CN205427081U - VCXO crystal electrical performance test mechanism - Google Patents
VCXO crystal electrical performance test mechanism Download PDFInfo
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- CN205427081U CN205427081U CN201620237658.9U CN201620237658U CN205427081U CN 205427081 U CN205427081 U CN 205427081U CN 201620237658 U CN201620237658 U CN 201620237658U CN 205427081 U CN205427081 U CN 205427081U
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Abstract
The utility model relates to a VCXO crystal electrical performance test mechanism, including test seat, load integrated circuit board and change -over panel, altitude mixture control piece, test apron, load card upper surface is provided with the VCXO change -over panel, and VCXO change -over panel upper surface is provided with tests the seat, the VCXO crystal sets up at test seat upper surface, the VCXO change -over panel is double -deck PCB board, and VCXO change -over panel upper surface is provided with 6 jacks, test seat sets up the guiding hole, and the guiding hole has with the jack position correspondingly, the VCXO crystal is provided with the pin, the pin position is corresponding with the jack position, 6 individual pin inserts through the guiding hole 6 in the individual jack. The utility model discloses VCXO crystal electrical performance test mechanism, simple structure, convenient operation, low in manufacturing cost, be convenient for installation and dismantlement, easy maintenance improves production efficiency.
Description
Technical field
This utility model relates to a kind of VCXO test device, specifically, relates to a kind of VCXO crystal current performance test mechanism.
Background technology
Original Vcxo electric performance testing device, its VCXO test device has 6 pin outputs, it is defined as: 1# foot is that Vco powers, 2# foot is Enable Pin control, 3# foot be GND, 4# foot be Out, 5# foot is GND, 6# foot is Vcc, and original general VCXO crystal Enable Pin is 2# pin, and the just corresponding test of test circuit.Needing Enable Pin to be the VCXO crystal of 5# pin now with client, when testing device to test with original VCXO, 5# foot is GND, energy terminal voltage ground connection, shows as without output, and when testing the VCXO crystal of the different voltage-controlled end of pin, test circuit need to be changed, and operating process is complicated, has a strong impact on board efficiency.
Utility model content
For above-mentioned deficiency of the prior art, this utility model provides a kind of rational in infrastructure, accuracy of detection is high, easy to operate VCXO crystal current performance test mechanism.
Technical solution adopted in the utility model is:
A kind of VCXO crystal current performance test mechanism, including test bench, load board and VCXO change-over panel, height adjusting blocks, testing cover plate；
Load card upper surface is provided with VCXO change-over panel, and VCXO change-over panel upper surface is provided with test bench, and described VCXO crystal is arranged on test bench upper surface；
Described VCXO change-over panel is double-layer PCB board, and VCXO change-over panel upper surface is provided with 6 jacks；
Described test bench arranges pilot hole, and pilot hole has corresponding with jack position；
Described VCXO crystal is provided with pin；Described Pin locations is corresponding with jack position；Described 6 pins are inserted in described 6 jacks by pilot hole；
Described jack includes left side jack and right side jack；
Described left side jack is respectively the 11st jack, the 12nd jack and the 13rd jack；Described right side jack is respectively the 14th jack, the 15th jack and the 16th jack；
It is provided with the 11st pin in described 11st jack；It is provided with the 12nd pin in described 12nd jack；It is provided with the 13rd pin in described 13rd jack；It is provided with the 14th pin in described 14th jack；It is provided with the 15th pin in described 15th jack；It is provided with the 16th pin in described 16th jack；Described VCXO change-over panel lower surface is provided with five keyset elastic probes；3 elastic probes in left side are respectively the 21st elastic probe, the 22nd elastic probe and the 23rd elastic probe；2 elastic probes in right side are respectively the 24th elastic probe and the 26th elastic probe；
21st elastic probe and the 11st jack are connected；
22nd elastic probe and the 15th jack are connected；
23rd elastic probe and the 13rd jack are connected；
24th elastic probe and the 14th jack are connected；
12nd receptacle ground；
26th elastic probe and the 16th jack are connected；
21st elastic probe, the 22nd elastic probe, the 23rd elastic probe, the 24th elastic probe, the 26th elastic probe are connected with load board 3 test lead respectively.
Described elastic probe is spring.
The beneficial effect of this utility model hinge structure:
This utility model VCXO crystal current performance test mechanism, simple in construction, easy to operate, low cost of manufacture, it is simple to installation and removal, easy to maintenance, improve production efficiency.
Accompanying drawing explanation
Fig. 1 is that main TV structure schematic diagram is put by this utility model VCXO crystal current performance test mechanism；
Fig. 2 is the VCXO change-over panel perspective view of this utility model VCXO crystal current performance test mechanism；
Fig. 3 is the testing cover plate structural representation of this utility model VCXO crystal current performance test mechanism.
Critical piece symbol description in accompanying drawing:
In figure:
1, computer 2, test circuit
3, load board 4, VCXO change-over panel
5, test bench 6, VCXO crystal
7, height adjusting blocks 8, testing cover plate
11, the 11st jack the 12, the 12nd jack
13, the 13rd jack the 14, the 14th jack
15, the 15th jack the 16, the 16th jack
17, spring.
Detailed description of the invention
Referring to the drawings and this utility model is described in detail by embodiment:
Accompanying drawing 1-3 understands, and a kind of VCXO crystal current performance test mechanism, including test bench 5, load board 3 and VCXO change-over panel 4, height adjusting blocks 7, testing cover plate 8；
Load card 3 upper surface is provided with VCXO change-over panel 4, and VCXO change-over panel 4 upper surface is provided with test bench 5, and described VCXO crystal 6 is arranged on test bench 5 upper surface；
Described VCXO change-over panel 4 is double-layer PCB board, and VCXO change-over panel 4 upper surface is provided with 6 jacks；
Described test bench arranges pilot hole, and pilot hole has corresponding with jack position；
Described VCXO crystal is provided with pin；Described Pin locations is corresponding with jack position；Described 6 pins are inserted in described 6 jacks by pilot hole；
Described jack includes left side jack and right side jack；
Described left side jack is respectively the 11st jack the 11, the 12nd jack the 12 and the 13rd jack 13；Described right side jack is respectively the 14th jack the 14, the 15th jack the 15 and the 16th jack 16；
It is provided with the 11st pin in described 11st jack；It is provided with the 12nd pin in described 12nd jack；It is provided with the 13rd pin in described 13rd jack；It is provided with the 14th pin in described 14th jack；It is provided with the 15th pin in described 15th jack；It is provided with the 16th pin in described 16th jack；Described VCXO change-over panel lower surface is provided with five keyset elastic probes；3 elastic probes in left side are respectively the 21st elastic probe the 211, the 22nd elastic probe the 212 and the 23rd elastic probe 213；2 elastic probes in right side are respectively the 24th elastic probe the 214 and the 26th elastic probe 216；
21st elastic probe 211 is connected with the 11st jack；
22nd elastic probe 212 is connected with the 15th jack；
23rd elastic probe 213 is connected with the 13rd jack；
24th elastic probe 214 is connected with the 14th jack；
12nd receptacle ground；
26th elastic probe 216 is connected with the 16th jack；
21st elastic probe, the 22nd elastic probe, the 23rd elastic probe, the 24th elastic probe, the 26th elastic probe are connected with load board 3 test lead respectively.
Described elastic probe is spring.
This utility model VCXO crystal current performance test mechanism, simple in construction, easy to operate, low cost of manufacture, it is simple to installation and removal, easy to maintenance, improve production efficiency.
This utility model VCXO crystal current performance test mechanism, when test Enable Pin is the VCXO crystal of the 12nd pin, does not use VCXO circuit conversion plate；When test Enable Pin is the VCXO crystal of the 15th pin, VCXO change-over panel 4 is placed on above load board 3, it is connected with the circuit on load card by nonrigid connector, it is responsible for the voltage of the 12nd pin and the 15th pin to exchange, then test bench 5 is placed on above VCXO change-over panel 4 again, it is connected with VCXO keyset by elastic probe, Enable Pin is that the VCXO crystal 6 of the 15th foot puts into test bench 5, height adjusting blocks 7 is responsible for the pressure height down of regulation testing cover plate, makes crystal be connected well with test bench.Load card 3, VCXO change-over panel 4, test bench 5, VCXO crystal 6 are all placed in testing cover plate 8 so that it is with test circuit 2 compact siro spinning technology, carry out electric performance test by computer 1 and test circuit 2.
