CN205786902U - Voltage ripple testing auxiliary device and voltage ripple test device - Google Patents
Voltage ripple testing auxiliary device and voltage ripple test device Download PDFInfo
- Publication number
- CN205786902U CN205786902U CN201620491374.2U CN201620491374U CN205786902U CN 205786902 U CN205786902 U CN 205786902U CN 201620491374 U CN201620491374 U CN 201620491374U CN 205786902 U CN205786902 U CN 205786902U
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- China
- Prior art keywords
- pillar
- probe
- folder
- voltage ripple
- oscilloprobe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
This utility model provides a kind of voltage ripple testing auxiliary device, including the first pillar, the second pillar, the 3rd pillar；Described first pillar, the second pillar, the 3rd pillar connect and compose trident support rack type by hinge member；Probe folder it is provided with on described first pillar；The probe of oscilloprobe is fixed on described first pillar by described probe folder.Meanwhile, the invention also discloses a kind of voltage ripple test device.
Description
Technical field
This utility model relates to testing for electrical equipment technical field, particularly relates to a kind of voltage ripple test auxiliary
Device and voltage ripple test device.
Background technology
Ripple is a kind of phenomenon caused due to the voltage pulsation of DC stable power supply, because DC stabilization is electric
Source is usually and is formed through links such as over commutation, voltage stabilizing, filtering by alternating current power supply, and this is the most inevitably
Making with some alternating components in DC stabilization amount, this AC compounent being superimposed upon in DC stabilization amount is just
Referred to as ripple.The composition of ripple is complex, and its form is usually a kind of frequency being similar to higher than power frequency
Sinusoidal wave harmonic wave, the most then be probably the impulse wave of a kind of narrower in width.
Producing or during inspection electronic equipment, in order to detect the performance parameter of electronic equipment, often needing
Electronic equipment is carried out voltage ripple test.Wherein, using oscillograph test voltage ripple is prior art
The most common method of middle one.But, below the method existence of existing employing oscillograph test voltage ripple
Two drawbacks: although one is that the oscillograph commercially bought is usual all with probe, but the most do not join
Putting the support of fixing probe, technical staff is generally required for grasping probe so that probe contacts tested electronics
Device carries out voltage ripple test, but the phenomenon such as handshaking that technical staff occurs in test process can be given
The accuracy of test result brings interference；Two is when voltage ripple is tested, in order to make by tested electronic device,
The loop of probe, probe ground wire composition is the shortest, and then the electromagnetic noise being incorporated in voltage ripple is the least,
When debugging or the local voltage ripple of testing single-board difference, need Rewelding ground wire for probe ground clamp even
Connect, the most time-consuming, and easily make a mess of veneer.
Utility model content
In view of this, the expectation of this utility model embodiment provides a kind of voltage ripple testing auxiliary device and voltage
Ripple test device, it is possible to simplify voltage ripple test process, and improve efficiency and the standard of voltage ripple test
Really property.
For reaching above-mentioned purpose, the technical solution of the utility model is achieved in that
This utility model provides a kind of voltage ripple testing auxiliary device, described device include the first pillar, the
Two pillars, the 3rd pillar；Described first pillar, the second pillar, the 3rd pillar connect structure by hinge member
Become trident support rack type；Probe folder it is provided with on described first pillar；Described probe folder is by the spy of oscilloprobe
Rod is fixed on described first pillar.
In such scheme, described second pillar is contact rod；The probe ground clamp of oscilloprobe is clipped in described
On contact rod；The bottom of described contact rod is connected with the negative electrode of tested electronic device.
In such scheme, the bottom of described contact rod is coated with conductive sponge.
In such scheme, described probe folder includes the first probe folder and the second probe folder.
In such scheme, the height of described first probe folder is more than the height of described second probe folder.
In such scheme, described first probe folder and the second probe folder roll to described second pillar position
The most fixing.
In such scheme, the top of described first pillar is provided with first handle；The top of described second pillar sets
There is second handle.
In such scheme, between described first pillar and the second pillar, it is provided with elastic clip.
In such scheme, the bottom of described 3rd pillar is circular arc type.
In such scheme, described first pillar, the 3rd pillar are insulating bar.
This utility model also provides for a kind of voltage ripple test device, surveys including oscillograph and described voltage ripple
Examination auxiliary device；Described oscillograph includes oscilloprobe；Described oscilloprobe include probe, probe and
Probe ground clamp.
