CN204882626U - Semiconductor component's test centre gripping frock - Google Patents
Semiconductor component's test centre gripping frock Download PDFInfo
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- CN204882626U CN204882626U CN201520563237.0U CN201520563237U CN204882626U CN 204882626 U CN204882626 U CN 204882626U CN 201520563237 U CN201520563237 U CN 201520563237U CN 204882626 U CN204882626 U CN 204882626U
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- conducting rod
- conductive
- centre gripping
- insulation crust
- test
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Abstract
The utility model relates to a semiconductor component's test centre gripping frock, including two centre gripping subassemblies, pivot and fastening nut, two centre gripping subassemblies include conducting rod, insulating casing, electrically conductive test piece respectively and lead electrical pillar, the conducting rod by the cladding in insulating casing, and the terminal surface at conducting rod top with lead electrical pillar welded connection, the terminal surface and the electrically conductive test piece fixed connection of bottom, insulating casing's bottom is equipped with the baffle, and the baffle is located the electrically conductive outside of testing the piece, the insulating casing of two centre gripping subassemblies is passed in the pivot, and the both ends of pivot and fastening nut fixed connection, thereby make first centre gripping subassembly and second centre gripping subassembly constitute hinge structure. The utility model discloses simple structure, the holding workpiece of just being convenient for.
Description
Technical field
The utility model relates to a kind of clamping tooling, is specifically related to a kind of test clamping tooling of semiconductor element.
Background technology
The package dimension of existing semiconductor element is more and more less, and product all needs to carry out electric performance test before dispatching from the factory, and to be testedly qualifiedly just to dispatch from the factory afterwards.The package dimension of some semiconductor elements is less, and the terminal pins of such semiconductor element is the back side being positioned at insulating gel shell, for this small dimension semiconductor element test electrical property time, be difficult to realize offhand and test, make difficulty of test larger.
Summary of the invention
The purpose of this utility model is: not only structure is simple to provide one, and is convenient to the test clamping tooling of semiconductor element of holding workpiece, to overcome the deficiencies in the prior art.
In order to achieve the above object, the technical solution of the utility model is: a kind of test clamping tooling of semiconductor element, and its innovative point is: comprise the first clamp assemblies, the second clamp assemblies, rotating shaft and clamp nut;
Described first clamp assemblies comprises the first conducting rod, the first insulation crust, the first conductive test sheet and the first conductive pole, described first conducting rod is covered by the first insulation crust, and the end face at the first conducting rod top and the first conductive pole are welded to connect, the end face of bottom is fixedly connected with the first conductive test sheet, the bottom of described first insulation crust is provided with the first baffle plate, and the first baffle plate is positioned at the outside of the first conductive test sheet;
Described second clamp assemblies comprises the second conducting rod, the second insulation crust, the second conductive test sheet and the second conductive pole, described second conducting rod is covered by the second insulation crust, and the end face at the second conducting rod top and the second conductive pole are welded to connect, the end face of bottom is fixedly connected with the second conductive test sheet, the bottom of described second insulation crust is provided with second baffle, and second baffle is positioned at the outside of the second conductive test sheet;
Described rotating shaft is through the first insulation crust and the second insulation crust, and the two ends of rotating shaft are fixedly connected with clamp nut; Thus make the first clamp assemblies and the second clamp assemblies form articulated structure.
In technique scheme, described first conductive pole has two, and two the first conductive poles are all welded to connect with the end face at the first conducting rod top; Described second conductive pole has two, and two the second conductive poles are all welded to connect with the end face at the second conducting rod top.
The good effect that the utility model has is: after adopting clamping tooling of the present utility model, during use, the first conductive pole and the second conductive pole are electrically connected with one end of test coaxial cable respectively, and the other end of test coaxial cable is electrically connected with test machine; The hand-holdable the utility model of testing staff, and clamp workpiece for measurement with the first insulation crust and the second insulation crust, the first baffle plate and second baffle is made to clamp the outer face of workpiece for measurement, and two of workpiece for measurement terminal pins abut against with the first conductive test sheet and the second conductive test sheet respectively, just electric performance test can be implemented.The utility model not only structure is simple, and is convenient to holding workpiece, achieves the purpose of this utility model.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of embodiment of the utility model;
Fig. 2 is using state schematic diagram of the present utility model.
Embodiment
Below in conjunction with accompanying drawing and the embodiment that provides, the utility model is further described, but is not limited thereto.
As shown in Figure 1, 2, a kind of test clamping tooling of semiconductor element, comprises the first clamp assemblies 1, second clamp assemblies 2, rotating shaft 3 and clamp nut 4;
Described first clamp assemblies 1 comprises the first conducting rod 1-1, the first insulation crust 1-2, the first conductive test sheet 1-3 and the first conductive pole 1-4, described first conducting rod 1-1 is covered by the first insulation crust 1-2, and the end face at the first conducting rod 1-1 top and the first conductive pole 1-4 are welded to connect, the end face of bottom is fixedly connected with the first conductive test sheet 1-3, the bottom of described first insulation crust 1-2 is provided with the first baffle plate 1-5, and the first baffle plate 1-5 is positioned at the outside of the first conductive test sheet 1-3;
Described second clamp assemblies 2 comprises the second conducting rod 2-1, the second insulation crust 2-2, the second conductive test sheet 2-3 and the second conductive pole 2-4, described second conducting rod 2-1 is covered by the second insulation crust 2-2, and the end face at the second conducting rod 2-1 top and the second conductive pole 2-4 are welded to connect, the end face of bottom is fixedly connected with the second conductive test sheet 2-3, the bottom of described second insulation crust 2-2 is provided with second baffle 2-5, and second baffle 2-5 is positioned at the outside of the second conductive test sheet 2-3;
Described rotating shaft 3 is through the first insulation crust 1-2 and the second insulation crust 2-2, and the two ends of rotating shaft 3 are fixedly connected with clamp nut 4; Thus make the first clamp assemblies 1 and the second clamp assemblies 2 form articulated structure.
As shown in Figure 1, 2, the stability of testing to make the utility model is better, and described first conductive pole 1-4 has two, and two the first conductive pole 1-4 are all welded to connect with the end face at the first conducting rod 1-1 top; Described second conductive pole 2-4 has two, and two the second conductive pole 2-4 are all welded to connect with the end face at the second conducting rod 2-1 top.During use, two the first conductive pole 1-4 and two the second conductive pole 2-4 are electrically connected with test machine respectively by coaxial p-wire, if one of them conductive pole loose contact or be damaged, also have another one conductive pole to use.
As shown in Figure 2, when the utility model uses, the first conductive pole 1-4 and the second conductive pole 2-4 is electrically connected with one end of test coaxial cable respectively, and the other end of test coaxial cable is electrically connected with test machine; Testing staff clamps workpiece for measurement by the first insulation crust 1-2 and the second insulation crust 2-2, the first baffle plate 1-5 and second baffle 2-5 is made to clamp and fix the outer face of workpiece for measurement, and two of workpiece for measurement 5 terminal pins abut against with the first conductive test sheet 1-3 and the second conductive test sheet 2-3 respectively, just electric performance test can be implemented.The utility model not only structure is simple, and is convenient to holding workpiece.
The utility model pilot run shows, and its effect is well-content.
Claims (2)
1. a test clamping tooling for semiconductor element, is characterized in that: comprise the first clamp assemblies (1), the second clamp assemblies (2), rotating shaft (3) and clamp nut (4);
Described first clamp assemblies (1) comprises the first conducting rod (1-1), first insulation crust (1-2), first conductive test sheet (1-3) and the first conductive pole (1-4), described first conducting rod (1-1) is covered by the first insulation crust (1-2), and the end face at the first conducting rod (1-1) top and the first conductive pole (1-4) are welded to connect, the end face of bottom is fixedly connected with the first conductive test sheet (1-3), the bottom of described first insulation crust (1-2) is provided with the first baffle plate (1-5), and the first baffle plate (1-5) is positioned at the outside of the first conductive test sheet (1-3),
Described second clamp assemblies (2) comprises the second conducting rod (2-1), second insulation crust (2-2), second conductive test sheet (2-3) and the second conductive pole (2-4), described second conducting rod (2-1) is covered by the second insulation crust (2-2), and the end face at the second conducting rod (2-1) top and the second conductive pole (2-4) are welded to connect, the end face of bottom is fixedly connected with the second conductive test sheet (2-3), the bottom of described second insulation crust (2-2) is provided with second baffle (2-5), and second baffle (2-5) is positioned at the outside of the second conductive test sheet (2-3),
Described rotating shaft (3) is through the first insulation crust (1-2) and the second insulation crust (2-2), and the two ends of rotating shaft (3) are fixedly connected with clamp nut (4); Thus make the first clamp assemblies (1) and the second clamp assemblies (2) form articulated structure.
2. the test clamping tooling of semiconductor element according to claim 1, is characterized in that: described first conductive pole (1-4) has two, and two the first conductive poles (1-4) are all welded to connect with the end face at the first conducting rod (1-1) top; Described second conductive pole (2-4) has two, and two the second conductive poles (2-4) are all welded to connect with the end face at the second conducting rod (2-1) top.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520563237.0U CN204882626U (en) | 2015-07-30 | 2015-07-30 | Semiconductor component's test centre gripping frock |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520563237.0U CN204882626U (en) | 2015-07-30 | 2015-07-30 | Semiconductor component's test centre gripping frock |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204882626U true CN204882626U (en) | 2015-12-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520563237.0U Active CN204882626U (en) | 2015-07-30 | 2015-07-30 | Semiconductor component's test centre gripping frock |
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| Country | Link |
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| CN (1) | CN204882626U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106645823A (en) * | 2017-01-24 | 2017-05-10 | 广东风华高新科技股份有限公司 | Test connector and test apparatus |
-
2015
- 2015-07-30 CN CN201520563237.0U patent/CN204882626U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106645823A (en) * | 2017-01-24 | 2017-05-10 | 广东风华高新科技股份有限公司 | Test connector and test apparatus |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee after: Changzhou Galaxy century microelectronics Limited by Share Ltd Address before: 213022 Changzhou, North New District, Jiangsu Yangtze River Road, No. 19 Patentee before: Changzhou Galaxy Century Micro-Electronics Co., Ltd. |