Claims (2)
1. a VCXO crystal current performance test mechanism, it is characterised in that: include test bench (5), load board (3) and VCXO change-over panel (4), height adjusting blocks (7), testing cover plate (8)；
Load card (3) upper surface is provided with VCXO change-over panel (4), and VCXO change-over panel (4) upper surface is provided with test bench (5), and described VCXO crystal (6) is arranged on test bench (5) upper surface；
Described VCXO change-over panel (4) is double-layer PCB board, and VCXO change-over panel (4) upper surface is provided with 6 jacks；
Described test bench arranges pilot hole, and pilot hole has corresponding with jack position；
Described VCXO crystal is provided with pin；Described Pin locations is corresponding with jack position；Described 6 pins are inserted in described 6 jacks by pilot hole；
Described jack includes left side jack and right side jack；
Described left side jack is respectively the 11st jack (11), the 12nd jack (12) and the 13rd jack (13)；Described right side jack is respectively the 14th jack (14), the 15th jack (15) and the 16th jack (16)；
It is provided with the 11st pin in described 11st jack；It is provided with the 12nd pin in described 12nd jack；It is provided with the 13rd pin in described 13rd jack；It is provided with the 14th pin in described 14th jack；It is provided with the 15th pin in described 15th jack；It is provided with the 16th pin in described 16th jack；Described VCXO change-over panel lower surface is provided with five keyset elastic probes；3 elastic probes in left side are respectively the 21st elastic probe (211), the 22nd elastic probe (212) and the 23rd elastic probe (213)；2 elastic probes in right side are respectively the 24th elastic probe (214) and the 26th elastic probe (216)；
21st elastic probe (211) is connected with the 11st jack (11)；
22nd elastic probe (212) is connected with the 15th jack (15)；
23rd elastic probe (213) is connected with the 13rd jack (13)；
24th elastic probe (214) is connected with the 14th jack (14)；
12nd receptacle ground；
26th elastic probe (216) is connected with the 16th jack (16)；
21st elastic probe, the 22nd elastic probe, the 23rd elastic probe, the 24th elastic probe, the 26th elastic probe are connected with load board 3 test lead respectively.
VCXO crystal current performance test mechanism the most according to claim 1, it is characterised in that: described elastic probe is spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620237658.9U CN205427081U (en) | 2016-03-26 | 2016-03-26 | VCXO crystal electrical performance test mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620237658.9U CN205427081U (en) | 2016-03-26 | 2016-03-26 | VCXO crystal electrical performance test mechanism |
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| Publication Number | Publication Date |
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| CN205427081U true CN205427081U (en) | 2016-08-03 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620237658.9U Active CN205427081U (en) | 2016-03-26 | 2016-03-26 | VCXO crystal electrical performance test mechanism |
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| Country | Link |
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| CN (1) | CN205427081U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108195241A (en) * | 2018-02-08 | 2018-06-22 | 深圳大成创安达电子科技发展有限公司 | A kind of electric detonator detection device and detection method |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN111007319A (en) * | 2019-12-05 | 2020-04-14 | 上海华力集成电路制造有限公司 | Detection circuit and method for socket probe yield |
-
2016
- 2016-03-26 CN CN201620237658.9U patent/CN205427081U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108195241A (en) * | 2018-02-08 | 2018-06-22 | 深圳大成创安达电子科技发展有限公司 | A kind of electric detonator detection device and detection method |
| CN108414869A (en) * | 2018-06-11 | 2018-08-17 | 南京尤尼泰信息科技有限公司 | A kind of test system suitable for plurality of specifications crystal oscillator |
| CN108414869B (en) * | 2018-06-11 | 2023-09-29 | 南京尤尼泰信息科技有限公司 | Test system suitable for multiple specification crystal oscillator |
| CN111007319A (en) * | 2019-12-05 | 2020-04-14 | 上海华力集成电路制造有限公司 | Detection circuit and method for socket probe yield |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |