CN204649622U - A kind of BSDF measuring system eliminating ambient light interference - Google Patents
A kind of BSDF measuring system eliminating ambient light interference Download PDFInfo
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- CN204649622U CN204649622U CN201520095417.0U CN201520095417U CN204649622U CN 204649622 U CN204649622 U CN 204649622U CN 201520095417 U CN201520095417 U CN 201520095417U CN 204649622 U CN204649622 U CN 204649622U
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Abstract
The utility model discloses a kind of BSDF measuring system eliminating ambient light interference, comprise framework platform, measuring table, rocking arm probe mechanism, control module, data acquisition module and PC; Measuring table comprises rotating base, the bracing frame be arranged on rotating base, bearing platform, loop sample platform, laser instrument etc.; During measurement, laser irradiates sample surface, after reflection or transmission, by the rotation of rocking arm and the rotation of sample stage, measures the light scattering situation of measurement point each in hemisphere face; Carry out break-make by electronic shutter to laser optical path during measurement to control, each measurement point measure respectively have laser irradiate and without laser irradiate (namely only having surround lighting) time data, two kinds of data are subtracted each other, just can remove the composition of surround lighting, obtain BSDF measurement data accurately.Native system can eliminate the interference of surround lighting automatically, measures without the need to carrying out in dark situation; Be widely used in the sample of various material properties.
Description
Technical field
The utility model relates to materials optical scattering properties and measures, and particularly relates to a kind of BSDF measuring system eliminating ambient light interference.
Background technology
Two-way dispersion distribution function (Bidirectional Scattering Distribution Function, i.e. BSDF) is the strength metric of light from the different directions scattering a surface.BSDF is a function not only having comprised incident direction but also comprised scattering direction, is therefore called " two-way ".It is defined as light from the outgoing spoke brightness a certain exit direction and the ratio of incident irradiance degree inciding material surface, and its mathematic(al) representation is:
In formula, subscript i represents incidence, the outgoing of subscript behalf; θ
ifor incidence zenith angle;
for incident orientation angle; θ
sfor outgoing zenith angle;
for outgoing position angle.
for the radiance of exit direction;
for the radiant illumination of incident direction.
Two-way dispersion distribution function (BSDF) comprises bidirectional reflectance distribution function (BRDF) and two-way transmission distribution function (BTDF).When incident light is reflected
be the radiance of reflection direction, during incident light transmission
be the radiance of transmission direction.
Radiance
be defined as along radiation direction
on radiation flux
with the projected area of swept area
the ratio of radiation solid angle Ω:
Radiant illumination
be defined as radiation flux
with the ratio of swept area A:
Therefore BSDF formula can be written as:
In formula,
for the radiation intensity of exit direction, when light is visible ray, be intensity of illumination.Therefore, as long as the power of incident light
known, then record
the intensity of direction place emergent light
namely can be regarded as
BSDF can be widely used in the fields such as computing machine 3D drawing, optical analogy emulation, can be used for that 3D plays up, weaves, in industry that cosmetics, coating, illumination and display etc. are relevant to optical scattering.
All need to carry out in dark situation in the measuring process of current existing BSDF measurement mechanism or patent, the accuracy that there is measurement result during ambient light interference can be affected, therefore comparatively harsh to the requirement of measuring condition.
Summary of the invention
In order to improve the accuracy that bidirectional reflectance distribution function is measured, automatically eliminate the interference of surround lighting, measurement need not carried out in dark situation, reduce the requirement of measuring condition, the utility model provides a kind of BSDF measuring system eliminating ambient light interference.This measuring system and measuring method adapt to the sample of different materials attribute, and measurement result can directly be imported in each optical simulation software.
The utility model is achieved through the following technical solutions:
Eliminate a BSDF measuring system for ambient light interference, comprise framework platform, measuring table 2, rocking arm probe mechanism, control module 6, data acquisition module 7 and PC 8; Described framework platform is divided into low platform 11 and high platform 12;
Described measuring table 2 is placed on low platform 11, described measuring table 2 comprises rotating base 21, the bracing frame 22 be arranged on rotating base 21, bracing frame 22 top has a bearing platform, bearing platform is provided with loop sample platform 23, loop sample platform 23 is provided with the laser instrument 3 of a band electronic shutter 4, described laser instrument 3 is connected with the index dial mechanism 34 be arranged on bearing platform by swingle 33, and laser instrument 3 is by the 360 ° of rotations of swingle 33 energy; The incidence zenith angle of laser instrument 3 laser is regulated by index dial mechanism 34;
The interior bottom circumferential lamella 231 that described loop sample platform 23 comprises enclosing cover ring flat-plate 232 and puts in the inner, the axis coinciding of described enclosing cover ring flat-plate 232, interior bottom circumferential lamella 231, rotating base 21;
The driver element 52 that described rocking arm probe mechanism comprises Rocker arm 5, the luminous intensity measurement probe 51 be arranged on Rocker arm 5, driving Rocker arm 5 move, driver element 52 is arranged on high platform 12;
Described PC 8 is link control module 6 and data acquisition module 7 respectively, and described control module 6 connects luminous intensity measurement probe 51, and described control module 6 connects the driving mechanism of driver element 52, electronic shutter 4 and rotating base 21 respectively.
