CN2062457U - Composite dielectric constant testing sensor of microwave dielectric substrate - Google Patents
Composite dielectric constant testing sensor of microwave dielectric substrate Download PDFInfo
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- CN2062457U CN2062457U CN 89213062 CN89213062U CN2062457U CN 2062457 U CN2062457 U CN 2062457U CN 89213062 CN89213062 CN 89213062 CN 89213062 U CN89213062 U CN 89213062U CN 2062457 U CN2062457 U CN 2062457U
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- conduction band
- dielectric substrate
- testing sensor
- metal conduction
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Abstract
The utility model relates to a composite dielectric constant testing sensor of microwave dielectric substrate, comprising two chips of measured dielectric substrates with homogeneous materials and same sizes, a straight resonance metal conduction band, two blocks of metal ground plates and two roots of input and output coaxial lines, wherein, the two input and output coaxial lines are symmetrically positioned on the both ends of the central resonance metal conduction band. The testing sensor has the advantages of achieving the measurement with no damage of the complex dielectric constant of the dielectric substrates, and the measurement has the advantages of broad scope, wide frequence band, rapidity and accuracy.
Description
The utility model belongs to the microwave measurement field.
Be used to measure the sensor of microwave-medium substrate complex permittivity at present, mainly contain strip line testing sensor (see figure 3) and non-damage testing sensor (see figure 4).
For the strip line testing sensor, in the method for testing of U.S. MIL-P-13949F standard and ASTM D3380 standard, be used.Its major advantage is a DIELECTRIC CONSTANT
r' test accuracy higher, and its major defect is the (see figure 3) that influences that produces parasitic mode owing to the uncontinuity of coaxial cable center conductor in the sensor and strip line intersection, makes test ε
r' scope extremely narrow, i.e. ε
r'=2.0～2.7.And the tested media substrate material is of less types, can only test soft material, can not test hard material.Sample is made complexity simultaneously, and can not carry out non-damage test.
For non-damage testing sensor, existing multiple structure, they are respectively rectangle or the garden waveguide sensor (is seen Fig. 4 a), coaxial cable sensor (seeing Fig. 4 b), rectangular cavity sensor (seeing Fig. 4 c), coaxial cavity sensor (seeing Fig. 4 d), the major advantage of this class sensor is to carry out non-damage test to deposited copper of single face and the two-sided sample that does not apply copper, its shortcoming is because actual dielectric substrate and sheet metal can not satisfy ideal model is infinitely-great requirement, therefore uncontinuity has appearred in the edge at substrate, the reflection and the radiation of field have been caused, make field structure and ideal model produce deviation, influenced the accuracy of test complex permittivity.
The purpose of this utility model is the non-damage testing sensor-microwave-medium substrate complex permittivity testing sensor of a kind of test accuracy height of development, test specification test microwave-medium substrate complex permittivity wide, easy to use.
The utility model is realized in the following manner, see (Fig. 1), two same material, the dielectric substrate (3) of same size overlaps, in the middle of it, place one straight, thin uniformly resonance metal conduction band (2), its length is concordant with dielectric substrate (3) two ends, two metal ground plates (4) concordant with dielectric substrate (3) are arranged in the outside of two dielectric substrates, to form resonator ［ dielectric substrate (3) can carry single face and apply copper or add thin sheet metal in addition as ground plate, and at this moment original ground plate (4) is a back up pad ］.By fixture block (5) resonator is exerted pressure, with the deaeration crack.
Add and the basic coaxial cable (1) that keeps point-blank of the center resonance metal conduction band (2) of resonator at the resonator two ends, be coupled by air-gap and resonator, and size and coupling amount size according to measured medium substrate (2), can carry out three-dimensional adjustment, so just constitute microwave-medium substrate complex permittivity testing sensor.
The utility model has the advantages that: when the incident wave excitation resonator, do not go out the strip line sensor of phenomenon MIL-P-13949F standard and the employing of ASTM D3380 standard,, face upward and made at ε in the uncontinuity of coaxial cable and strip line intersection in coupling place
rOccur parasitic mode during increase, make ε
rThe scope surveyed significantly be increased to 2～25.Can not only test soft dielectric substrate, but also can test hard dielectric substrate, simultaneously test circuit is simple, and test speed is fast, and is easy to use, be convenient to large-scale industrial test and use.Simultaneously, can also on the Frequency point of the many separation in the very wide frequency range, the dielectric substrate complex permittivity be tested, investigate its frequency characteristic.
Description of drawings:
Fig. 1 is a microwave-medium substrate complex permittivity testing sensor.(1)-coaxial cable wherein, (2)-resonance metal conduction band, (3)-dielectric substrate, (4)-metal ground plate, (5)-fixture block, (6)-pressue device.
Fig. 2 is this testing sensor resonator circuit figure
Wherein: (2)-resonance metal conduction band, (3)-dielectric substrate
Fig. 3 is MIL-P-13949F and ASTM D3380 standard resonator circuit figure.(1)-coaxial cable wherein, (2)-resonance metal conduction band, (3)-dielectric substrate, (7)-leader tape.
Fig. 4 is non-damage testing sensor.
(figure is rectangle or garden waveguide sensor a).
Wherein: (8)-rectangle or garden waveguide, (9)-sheet metal, (3)-dielectric substrate.
(figure b) is the coaxial cable sensor.
Wherein: (10)-coaxial cable, (9)-sheet metal, (3)-dielectric substrate.
(figure c) is the rectangular cavity sensor.
Wherein: (11)-rectangular cavity, (9)-sheet metal, (3)-dielectric substrate.
(figure d) is the coaxial cavity sensor.
Wherein: (12)-coaxial cavity, (9)-sheet metal, (3)-dielectric substrate.
Accompanying drawings embodiment:
Fixture block (5) is made 70 * 30 * 30 bloom, ground plate (4) is made 50 * 30 * 5 copper coin, tested dielectric substrate (3) is of a size of 50 * 30 * 1, resonance metal conduction band copper foil material, it is of a size of 50 * 2 * 0.18, and they are put into maneuverable anchor clamps by shown in Figure 1 combining, and by fixture block (5) resonator is exerted pressure, with the deaeration crack, add that at the resonator two ends coaxial cable (1) promptly forms this testing sensor.
The process of test is that microwave signal is passed through coaxial cable (1) de-energisation resonator, when resonator generation resonance, from the frequency meter that adds, attenuator can be measured resonance frequency and quality factor, consider the physical dimension of resonator, just can calculate the complex permittivity of dielectric substrate.
Claims (5)
1, microwave-medium substrate complex permittivity testing sensor, it is by the measured medium substrate, resonance metal conduction band, the formed resonator of metal ground plate and coaxial cable and pressue device constitute, and it is characterized in that:
(1) resonance metal conduction band places the center of two measured medium substrates.
(2) coaxial cable is by air-gap and resonator coupling.
2, sensor according to claim 1 is characterized in that the measured medium substrate is the rectangle dielectric substrate of same material, same size.
3, sensor according to claim 1 is characterized in that the measured medium substrate is identical with the length of resonance metal conduction band and ground plate.
4, sensor according to claim 1, the resonance metal conduction band that it is characterized in that placing two measured medium substrates centers be uniformly, thin metal directly is with, can with the measured medium substrate separation.
