measured surface, so that the optical receiver directly receives institute
State self-radiation light and the first electric signal of formation that measured surface is sent；In second measurement position, the absorption tube
The light inputting end is located at outside the through hole of the reflector or the through hole, so that the optical receiver receives described tested
Reflected radiation light between self-radiation light and the reflecting surface and measured surface of the reflector that surface is sent simultaneously is formed
Second electric signal；The data handling system forms the measured surface according to first electric signal and second electric signal
Surface temperature and emissivity.
The surface temperature and the measurement apparatus of emissivity provided based on the utility model, because absorption tube can be surveyed first
Measure and switch between position and the second measurement position, apparatus above only can be such that optical receiver obtains by the motion of absorption tube
The self-radiation light of measured surface can obtain above-mentioned self-radiation light plus the reflection between reflector and measured surface again
Radius, the measurement data that data handling system can be obtained according to absorption tube in different measurement positions is while obtain tested table
Face temperature and emissivity.
It is theoretical that the utility model is based on Equations of The Second Kind blackbody radiation source, it is proposed that with reflector and relative to reflector locations
The reflection converter of variable absorption tube, realizes the rapid translating of two kinds of radiation regimes (reflected radiation and self-radiation), except reality
Now while outside measurement surface temperature and emissivity, its advantage is also resided in：
First, measurement accuracy is improved, and reason is：1) it is two kinds of radiation regimes of acquisition, it is not necessary to mobile reflector, reflection
The gap of device and measured surface can smaller or even gapless (reflector can be contacted with measured surface) so that measured surface is sent
Through bottom surface gap escape radius reduce or eliminate, improve measurement accuracy；2) absorption tube need to only be moved, you can realize two
The switching of radiation regimes is planted, compared to mobile reflector, the absorption smaller quality of pipe volume is lighter, and the shorter distance of movement (if
For dome-type reflector, then mobile 1 times of radius distance is needed) so that switch speed is faster, surface temperature destruction is smaller, surveys
Amount is more accurate；3) it is not required to move reflector, completely eliminates background radiation interference, also can in the industry spot of strong background radiation
Ensure measurement accuracy；4) normal emittance can be not only surveyed, while the relative position of absorption tube and reflector can be designed, so as to measure
Non- normal emittance.
Second, application aspect due to not needing the supplementary structures such as guide rail, support frame, and need not move reflector, required
Measurement space is small, and installation requirement is few, and low cost is portable, no background radiation interference；Suitable for confined space occasion, or need quick
Occasion is measured, or the occasion of guide rail supporting frame can not be installed.Such as the significant steel mill's Steel In Reheating Furnace base surface of background radiation, continuous casting
Base surface etc..
It is of the present utility model other by referring to the drawings to the detailed description of exemplary embodiment of the present utility model
Feature and its advantage will be made apparent from.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding to of the present utility model, constitutes the part of the application,
Schematic description and description of the present utility model is used to explain the utility model, does not constitute to of the present utility model improper
Limit.In the accompanying drawings：
Fig. 1 is the structural representation of the measurement apparatus of the utility model first embodiment.
Fig. 2 is structural representation of the measurement apparatus under the first measurement position shown in Fig. 1.
Fig. 3 is structural representation of the measurement apparatus under the second measurement position shown in Fig. 1.
Fig. 4 be Fig. 1 shown in measurement apparatus in reflector reflected radiation light schematic diagram.
Fig. 5 is the structural representation of the measurement apparatus of the utility model 3rd embodiment.
Fig. 6 is the structural representation of the measurement apparatus of the embodiment of the utility model the 5th.
Fig. 1 is into Fig. 6, and each reference is represented respectively：
1st, converter is reflected；1-1, reflector；1-2, absorption tube；2nd, spectrometer；3rd, drive mechanism；4th, light guide structure；5、
Optical receiver；6th, data handling system；7th, through hole；9th, measured surface；10th, reflecting surface；11st, the centre of sphere；13rd, the second measurement position；
14th, the first measurement position.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is carried out
Clearly and completely describe, it is clear that described embodiment is only a part of embodiment of the utility model, rather than whole
Embodiment.The description only actually at least one exemplary embodiment is illustrative below, never as to this practicality
New and its application or any limitation used.Based on the embodiment in the utility model, those of ordinary skill in the art are not having
There is the every other embodiment made and obtained under the premise of creative work, belong to the scope of the utility model protection.
Unless specifically stated otherwise, the part and positioned opposite, the digital table of step otherwise illustrated in these embodiments
Scope of the present utility model is not limited up to formula and numerical value.Simultaneously, it should be appreciated that each shown in accompanying drawing for the ease of description
The size of individual part is not to be drawn according to actual proportionate relationship.For skill known to person of ordinary skill in the relevant
Art, method and apparatus may be not discussed in detail, but in the appropriate case, the technology, method and apparatus should be considered as awarding
Weigh a part for specification.In shown here and discussion all examples, any occurrence should be construed as merely example
Property, not as limitation.Therefore, the other examples of exemplary embodiment can have different values.It should be noted that：It is similar
Label and letter similar terms is represented in following accompanying drawing, therefore, once be defined in a certain Xiang Yi accompanying drawing, then with
It need not be further discussed in accompanying drawing afterwards.
For the ease of description, space relative terms can be used herein, such as " ... on ", " ... top ",
" ... upper surface ", " above " etc., for describing such as a device shown in the figure or feature and other devices or spy
The spatial relation levied.It should be appreciated that space relative terms are intended to comprising the orientation except device described in figure
Outside different azimuth in use or operation.If for example, the device in accompanying drawing is squeezed, be described as " in other devices
It will be positioned as " under other devices or construction after the device of part or construction top " or " on other devices or construction "
Side " or " under other devices or construction ".Thus, exemplary term " ... top " can include " ... top " and
" in ... lower section " two kinds of orientation.The device can also other different modes positioning (being rotated by 90 ° or in other orientation), and
Respective explanations are made in description relative to space used herein above.
The utility model embodiment provides the measurement apparatus of a kind of surface temperature and emissivity, and the measurement apparatus can be more smart
Really measure the surface temperature and emissivity of measured surface 9.