Described driver element 52 drives Rocker arm 5 to rotate, and luminous intensity measurement probe 5 is rotated within the scope of ﹣ 90 ° ~ 90 ° around γ axle.
Described interior bottom circumferential lamella 231 upper surface outer rim has 45 ° of outer chamferings, and the size of outer chamfering is equal with interior bottom circumferential lamella 231 thickness; There is chamfering in 45 ° described enclosing cover ring flat-plate 232 lower surface inner edge, and the size of interior chamfering is equal with the thickness of enclosing cover ring flat-plate 232; Described enclosing cover ring flat-plate 232 is equal with the thickness of interior bottom circumferential lamella 231.
The optical axis of described laser instrument 3 and luminous intensity measurement probe (51) are just to the center of circle of loop sample platform (23).
Described control module controls Rocker arm 5 (i.e. zenith angle θ), the rotation of rotating base 21 (i.e. position angle φ) and the folding of electronic shutter 4 respectively.
The controling parameters needed for the input of described control module given by described PC; Data acquisition module will carry out data processing in the data collected input PC and export preservation.
A kind of BSDF measuring method eliminating ambient light interference is as follows:
(1) testing sample is placed on loop sample platform 23;
Directly be placed on when sample is hard above enclosing cover ring flat-plate 232; Then first take out enclosing cover ring flat-plate 232 when sample is soft, sample is placed on interior bottom circumferential lamella 231 surface, and then the upper outside bezel ring, plate 232 of fit, carry out tensioning by the pressing of enclosing cover ring flat-plate 232 and interior bottom circumferential lamella 231, even up sample;
(2) rotating swingle 33 makes the laser rotary of laser instrument 3 to required incident angle;
When measuring bidirectional reflectance distribution function (BRDF), laser instrument 3 rotates to the top of sample; When measuring two-way transmission distribution function (BTDF), laser instrument 3 rotates to the below of sample;
(3) start to measure;
Independent measurement bidirectional reflectance distribution function (BRDF) and two-way transmission distribution function (BTDF) or both merging are obtained two-way dispersion distribution function (BSDF); During measurement, the laser optical path being controlled electronic shutter 4 pairs of laser instruments 3 by PC carries out break-make control; When laser instrument 3 often rotates to a measurement point, electronic shutter 4 is first opened, and measures data when having laser irradiation (now measure light and comprise scattering laser and surround lighting); Then control electronic shutter 41 to close, measure without data time laser irradiation (namely measure light and only have surround lighting);
(4) after having laser irradiation and nothing to swash light-struck two kinds of data acquisitions in the step (2) that luminous intensity measurement probe 51 measures by data acquisition module 7, be delivered in PC 8, data when irradiating there being laser deduct data when irradiating without laser, the composition of surround lighting can be removed, only comprised the measurement data of laser light scattering, thus obtained BSDF measurement result accurately;
(5) PC 8 measurement result is processed further, and the data layout needed for exporting.
The utility model measuring system, during measurement, laser irradiates sample surface, after reflection or transmission, by the rotation of rocking arm and the rotation of loop sample platform, measures the light scattering situation of measurement point each in hemisphere face; Carry out break-make by electronic shutter to laser optical path during measurement to control, each measurement point measures data when having laser irradiate (measure light comprise scattering laser and surround lighting) and irradiate (namely only having surround lighting) without laser respectively, two kinds of data are subtracted each other, just can remove the composition of surround lighting, obtain BSDF measurement data accurately.Automatically can eliminating the interference of surround lighting, measuring without the need to carrying out in dark situation; Native system is widely used in the sample of various material properties; Measurement data can save as the form of the optical software such as TracePro, conveniently carries out optical analogy emulation.
Accompanying drawing explanation
Fig. 1 is that BSDF illustrates schematic diagram
Fig. 2 is systematic survey angle schematic diagram
Fig. 3 is the one-piece construction schematic diagram of measuring system
Fig. 4 is measuring table structure enlarged diagram
Fig. 5 is bottom circumferential lamella and the bezel ring, plate assembling schematic diagram of loop sample platform
Embodiment
Below in conjunction with specific embodiment, the utility model is more specifically described in detail.
Embodiment
As shown in the figure.A kind of BSDF measuring system eliminating ambient light interference of the utility model, comprises framework platform, measuring table 2, rocking arm probe mechanism, control module 6, data acquisition module 7 and PC 8; Described framework platform is divided into low platform 11 and high platform 12;
Described measuring table 2 is placed on low platform 11, described measuring table 2 comprises rotating base 21, the bracing frame 22 be arranged on rotating base 21, bracing frame 22 top has a bearing platform, bearing platform is provided with loop sample platform 23, loop sample platform 23 is provided with the laser instrument 3 of a band electronic shutter 4, described laser instrument 3 is connected with the index dial mechanism 34 be arranged on bearing platform by swingle 33, and laser instrument 3 can around the rotation of 360 °, C axle by swingle 33; The incidence zenith angle of laser instrument 3 laser is regulated by index dial mechanism 34;
The interior bottom circumferential lamella 231 that described loop sample platform 23 comprises enclosing cover ring flat-plate 232 and puts in the inner, the axis coinciding of described enclosing cover ring flat-plate 232, interior bottom circumferential lamella 231, rotating base 21;
The driver element 52 that described rocking arm probe mechanism comprises Rocker arm 5, the luminous intensity measurement probe 51 be arranged on Rocker arm 5, driving Rocker arm 5 move, driver element 52 is arranged on high platform 12;
Described PC 8 is link control module 6 and data acquisition module 7 respectively, and described control module 6 connects luminous intensity measurement probe 51, and described control module 6 connects the driving mechanism of driver element 52, electronic shutter 4 and rotating base 21 respectively.
Described driver element 52 drives Rocker arm 5 to rotate, and luminous intensity measurement probe 5 is rotated within the scope of ﹣ 90 ° ~ 90 ° around γ axle, adjustable arbitrarily to realize measuring zenith angle; This luminous intensity measurement probe 51 is calibrated, can accurately measure absolute light intensity values.
Described interior bottom circumferential lamella 231 upper surface outer rim has 45 ° of outer chamferings, and the size of outer chamfering is equal with interior bottom circumferential lamella 231 thickness; There is chamfering in 45 ° described enclosing cover ring flat-plate 232 lower surface inner edge, and the size of interior chamfering is equal with the thickness of enclosing cover ring flat-plate 232; Described enclosing cover ring flat-plate 232 is equal with the thickness of interior bottom circumferential lamella 231.
The optical axis of described laser instrument 3 and luminous intensity measurement probe 51 face the center of circle of loop sample platform 23.
Described control module controls Rocker arm 5 (i.e. zenith angle θ), the rotation of rotating base 21 (i.e. position angle φ) and the folding of electronic shutter 4 respectively.
The controling parameters needed for the input of described control module given by described PC; Data acquisition module will carry out data processing in the data collected input PC and export preservation.
Described PC 8, except exporting original BSDF measurement data, also can save as the form that directly can import the optical software such as TracePro, conveniently carry out optical analogy emulation.
A kind of BSDF measuring method eliminating ambient light interference is as follows:
(1) testing sample is placed on loop sample platform 23;
Directly be placed on when sample is hard above enclosing cover ring flat-plate 232; Then first take out enclosing cover ring flat-plate 232 when sample is soft, sample is placed on interior bottom circumferential lamella 231 surface, and then the upper outside bezel ring, plate 232 of fit, carry out tensioning by the pressing of enclosing cover ring flat-plate 232 and interior bottom circumferential lamella 231, even up sample;
(2) rotating swingle 33 makes the laser rotary of laser instrument 3 to required incident angle;
When measuring bidirectional reflectance distribution function (BRDF), laser instrument 3 rotates to the top of sample; When measuring two-way transmission distribution function (BTDF), laser instrument 3 rotates to the below of sample;
(3) start to measure;
Independent measurement bidirectional reflectance distribution function (BRDF) and two-way transmission distribution function (BTDF) or both merging are obtained two-way dispersion distribution function (BSDF); During measurement, the laser optical path being controlled electronic shutter 4 pairs of laser instruments 3 by PC carries out break-make control; When laser instrument 3 often rotates to a measurement point, electronic shutter 4 is first opened, and measures data when having laser irradiation (now measure light and comprise scattering laser and surround lighting); Then control electronic shutter 4 to close, measure without data time laser irradiation (namely measure light and only have surround lighting); Described laser instrument 3 power stability and power is accurately known.
(4) after having laser irradiation and nothing to swash light-struck two kinds of data acquisitions in the step (2) that luminous intensity measurement probe 51 measures by data acquisition module 7, be delivered in PC 8, data when irradiating there being laser deduct data when irradiating without laser, the composition of surround lighting can be removed, only comprised the measurement data of laser light scattering, thus obtained BSDF measurement result accurately;
(5) PC 8 measurement result is processed further, and the data layout needed for exporting.
As mentioned above, just the present invention can be realized preferably.
Embodiment of the present utility model is not restricted to the described embodiments; other are any do not deviate from Spirit Essence of the present utility model and principle under do change, modification, substitute, combine, simplify; all should be the substitute mode of equivalence, be included within protection domain of the present utility model.
Claims (6)
1. eliminate a BSDF measuring system for ambient light interference, it is characterized in that: comprise framework platform, measuring table (2), rocking arm probe mechanism, control module (6), data acquisition module (7) and PC (8); Described framework platform is divided into low platform (11) and high platform (12);
Described measuring table (2) is placed on low platform (11), described measuring table (2) comprises rotating base (21), be arranged on the circumflex branch support (22) on rotating base (21), circumflex branch support (22) top has a bearing platform, bearing platform is provided with loop sample platform (23), loop sample platform (23) is provided with the laser instrument (3) of a band electronic shutter (4), described laser instrument (3) is connected with the index dial mechanism (34) be arranged on bearing platform by swingle (33), laser instrument (3) is by the 360 ° of rotations of swingle (33) energy, the incidence zenith angle of laser instrument (3) laser is regulated by index dial mechanism (34),
Described loop sample platform (23) comprises enclosing cover ring flat-plate (232) and puts interior bottom circumferential lamella (231) in the inner, the axis coinciding of described enclosing cover ring flat-plate (232), interior bottom circumferential lamella (231), rotating base (21);
The driver element (52) that described rocking arm probe mechanism comprises rocking arm (5), the luminous intensity measurement be arranged on rocking arm (5) is popped one's head in (51), driven rocking arm (5) to move, driver element (52) is arranged on high platform (12);
Described PC (8) is link control module (6) and data acquisition module (7) respectively, described control module (6) connects luminous intensity measurement probe (51), and described control module (6) connects the driving mechanism of driver element (52), electronic shutter (4) and rotating base (21) respectively.
2. the BSDF measuring system of elimination ambient light interference according to claim 1, it is characterized in that: described driver element (52) drives rocking arm (5) to rotate, luminous intensity measurement probe (51) is rotated around γ axle within the scope of ﹣ 90 ° ~ 90 °.
3. the BSDF measuring system of elimination ambient light interference according to claim 1, is characterized in that: described interior bottom circumferential lamella (231) upper surface outer rim has 45 ° of outer chamferings, and the size of outer chamfering is equal with interior bottom circumferential lamella (231) thickness; There is chamfering in 45 ° described enclosing cover ring flat-plate (232) lower surface inner edge, and the size of interior chamfering is equal with the thickness of enclosing cover ring flat-plate (232); Described enclosing cover ring flat-plate (232) is equal with the thickness of interior bottom circumferential lamella (231).
4. the BSDF measuring system of elimination ambient light interference according to any one of claim 1 to 3, is characterized in that: the optical axis of described laser instrument (3) and luminous intensity measurement probe (51) are just to the center of circle of loop sample platform (23).
5. the BSDF measuring system of elimination ambient light interference according to claim 4, is characterized in that: described control module controls rocking arm (5), the rotation of rotating base (21) and the folding of electronic shutter (4) respectively.
6. the BSDF measuring system of elimination ambient light interference according to claim 4, is characterized in that: described PC (8) is to the controling parameters needed for described control module input; Data acquisition module will carry out data processing in the data collected input PC (8) and export preservation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520095417.0U CN204649622U (en) | 2015-02-10 | 2015-02-10 | A kind of BSDF measuring system eliminating ambient light interference |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520095417.0U CN204649622U (en) | 2015-02-10 | 2015-02-10 | A kind of BSDF measuring system eliminating ambient light interference |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104677859A (en) * | 2015-02-10 | 2015-06-03 | 华南理工大学 | BSDF (Bidirectional Scattering Distribution Function) measurement system and method for eliminating ambient light interference |
| CN106680865A (en) * | 2017-03-08 | 2017-05-17 | 沈阳东软医疗***有限公司 | Equipment and method for ray leakage testing of radiation source component |
| CN110823836A (en) * | 2019-08-14 | 2020-02-21 | 长春欧明科技有限公司 | Multi-angle test system for surface feature spectrum |
-
2015
- 2015-02-10 CN CN201520095417.0U patent/CN204649622U/en not_active Withdrawn - After Issue
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104677859A (en) * | 2015-02-10 | 2015-06-03 | 华南理工大学 | BSDF (Bidirectional Scattering Distribution Function) measurement system and method for eliminating ambient light interference |
| CN106680865A (en) * | 2017-03-08 | 2017-05-17 | 沈阳东软医疗***有限公司 | Equipment and method for ray leakage testing of radiation source component |
| CN110823836A (en) * | 2019-08-14 | 2020-02-21 | 长春欧明科技有限公司 | Multi-angle test system for surface feature spectrum |
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| AV01 | Patent right actively abandoned |
Granted publication date: 20150916 Effective date of abandoning: 20170531 |
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| AV01 | Patent right actively abandoned |