CN206311730U - Digit chip tester - Google Patents

Abstract

The utility model is related to a kind of digit chip tester.Including the first main control module, the second main control module, Keysheet module, power module, LCD display module, level switch module, memory module, analog switch module, IC test jacks, first main control module is connected with Keysheet module, level switch module, LCD display module, memory module, second main control module is connected with analog switch module, IC test jacks, the IC test jacks are used to place chip to be tested, first main control module is connected with the second main control module, and the power module is used to be powered for whole tester.The utility model can be manually entered test chip model, improve testing efficiency；And the tester is also powered using independent current source, energy off-line working is convenient for carrying.

Description

Digit chip tester

Technical field

The utility model is related to a kind of integrated circuit chip test instrument, specially a kind of digit chip tester.

Background technology

Since the forties in 20th century, computer came out, the test problem of digital display circuit is just proposed, early stage is people Work test and the inspection completely based on exhaustive testing be difficult to satisfaction and be actually needed, thus gradually by automatically test replace.But The time complexity of automatic testing generation is a uncertain multinomial complete problem.The test of integrated circuit is one regular Work, it is badly that can't see from surface that circuit is well in a collection of circuit.Simple approach is such as used, use is powered up to circuit Universal meter is surveyed, then be a very troublesome thing, and this not only has requirement very high, and fault diagnosis to the quality of technical staff Speed it is slow, it is of poor quality.Because one piece of circuit there are a lot of pin, survey is clapped according to truth table one, be a thing for difficulty. Special digital IC tester in the market, it is not only bulky and expensive, it is impossible in laboratory Middle popularization.Prior art also mostly includes controller unit, processor unit, IC pin sockets on digit chip tester Deng.But the core components such as single-chip microcomputer used and designed circuit are different.

Prior art：

1st, single-chip microcomputer is connected with test chip pin, and the reality output of gate circuit is measured by I/O mouthfuls of simulation input, The actual logic function of IC-components is tested with this.

The 2nd, the standard logic menu storage of conventional TTL series, COMS series digit integrated circuits is arrived the expansion of single-chip microcomputer In exhibition memory.

3rd, the standard logic in the actual logic function and memory obtained by test is compared, both unanimously prove quilt Survey device intact, on the contrary device failure.

4th, test result passes through LCD liquid crystal displays.

5th, single-chip microcomputer is connected by level conversion with PC serial ports, realizes data communication.

In the prior art, digit chip tester is used for two aspects, and one is chip model identification, and two is chip quality Detection.Whether type identifier or functional test, single-chip microcomputer is both needed to store substantial amounts of conventional chip model function, so as to right Than.But the data of storage are more, the time of identification is more long needed for single-chip microcomputer, is not easy to quick measurement.And some are tested Chip not cannot identification type number, if the two of tester functions can be separated, for the clear and definite chip of model, be manually entered type Number matching, be able to will greatly reduce single-chip microcomputer operation time, improve detection efficiency.

In addition, patent A（Application number CN201520277932.0）In, the logic function data of standard digital chip are deposited Single-chip microcomputer internal storage is put in, is compared with digit chip data to be measured, add temperature circuit, measure operating temperature, with Just chip temperature to be measured is monitored, prevents from burning out；Existing patent B（CN201521045753.0）In, carried out at data using FPGA Reason, speed, and row data communication can be entered with PC.

However,

For patent A, using single-chip microcomputer internal storage, it is impossible to the chip data of a large amount of different models is stored, in chip Compare aspect to have some limitations.And no independent current source is powered, it is not easy to carry with.

For patent B, using external memory storage, and data processing is carried out by FPGA, the chip of different model can be met Test.But can not be by outside（Such as keyboard）Input model carries out Rapid matching, and is powered also without independent current source, no Portable belt.

This programme proposes a digit chip tester, and control keyboard input module can be manually entered test chip model, Improve testing efficiency.The tester is also powered using independent current source, energy off-line working, is convenient for carrying.