Voltage ripple testing auxiliary device and voltage ripple that this utility model embodiment provides test device, logical
Cross the trident stent-type structure being made up of the first pillar, the second pillar, the 3rd pillar spy to oscilloprobe
Rod is fixed, and decreasing needs operator to hold probe just to test in voltage ripple test process
Operation, it is possible to effectively prevent the measurement error causing due to anthropic factor or introducing, improve voltage ripple
The efficiency of test and accuracy；Additionally, be directly sandwiched in by the probe ground clamp of oscilloprobe, there is conduction merit
Can the second pillar on, the place that veneer is different being debugged or during test voltage ripple, it is not necessary to
Veneer repeats welding ground, simplifies test process, and the wind that veneer is destroyed can be efficiently reduced
Danger.
Accompanying drawing explanation
Fig. 1 is the composition structural representation of this utility model embodiment voltage ripple testing auxiliary device.
Detailed description of the invention
Embodiment one
Fig. 1 is the composition structural representation of this utility model embodiment voltage ripple testing auxiliary device, such as figure
Shown in 1, described device includes first pillar the 4, second pillar the 5, the 3rd pillar 6；First pillar 4,
Two pillar the 5, the 3rd pillars 6 connect and compose trident support rack type by hinge member 7；Set on first pillar 4
It is equipped with probe folder；The probe 1 of oscilloprobe is fixed on the first pillar 4 by described probe folder.
Here, oscillograph is for measuring and show the voltage ripple of tested electronic device；Described oscilloprobe
It is the electronic device connecting tested electronic device with oscillograph input end interface, belongs to oscillographic regular collocation
Device, is used for obtaining voltage ripple signals；Described oscilloprobe includes probe 1, probe 2 and probe ground
Wire clamp 3.
Here, described hinge member 7 can be rivet, it is also possible to be the fixing device of other movable regulation.
Further, for convenience of regulation first pillar the 4, second pillar the 5, the 3rd pillar 6 each other away from
From and/or the size of angle so that be made up of described first pillar the 4, second pillar the 5, the 3rd pillar 6
The size and/or shape of trident support adapt with the condition of tested electronic device position, the first pillar
The top of 4 is provided with first handle 10, and the top of the second pillar 5 is provided with second handle 11.
Further, for making the distance between first pillar the 4, second pillar 5 measure tested electronic device
Shi Buhui changes, and is provided with elastic clip 12 between the first pillar 4 and the second pillar 5.
Here, described elastic clip 12 can be that one end is arranged at first handle 10 position and hinge member
Between 7 positions, the other end be arranged at second handle 11 position and hinge member 7 position it
Between；Described elastic clip 12 can also is that one end is arranged at the bottom of the first pillar 4 and hinge member 7 institute is in place
Between putting, the other end is arranged between the bottom of the second pillar 5 and hinge member 7 position.
Further, slide to make the most passive 3rd pillar 6 be not easy, and be prone to adjust
3rd pillar 6 position, the bottom of described 3rd pillar 6 is circular arc type.
Further, in order to make what probe 1 can be stable on the first pillar 4 to be fixed, described probe
Folder includes the first probe folder 8 and the second probe folder 9；Wherein, the second probe folder 9 and first is bottom pillar 4
Distance be less than the first probe folder 8 and the first distance bottom pillar 4；Owing to the two ends of probe 1 are usual
It not that size is identical, it may be assumed that in probe 1, the one end near probe 2 typically can be than close probe ground clamp 3
The diameter of one end want big, during for making to measure, probe 1 tilts downwards as far as possible, facilitates probe 2 fully
With the positive contact of tested electronic device, therefore, the first probe folder 8 is perpendicular to the height of the first pillar 4
It is greater than the second probe folder 9 and is perpendicular to the height of the first pillar 4, it may be assumed that the height of the first probe folder 8 is permissible
It is set greater than the height of the second probe folder 9；Additionally, measure process for convenience, the first probe folder 8 Hes
Second probe folder 9 could be arranged to carry out to the second side, pillar 5 position tilting to fix.
Here, it is movable fixing that described probe presss from both sides, can needing to probe folder in place according to probe 1
Put and be adjusted；Described probe folder can also replace with other device with fixation；Described probe presss from both sides
Quantity can also be two or more.