As shown in Figures 1 to 6, measurement apparatus of the present utility model is included at reflection converter 1, optical receiver 5 and data
Reason system 6.Optical receiver 5 with reflection converter 1 couple, optical receiver 5 receive it is being sent by measured surface 9 and by reflection
Radius is simultaneously converted to electric signal by the radius of converter 1.Data handling system 6 couples to receive with optical receiver 5
Electric signal and the surface temperature and emissivity that measured surface 9 is formed according to electric signal.Reflect converter 1 include reflector 1-1 and
Absorption tube 1-2.Reflector 1-1 has through hole 7.Absorption tube 1-2 is changeably set so that absorption tube relative to reflector 1-1 positions
1-2 switches between the first measurement position and the second measurement position.Wherein, in the first measurement position, absorption tube 1-2 passes through through hole
7 are arranged in reflector 1-1 inside to absorption tube 1-2 light inputting end near to or in contact with measured surface 9 so that optical receiver 5 is direct
Receive self-radiation light and the first electric signal of formation that measured surface 9 is sent；In the second measurement position, absorption tube 1-2's enters
Light end is located at reflector 1-1 through hole 7 or through hole 7 is outer so that optical receiver 5 receives the self-radiation light that measured surface 9 is sent
Reflected radiation light and the second electric signal of formation between line and reflector 1-1 reflecting surface 10 and measured surface 9.Data processing
System 6 forms the surface temperature and emissivity of measured surface 9 according to the first electric signal and the second electric signal.
Because absorption tube 1-2 can switch between the first measurement position and the second measurement position, above measurement apparatus can
Only to make optical receiver 5 to obtain the self-radiation light of measured surface 9 by absorption tube 1-2 motion, and it can obtain
Self-radiation light is stated plus the reflected radiation light between reflector 1-1 reflecting surface 10 and measured surface 9, data processing system
The measurement data that system 6 can be obtained according to absorption tube in different measurement positions is while obtain the surface temperature and hair of measured surface 9
Penetrate rate.
It is theoretical that the utility model is based on Equations of The Second Kind blackbody radiation source, it is proposed that with reflector and relative to reflector locations
The reflection converter of variable absorption tube, realizes the rapid translating of two kinds of radiation regimes (reflected radiation and self-radiation), except reality
Now while outside measurement surface temperature and emissivity, its advantage is also resided in：
First, measurement accuracy aspect：1) it is two kinds of radiation regimes of acquisition, it is not necessary to which mobile reflector, reflector is with being tested
The gap on surface can smaller or even gapless (reflector can be contacted with measured surface) so that measured surface send through bottom surface
The radius of gap effusion is reduced or eliminated, and improves measurement accuracy；2) only need to move absorption tube, you can realize two kinds it is radial
The switching of state, compared to mobile reflector, the absorption smaller quality of pipe volume is lighter, and mobile shorter distance is (if dome-type
Reflector, then need mobile 1 times of radius distance) so that switch speed is faster, surface temperature destruction is smaller, measures more accurate；
3) it is not required to move reflector, completely eliminates background radiation interference, measurement is also ensure that in the industry spot of strong background radiation
Precision；4) normal emittance can be not only surveyed, while the relative position of absorption tube and reflector can be designed, so as to measure illegal to hair
Penetrate rate.
Second, application aspect due to not needing the supplementary structures such as guide rail, support frame, and need not move reflector, required
Measurement space is small, and installation requirement is few, and low cost is portable, no background radiation interference；Suitable for confined space occasion, or need quick
Occasion is measured, or the occasion of guide rail supporting frame can not be installed.Such as the significant steel mill's Steel In Reheating Furnace base surface of background radiation, continuous casting
Base surface etc..
It can be seen that, because the radiation regimes for obtaining different only need to move absorption tube, simple in construction, the measurement speed of the measurement apparatus
Degree is fast, portable and more easy to operate and arrangement.
Preferably, the first electric signal is first voltage signal, and the second electric signal is second voltage signal, data handling system
6 pairs of first voltage signals and second voltage signal are handled as follows：
The first measurement position radiance expression formula under n wavelength or under n wave band is obtained according to below equation：L1
(λi, T) and=ε (λi)L0(λi,T0), wherein, L1(λi,T0) be optical receiver (5) receive by measured surface (9) send in ripple
Long λiUnder radiance, and obtained by the spectral response functions of first voltage signal and optical receiver (5)；ε(λi) it is tested table
Face (9) is in wavelength XiUnder emissivity；L0(λi,T0) be measured surface (9) black matrix under the same conditions radiance；I=1
~n, i, n are the positive integer more than or equal to 1；λiFor EWL, unit is rice；T0For the surface temperature of measured surface (9), list
Position is K；
The second measurement position radiance expression formula under n wavelength or under n wave band is obtained according to below equation：L2
(λi,T0)=f (εi)L0(λi,T0), wherein, L2(λi,T0) be optical receiver (5) receive by measured surface (9) send in ripple
Long λiUnder radiance, and obtained by the spectral response functions of second voltage signal and optical receiver (5)；f(εi) it is reflector
(1-1) is in wavelength XiUnder effective emissivity function；
According to n the first measurement position radiance expression formula L1(λi,T0)=ε (λi)L0(λi,T0) and n second measurement
Position radiance expression formula L2(λi,T0)=f (εi)L0(λi,T0), while calculating surface temperature T0With the hair under n wavelength
Penetrate rate εi。
Wherein, reflector 1-1 reflecting surface 10 is preferably spherical crown surface.It is highly preferred that reflecting surface is hemisphere face.
Hemispherical bottom surface circle can measure the temperature and emissivity of measured surface 9 on reflector 1-1 bottom surface
When, reflector 1-1 is placed directly on measured surface 9, and ensure the relative position of measured surface 9 and reflector 1-1, make anti-
The emitter 1-1 centre of sphere is fallen on measured surface 9, improves the accuracy of measurement result.
Certainly, reflecting surface 10 can also be hyperboloid, the face of cylinder, parabola, lozenges or circular conical surface or other types of
Reflecting surface.
It is preferably carried out at one in mode, reflecting surface 10 is spherical crown surface, for example, hemisphere face, absorption tube 1-2 is straight tube,
In the first measurement position and the second measurement position, absorption tube 1-2 axis passes through the centre of sphere 11 of spherical crown surface.The setting can be improved
The accuracy of measurement result.
In the case where reflecting surface 10 is spherical crown surface, absorption tube 1-2 axis and the diameter perpendicular to the bottom surface of reflector
Angle is θ, in the range of 0 °~80 °.For example, angle theta can for 0 °, 5 °, 10 °, 20 °, 30 °, 45 °, 55 °, 60 °,
70 °, 80 ° etc..
The ratio range of the diameter of the diameter of through hole 7 and the reflecting surface 10 of spherical crown surface is ensureing smooth light extraction and needed
When ensure absorption tube 1-2 can with it is smooth pass through through hole 7 when it is the smaller the better, for example, it may be 1/10~1/2, it is of course also possible to small
In 1/10.
In order to realize switchings of the absorption tube 1-2 between the first measurement position and the second measurement position, it is preferable that absorption tube
1-2 is reciprocatingly set along own axes.Or, absorption tube can be telescoping tube, and light inputting end is located at the pars contractilis of telescoping tube
The end divided.The structure of absorption tube is relatively simple in arrangement above, and the control of motion process is more convenient, accurate.
For example, being telescoping tube, being realized by way of itself is flexible in the first measurement position and second in absorption tube
During switching between measurement position, absorption tube can be divided into two sections of bodys of the first body and the second body in itself, and the first body can
To be fixedly installed relative to reflector, the second body is telescopically set relative to the first body, and light inputting end is in the second body
Away from the first body end.In the first measurement position, the second body, which stretches out and stretched to from the first body, makes light inputting end
With measured surface near to or in contact with.In the second measurement position, second the first body of body retraction, and light inputting end is set to be in through hole
Outside place or through hole.
Preferably, absorption tube 1-2 inner surface is rough surface and forms the coating of high-absorbility.For example, can pass through
Make absorption tube 1-2 inner surface setting internal thread to form rough surface, then carry out oxidation processes.The setting can increase absorption
The absorptivity of pipe 1-2 inwall, to absorb the radius of directive inner surface, and is only transmitted directly from absorption tube 1-2 center
The light of hole transmission, the reflection for making light absorber 5 receive self-radiation light, now reflector 1-1 from measured surface 9
Effect failure.
Preferably, reflection converter 1 also includes light guide structure 4, light guide structure 4 be located at absorption tube 1-2 and optical receiver 5 it
Between.Light guide structure 4 is used to the radius by absorption tube 1-2 centre bore being transferred to optical receiver 5.Preferably, it is guide-lighting
Structure 4 includes lens subassembly and/or optical fiber.
Optical receiver 5 includes photoelectric conversion unit, and photoelectric conversion unit is used to radius being converted to electric signal.Example
Such as, photoelectric conversion unit includes one or more photodiodes, or photoelectric conversion unit includes thermoelectric pile.
The semi-conducting material of wherein photodiode includes but is not limited to Si, InGaAs, Ge etc., and photodiode is received
Wave-length coverage is 0.25um~14um.
Preferably, optical receiver 5 also include spectrometer 2, spectrometer 2 respectively with absorption tube 1-2 and photoelectric conversion unit coupling
Close.
The wave-length coverage that spectrometer 2 is received can reach 0.2um~1000um.Spectrometer 2 for example can be prismatic spectrum
Instrument, grating spectrograph or fourier spectrometer.When light guide structure 4 is arranged between absorption tube 1-2 and optical receiver 5, spectrum
Instrument 2 is located between light guide structure 4 and photoelectric conversion unit, for example, be arranged between lens subassembly and photodiode.Spectrometer 2
For receiving the radius that absorption tube 1-2 or light guide structure 4 are transmitted, radius is divided into monochromatic light, and monochromatic light is passed
Pass photoelectric conversion unit, finally make data be in reason system 6 obtain brightness temperature in different wavelength or wavelength band with
The expression formula of emissivity.
In order to control absorption tube 1-2 to switch between the first measurement position and the second measurement position, measurement apparatus also includes
Drive mechanism 3, drive mechanism 3 includes power set 8, and power set 8 and absorption tube 1-2 drive connections are to drive absorption tube 1-2
Switch between the first measurement position and the second measurement position.
Wherein preferably, data handling system 6 couples to control the action of drive mechanism 3 with power set 8.For example, dynamic
Power apparatus 8 can be electromagnet or motor or pneumatic means or hydraulic means.Data handling system 6 can be by controlling electromagnetism
Iron, motor or the magnetic valve that is coupled with pneumatic means or hydraulic means etc. electric or dead electricity or it is electric when electric current size control
Absorption tube 1-2 processed action.
In one preferred embodiment, drive mechanism 3 also includes hollow box, and power set 8 divide with absorption tube 1-2
It is not connected on hollow box, measurement apparatus also includes light guide structure 4, light guide structure 4 is arranged at absorption tube 1-2 and optical receiver
Between 5, wherein, light guide structure 4 is located in hollow box.The setting can make drive mechanism 3 drive the motion not shadow of absorption tube
The work of pilot's photo structure 4.
Certainly, drive mechanism 3 it is not necessary to, the dynamic of absorption tube 1-2 can also be directly or indirectly manipulated by manpower
Make.
Reflecting surface 10 is minute surface.The formation of minute surface can be handled by mechanically polishing after the inner surface of reflector, then is plated
Film with high reflectance.Preferably, film is metallic film.The material of metallic film can be for example gold or silver or aluminium
Deng.It is scraped off it is highly preferred that layer protecting film can also be re-formed on metallic film to prevent reflecting surface, for example magnesium fluoride is protected
Film.
Measurement apparatus also includes measurement result output device, such as display device or sound-producing device.Measurement result output dress
Put and coupled with data handling system, with the measurement result of output data processing system formation.
The utility model provides a kind of surface temperature of accurate measurement measured surface 9 and the measuring method of emissivity, the survey
Amount method includes the emissivity and temperature that measured surface 9 is measured using any of the above measurement apparatus.
The measuring method preferably includes following steps：
First measurement position radiance expression formula obtain step, make absorption tube 1-2 be in the first measurement position, according to
Lower formula obtains the first measurement position radiance expression formula under n wavelength or under n wave band：L1(λi, T) and=ε (λi)L0
(λi,T0), wherein, L1(λi,T0) it is optical receiver 5 in wavelength XiUnder radiance, by first voltage signal and optical receiver 5
Spectral response functions obtain；ε(λi) it is measured surface 9 in wavelength XiUnder emissivity；L0(λi,T0) it is measured surface 9 in phase
The radiance of black matrix with the conditions of；I=1~n, i, n are the positive integer more than or equal to 1；λiFor EWL, unit is rice；T0
For the surface temperature of measured surface 9, unit is K；
Second measurement position radiance expression formula obtain step, make absorption tube 1-2 be in the second measurement position, according to
Lower formula obtains the second measurement position radiance expression formula under n wavelength or under n wave band：L2(λi,T0)=f (εi)L0
(λi,T0), wherein, L2(λi,T0) it is optical receiver 5 in wavelength XiUnder radiance, by second voltage signal and optical receiver 5
Spectral response functions obtain；f(εi) it is reflector 1-1 in wavelength XiUnder effective emissivity function；L0(λi,T0) it is tested table
The radiance of the black matrix under the same conditions of face 9；I=1~n, i, n are the positive integer more than or equal to 1；λiFor EWL, list
Position is rice；T0For the surface temperature of measured surface 9, unit is K；
Measurement result obtains step, according to n the first measurement position radiance expression formula L1(λi,T0)=ε (λi)L0
(λi,T0) and n the second measurement position radiance expression formula L2(λi,T0)=f (εi)L0(λi,T0), while calculating n hair
Penetrate rate εiWith true temperature T0。
The utility model is not intended to limit the first measurement position radiance expression formula and obtains step and the second measurement position spoke
The order that brightness expression formula obtains step is penetrated, i.e. the first measurement position radiance expression formula obtains step can be in the second measurement
Position radiance expression formula is obtained before step, can also be obtained in the second measurement position radiance expression formula step it
Afterwards, when n is more than 1, it can also be that the first measurement position radiance expression formula obtains step and the radiation of the second measurement position is bright
Spend expression formula and obtain step intersection execution, obtained when also not limiting the order of intersection or intersection every time during intersection is performed
The quantity of expression formula.
For example, can first data processor 6 is obtained under two wavelength or two ripples in the first measurement position when n is 2
The expression formula of radiance under section, then data processor 6 is obtained under two wavelength or two wave bands in the second measurement position
Under radiance expression formula；Can also be first the second measurement position make data processor 6 obtain two wavelength under or two
The expression formula of radiance under individual wave band, then the first measurement position make data processor 6 obtain two wavelength under or two
The expression formula of radiance under wave band；Can also be first data processor 6 is obtained first wavelength in the first measurement position
The expression formula of radiance lower or under first wave band, then data processor 6 is obtained first ripple in the second measurement position
The expression formula of radiance long lower or under first wave band, then makes data processor 6 obtain second in the second measurement position
The expression formula of radiance under individual wavelength or under second wave band, then data processor 6 is obtained the in the first measurement position
Expression formula of radiance under two wavelength or under second wave band etc..In a word, as long as can obtain needs the expression of quantity
Formula, the order for obtaining the expression formula of radiance is unrestricted in the utility model.
Wherein, step is obtained in the second measurement position radiance expression formula, effective emissivity function can be according to measurement
The physical parameter of device is by deriving or simulation is formed, the spectral reflectivity of physical parameter including reflecting surface 10, reflecting surface 10
The location parameter and measured surface of geometric parameter, reflecting surface 10 and the measurement distance of measured surface 9, absorption tube 1-2 and reflector 2
9 transmitting and reflection characteristic.In the simple in construction of reflecting surface 10, in the case of easily being described with mathematic(al) representation, such as in reflection
In the case of face 10 is hemispherical, effective emissivity function can be formed by way of derivation；And in reflector 1-1 and reflection
Face 10 it is complex-shaped in the case of, for example can then form empirical equation when reflecting surface is hyperboloid or the face of cylinder
Or the expression of the form such as chart.
It is preferably carried out at one in mode, reflector 1-1 reflecting surface 10 is spherical crown surface, and thermometry is also wrapped
Include：Ensure that the centre of sphere of reflecting surface 10 just falls on tested surface and kept constant in measurement.The setting is beneficial to obtain accurate
Measurement result.
At this point it is possible to use the example that formula is described for：In measured surface 9 to overflow transmitting, diffusing reflection surface,
Reflector 1-1 reflecting surface 10 is hemisphere face, when absorption tube 1-2 axis and the angle of measured surface 9 are 90 °, effective emissivity
Function is：
Wherein, ρiFor reflector 1-1 spectral reflectivity；R is the radius of through hole, and unit is rice；R is the half of reflector
Footpath, unit is rice.
Above measuring method has advantage corresponding with corresponding measurement apparatus.
Each embodiment of the utility model will be described in detail further combined with Fig. 1 to Fig. 6 below.
First embodiment
Fig. 1 to Fig. 3 shows the structure and operation principle of the measurement apparatus of the utility model first embodiment.
As shown in Figure 1 to Figure 3, the measurement apparatus of first embodiment includes reflection converter 1, drive device 3, optical receiver
5th, data handling system 6 and the display device as measurement result output device.
Reflecting converter 1 includes reflector 1-1, absorption tube 1-2 and guide structure 4.In the present embodiment, guide structure 4 has
It is lens subassembly body.
Reflector has through hole 7, and reflector 1-1 reflecting surface 10 is hemisphere face.Wherein, reflector 1-1 reflecting surface 10
For hemisphere face.Reflector 1-1 bottom surface is plane, and hemispherical bottom surface circle is located on bottom surface.
In the present embodiment, the ratio of the diameter of reflector 1-1 through hole 7 and the diameter of reflecting surface 10 is 0.16.
In order that absorption tube 1-2 is successfully moved in through hole 7, absorption tube 1-2 external diameter is less than the diameter of through hole 7.For
Absorption tube 1-2 light inputting end is set to reach corresponding measurement position, absorption tube 1-2 length is more than reflector 1-1 hemisphere face
Radius.
In first embodiment, absorption tube 1-2 is changeably set relative to reflector 1-1 positions so that absorption tube 1-2 is
Switch between one measurement position and the second measurement position.As shown in Fig. 2 in the first measurement position, absorption tube 1-2 passes through through hole 7
Inside to the absorption tube 1-2 light inputting end for being arranged in reflector 1-1 is in low level 14, near to or in contact with measured surface 9 so that light
Receiver 5 directly receives the self-radiation light that measured surface 9 is sent.As shown in figure 3, in the second measurement position, absorption tube 1-2
Light inputting end be in a high position 13, at reflector 1-1 through hole 7 or through hole 7 is outer so that optical receiver 5 receives measured surface 9
Reflected radiation light between the self-radiation light and reflector 1-1 reflecting surface 10 and measured surface 9 that send.
Optical receiver 5 is coupled with reflection converter 1.Optical receiver 5 receives the radius of reflection converter 1 and will radiation
Light is converted to electric signal.In the present embodiment, optical receiver 5 is by coupling the coupling realized with reflection converter 1 with lens subassembly
Close.
Data handling system 6 couples to receive electric signal and form the table of measured surface 9 according to electric signal with optical receiver 5
Face temperature and emissivity.
Display device is coupled with data handling system 6, the surface temperature and emissivity of the formation of display data processing system.
Absorption tube 1-2 is straight tube.In the first measurement position and the second measurement position, absorption tube 1-2 axis passes through spherical crown
The centre of sphere 11 in face.During measurement, reflector 1-1 is contacted with measured surface 9, it is ensured that the centre of sphere 11 of reflecting surface 10 is on measured surface 9
And keep constant.
In the present embodiment, absorption tube 1-2 axis is with the diameter angle perpendicular to reflector 1-1 bottom surface
0°.In measurement absorption tube 1-2 axis with measured surface 9 at an angle of 90.
In the present embodiment, in absorption tube 1-2 inner surface setting internal thread to form rough surface, and in sorbent surface shape
Absorbed layer is used as into the coating with high-absorbility.
Light guide structure 4 is located between absorption tube 1-2 and optical receiver 5.Light guide structure 4 includes lens group in the present embodiment
Part.When light guide structure 4 includes lens subassembly, absorption tube 1-2 need to be aligned in the hot spot on measured surface 9, hot spot in measurement
At the hemispherical centre of sphere.
Optical receiver 5 includes photoelectric conversion unit, and photoelectric conversion unit is used to radius being converted to electric signal.This reality
Apply in example, photoelectric conversion unit includes photodiode.
In the present embodiment specifically, photoelectric conversion unit includes the photodiode of two eclipsed form structures.The photoelectricity
Converting unit can receive the light energy of two wave bands simultaneously.Therefore, the measurement apparatus of the embodiment is in the first measurement position and
Two measurement positions can obtain the expression formula of two radiances respectively.So as to which data handling system 6 can utilize four obtained
Individual expression formula is calculated including the surface temperature and emissivity under two wave bands or wavelength.
In order to realize switchings of the absorption tube 1-2 between the first measurement position and the second measurement position, absorption tube 1-2 is along certainly
Body axis is reciprocatingly set.Absorption tube 1-2's is simple in construction in the setting, and Moving process control is convenient, accurate.
In order to preferably measure, control in time absorption tube 1-2 the first measurement position and the second measurement position it
Between switch, drive device 3 and absorption tube 1-2 drive connections, data handling system 6 also couple to control driving with drive device 3
Device 3 is acted, and is switched so as to realize and automatically control absorption tube 1-2 between the first measurement position and the second measurement position.
As shown in Figure 1 to Figure 3, drive mechanism 3 includes power set 8, power set 8 and absorption tube 1-2 drive connections with
Absorption tube 1-2 is driven to switch between the first measurement position and the second measurement position.In the present embodiment, power set 8 are specifically
For electromagnet.Data handling system 6 couples to control absorption tube 1-2's by controlling the electric or dead electricity that obtains of electromagnet with electromagnet
Action.Specifically, drive mechanism 3 is driven by electromagnet, when electromagnet is powered off, and the spring on electromagnet pushes away absorption tube 1-2
To the first measurement position (low level) and keep；When the solenoid is energized, absorption tube 1-2 is driven to the second measurement position (high position).
As shown in Figure 1 to Figure 3, in one preferred embodiment, drive mechanism 3 also includes hollow box, power dress
8 are put to be connected on hollow box with absorption tube 1-2.Light guide structure 4 is located in hollow box.
In the present embodiment, reflector 1-1 is made of stainless steel.Reflecting surface 10 plates last layer gold again by mechanical polishing processing
To form minute surface, then again in gold-plated surface one layer of magnesium fluoride diaphragm of formation with anti-scratch reflecting surface 10.
In the present embodiment, absorption tube 1-2 and drive mechanism 3 are relative to reflector 1-1, optical receiver 5 and data processing system
System 6 is reciprocally moveable.Absorption tube 1-2 moving direction is absorption tube 1-2 axis directions.Absorption tube 1-2 axis passes through
The centre of sphere 11.Absorption tube 1-2 upper end is connected with drive mechanism 3, and lower end may pass through through hole 7 as light inputting end and reflecting surface 10 is stretched into
Inside reflector 1-1.In the first measurement position, absorption tube 1-2 is moved towards the direction of the centre of sphere 11, until lower end and measured surface 9
Near to or in contact with absorption tube 1-2 light inputting end is in the low level 14 shown in Fig. 2；In the second measurement position, absorption tube 1-2 takes out
It is located to light inputting end beyond reflector 1-1 reflecting surface 10 i.e. in a high position 13 as shown in Figure 3.
As lens subassembly one end of light guide structure 4 against the hemispherical centre of sphere 11, the other end is opposite to be used as optical receiver 5
Photodiode.Light guide structure 4 forms a part for receiving light path.The radius sent at the hot spot of measured surface 9
Through injecting lens subassembly inside absorption tube 1-2, lens subassembly converges in radius on the receiving plane of photodiode.
In the present embodiment, the receiving light path of the formation of lens subassembly 4 meets two conditions：A. the position of hot spot is just in the centre of sphere
Place；B. the diameter of hot spot is less than absorption tube 1-2 internal diameters, and absorption tube 1-2 does not hinder in the first measurement position and the second measurement position
Keep off receiving light path.For example, in the present embodiment, the ratio of spot diameter and hemispherical diameter is 0.02.
Second embodiment
Second embodiment is a surface temperature and transmitting using the measurement apparatus measurement measured surface 9 of first embodiment
The measuring method of rate.
In the present embodiment, the specific measuring process of the measuring method is as follows：
First measurement position radiance expression formula obtains step.The reflector 1-1 of measurement apparatus is set to be located at measured surface 9
On, drive absorption tube 1-2 to be moved to the first measurement position and remain stationary as by drive mechanism 3, by the reflector of measurement apparatus
1-1 is placed on measured surface 9, reflector 1-1 is contacted and is kept with measured surface 9, now reflector 1-1 reflex
Failure, the emittance part sent at the centre of sphere 11 is absorbed by absorption tube 1-2 inner surface, and another part is along absorption tube 1-2
Axis direction, projected by lens subassembly on photodiode.Data processor 6 obtains the first measurement under two wave bands
Position radiance expression formula：
L1(λi, T) and=ε (λi)L0(λi,T0)
Wherein, i=1,2；L1(λi,T0) it is optical receiver (5) in wavelength XiUnder radiance, ε (λi) it is measured surface
(9) in wavelength XiUnder emissivity, L0(λi,T0) be measured surface (9) black matrix under the same conditions radiance；λiTo be effective
Wavelength, unit is rice；T0For the surface temperature of measured surface (9), unit is K.
The first measurement position radiance expression formula is obtained in step, the first measurement position radiance expression formula L1
(λi, T) and=ε (λi)L0(λi,T0) form can be embodied using different.For example, using equation below in the present embodiment：Wherein, i=1~n, i, n are the positive integer more than or equal to 1；λiFor EWL, unit is rice；TbiFor
Absorption tube 1-2 is in the first measurement position, wavelength XiBrightness temperature under state, unit is K；T0For the true temperature of measured surface 9
Degree, unit K；εiFor wavelength Xi, temperature T0Under the conditions of emissivity.
Second measurement position radiance expression formula obtains step.The reflector 1-1 of measurement apparatus is kept to be located at tested table
On face 9, absorption tube 1-2 is driven to be moved to the second measurement position and keep by drive mechanism 3, now reflector 1-1 is to the centre of sphere
There is the radius part sent at reflex, the centre of sphere 11 directly to be received by optical receiver 5, another part is anti-at 11
Emitter 1-1 by optical receiver 5 with during the multiple reflections of the centre of sphere 11, being received.Now data processor 6 is obtained under two wave bands
The second measurement position radiance expression formula：
L2(λi,T0)=f (εi)L0(λi,T0)
Wherein, i=1,2；L2(λi,T0) it is optical receiver (5) in wavelength XiUnder radiance；f(εi) it is reflector (1-
1) in wavelength XiUnder effective emissivity function；L0(λi,T0) be measured surface (9) black matrix under the same conditions radiance；
λiFor EWL, unit is rice；T0For the surface temperature of measured surface (9), unit is K.
The second measurement position radiance expression formula is obtained in step, the second measurement position radiance expression formula L2
(λi,T0)=f (εi)L0(λi,T0) form can be embodied using different.For example, in the present embodiment using following public
Formula：Wherein TaiThe second measurement position, wavelength X are in for absorption tube 1-2iBrightness temperature under state
Degree, unit is K；f(εi) be reflector 1-1 effective emissivity function.
As shown in figure 4, in the present embodiment, reflecting surface 10 is set to hemisphere face, and reflecting surface and measurement surface in measurement
Position relationship be in for the hemispherical centre of sphere on measured surface 9, in Fig. 4, because the symmetry of light is only drawn on the right of normal direction
Radius.In this case, hot spot has following features：
1) radius route is simple at hot spot.All radius sent at hot spot are through hemisphere face only through primary event
Origin is reflected back toward afterwards, reflects Aligning control through half-sphere mirror again after being reflected through measured surface 9, the rest may be inferred；Meanwhile, in tested table
The radius that other points are sent in addition to hot spot of face 9 does not fall at hot spot；
2) at hot spot be ' isolated ' radiant.Due to being exchanged at hot spot with non-thermal radiation at non-hot spot, so measurement model
The temperature and emissivity at only hot spot are enclosed, it is unrelated with state at non-hot spot.When measured surface 9 emissivity and Temperature Distribution not
Uniformly, in addition measured surface 9 area be less than half-sphere mirror area coverage when, measurement result is not influenceed.
2 points of above decision, its f (ε) expression formula can be accurately calculated, only with the intrinsic emissivity at hot spot, anti-
The reflectivity of emitter is relevant.
Because the centre of sphere of dome-type reflection is on measured surface 9, hot spot 11 and reflector 1-1 reflected radiation light route
Simply, its f (εi) expression formula can obtain accurately：Wherein, ρiSpectrum for reflector 1-1 is anti-
Rate is penetrated, r, R are respectively the radius of through hole 7 and reflector 1-1 radius.
Measurement result obtains step.Measurement apparatus is removed into measured surface 9, expressed according to the first measurement position radiance
Formula obtains step and the second measurement position radiance expression formula obtains 4 equation L that step is obtained1(λi,T0)=ε (λi)L0
(λi,T0) and L2(λi,T0)=f (εi)L0(λi,T0) (be in particular in the present embodimentWithWherein TbiAnd TaiThe respectively brightness temperature of first, second measurement position, unit is K) by data
Processing system 6 calculates two emissivity εs of measured surface 9 simultaneouslyiWith true temperature T0, and measurement is shown on the display apparatus
As a result.
In 4 equations, Tbi、Tai、λiCan directly it be measured by measurement apparatus, C2For constant, reflector 1-1 spectrum is anti-
Penetrate rate ρiIt is reflector 1-1 physical attribute, the state with measured surface is unrelated.From prior art, if reflecting surface 10 is plated
Gold, then ρiIn infrared spectral coverage λ>1um is almost equal.It then may be assumed that ρi=ρ is the unknown number unrelated with wavelength, then has 4 equations to have
4 unknown numbers, including two emissivity εs1、ε2, reflectivity ρ and surface temperature T0, can obtain by solving Nonlinear System of Equations
Emissivity and surface temperature value.
Other unaccounted parts refer to the related content of other each embodiments in second embodiment.
3rd embodiment
As shown in figure 5, the difference of the present embodiment and first embodiment is, absorption tube 1-2 axis with perpendicular to reflection
Diameter one angle theta of formation of device 1-1 bottom surface, so that in measurement, bottom surface is placed in after measured surface 9, absorption tube 1-2's
The normal direction of axis and measured surface 9 has angle θ.The measurable θ angular direction emissivity of the present embodiment.Angle theta is in the present embodiment
30°。
Other unaccounted parts refer to the related content of other each embodiments in 3rd embodiment.
Fourth embodiment
As shown in fig. 6, the difference of fourth embodiment and first embodiment is, the reflection converter 1 of measurement apparatus
Middle light guide structure 4 is optical fiber.In addition, optical receiver 5 also includes spectrometer 2.Spectrometer 2 is in particular fourier spectrometer.Through
The radius that absorption tube 1-2 enters reflection converter 1 is imported in spectrometer 2 through optical fiber 4, then decomposes monochromatizing by spectrometer 2
Light, then project in photodiode.
Other unaccounted parts refer to the related content of other each embodiments in fourth embodiment.
5th embodiment
5th embodiment is the surface temperature that measured surface 9 is measured using the measurement apparatus of a variation of first embodiment
One measuring method of degree and emissivity.In the variation, photoelectric conversion unit includes a photodiode, the pole of photoelectricity two
Pipe receives the radius of a wave band.From unlike second embodiment, data processor 6 is obtained under a wave band
The expression formula of radiance, be respectively in the expression formula of the first measurement position and the second measurement position：L2(λ1,T0)=εa(λ1)L0
(λ1,T0) and L2(λ1,T0)=f (ε1)L0(λ1,T0).NowReflectivity ρ1Given by experience
Go out, now only two unknown number ε1And T0, the two unknown numbers can be solved simultaneously using two equations.
Other unaccounted parts refer to the related content of other each embodiments in 5th embodiment.
Sixth embodiment
Sixth embodiment is to use the reflecting surface of reflector (reflecting surface is non-spherical structure, or reflector for non-hemisphere face
Be sphere but the centre of sphere not on tested surface) measurement apparatus measurement measured surface 9 surface temperature and emissivity a measurement
Method.
Because the reflecting surface of the reflector is non-spherical structure, or reflector be sphere but the centre of sphere not on tested surface, have
Imitate emissivity function f (εi) expression formula it is different from second embodiment.Its effective emissivity function f (εi) expression formula can root
Obtained according to empirical equation or simulation calculation：
f(εi)=f (εi,ρi,θ,h,Ω,η)
Its relevant parameter is that physical parameter includes the spectral reflectivity ρ of reflecting surface 10 according to the measurement apparatusi、
The geometric parameter Ω of reflecting surface 10, measurement distance h, absorption tube 1-2 axis and the measured surface 9 of reflecting surface 10 and measured surface 9
Angle, θ, and measured surface 9 transmitting and reflection characteristic parameter η.
Other unaccounted parts refer to the related content of other each embodiments in sixth embodiment.
Measurement apparatus or the measurement of the surface temperature and emissivity of the measurement measured surface 9 of the utility model above example
Method has portable, required measurement space small, no background radiation interference, the high advantage of easy to use, measurement accuracy.This practicality is new
Type can be used for the on-line measurement of surface temperature and emissivity, and the emissivity parameter for setting general radiation temperature measurer can also be made
For the measurement standard of emissivity and surface temperature, metrology and measurement department is equally applicable to.
The utility model is not limited to above example, if for example, temperature and the transmitting of the mobile measured surface of measurement
Rate, then can use the spherical crown surface or hyperboloid of non-hemispherical as the reflecting surface of reflector.Now, the reflecting surface of reflector with
Measured surface makes measured surface keep suitable relative to relative motion between the reflector of measurement apparatus when maintaining a certain distance
Freely.The centre of sphere of spherical crown surface is advantageously set to remain on measured surface in measurement process when reflecting surface is spherical crown surface.In reflection
The distance between reflector and measured surface is advantageously set to be within effective range when face is hyperboloid in measurement process.
When measuring mobile measured surface using measurement apparatus of the present utility model, although be in first in absorption tube and survey
The measurement point for the measured surface being aligned when amount position and the second measurement position changes, but for a continuous measured surface
For, violent change can't occur for temperature and emissivity in its certain area, therefore, the surface temperature now measured and
Although emissivity is not by the gain of parameter of the same measurement point of measured surface, but still is that the result measured still can be represented
The surface temperature and emissivity of measured surface in certain area coverage, therefore, equally with practical significance.
Finally it should be noted that：Above example is only to illustrate the technical solution of the utility model rather than it is limited
System；Although the utility model is described in detail with reference to preferred embodiment, those of ordinary skill in the art should
Understand：Still embodiment of the present utility model can be modified or some technical characteristics are equally replaced
Change；Without departing from the spirit of technical solutions of the utility model, it all should cover in the claimed technical scheme of the utility model
Among scope.
Claims (14)
1. the measurement apparatus of a kind of surface temperature and emissivity, including reflection converter (1), optical receiver (5) and data processing
System (6), the optical receiver (5) is coupled with the reflection converter (1), and the optical receiver (5) is received by measured surface
(9) radius is simultaneously converted to electric signal by radius send and by the reflection converter (1), described
Data handling system (6) couples to receive the electric signal and according to forming the electric signal with the optical receiver (5)
The surface temperature and emissivity of measured surface (9), it is characterised in that
The reflection converter (1) includes reflector (1-1) and absorption tube (1-2), and the reflector (1-1) has through hole (7),
The absorption tube (1-2) is changeably set relative to the reflector (1-1) position so that the absorption tube (1-2) is surveyed first
Measure and switch between position and the second measurement position, wherein,
In first measurement position, the absorption tube (1-2) is arranged in the reflector (1-1) by the through hole (7)
Inside is to the light inputting end of the absorption tube (1-2) near to or in contact with the measured surface (9), so that the optical receiver (5) is straight
Receive self-radiation light and the first electric signal of formation that the measured surface (9) sends；
In second measurement position, the light inputting end of the absorption tube (1-2) is located at the described logical of the reflector (1-1)
Hole (7) place or the through hole (7) outside so that the optical receiver (5) receives the self-radiation light that the measured surface (9) sends
Reflected radiation light and formation second between line and the reflecting surface (10) and the measured surface (9) of the reflector (1-1)
Electric signal；
The data handling system (6) forms the measured surface (9) according to first electric signal and second electric signal
Surface temperature and emissivity.
2. measurement apparatus according to claim 1, it is characterised in that first electric signal is first voltage signal, institute
The second electric signal is stated for second voltage signal, the data handling system (6) is to the first voltage signal and second electricity
Pressure signal is handled as follows：
The first measurement position radiance expression formula under n wavelength or under n wave band is obtained according to below equation：L1(λi,T)
=ε (λi)L0(λi,T0), wherein, L1(λi,T0) be the optical receiver (5) receive by measured surface (9) send in wavelength
λiUnder radiance, and obtained by the spectral response functions of the first voltage signal and the optical receiver (5)；ε(λi) be
The measured surface (9) is in wavelength XiUnder emissivity；L0(λi,T0) it is the measured surface (9) black matrix under the same conditions
Radiance；I=1~n, i, n are the positive integer more than or equal to 1；λiFor EWL, unit is rice；T0For the measured surface
(9) surface temperature, unit is K；
The second measurement position radiance expression formula under n wavelength or under n wave band is obtained according to below equation：L2(λi,T0)
=f (εi)L0(λi,T0), wherein, L2(λi,T0) be the optical receiver (5) receive by measured surface (9) send in wavelength
λiUnder radiance, and obtained by the spectral response functions of the second voltage signal and the optical receiver (5)；f(εi) be
The reflector (1-1) is in wavelength XiUnder effective emissivity function；
According to n the first measurement position radiance expression formula L1(λi,T0)=ε (λi)L0(λi,T0) and n the second measurement positions
Radiance expression formula L2(λi,T0)=f (εi)L0(λi,T0), while calculating surface temperature T0With the emissivity under n wavelength
εi。
3. measurement apparatus according to claim 1, it is characterised in that the reflecting surface (10) of the reflector (1-1) includes
Spherical crown surface, hyperboloid, the face of cylinder, parabola, lozenges or circular conical surface.
4. measurement apparatus according to claim 3, it is characterised in that the reflecting surface (10) is hemisphere face.
5. measurement apparatus according to claim 1, it is characterised in that the reflecting surface (10) is spherical crown surface, the absorption
It is straight tube to manage (1-2), and in first measurement position and second measurement position, the axis of the absorption tube (1-2) passes through
The centre of sphere (11) of the spherical crown surface.
6. measurement apparatus according to claim 5, it is characterised in that the axis of the absorption tube (1-2) with perpendicular to institute
The diameter angle for stating the bottom surface of reflector (1-1) is θ, in the range of 0 °~80 °.
7. measurement apparatus according to claim 1, it is characterised in that the absorption tube (1-2) along own axes relative to
The reflector (1-1) is reciprocatingly set；Or, the absorption tube is telescoping tube, and the light inputting end is located at described flexible
The end of the telescopable portion of pipe.
8. measurement apparatus according to claim 1, it is characterised in that the reflection converter (1) also includes light guide structure
(4), the light guide structure (4) is located between the absorption tube (1-2) and the optical receiver (5).
9. measurement apparatus according to claim 1, it is characterised in that the optical receiver (5) includes photoelectric conversion unit,
The photoelectric conversion unit is coupled to radius being converted to electric signal with the absorption tube (1-2).
10. measurement apparatus according to claim 9, it is characterised in that the optical receiver (5) also includes spectrometer
(15), the spectrometer (15) couples with the absorption tube (1-2) and the photoelectric conversion unit respectively.
11. measurement apparatus according to any one of claim 1 to 10, it is characterised in that the measurement apparatus also includes
Drive mechanism (3), the drive mechanism (3) includes power set (8), and the power set (8) are driven with the absorption tube (1-2)
It is dynamic to connect to drive the absorption tube (1-2) between first measurement position and second measurement position to switch.
12. measurement apparatus according to claim 11, it is characterised in that the data handling system (6) and the power
Device (8) couples to control the action of the drive mechanism (3).
13. measurement apparatus according to claim 11, it is characterised in that the power set (8) are electromagnet or motor
Or pneumatic means or hydraulic means.
14. measurement apparatus according to claim 11, it is characterised in that the drive mechanism (3) also includes hollow box,
The power set (8) are connected on the hollow box with the absorption tube (1-2), and the reflection converter (1) is also
Including light guide structure (4), the light guide structure (4) is located between the absorption tube (1-2) and the optical receiver (5), wherein,
The light guide structure (4) is arranged in the hollow box.
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| CN201621431817.5U CN206330670U (en) | 2016-12-26 | 2016-12-26 | The measurement apparatus of surface temperature and emissivity |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108240865A (en) * | 2016-12-26 | 2018-07-03 | 沈阳泰合冶金测控技术有限公司 | The measuring device and measuring method of surface temperature and emissivity |
| CN113138027A (en) * | 2021-05-07 | 2021-07-20 | 东南大学 | Far infrared non-vision object positioning method based on bidirectional refractive index distribution function |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108240865A (en) * | 2016-12-26 | 2018-07-03 | 沈阳泰合冶金测控技术有限公司 | The measuring device and measuring method of surface temperature and emissivity |
| CN108240865B (en) * | 2016-12-26 | 2024-03-29 | 沈阳泰合冶金测控技术有限公司 | Surface temperature and emissivity measuring device and measuring method |
| CN113138027A (en) * | 2021-05-07 | 2021-07-20 | 东南大学 | Far infrared non-vision object positioning method based on bidirectional refractive index distribution function |
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