The content of the invention

The purpose of this utility model is to provide a kind of digit chip tester, and the tester can be manually entered test chip Model, improves testing efficiency；And the tester is also powered using independent current source, energy off-line working is convenient for carrying.

To achieve the above object, the technical solution of the utility model is：A kind of digit chip tester, including the first master control Module, the second main control module, Keysheet module, power module, LCD display module, level switch module, memory module, simulation are opened Close module, IC test jacks, first main control module and Keysheet module, level switch module, LCD display module, storage mould Block is connected, and second main control module is connected with analog switch module, IC test jacks, and the IC test jacks are treated for placement Test chip, first main control module is connected with the second main control module, and the power module is used to be powered for whole tester.

In the embodiment of the utility model one, first main control module, the second main control module are mono- using HT46RU24 Piece machine, its built-in A/D translation function.

In the embodiment of the utility model one, the LCD display module uses DM12232F.

In the embodiment of the utility model one, the power module uses lithium battery power supply, and by three terminal regulator AMS1117-5.0 voltage stabilizings are into 5V power supplys.

In the embodiment of the utility model one, the analog switch module uses CD4052 chips.

In the embodiment of the utility model one, the memory module uses AT24C256 memories.

Compared to prior art, the utility model has the advantages that：The utility model tester can be manually entered Test chip model, improves testing efficiency；And the tester is also powered using independent current source, energy off-line working is convenient for carrying.

Brief description of the drawings

Fig. 1 is the HT46RU24 system framework figures that the utility model is used.

Fig. 2 is the utility model digit chip tester hardware block diagram.

Fig. 3 is the utility model LCD display module DM12232F hardware module figures.

Fig. 4 is the utility model DM12232F, keyboard and HT46RU24 connection figures.

Fig. 5 is the utility model test interface hardware chart.

Fig. 6 is the direct current regulation circuit figure of the utility model power module.

Specific embodiment

1-6, is specifically described to the technical solution of the utility model below in conjunction with the accompanying drawings.

A kind of digit chip tester of the present utility model, including the first main control module, the second main control module, keyboard mould Block, power module, LCD display module, level switch module, memory module, analog switch module, IC test jacks, described One main control module is connected with Keysheet module, level switch module, LCD display module, memory module, second main control module with Analog switch module, IC test jacks connection, the IC test jacks are used to place chip to be tested, first main control module It is connected with the second main control module, the power module is used to be powered for whole tester.

First main control module, the second main control module use HT46RU24 single-chip microcomputers, its built-in A/D translation function.

The LCD display module uses DM12232F.

The power module uses lithium battery power supply, and by three terminal regulator AMS1117-5.0 voltage stabilizings into 5V power supplys.

The analog switch module uses CD4052 chips.

The memory module uses AT24C256 memories.

Hereinafter process is implemented for of the present utility model.

The present embodiment with HT46RU24 be a kind of digit chip tester of core design, including Keysheet module, power module, LCD display module, level switch module, memory module, analog switch module, IC test jacks, specifically：

Fig. 1 show HT46RU24 system framework figures, and HT46RU24 is a kind of A/D types single-chip microcomputer, and its structure is 8 property high Can, the risc architecture of high benefit, for directly processing analog signal, also including an integrated multichannel analog-to-digital conversion device, with And one or more pulse width modulations output.

Fig. 2 show digit chip tester hardware block diagram, including Keysheet module, power module, LCD display mould Block, level switch module, memory module, analog switch module, IC test jacks etc..The general principle of the tester is will be tested Compared with the standard logic menu in memory, both are consistent to prove tested device to the actual logic function of IC-components Part be it is good, it is inconsistent to prove bad.

Fig. 3 show LCD display module DM12232F hardware module figures, can complete 16 × 2 (16 × 8 dot matrix) ASCII Code display, it is also possible to show 7.5 × 2 (16 × 16 dot matrix) Chinese characters.Can be adopted using parallel mode control with outer CPU interface Powered with 5V.When off line test chip, test result is shown by LCD.

Fig. 4 show DM12232F, keyboard and HT46RU24 connection figures, and keyboard hardware circuit is mainly to be pressed by 4 × 4 The keyboard of key composition, wherein comprising 0 to 9, reset key, known models acknowledgement key, automatic feeler switch.In order to save I/O mouthfuls, we The data/address bus and 4*4 keyboard sharings of LCD.By by the respective pin for being bonded to keyboard scan chip, keyboard scan is exported Four figures be connected to LCD according to output, corresponding button is pressed in observation, and LCD displays whether correctly, after all going well, to be connect To coding chip, then coding output is directly connected to coding chip, decoding live end and four figures is connected to LED according to output, Whether, when decoding effective, the LCD of decoding end can be lighted moment, correct after observation decoding by corresponding button.

Fig. 5 show test interface hardware chart, and mould is controlled by second piece the two of HT46RU24 single-chip microcomputers I/O mouthfuls Intend four passages of switch, so as to select the ground pin positions of different chips.

Fig. 6 show the direct current regulation circuit figure of power module, after lithium battery voltage output, by after commutation diode again By electrochemical capacitor（100μF）One-level filtering is carried out, to remove the clutter inside direct current, interference is prevented.Filtered direct current Electricity turns into the 5V power supplys of stabilization by three terminal regulator AMS1117-5.0 voltage stabilizings again, and the Vin pin of wherein AMS1117-5.0 are defeated Enter pin, connect battery DC positive source, GND is grounding leg, connect battery DC power cathode, Vout is output pin, it and ground connection The voltage of pin is exactly+5V.5V power supplys make 5V power supplys more reliable and more stable out again by the secondary filter of electrochemical capacitor.Together When 5V voltage-stabilized power supplies plus 1K resistance and a red light emitting diodes, after upper electricity, red light emitting diodes point It is bright, represent that power work is normal.

The digit chip tester of the present embodiment, by test patterns control and tests the ruuning situation of hardware, and test is tied Fruit is compared with right value, and the result of positive erroneous judgement is given automatically.The instrument can complete TTL series and CMOS series numbers within 20 pin The test of word IC chip.

HT46RU24 provides I2C EBIs, and I2C buses are two-way two cable architectures, and data wire and clock line are respectively SDA and SCL.SDA and SCL are NMOS open-drain outputs, must external pull-up resistor when using.

Need to concatenate the resistance of 470 Ω (or 510 Ω) between HT46RU24 single-chip microcomputers and test chip.First, concatenate The purpose of resistance is to play current-limiting protection to HT46RU24, it is assumed that PA0 exports high level, and now, test chip is again Not gate, then, sink current phenomenon will be caused, cause the electric current in PA0 mouth lines very big, HT46RU24 may be burnt.Secondly The correct of logic level can be ensured, the resistance that hundreds of Europe are concatenated on connecting line is without connecing several kilo-ohms of resistance reason： Assuming that allowing PA0 for logic low, such base stage will be high level, and it is 3K or so to have the pull-up resistor on PA mouths again, if even Resistance in wiring also takes 3K, then PA0 will be made to go out logic high, now logic level is wrong；If the electricity of connection It is 470 Ω or so to hinder, and PA0 so can correctly export logic low, this ensures that there the correctness of logic level.

According to 20 pin test chip sockets of design, chip under test highest pin is corresponding with the pin of test jack 20, chip under test 1 Pin is corresponding with the pin of test jack 1, and center section is with pin（NC）Instead of.The following chip of 20 pin is all so regarded as 20 pin chips, if Meter test vector is tested.

The I/O control words rule for being wherein tested IC chip is as follows：

1. the power line and ground wire of IC are tested, are corresponded to " 1 " in selection word；

2. each sky pin of IC is tested, is corresponded to " 1 " in selection word；

3. the output pin for being tested IC regards the input of PIO as, is corresponded to " 0 " in selection word；

4. the input pin for being tested IC regards the output of PIO, corresponding to " 1 " in selection word as；

For the digital integrated electronic circuit of known models, after the model of chip is input into, program can go according to different models The subprogram of different model is called, i.e., adds the high and low level signal of various combination in its input according to different chips.So Read the level signal of output end again afterwards, determine whether logic function is correct, so as to judge the quality of chip.

Because the number of pins and width of each I C blocks are inconsistent, and the position on power supply and ground is different because of piece, so chip to be measured The pin of socket must selectively be controlled by.According to TTL74,54 series and CMOS4000,4500 common more than 200 The statistics of chip is planted, the chip within 20 pins accounts for more than 95%, 20 core locking sockets devised for this, and be specified below：Will First pin and last pin of chip to be measured insert the 1st pin and the 20th pin of 20 core locking sockets, because the upper right of regular chip Pin is all power supply (VCC), and lower left corner is all ground (GND).By the statistics to document and classification, regular chip within 20 pin is listed The situation of number of pins, VCC and GND with irregular chip.According to defined above, therefrom analyze and draw：VCC may socket Pin is 4,5 and 20 pin, and it is regular chip that VCC connects the chip of 20 pin, and the chip that VCC connects 4 and 5 pin is irregular chip； The possible socket pins of GND are 7,8,9,10.Correctly to find out the particular location of the GND sockets of chip, CD4052 chips have been selected. CD4052 is one double 4 select one multi-channel analog selecting switch.The 12 of its pin, 14,15,11 pin correspond respectively to socket Pin 7,8,9,10.Using when can by single-chip microcomputer to A/B control select input for which, for example：Need from 4 tunnels The second tunnel is selected to be input into input, it is assumed that to use Y groups, then single-chip microcomputer only needs to send 1 and 0 i.e. to A and B respectively The road can be chosen, then processed accordingly, note the 6th pin for enable pin, only for 0 when, just have passage be selected Output.

Chip to be measured is put into after chip testing socket tightens and be electrified, after the model that keyboard keys in chip, point Hit " it is determined that " key, meeting display " GOOD " that as a result chip has been, if bad just display " FAIL ".For the core not having in storehouse Piece then shows " ERROR " that the model of input error can click on " clearing " key.

In order to detect the reliability of the tester, choosing conventional CMOS, TTL family chip carries out test and validation, its Middle CMOS family chips 5, TTL family chips 5.It is previously provided with power failure, earth fault, input pin failure, output pin Various situations such as failure, normal, actual tests are carried out by this tester, can accurately detect the whether normal of chip, and The fault pin of inoperable chip can be accurately pointed out, the test sample accuracy of selection is specific as shown in table 1 up to 100%.Therefore, This tester has important application value in the test of chip.

Compare with general same type tester, this tester uses lithium battery power supply, conveniently moving, stable work in work, Output result is accurate.

The above, only the utility model preferably specific embodiment, but protection domain of the present utility model is not This is confined to, any one skilled in the art can readily occur in the technical scope that the utility model is disclosed Change or replacement, should all cover within protection domain of the present utility model.Therefore protection domain of the present utility model should It is defined by scope of the claims.

Claims (6)

1. a kind of digit chip tester, it is characterised in that：Including the first main control module, the second main control module, Keysheet module, electricity Source module, LCD display module, level switch module, memory module, analog switch module, IC test jacks, first master control Module is connected with Keysheet module, level switch module, LCD display module, memory module, and second main control module is opened with simulation Module, IC test jacks connection are closed, the IC test jacks are used to place chip to be tested, first main control module and second Main control module is connected, and the power module is used to be powered for whole tester.

2. digit chip tester according to claim 1, it is characterised in that：First main control module, the second master control Module uses HT46RU24 single-chip microcomputers, its built-in A/D translation function.

3. digit chip tester according to claim 1, it is characterised in that：The LCD display module is used DM12232F。

4. digit chip tester according to claim 1, it is characterised in that：The power module is supplied using lithium battery Electricity, and by three terminal regulator AMS1117-5.0 voltage stabilizings into 5V power supplys.

5. digit chip tester according to claim 1, it is characterised in that：The analog switch module uses CD4052 Chip.

6. digit chip tester according to claim 1, it is characterised in that：The memory module is deposited using AT24C256 Reservoir.