Further, after probe 1 schedules on the first pillar 4 by described probe is clamping, the top of probe 2
End would generally measure process for convenience more than the bottom of the first pillar 4, and the length of described first pillar 4 can
Shorter than the length of the second pillar 5 to be set to.
When utilizing the voltage ripple of this measurement device electronic device, operating procedure can be such that opens oscillography
Device, and oscillograph parameter is configured, including the input mode of probe being set to AC coupling, oscillography
Device bandwidth is set to 20MHz, display mode is set to persistence；The BNC of oscilloprobe is connected
Head is connected on oscillograph corresponding input end interface；By probe 1 by first probe folder the 8, second probe
Folder 9 is fixed on the first pillar 4；Adjust the position change probe 1 of first probe folder the 8, second probe folder 9
Position on the first pillar 4, and by holding first handle 10, second handle 11 adjust the first pillar 4,
Second pillar the 5, the 3rd pillar 6 distance each other and/or corner dimension each other, and then change
The shape of trident support so that probe 2 just anode with tested electronic device is fully contacted；By probe ground
Wire clamp 3 is connected with the ground wire of described tested electronic device place circuit, starts to measure described tested electronic device
Voltage ripple.
Embodiment two
The present embodiment is the electronic device in order to solve to be distributed in measuring circuit in embodiment one diverse location
During voltage ripple, needing the individually problem of welding ground from circuit, the present embodiment is by the second pillar 5 every time
It is set to the contact rod that there is conducting function, can use directly as ground wire.Fig. 1 is that this utility model is real
Execute the composition structural representation of example voltage ripple testing auxiliary device, as it is shown in figure 1, described device includes
One pillar the 4, second pillar the 5, the 3rd pillar 6；First pillar the 4, second pillar the 5, the 3rd pillar 6 leads to
Cross hinge member 7 and connect and compose trident support rack type；Probe folder it is provided with on first pillar 4；Described probe presss from both sides
The probe 1 of oscilloprobe is fixed on the first pillar 4.
Here, oscillograph is for measuring and show the voltage ripple of tested electronic device；Described oscilloprobe
It is the electronic device connecting tested electronic device with oscillograph input end interface, belongs to oscillographic regular collocation
Device, is used for obtaining voltage ripple signals；Described oscilloprobe includes probe 1, probe 2 and probe ground
Wire clamp 3.
Here, described hinge member 7 can be rivet, it is also possible to be the fixing device of other movable regulation.
Further, for convenience of regulation first pillar the 4, second pillar the 5, the 3rd pillar 6 each other away from
From and/or the size of angle so that be made up of described first pillar the 4, second pillar the 5, the 3rd pillar 6
The size and/or shape of trident support adapt with the condition of tested electronic device position, the first pillar
The top of 4 is provided with first handle 10, and the top of the second pillar 5 is provided with second handle 11.
Further, for making the distance between first pillar the 4, second pillar 5 measure tested electronic device
Shi Buhui changes, and is provided with elastic clip 12 between the first pillar 4 and the second pillar 5.
Here, described elastic clip 12 can be that one end is arranged at first handle 10 position and hinge member
Between 7 positions, the other end be arranged at second handle 11 position and hinge member 7 position it
Between；Described elastic clip 12 can also is that one end is arranged at the bottom of the first pillar 4 and hinge member 7 institute is in place
Between putting, the other end is arranged between the bottom of the second pillar 5 and hinge member 7 position.
Further, slide to make the most passive 3rd pillar 6 be not easy, and be prone to adjust
3rd pillar 6 position, the bottom of described 3rd pillar 6 is circular arc type.
Further, in order to make what probe 1 can be stable on the first pillar 4 to be fixed, described probe
Folder includes the first probe folder 8 and the second probe folder 9；Wherein, the second probe folder 9 and first is bottom pillar 4
Distance be less than the first probe folder 8 and the first distance bottom pillar 4；Owing to the two ends of probe 1 are usual
It not that size is identical, it may be assumed that in probe 1, the one end near probe 2 typically can be than close probe ground clamp 3
The diameter of one end want big, during for making to measure, probe 1 tilts downwards as far as possible, facilitates probe 2 fully
With the positive contact of tested electronic device, therefore, the first probe folder 8 is perpendicular to the height of the first pillar 4
It is greater than the second probe folder 9 and is perpendicular to the height of the first pillar 4, it may be assumed that the height of the first probe folder 8 is permissible
It is set greater than the height of the second probe folder 9；Additionally, measure process for convenience, the first probe folder 8 Hes
Second probe folder 9 could be arranged to carry out to the second side, pillar 5 position tilting to fix.
Here, it is movable fixing that described probe presss from both sides, can needing to probe folder in place according to probe 1
Put and be adjusted；Described probe folder can also replace with other device with fixation；Described probe presss from both sides
Quantity can also be two or more.
Further, after probe 1 schedules on the first pillar 4 by described probe is clamping, the top of probe 2
End would generally measure process for convenience more than the bottom of the first pillar 4, and the length of described first pillar 4 can
Shorter than the length of the second pillar 5 to be set to.
Further, the second pillar 5 is contact rod.Here, when described second pillar 5 is contact rod,
When electronic device being carried out voltage ripple test, by the moon of the bottom of described contact rod Yu tested electronic device
Pole connects, and probe ground clamp 3 is clipped on described contact rod, thus can avoid at system single board or end
In end veneer, for making the loop being made up of tested electronic device, probe, probe ground wire the shortest, thus every time
Need the individually problem of welding ground from veneer.
Further, in order to improve the degree of accuracy of voltage ripple test, the bottom of described contact rod is coated with leads
Electricity sponge.
Here, described conductive sponge can play greatly the effect increasing thick ground wire due to contact area；Research experiment
Showing, ground wire is the thickest, and the degree of accuracy of voltage ripple test is the highest.
Further, described first pillar the 4, the 3rd pillar 6 is insulating bar.
Here, the first pillar the 4, the 3rd pillar 6 can avoid introducing the external world during measuring for insulating bar
Noise, in voltage ripple, reduces the accuracy of measurement result；Described insulating bar can be sticking plaster, rubber
Rod etc. has one or more of electric insulation functions.
When utilizing the voltage ripple of this measurement device electronic device, operating procedure can be such that opens oscillography
Device, and oscillograph parameter is configured, including the input mode of probe being set to AC coupling, oscillography
Device bandwidth is set to 20MHz, display mode is set to persistence；The BNC of oscilloprobe is connected
Head is connected on oscillograph corresponding input end interface；By probe 1 by first probe folder the 8, second probe
Folder 9 is fixed on the first pillar 4；Adjust the position change probe 1 of first probe folder the 8, second probe folder 9
Position on the first pillar 4, and by holding first handle 10, second handle 11 adjust the first pillar 4,
Second pillar the 5, the 3rd pillar 6 distance each other and/or corner dimension each other, and then change
The shape of trident support so that probe 2 just anode with tested electronic device is fully contacted；By probe ground
Wire clamp 3 is clipped on the second pillar 5 that material is metal bar, the conduction sea that the bottom of the second pillar 5 is covered
The negative electrode of continuous and tested electronic device is fully contacted, and first pillar the 4, second pillar 5 is at the work of elastic clip 12
Clamp described tested electronic device under with, start to measure the voltage ripple of described tested electronic device.
The above, preferred embodiment the most of the present utility model, it is not intended to limit this utility model
Protection domain.All made within spirit and scope of the present utility model any amendment, equivalent and
Improve, within being all contained in protection domain of the present utility model.
Claims (11)
1. a voltage ripple testing auxiliary device, it is characterised in that described device include the first pillar (4),
Second pillar (5), the 3rd pillar (6)；Described first pillar (4), the second pillar (5), the 3rd pillar
(6) trident support rack type is connected and composed by hinge member (7)；It is provided with spy on described first pillar (4)
Rod folder；The probe (1) of oscilloprobe is fixed on described first pillar (4) by described probe folder.
Device the most according to claim 1, it is characterised in that described second pillar (5) is conduction
Rod；The probe ground clamp (3) of oscilloprobe is clipped on described contact rod；The bottom of described contact rod and quilt
The negative electrode of test electronic device connects.
Device the most according to claim 2, it is characterised in that the bottom of described contact rod is coated with
Conductive sponge.
4. according to the device described in any one of claims 1 to 3, it is characterised in that described probe clip pack
Include the first probe folder (8) and the second probe folder (9).
Device the most according to claim 4, it is characterised in that the height of described first probe folder (8)
Degree is more than the height of described second probe folder (9).
Device the most according to claim 4, it is characterised in that described first probe folder (8) and the
Two probes folder (9) roll the most fixing to described second pillar (5) position.
7. according to the device described in any one of claims 1 to 3, it is characterised in that described first pillar
(4) top is provided with first handle (10)；The top of described second pillar (5) is provided with second handle (11).
8. according to the device described in any one of claims 1 to 3, it is characterised in that described first pillar
(5) elastic clip (12) it is provided with between and the second pillar (6).
9. according to the device described in any one of claims 1 to 3, it is characterised in that described 3rd pillar
(6) bottom is circular arc type.
10. according to the device described in any one of claims 1 to 3, it is characterised in that described first pillar
(4), the 3rd pillar (6) is insulating bar.
11. 1 kinds of voltage ripple test devices, it is characterised in that include oscillograph and claim 1 to 9
Voltage ripple testing auxiliary device described in any one；Described oscillograph includes oscilloprobe；Described oscillography
Device probe includes probe (1), probe (2) and probe ground clamp (3).
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620491374.2U CN205786902U (en) | 2016-05-25 | 2016-05-25 | Voltage ripple testing auxiliary device and voltage ripple test device |
| PCT/CN2017/085071 WO2017202246A1 (en) | 2016-05-25 | 2017-05-19 | Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620491374.2U CN205786902U (en) | 2016-05-25 | 2016-05-25 | Voltage ripple testing auxiliary device and voltage ripple test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205786902U true CN205786902U (en) | 2016-12-07 |
Family
ID=58111048
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620491374.2U Expired - Fee Related CN205786902U (en) | 2016-05-25 | 2016-05-25 | Voltage ripple testing auxiliary device and voltage ripple test device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN205786902U (en) |
| WO (1) | WO2017202246A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017202246A1 (en) * | 2016-05-25 | 2017-11-30 | 深圳市中兴微电子技术有限公司 | Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device |
| CN112485472A (en) * | 2020-10-29 | 2021-03-12 | 苏州浪潮智能科技有限公司 | Voltage test auxiliary device and test method |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116520137A (en) * | 2023-06-27 | 2023-08-01 | 北京智芯微电子科技有限公司 | Low-noise chip pin interference measurement auxiliary device and measurement system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8368415B2 (en) * | 2009-02-20 | 2013-02-05 | Spx Corporation | Multi-position probe circuit tester |
| CN102052931A (en) * | 2009-11-09 | 2011-05-11 | 神讯电脑(昆山)有限公司 | Test bracket |
| CN104076210A (en) * | 2013-03-25 | 2014-10-01 | 深圳市祈飞科技有限公司 | Ripple wave noise testing device |
| CN203645100U (en) * | 2013-10-29 | 2014-06-11 | 国家电网公司 | Y-type capacitor discharging device |
| CN203705493U (en) * | 2013-12-23 | 2014-07-09 | 宇龙计算机通信科技(深圳)有限公司 | Oscilloscope probe for testing ripple waves |
| CN205786902U (en) * | 2016-05-25 | 2016-12-07 | 深圳市中兴微电子技术有限公司 | Voltage ripple testing auxiliary device and voltage ripple test device |
-
2016
- 2016-05-25 CN CN201620491374.2U patent/CN205786902U/en not_active Expired - Fee Related
-
2017
- 2017-05-19 WO PCT/CN2017/085071 patent/WO2017202246A1/en active Application Filing
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017202246A1 (en) * | 2016-05-25 | 2017-11-30 | 深圳市中兴微电子技术有限公司 | Auxiliary device for use in voltage waveform measurement, and voltage waveform measurement device |
| CN112485472A (en) * | 2020-10-29 | 2021-03-12 | 苏州浪潮智能科技有限公司 | Voltage test auxiliary device and test method |
| CN112485472B (en) * | 2020-10-29 | 2022-05-13 | 苏州浪潮智能科技有限公司 | Voltage test auxiliary device and test method |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017202246A1 (en) | 2017-11-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Xi'an Chris Semiconductor Technology Co.,Ltd. Assignor: SANECHIPS TECHNOLOGY Co.,Ltd. Contract record no.: 2019440020036 Denomination of utility model: Voltage ripple test auxiliary device and voltage ripple testing arrangement Granted publication date: 20161207 License type: Common License Record date: 20190619 |
|
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161207 |