5, sensor according to claim 1 is characterized in that coaxial cable center conductor and resonance metal conduction band keep point-blank substantially.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 89213062 CN2062457U (en) | 1989-07-12 | 1989-07-12 | Composite dielectric constant testing sensor of microwave dielectric substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 89213062 CN2062457U (en) | 1989-07-12 | 1989-07-12 | Composite dielectric constant testing sensor of microwave dielectric substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2062457U true CN2062457U (en) | 1990-09-19 |
Family
ID=4869115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 89213062 Withdrawn CN2062457U (en) | 1989-07-12 | 1989-07-12 | Composite dielectric constant testing sensor of microwave dielectric substrate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2062457U (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004121A (en) * | 2010-09-27 | 2011-04-06 | 东南大学 | Device and method for measuring ceramic contractibility rate and dielectric constant systematically |
| CN104569617A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | Method for testing dielectric properties by using strip-line resonance method |
| CN107543969A (en) * | 2016-06-29 | 2018-01-05 | 广州司南天线设计研究所有限公司 | The method of testing and device of a kind of dielectric constant |
| CN108445302A (en) * | 2018-02-02 | 2018-08-24 | 北京航空航天大学 | A kind of highly sensitive near field resonating electric field test probe of load T-type electrode |
| CN109596895A (en) * | 2019-01-30 | 2019-04-09 | 杭州电子科技大学温州研究院有限公司 | A kind of high portability balanced type microwave-medium sensor |
| WO2020007045A1 (en) * | 2018-07-02 | 2020-01-09 | 京东方科技集团股份有限公司 | Method, device and system for measuring dielectric constant of liquid crystals |
| CN110940863A (en) * | 2019-10-23 | 2020-03-31 | 上海大学 | Resonance sensor based on integrated active amplifier chip |
| CN115842234A (en) * | 2023-02-14 | 2023-03-24 | 电子科技大学 | Novel coupling mode strip line resonator |
| CN107543969B (en) * | 2016-06-29 | 2024-06-07 | 广州司南技术有限公司 | Method and device for testing dielectric constant |
-
1989
- 1989-07-12 CN CN 89213062 patent/CN2062457U/en not_active Withdrawn
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004121A (en) * | 2010-09-27 | 2011-04-06 | 东南大学 | Device and method for measuring ceramic contractibility rate and dielectric constant systematically |
| CN102004121B (en) * | 2010-09-27 | 2012-08-15 | 东南大学 | Device and method for measuring ceramic contractibility rate and dielectric constant |
| CN104569617A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | Method for testing dielectric properties by using strip-line resonance method |
| CN107543969A (en) * | 2016-06-29 | 2018-01-05 | 广州司南天线设计研究所有限公司 | The method of testing and device of a kind of dielectric constant |
| CN107543969B (en) * | 2016-06-29 | 2024-06-07 | 广州司南技术有限公司 | Method and device for testing dielectric constant |
| CN108445302B (en) * | 2018-02-02 | 2021-01-19 | 北京航空航天大学 | High-sensitivity near-field resonance electric field test probe loaded with T-shaped electrode |
| CN108445302A (en) * | 2018-02-02 | 2018-08-24 | 北京航空航天大学 | A kind of highly sensitive near field resonating electric field test probe of load T-type electrode |
| WO2020007045A1 (en) * | 2018-07-02 | 2020-01-09 | 京东方科技集团股份有限公司 | Method, device and system for measuring dielectric constant of liquid crystals |
| US11215654B2 (en) | 2018-07-02 | 2022-01-04 | Boe Technology Group Co., Ltd. | Measuring device, measuring system, and measuring method for liquid crystal dielectric constant |
| CN109596895A (en) * | 2019-01-30 | 2019-04-09 | 杭州电子科技大学温州研究院有限公司 | A kind of high portability balanced type microwave-medium sensor |
| CN110940863A (en) * | 2019-10-23 | 2020-03-31 | 上海大学 | Resonance sensor based on integrated active amplifier chip |
| CN110940863B (en) * | 2019-10-23 | 2020-11-17 | 上海大学 | Resonance sensor based on integrated active amplifier chip |
| CN115842234A (en) * | 2023-02-14 | 2023-03-24 | 电子科技大学 | Novel coupling mode strip line resonator |
| CN115842234B (en) * | 2023-02-14 | 2024-03-26 | 电子科技大学 | Strip line resonator |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |